A symbolic simulation-based ANSI/IEEE Std 1149.1 compliance checker and BSDL generator

Harbinder Singh, James Beausang, Girish Patankar
{"title":"A symbolic simulation-based ANSI/IEEE Std 1149.1 compliance checker and BSDL generator","authors":"Harbinder Singh, James Beausang, Girish Patankar","doi":"10.1109/TEST.1997.639621","DOIUrl":null,"url":null,"abstract":"The paper shows how to extract the boundary-scan circuitry from an IC (Integrated Circuit), verify its compliance to IEEE Std 1149.1 and generate its BSDL (Boundary Scan Description Language) description. This work applies to the 75% of boundary-scan ICs that have hand-generated or macro-cell based boundary-scan circuity. It also applies to boundary-scan ICs designed using RTL (Register Transfer Level) synthesis.","PeriodicalId":186340,"journal":{"name":"Proceedings International Test Conference 1997","volume":"36 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1997-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"9","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings International Test Conference 1997","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TEST.1997.639621","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 9

Abstract

The paper shows how to extract the boundary-scan circuitry from an IC (Integrated Circuit), verify its compliance to IEEE Std 1149.1 and generate its BSDL (Boundary Scan Description Language) description. This work applies to the 75% of boundary-scan ICs that have hand-generated or macro-cell based boundary-scan circuity. It also applies to boundary-scan ICs designed using RTL (Register Transfer Level) synthesis.
基于符号仿真的ANSI/IEEE Std 1149.1符合性检查器和BSDL生成器
本文介绍了如何从集成电路中提取边界扫描电路,验证其符合IEEE标准1149.1,并生成其边界扫描描述语言(BSDL)描述。这项工作适用于75%的具有手工生成或基于宏单元的边界扫描电路的边界扫描ic。它也适用于使用RTL(寄存器传输电平)合成设计的边界扫描ic。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术官方微信