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引用次数: 6
摘要
干扰测试算法的目标是行相邻的耦合缺陷，可以是时间流逝相关的。描述了用于测试256 Meg SDRAM芯片的这些测试的应用程序的BIST设计。
The Disturb Test Algorithms are targeted for row adjacent coupled defects that can be time elapsed dependent. A BIST design is described for application of these tests for testing 256 Meg SDRAM chips.
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