{"title":"A symbolic simulation-based ANSI/IEEE Std 1149.1 compliance checker and BSDL generator","authors":"Harbinder Singh, James Beausang, Girish Patankar","doi":"10.1109/TEST.1997.639621","DOIUrl":null,"url":null,"abstract":"The paper shows how to extract the boundary-scan circuitry from an IC (Integrated Circuit), verify its compliance to IEEE Std 1149.1 and generate its BSDL (Boundary Scan Description Language) description. This work applies to the 75% of boundary-scan ICs that have hand-generated or macro-cell based boundary-scan circuity. It also applies to boundary-scan ICs designed using RTL (Register Transfer Level) synthesis.","PeriodicalId":186340,"journal":{"name":"Proceedings International Test Conference 1997","volume":"36 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1997-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"9","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings International Test Conference 1997","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TEST.1997.639621","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 9
Abstract
The paper shows how to extract the boundary-scan circuitry from an IC (Integrated Circuit), verify its compliance to IEEE Std 1149.1 and generate its BSDL (Boundary Scan Description Language) description. This work applies to the 75% of boundary-scan ICs that have hand-generated or macro-cell based boundary-scan circuity. It also applies to boundary-scan ICs designed using RTL (Register Transfer Level) synthesis.