Proceedings International Test Conference 1997最新文献_第6页

OLDEVDTP: a novel environment for off-line debugging of VLSI device test programs OLDEVDTP:一种新颖的VLSI器件测试程序离线调试环境

Proceedings International Test Conference 1997 Pub Date : 1997-11-01 DOI: 10.1109/TEST.1997.639680

Yuhai Ma, W. Shi

引用次数: 1

Sequential test generation with advanced illegal state search 具有高级非法状态搜索的顺序测试生成

Proceedings International Test Conference 1997 Pub Date : 1997-11-01 DOI: 10.1109/TEST.1997.639686

M. Konijnenburg, J. V. D. Linden, A. V. Goor

引用次数: 7

A 256 Meg SDRAM BIST for disturb test application 用于干扰测试应用的256 Meg SDRAM BIST

Proceedings International Test Conference 1997 Pub Date : 1997-11-01 DOI: 10.1109/TEST.1997.639614

T. Powell, D. Cline, F. Hii

引用次数: 6

A parameterized VHDL library for on-line testing 一个用于在线测试的参数化VHDL库

Proceedings International Test Conference 1997 Pub Date : 1997-11-01 DOI: 10.1109/TEST.1997.639654

C. Stroud, M. Ding, S. Seshadri, R. Karri, I. Kim, Subhajit Roy, S. Wu

引用次数: 7

An efficient scheme to diagnose scan chains 一种有效的扫描链诊断方案

Proceedings International Test Conference 1997 Pub Date : 1997-11-01 DOI: 10.1109/TEST.1997.639683

S. Narayanan, A. Das

引用次数: 94

H-SCAN+: a practical low-overhead RTL design-for-testability technique for industrial designs H-SCAN+:用于工业设计的实用低开销RTL可测试性设计技术

Proceedings International Test Conference 1997 Pub Date : 1997-11-01 DOI: 10.1109/TEST.1997.639622

Toshiharu Asaka, Masaaki Yoshida, S. Bhattacharya, S. Dey

引用次数: 23

Design, fabrication and use of mixed-signal IC testability structures 混合信号集成电路测试结构的设计、制造和使用

Proceedings International Test Conference 1997 Pub Date : 1997-11-01 DOI: 10.1109/TEST.1997.639655

K. Parker, J. McDermid, R. Browen, Kozo Nuriya, K. Hirayama, A. Matsuzawa

引用次数: 9

Real time in-situ monitoring and characterization of production wafer probing process 生产晶圆探测过程的实时现场监测与表征

Proceedings International Test Conference 1997 Pub Date : 1997-11-01 DOI: 10.1109/TEST.1997.639694

Minh Quach, K. Harper

引用次数: 1

Analog fault diagnosis for unpowered circuit boards 无电电路板模拟故障诊断

Proceedings International Test Conference 1997 Pub Date : 1997-11-01 DOI: 10.1109/TEST.1997.639675

Jiun-Lang Huang, K. Cheng

引用次数: 7

Design for primitive delay fault testability 原始延迟故障可测试性设计

Proceedings International Test Conference 1997 Pub Date : 1997-11-01 DOI: 10.1109/TEST.1997.639649

Angela Krstic, K. Cheng, S. Chakradhar

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引用次数: 4