一个用于在线测试的参数化VHDL库

C. Stroud, M. Ding, S. Seshadri, R. Karri, I. Kim, Subhajit Roy, S. Wu
{"title":"一个用于在线测试的参数化VHDL库","authors":"C. Stroud, M. Ding, S. Seshadri, R. Karri, I. Kim, Subhajit Roy, S. Wu","doi":"10.1109/TEST.1997.639654","DOIUrl":null,"url":null,"abstract":"We describe a library of parameterized VHDL models for various concurrent fault detection circuits and maintenance functions developed for simulation and synthesis of ASICs which support on-line testing and diagnostics in systems designed for high reliability and availability. Issues associated with the selection and modeling of the various online testing functions are also discussed.","PeriodicalId":186340,"journal":{"name":"Proceedings International Test Conference 1997","volume":"132 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1997-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"7","resultStr":"{\"title\":\"A parameterized VHDL library for on-line testing\",\"authors\":\"C. Stroud, M. Ding, S. Seshadri, R. Karri, I. Kim, Subhajit Roy, S. Wu\",\"doi\":\"10.1109/TEST.1997.639654\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We describe a library of parameterized VHDL models for various concurrent fault detection circuits and maintenance functions developed for simulation and synthesis of ASICs which support on-line testing and diagnostics in systems designed for high reliability and availability. Issues associated with the selection and modeling of the various online testing functions are also discussed.\",\"PeriodicalId\":186340,\"journal\":{\"name\":\"Proceedings International Test Conference 1997\",\"volume\":\"132 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1997-11-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"7\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings International Test Conference 1997\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/TEST.1997.639654\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings International Test Conference 1997","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TEST.1997.639654","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 7

摘要

我们描述了一个参数化VHDL模型库,用于各种并发故障检测电路和维护功能,这些功能是为asic的仿真和综合而开发的,这些asic支持高可靠性和可用性系统中的在线测试和诊断。本文还讨论了与各种在线测试功能的选择和建模相关的问题。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A parameterized VHDL library for on-line testing
We describe a library of parameterized VHDL models for various concurrent fault detection circuits and maintenance functions developed for simulation and synthesis of ASICs which support on-line testing and diagnostics in systems designed for high reliability and availability. Issues associated with the selection and modeling of the various online testing functions are also discussed.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术官方微信