A parameterized VHDL library for on-line testing

Proceedings International Test Conference 1997 Pub Date : 1997-11-01 DOI:10.1109/TEST.1997.639654

C. Stroud, M. Ding, S. Seshadri, R. Karri, I. Kim, Subhajit Roy, S. Wu

引用次数: 7

Abstract

We describe a library of parameterized VHDL models for various concurrent fault detection circuits and maintenance functions developed for simulation and synthesis of ASICs which support on-line testing and diagnostics in systems designed for high reliability and availability. Issues associated with the selection and modeling of the various online testing functions are also discussed.

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一个用于在线测试的参数化VHDL库

我们描述了一个参数化VHDL模型库，用于各种并发故障检测电路和维护功能，这些功能是为asic的仿真和综合而开发的，这些asic支持高可靠性和可用性系统中的在线测试和诊断。本文还讨论了与各种在线测试功能的选择和建模相关的问题。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

Proceedings International Test Conference 1997

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