Yu-Shih Su, Po-Hsien Chang, Shih-Chieh Chang, TingTing Hwang
{"title":"时序误差检测体系结构的综合","authors":"Yu-Shih Su, Po-Hsien Chang, Shih-Chieh Chang, TingTing Hwang","doi":"10.1109/VDAT.2008.4542437","DOIUrl":null,"url":null,"abstract":"Delay variation can cause a design to fail its timing specification. Ernst in D. Ernst, et al., (2003), observes that the worst delay of a design is least probable to occur. They propose a mechanism to detect and correct occasional errors while the design can be optimized for the common cases. Their experimental results show significant performance (or power) gain as compared with the worst-case design. However, the architecture in D. Ernst, et al., (2003), suffers the short path problem which is difficult to resolve. In this paper, we propose a novel error-detecting architecture to solve the short path problem. Our experimental results show considerable performance gain can be achieved with reasonable area overhead.","PeriodicalId":156790,"journal":{"name":"2008 IEEE International Symposium on VLSI Design, Automation and Test (VLSI-DAT)","volume":"62 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2008-04-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Synthesis of a timing-error detection architecture\",\"authors\":\"Yu-Shih Su, Po-Hsien Chang, Shih-Chieh Chang, TingTing Hwang\",\"doi\":\"10.1109/VDAT.2008.4542437\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Delay variation can cause a design to fail its timing specification. Ernst in D. Ernst, et al., (2003), observes that the worst delay of a design is least probable to occur. They propose a mechanism to detect and correct occasional errors while the design can be optimized for the common cases. Their experimental results show significant performance (or power) gain as compared with the worst-case design. However, the architecture in D. Ernst, et al., (2003), suffers the short path problem which is difficult to resolve. In this paper, we propose a novel error-detecting architecture to solve the short path problem. Our experimental results show considerable performance gain can be achieved with reasonable area overhead.\",\"PeriodicalId\":156790,\"journal\":{\"name\":\"2008 IEEE International Symposium on VLSI Design, Automation and Test (VLSI-DAT)\",\"volume\":\"62 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2008-04-23\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2008 IEEE International Symposium on VLSI Design, Automation and Test (VLSI-DAT)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/VDAT.2008.4542437\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2008 IEEE International Symposium on VLSI Design, Automation and Test (VLSI-DAT)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VDAT.2008.4542437","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Synthesis of a timing-error detection architecture
Delay variation can cause a design to fail its timing specification. Ernst in D. Ernst, et al., (2003), observes that the worst delay of a design is least probable to occur. They propose a mechanism to detect and correct occasional errors while the design can be optimized for the common cases. Their experimental results show significant performance (or power) gain as compared with the worst-case design. However, the architecture in D. Ernst, et al., (2003), suffers the short path problem which is difficult to resolve. In this paper, we propose a novel error-detecting architecture to solve the short path problem. Our experimental results show considerable performance gain can be achieved with reasonable area overhead.