Design, fabrication and use of mixed-signal IC testability structures

Abstract

The goals of the studies of the MNABST-1 IC device were as follows: study the technical and economic feasibility of adding P1149.4 structures into mixed-signal devices; elicit design considerations at the silicon level and for silicon design software; study the interoperability of P1149.4 with 1149.1 interconnection test algorithms; study the efficacy of discrete component and network value measurements; establish limits on analog value measurements; and predict the capabilities of P1149.4 in the future. The results shows that we can emulate the capabilities of in-circuit test for most types of components currently tested this way. This will preserve the advantages of this well-known technology into the future when direct nodal access will no longer be the rule, but rather the exception.