故障模型扩展，用于诊断自定义单元故障

Proceedings International Test Conference 1997 Pub Date : 1997-11-01 DOI:10.1109/TEST.1997.639670

G. Vandling, Thomas Bartenstein

{"title":"故障模型扩展，用于诊断自定义单元故障","authors":"G. Vandling, Thomas Bartenstein","doi":"10.1109/TEST.1997.639670","DOIUrl":null,"url":null,"abstract":"This paper describes an extension of the standard, stuck-at fault model typically used for diagnostics. By defining stuck-at faults at all levels of a design hierarchy, diagnostic simulation has been able to succinctly identify a number of custom circuit design and modeling errors. Approximately half of these errors were not well identified by conventional diagnostics.","PeriodicalId":186340,"journal":{"name":"Proceedings International Test Conference 1997","volume":"35 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1997-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Fault model extension for diagnosing custom cell fails\",\"authors\":\"G. Vandling, Thomas Bartenstein\",\"doi\":\"10.1109/TEST.1997.639670\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper describes an extension of the standard, stuck-at fault model typically used for diagnostics. By defining stuck-at faults at all levels of a design hierarchy, diagnostic simulation has been able to succinctly identify a number of custom circuit design and modeling errors. Approximately half of these errors were not well identified by conventional diagnostics.\",\"PeriodicalId\":186340,\"journal\":{\"name\":\"Proceedings International Test Conference 1997\",\"volume\":\"35 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1997-11-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings International Test Conference 1997\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/TEST.1997.639670\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings International Test Conference 1997","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TEST.1997.639670","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 1

摘要

本文描述了通常用于诊断的标准卡在故障模型的扩展。通过在设计层次的所有层次上定义卡在故障，诊断仿真能够简洁地识别一些定制电路设计和建模错误。这些错误中约有一半不能通过常规诊断很好地识别出来。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

查看原文本刊更多论文

Fault model extension for diagnosing custom cell fails

This paper describes an extension of the standard, stuck-at fault model typically used for diagnostics. By defining stuck-at faults at all levels of a design hierarchy, diagnostic simulation has been able to succinctly identify a number of custom circuit design and modeling errors. Approximately half of these errors were not well identified by conventional diagnostics.

求助全文

通过发布文献求助，成功后即可免费获取论文全文。去求助

来源期刊

Proceedings International Test Conference 1997

自引率

0.00%

发文量