Yu-Shih Su, Po-Hsien Chang, Shih-Chieh Chang, TingTing Hwang
{"title":"Synthesis of a timing-error detection architecture","authors":"Yu-Shih Su, Po-Hsien Chang, Shih-Chieh Chang, TingTing Hwang","doi":"10.1109/VDAT.2008.4542437","DOIUrl":"https://doi.org/10.1109/VDAT.2008.4542437","url":null,"abstract":"Delay variation can cause a design to fail its timing specification. Ernst in D. Ernst, et al., (2003), observes that the worst delay of a design is least probable to occur. They propose a mechanism to detect and correct occasional errors while the design can be optimized for the common cases. Their experimental results show significant performance (or power) gain as compared with the worst-case design. However, the architecture in D. Ernst, et al., (2003), suffers the short path problem which is difficult to resolve. In this paper, we propose a novel error-detecting architecture to solve the short path problem. Our experimental results show considerable performance gain can be achieved with reasonable area overhead.","PeriodicalId":156790,"journal":{"name":"2008 IEEE International Symposium on VLSI Design, Automation and Test (VLSI-DAT)","volume":"62 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2008-04-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131832730","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"High throughput partially-parallel irregular LDPC decoder based on delta-value message-passing schedule","authors":"Wen Ji, Xing Li, T. Ikenaga, S. Goto","doi":"10.1109/VDAT.2008.4542452","DOIUrl":"https://doi.org/10.1109/VDAT.2008.4542452","url":null,"abstract":"In this paper, we propose a partially-parallel decoder architecture for irregular LDPC code targeting high throughput applications. The proposed decoder is based on a novel delta-value message-passing algorithm to facilitate the decoding throughput by removing redundant computations using the difference between the updated value and the original value. Techniques such as binary sorting, high performance pipelining are used to further speed up the message- passing procedure. The synthesis result in TSMC 0.18 CMOS technology shows that for (648,324) irregular LDPC code, our decoder can increase 8 times in throughput, which reaches 418 Mbps at the frequency of 200 MHz.","PeriodicalId":156790,"journal":{"name":"2008 IEEE International Symposium on VLSI Design, Automation and Test (VLSI-DAT)","volume":"57 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2008-04-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128680922","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Built-in jitter measurement methodology for spread-spectrum clock generators","authors":"Jen-Chien Hsu, Maohsuan Chou, C. Su","doi":"10.1109/VDAT.2008.4542414","DOIUrl":"https://doi.org/10.1109/VDAT.2008.4542414","url":null,"abstract":"In this paper, a built-in-self-test methodology for measuring frequency deviation and jitter of spread-spectrum clock generators is presented. It utilizes a phase detector to detect the clock phase of spread spectrum clock (SSC) and then measure the jitter by filtering out the low frequency component of the clock phase. Frequency of spread-spectrum clock can also be obtained by filtering out the high frequency component of the signal. The methodology is analyzed and verified with chip implementation and measurement. As an all digital design, the hardware overhead is very low.","PeriodicalId":156790,"journal":{"name":"2008 IEEE International Symposium on VLSI Design, Automation and Test (VLSI-DAT)","volume":"72 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2008-04-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117052724","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Po-Chou Lin, Chao-Hsuan Hsu, J.C.-M. Li, Chih-Ming Chiang, C. Pan
{"title":"Phase noise testing of single chip TV tuners","authors":"Po-Chou Lin, Chao-Hsuan Hsu, J.C.-M. Li, Chih-Ming Chiang, C. Pan","doi":"10.1109/VDAT.2008.4542473","DOIUrl":"https://doi.org/10.1109/VDAT.2008.4542473","url":null,"abstract":"Phase noise testing for TV tuners is time consuming and expensive because of the great number of TV channels. This paper presents a hierarchical simulation method for a complex single chip TV tuner. Based on the simulation results, an effective and economic test method is proposed to save the test application time. This method determines the most effective channels and frequencies to test so the number of phase noise measurements is reduced. Experimental results on commercial chips show that our proposed method reduces the test time by a factor often without test escapes.","PeriodicalId":156790,"journal":{"name":"2008 IEEE International Symposium on VLSI Design, Automation and Test (VLSI-DAT)","volume":"13 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2008-04-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115640349","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"A 1-GS/s CMOS 6-bit flash ADC with an offset calibrating method","authors":"C. Chang, Chih-Yi Hsiao, Ching-Yuan Yang","doi":"10.1109/VDAT.2008.4542455","DOIUrl":"https://doi.org/10.1109/VDAT.2008.4542455","url":null,"abstract":"In this paper a 1-GS/s 6-bit flash type analog-to-digital converter (ADC) is designed in 0.18-mum one-poly six-metal CMOS. An offset calibrating method is used to improve the performance of ADC. To reduce the input capacitance of the ADC and the amount of calibration circuit, the active interpolation technique is applied. Measured results show the ADC achieves a SNDR of 32.5 dB for a 7 MHz input at 1 GS/s, and 25.4 dB for a 108-MHz input. The power consumption is 550 mW at 1 GS/s from a 1.8-V supply.","PeriodicalId":156790,"journal":{"name":"2008 IEEE International Symposium on VLSI Design, Automation and Test (VLSI-DAT)","volume":"20 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2008-04-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126531173","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Adaptive biasing circuit overcoming process variation for high-speed circuits in scaled CMOS technology","authors":"Luis Chen, C. Yue","doi":"10.1109/VDAT.2008.4542458","DOIUrl":"https://doi.org/10.1109/VDAT.2008.4542458","url":null,"abstract":"A self-biased, VTH tracking current reference circuit is designed in 90 nm CMOS process. A finite state machine automatically adjusts the reference current to achieve plusmn5% deviation across process variation. The bias circuit is used on a differential test circuit and simulation shows a maximum of 8.53% variation in bias current.","PeriodicalId":156790,"journal":{"name":"2008 IEEE International Symposium on VLSI Design, Automation and Test (VLSI-DAT)","volume":"76 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2008-04-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124943203","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Chih-Wea Wang, C. Lai, Chi-Feng Wu, Shih-Arn Hwang, Ying-Hsi Lin
{"title":"On-chip interconnection design and SoC integration with OCP","authors":"Chih-Wea Wang, C. Lai, Chi-Feng Wu, Shih-Arn Hwang, Ying-Hsi Lin","doi":"10.1109/VDAT.2008.4542404","DOIUrl":"https://doi.org/10.1109/VDAT.2008.4542404","url":null,"abstract":"With the increasing complexity of modern system-on-chip (SoC) designs, more and more intellectual property (IP) blocks will be integrated into a chip. An open and flexible standard for IP core interface is quickly becoming necessary for efficient on-chip interconnection design and SoC integration. In this paper, we address the issues and share experiences on using Open Core Protocol (OCP) as the standard interface protocol, defining reusable profiles to fit different IPs, on-chip interconnection design, verification, and SoC integration with them.","PeriodicalId":156790,"journal":{"name":"2008 IEEE International Symposium on VLSI Design, Automation and Test (VLSI-DAT)","volume":"36 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2008-04-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123420240","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"A 4-PAM adaptive analog equalizer for backplane interconnections","authors":"Yen-Chuan Huang, Qui-Ting Chen, Tai-Cheng Lee","doi":"10.1109/VDAT.2008.4542447","DOIUrl":"https://doi.org/10.1109/VDAT.2008.4542447","url":null,"abstract":"Increasing of data rate has created a major challenge for electronic circuits used at the interface of the backplane physical layer links. As the data rate increases above Gb/s, intersymbol interference (ISI) becomes a critical issue in received signal quality, limiting the achievable transmission speed and distance over channels. A 4-PAM (pulse amplitude modulation) adaptive analog equalizer is proposed to compensate the FR-4 PCB backplane interconnections by using a sum- feedback filter (SFF), relaxing the design requirement of the conventional analog feed-forward equalizers (FFE). Fabricated in a 0.13- mum digital CMOS technology, the analog equalizer recovers 14 Gb/s random data transmitted over FR-4 PCB copper channels.","PeriodicalId":156790,"journal":{"name":"2008 IEEE International Symposium on VLSI Design, Automation and Test (VLSI-DAT)","volume":"4 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2008-04-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123659807","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Power and density-aware buffer insertion","authors":"Yi-Ju Ho, Wai-Kei Mak","doi":"10.1109/VDAT.2008.4542469","DOIUrl":"https://doi.org/10.1109/VDAT.2008.4542469","url":null,"abstract":"In modern SOC design, a large number of buffers need to be inserted to a large number of nets to improve performance and/or signal integrity. These buffers increase the power consumption and occupy silicon area. So it is important to avoid over-buffering. Buffering spaces are more limited in the denser regions of a layout. Thus it is also necessary to reserve the more premium buffering spaces in the denser regions until they are absolutely needed during physical synthesis. This paper presents a buffer insertion algorithm with consideration of both power dissipation and design density under a given timing constraint. We propose a formulation for this multiobjective problem and a heuristic solver using Lagrangian relaxation technique. Experiment shows that our method can significantly improve the overall design density while achieving low power.","PeriodicalId":156790,"journal":{"name":"2008 IEEE International Symposium on VLSI Design, Automation and Test (VLSI-DAT)","volume":"100 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2008-04-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124806445","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Temperature aware SoC design for reduced leakage power and enhanced reliability","authors":"M. Abadir, K. Khouri, A. Gupta","doi":"10.1109/VDAT.2008.4542398","DOIUrl":"https://doi.org/10.1109/VDAT.2008.4542398","url":null,"abstract":"Summary form only given. Improvements in the speed and the size of chips due to process scaling come with the penalties of increased power densities and higher operating temperatures. Higher temperature not only poses a risk of thermal runaway of the chips but also increases leakage-power dissipation and reduces interconnect lifetime. Furthermore, the floorplan of a System-on-a-Chip (SoC) has a significant impact on the temperature profile and leakage power, requiring early analysis of the SoC temperature profiles. We will talk about a system level leakage estimation methodology that considers the floorplan of the SoC and also the positive feedback relation between temperature and leakage power. We also talk about a system-level Leakage-Aware Floorplanner (LEAF) that optimizes floorplans for temperature-aware leakage power along with the traditional metric of area. We observed up to 190% difference in the leakage power between leakage-unaware and leakage-aware floorplanning. Temperature also has a serious effect on the Mean Time to Failure (MTF) of interconnects because of electromigration. To address this issue, we have developed a Temperature Aware Global Router (TAGORE) that reduces the probability of chip failure due to interconnect failures. TAGORE achieves a reduction in the probability of failure by routing more wires in the colder regions of the chip and fewer wires in the hotter regions of the chip. We observed that TAGORE reduced the number of wires in the hottest region of a chip by up to 19.95% and by an average of 12.29%. This resulted in a decrease in the failure rate by up to 292 failures per million hours of operation. This approach to reliability improvement does not require any addition of redundant wires or vias. We also have an analytical examination of the reduction in the probability of interconnect failure and the failure rate due to temperature aware global routing.","PeriodicalId":156790,"journal":{"name":"2008 IEEE International Symposium on VLSI Design, Automation and Test (VLSI-DAT)","volume":"134 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2008-04-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131735635","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}