{"title":"为什么要自动化光学检测?","authors":"D. Raymond, Dominic F. Haigh","doi":"10.1109/TEST.1997.639723","DOIUrl":null,"url":null,"abstract":"It is suggested that automated optical inspection (AOI) competes effectively to fill the in-circuit test gap. AOI adds no unwelcome technologies to the workplace. Its programming and its results are simple and understandable in visual terms. AOI is thus considered high in strength, simplicity and universality. It is expected to grow rapidly, driven by the never ending demand for strong, simple, universal inspection methods.","PeriodicalId":186340,"journal":{"name":"Proceedings International Test Conference 1997","volume":"48 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1997-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"10","resultStr":"{\"title\":\"Why automate optical inspection?\",\"authors\":\"D. Raymond, Dominic F. Haigh\",\"doi\":\"10.1109/TEST.1997.639723\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"It is suggested that automated optical inspection (AOI) competes effectively to fill the in-circuit test gap. AOI adds no unwelcome technologies to the workplace. Its programming and its results are simple and understandable in visual terms. AOI is thus considered high in strength, simplicity and universality. It is expected to grow rapidly, driven by the never ending demand for strong, simple, universal inspection methods.\",\"PeriodicalId\":186340,\"journal\":{\"name\":\"Proceedings International Test Conference 1997\",\"volume\":\"48 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1997-11-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"10\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings International Test Conference 1997\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/TEST.1997.639723\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings International Test Conference 1997","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TEST.1997.639723","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
It is suggested that automated optical inspection (AOI) competes effectively to fill the in-circuit test gap. AOI adds no unwelcome technologies to the workplace. Its programming and its results are simple and understandable in visual terms. AOI is thus considered high in strength, simplicity and universality. It is expected to grow rapidly, driven by the never ending demand for strong, simple, universal inspection methods.
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