Proceedings International Test Conference 1997最新文献

Test access of TAP'ed and non-TAP'ed cores 测试TAP和非TAP芯线的访问

Proceedings International Test Conference 1997 Pub Date : 1997-11-03 DOI: 10.1109/TEST.1997.639730

L. Whetsel

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引用次数: 0

Why would an ASIC foundry accept anything less than full scan? 为什么ASIC代工厂会接受不完全扫描的东西?

Proceedings International Test Conference 1997 Pub Date : 1997-11-03 DOI: 10.1109/TEST.1997.639721

S. F. Oakland

引用次数: 2

Putting the squeeze on test sequences 对测试序列施加压力

Proceedings International Test Conference 1997 Pub Date : 1997-11-03 DOI: 10.1109/TEST.1997.639685

E. Rudnick, J. Patel

引用次数: 14

Application and analysis of IDDQ diagnostic software IDDQ诊断软件的应用与分析

Proceedings International Test Conference 1997 Pub Date : 1997-11-03 DOI: 10.1109/TEST.1997.639633

P. Nigh, D. Forlenza, F. Motika

引用次数: 46

Design and realization of an accurate built-in current sensor for on-line power dissipation measurement and I/sub DDQ/ testing 用于在线功耗测量和I/sub DDQ/测试的精确内置电流传感器的设计与实现

Proceedings International Test Conference 1997 Pub Date : 1997-11-03 DOI: 10.1109/TEST.1997.639666

Karim Arabi, B. Kaminska

引用次数: 29

"Ethics, professionalism and accountability in testing" “考试中的道德、专业和问责”

Proceedings International Test Conference 1997 Pub Date : 1997-11-03 DOI: 10.1109/TEST.1997.639724

W. Simpson

引用次数: 0

Supervisors for testing non-deterministically specified systems 测试非确定性指定系统的监督员

Proceedings International Test Conference 1997 Pub Date : 1997-11-03 DOI: 10.1109/TEST.1997.639710

T. Savor, R. Seviora

引用次数: 4

Screening for known good die (KGD) based on defect clustering: an experimental study 基于缺陷聚类的已知好模(KGD)筛选的实验研究

Proceedings International Test Conference 1997 Pub Date : 1997-11-03 DOI: 10.1109/TEST.1997.639638

A. Singh, P. Nigh, C. M. Krishna

引用次数: 39

Incorporating physical design-for-test into routing 将物理测试设计纳入路由

Proceedings International Test Conference 1997 Pub Date : 1997-11-03 DOI: 10.1109/TEST.1997.639681

R. McGowen, F. Ferguson

引用次数: 1

On-line testing for VLSI VLSI在线测试

Proceedings International Test Conference 1997 Pub Date : 1997-11-03 DOI: 10.1109/TEST.1997.639731

M. Nicolaidis

引用次数: 20