IEEE Solid-State Circuits Letters最新文献

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A 1.54 pJ/b 80 Gb/s D-Band 2-D Scalable Transceiver Array With On-Chip Antennas in 28-nm Bulk CMOS 基于28nm CMOS片上天线的1.54 pJ/b 80gb /s d波段二维可扩展收发器阵列
IF 2.2
IEEE Solid-State Circuits Letters Pub Date : 2025-02-05 DOI: 10.1109/LSSC.2025.3539228
Hesham Beshary;Yikuan Chen;Ethan Chou;Ali M. Niknejad
{"title":"A 1.54 pJ/b 80 Gb/s D-Band 2-D Scalable Transceiver Array With On-Chip Antennas in 28-nm Bulk CMOS","authors":"Hesham Beshary;Yikuan Chen;Ethan Chou;Ali M. Niknejad","doi":"10.1109/LSSC.2025.3539228","DOIUrl":"https://doi.org/10.1109/LSSC.2025.3539228","url":null,"abstract":"This work represents a 140 GHz wideband 2-D scalable phased array in 28-nm bulk CMOS technology. The chip integrates <inline-formula> <tex-math>$2times 2$ </tex-math></inline-formula> transceiving elements with on-chip antennas and a <inline-formula> <tex-math>$times 16$ </tex-math></inline-formula> LO multiplication chain in <inline-formula> <tex-math>$2.115times 2$ </tex-math></inline-formula>.115 mm2. The elements are forming an RF beamformer while keeping approximately half-wavelength spacing between the elements. The integrated antennas leverage substrate thinning and substrate mode cancellation to boost the array radiation efficiency. The system adopts a superheterodyne transceiver (TRX) architecture with 25 GHz IF center frequency. The proposed work achieves 1.54 pJ/b and 80 Gb/s over-the-air (OTA) using 16-QAM modulation scheme for the overall transmit-receive link. To the best of the authors’ knowledge, this work achieves the highest reported array-level OTA data rate while improving the energy efficiency (pJ/b) by approximately an order of magnitude compared to other D-band transceiver arrays.","PeriodicalId":13032,"journal":{"name":"IEEE Solid-State Circuits Letters","volume":"8 ","pages":"61-64"},"PeriodicalIF":2.2,"publicationDate":"2025-02-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143455321","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
5-nm High-Efficiency and High-Density Digital SRAM In-Memory-Computing Macros for AI Accelerators 用于AI加速器的5nm高效高密度数字SRAM内存计算宏
IF 2
IEEE Solid-State Circuits Letters Pub Date : 2025-01-22 DOI: 10.1109/LSSC.2025.3532788
Seok-Ju Yun;Jaehyuk Lee;Sungmeen Myung;Jangho An;Daekun Yoon;Seungchul Jung;Soonwan Kwon;Sangjoon Kim
{"title":"5-nm High-Efficiency and High-Density Digital SRAM In-Memory-Computing Macros for AI Accelerators","authors":"Seok-Ju Yun;Jaehyuk Lee;Sungmeen Myung;Jangho An;Daekun Yoon;Seungchul Jung;Soonwan Kwon;Sangjoon Kim","doi":"10.1109/LSSC.2025.3532788","DOIUrl":"https://doi.org/10.1109/LSSC.2025.3532788","url":null,"abstract":"Two specialized digital SRAM In-memory computing (IMC) macros were implemented using a 5-nm process: 1) a high efficiency (HE) macro and 2) a high-density (HD) macro. The HE macro achieves an energy efficiency of 274 TOPS/W under 90% input bit sparsity, 50% weight bit sparsity, and 0.46-V supply voltage, by adopting a compact Wallace tree adder (WTA) and a tristate buffer optimized for pipelined operation. The HD macro achieves a state-of-the-art memory density performance of 5.67 Mb/mm2 by employing a multiply-cell consisting of a single transistor. Extensive sample measurements have confirmed the robust and reliable performance of the two digital IMC macros. The proposed HE and HD macros have demonstrated their significant potential as key building blocks for next-generation Artificial intelligence (AI) accelerators.","PeriodicalId":13032,"journal":{"name":"IEEE Solid-State Circuits Letters","volume":"8 ","pages":"269-272"},"PeriodicalIF":2.0,"publicationDate":"2025-01-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145141623","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A 0.86 mW 17 fA/√Hz, 129-dB DR Current-Sensing Front-End for Under-Display Ambient Light Sensor With Zero-Compensated Logarithmic TIA 一种0.86 mW 17 fA/√Hz, 129 db DR电流传感前端,用于零补偿对数TIA显示下环境光传感器
IF 2.2
IEEE Solid-State Circuits Letters Pub Date : 2025-01-13 DOI: 10.1109/LSSC.2025.3528962
Liheng Liu;Tianxiang Qu;Hao Li;Dan Li;Gan Guo;Zhiliang Hong;Jiawei Xu
{"title":"A 0.86 mW 17 fA/√Hz, 129-dB DR Current-Sensing Front-End for Under-Display Ambient Light Sensor With Zero-Compensated Logarithmic TIA","authors":"Liheng Liu;Tianxiang Qu;Hao Li;Dan Li;Gan Guo;Zhiliang Hong;Jiawei Xu","doi":"10.1109/LSSC.2025.3528962","DOIUrl":"https://doi.org/10.1109/LSSC.2025.3528962","url":null,"abstract":"This letter presents a low-noise, power-efficient, and pulsatile-interference stabilized photocurrent readout circuit for under-display ambient light sensors (ALS). To achieve pA-level input noise and seven decades of input current dynamic range (DR) simultaneously, a logarithmic transimpedance amplifier (TIA) with a diode-connected MOS feedback is set as the first stage of the ALS. An auto-tracking zero, implemented in the amplifier of the TIA, improves the phase-margin and reduces the settling time against pulsatile interference without extra power consumption. The TIA output is then quantized by a first-order 9-bit incremental delta-sigma modulator. Fabricated in a standard 0.18-<inline-formula> <tex-math>$mu $ </tex-math></inline-formula>m CMOS process, the proposed ALS achieves the best-in-the-class input-referred current noise of <inline-formula> <tex-math>$0.6~rm {pA}_{mathrm {rms}}$ </tex-math></inline-formula> within a 400-<inline-formula> <tex-math>$mu $ </tex-math></inline-formula>s readout time. The total input range of <inline-formula> <tex-math>$1.7~rm {pA}_{mathrm {PP}}$ </tex-math></inline-formula>–<inline-formula> <tex-math>$5~mu rm {A}_{mathrm {PP}}$ </tex-math></inline-formula> corresponds to a DR of 129 dB while consuming 0.86 mW at a 1.8-V supply.","PeriodicalId":13032,"journal":{"name":"IEEE Solid-State Circuits Letters","volume":"8 ","pages":"49-52"},"PeriodicalIF":2.2,"publicationDate":"2025-01-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143105874","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
20–26-GHz CMOS PA With High Pout and OP1 dB Using a 1:2 Capacitance-Ratio-Equivalent Power Combiner 20 - 26 ghz高输出和OP1 dB的CMOS PA采用1:2电容比等效功率合成器
IF 2.2
IEEE Solid-State Circuits Letters Pub Date : 2025-01-13 DOI: 10.1109/LSSC.2025.3529347
Jin-Fa Chang
{"title":"20–26-GHz CMOS PA With High Pout and OP1 dB Using a 1:2 Capacitance-Ratio-Equivalent Power Combiner","authors":"Jin-Fa Chang","doi":"10.1109/LSSC.2025.3529347","DOIUrl":"https://doi.org/10.1109/LSSC.2025.3529347","url":null,"abstract":"We demonstrate a four-way wide-band power amplifier (PA1) with a 1:2 capacitance-ratio-equivalent power combiner (PC) and a dynamic-threshold-voltage MOSFET with a resistor (DTMOS-R) using a 90-nm CMOS. Another PA (PA2) without a DTMOS-R using low-loss micro-strip line inductors replaced with a PC is demonstrated for contrast. A low-loss PC is realized using equal <inline-formula> <tex-math>$lambda $ </tex-math></inline-formula>/4 spiral transmission line inductors based on a <inline-formula> <tex-math>$lambda $ </tex-math></inline-formula>/9 one (with a 1:2 capacitance ratio involving Cp1 and Cp2) for low-loss output-stage matching. The output power of the output stage of PA1, with low-threshold voltage (<inline-formula> <tex-math>$V_{mathrm { th}}$ </tex-math></inline-formula>) due to the DTMOS-R and low Rds based on the parallel four-way output, is enhanced using a PC. Between 20–26 GHz, PA1 achieves a prominent S21 of 23.2 dB, peak power-added-efficiency (PAE) between 20.8%–29.7%, and saturation output power between 19.9–21.2 dBm. Moreover, the output 1-dB compression point (OP1dB) is 16–20.4 dBm between 20–26 GHz. Using the PC and DTMOS-R yields the bulk CMOS PA’s high performance (Pout, PAE, and OP1dB), comparable to recent state-of-the-art millimeter-wave PAs, i.e., SOI/SiGe processes.","PeriodicalId":13032,"journal":{"name":"IEEE Solid-State Circuits Letters","volume":"8 ","pages":"53-56"},"PeriodicalIF":2.2,"publicationDate":"2025-01-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143105875","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A 23–28-GHz Doherty Power Amplifier With a PVT Insensitive Power Detection for Adaptive Biasing 基于PVT自适应偏置不敏感功率检测的23 - 28 ghz多尔蒂功率放大器
IF 2.2
IEEE Solid-State Circuits Letters Pub Date : 2025-01-10 DOI: 10.1109/LSSC.2025.3528055
Yahia Ibrahim;Ali Niknejad
{"title":"A 23–28-GHz Doherty Power Amplifier With a PVT Insensitive Power Detection for Adaptive Biasing","authors":"Yahia Ibrahim;Ali Niknejad","doi":"10.1109/LSSC.2025.3528055","DOIUrl":"https://doi.org/10.1109/LSSC.2025.3528055","url":null,"abstract":"This letter presents a compact Doherty power amplifier (PA) featuring a single transformer balun. A novel envelope power detector architecture is introduced for high-bandwidth (BW) adaptive biasing, that is, insensitive to process-voltage–temperature (PVT) variations. The measured PA attains a saturated power <inline-formula> <tex-math>$(mathbf {P_{mathrm { sat}}})$ </tex-math></inline-formula> exceeding 20.2 dBm and a power gain of 19.5 dB across the frequency range of 23–28 GHz. Moreover, it exhibits a peak power added efficiency (PAE) of 38% and a 6-dB power back-off (PBO) PAE of 27% at 25 GHz. The proposed adaptive biasing scheme enables a modulation BW of up to 800 MHz for a 64-QAM signal. Under this setting, the average output power <inline-formula> <tex-math>$(mathbf {P_{avg}})$ </tex-math></inline-formula> is measured at 11.3 dBm with an RMS error vector magnitude (EVM) of −24.5 dB and an average PAE of 15.5%. The PA is fabricated in Global Foundries 45-nm-SOI technology with a compact area of 0.27 mm2. To the best of the authors’ knowledge, this work is the first to demonstrate robust performance for Doherty PAs across PVT variations.","PeriodicalId":13032,"journal":{"name":"IEEE Solid-State Circuits Letters","volume":"8 ","pages":"41-44"},"PeriodicalIF":2.2,"publicationDate":"2025-01-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143105950","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A Low-Jitter Fractional-N LC-PLL With a 1/4 DTC-Range-Reduction Technique 具有1/4 dtc范围缩减技术的低抖动分数n lc -锁相环
IF 2.2
IEEE Solid-State Circuits Letters Pub Date : 2025-01-10 DOI: 10.1109/LSSC.2025.3528005
Gaofeng Jin;Fei Feng;Yan Chen;Hanli Liu;Xiang Gao
{"title":"A Low-Jitter Fractional-N LC-PLL With a 1/4 DTC-Range-Reduction Technique","authors":"Gaofeng Jin;Fei Feng;Yan Chen;Hanli Liu;Xiang Gao","doi":"10.1109/LSSC.2025.3528005","DOIUrl":"https://doi.org/10.1109/LSSC.2025.3528005","url":null,"abstract":"A fractional-N LC oscillator-based phase-locked loop (PLL) with a 1/4 quantization noise (QN) range reduction technique is proposed. Simple open-loop delay cells are used to generate 4-phase clocks and reduce the QN by a factor of 4 while the mismatches of the four phases are calibrated and covered by a single DTC. Designed in 40-nm CMOS process, the proposed PLL achieves 159-fs RMS-jitter with 2.6-mW power consumption, leading to –251.8-dB FoM.","PeriodicalId":13032,"journal":{"name":"IEEE Solid-State Circuits Letters","volume":"8 ","pages":"45-48"},"PeriodicalIF":2.2,"publicationDate":"2025-01-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143105873","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A Sub-THz Harmonic Recycling Single-Stage Frequency Quadrupler in CMOS 28-nm Technology 基于CMOS 28纳米技术的次太赫兹谐波回收单级四倍频器
IF 2.2
IEEE Solid-State Circuits Letters Pub Date : 2025-01-09 DOI: 10.1109/LSSC.2025.3527533
Ali Ameri;Ali M. Niknejad
{"title":"A Sub-THz Harmonic Recycling Single-Stage Frequency Quadrupler in CMOS 28-nm Technology","authors":"Ali Ameri;Ali M. Niknejad","doi":"10.1109/LSSC.2025.3527533","DOIUrl":"https://doi.org/10.1109/LSSC.2025.3527533","url":null,"abstract":"A single-stage frequency quadrupler operating in the 199–219-GHz frequency range is presented. The quadrupler utilizes a second harmonic trap and recycles the trapped power to generate additional power toward the desired fourth harmonic. The quadrupler has a peak power of −2.54 dBm while consuming 54 mW, resulting in a maximum efficiency <inline-formula> <tex-math>$eta _{mathrm {MAX}}=1.03%$ </tex-math></inline-formula>. The circuit occupies an area of <inline-formula> <tex-math>$370~mu $ </tex-math></inline-formula>m <inline-formula> <tex-math>$times $ </tex-math></inline-formula> <inline-formula> <tex-math>$240~mu $ </tex-math></inline-formula>m, the smallest footprint among the reported sub-THz frequency quadruplers. An on-chip LC oscillator and a tuned buffer provide the input signal to the quadrupler, constituting a fully integrated system.","PeriodicalId":13032,"journal":{"name":"IEEE Solid-State Circuits Letters","volume":"8 ","pages":"37-40"},"PeriodicalIF":2.2,"publicationDate":"2025-01-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143105872","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A 65-nm Delta-Sigma ADC-Based VDD-Variation-Tolerant Power-Side-Channel-Attack Sensor 一种65纳米Delta-Sigma adc型vdd容差功率侧信道攻击传感器
IF 2.2
IEEE Solid-State Circuits Letters Pub Date : 2025-01-08 DOI: 10.1109/LSSC.2025.3527153
Shota Konno;Zachary J. Ellis;Anupam Golder;Sigang Ryu;Daniel Dinu;Avinash Varna;Sanu Mathew;Arijit Raychowdhury
{"title":"A 65-nm Delta-Sigma ADC-Based VDD-Variation-Tolerant Power-Side-Channel-Attack Sensor","authors":"Shota Konno;Zachary J. Ellis;Anupam Golder;Sigang Ryu;Daniel Dinu;Avinash Varna;Sanu Mathew;Arijit Raychowdhury","doi":"10.1109/LSSC.2025.3527153","DOIUrl":"https://doi.org/10.1109/LSSC.2025.3527153","url":null,"abstract":"This letter describes a delta-sigma ADC-based power-side-channel-attack sensor. Use of 64 sampling capacitors allows the use of over-sampling architecture even with a decoupling capacitor connected to the power supply. The LDO with low-leakage S/H is used as a driver for the integrator’s amplifier to minimize the offset error. A differential conversion method utilizing dual-integrate capacitors (CAPs) provides signal processing to compensate for drift due to supply voltage (VDD) variations. The prototype sensor chip fabricated in 65-nm CMOS has a worst-case detection accuracy of 98.7%, including VDD variations, for an insertion resistance ><inline-formula> <tex-math>${=}0.25~Omega $ </tex-math></inline-formula> and a power consumption of <inline-formula> <tex-math>$50~mu $ </tex-math></inline-formula>W at 1.0-V operation.","PeriodicalId":13032,"journal":{"name":"IEEE Solid-State Circuits Letters","volume":"8 ","pages":"57-60"},"PeriodicalIF":2.2,"publicationDate":"2025-01-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143422849","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A 1.1-pJ/b/Lane, 1.8-Tb/s Chiplet Using 113-Gb/s PAM-4 Transceiver With Equalization Strategy to Reduce Fractionally Spaced 0.5-UI ISI in 5-nm CMOS 基于113gb /s PAM-4收发器的1.1 pj /b/Lane 1.8 tb /s芯片及均衡策略降低分数间隔0.5 ui ISI
IF 2.2
IEEE Solid-State Circuits Letters Pub Date : 2025-01-06 DOI: 10.1109/LSSC.2025.3526877
G. Gangasani;A. Mostafa;A. Singh;D. Storaska;D. Prabakaran;K. Mohammad;M. Baecher;M. Shannon;M. Sorna;M. Wielgos;P. Jenkins;P. Ramakrishna;U. Shukla
{"title":"A 1.1-pJ/b/Lane, 1.8-Tb/s Chiplet Using 113-Gb/s PAM-4 Transceiver With Equalization Strategy to Reduce Fractionally Spaced 0.5-UI ISI in 5-nm CMOS","authors":"G. Gangasani;A. Mostafa;A. Singh;D. Storaska;D. Prabakaran;K. Mohammad;M. Baecher;M. Shannon;M. Sorna;M. Wielgos;P. Jenkins;P. Ramakrishna;U. Shukla","doi":"10.1109/LSSC.2025.3526877","DOIUrl":"https://doi.org/10.1109/LSSC.2025.3526877","url":null,"abstract":"This letter uses 113-Gb/s PAM4 transceiver in 5-nm CMOS to demonstrate a 1.8-Tb/s chiplet, over die-to-die extremely short-reach (XSR) intrapackage links, in an 8-port configuration. The 16-channels range from 1 to 12 dB of loss at <inline-formula> <tex-math>$F_{textrm {baud}}/2$ </tex-math></inline-formula>. The chiplet performance over these channels is better than <inline-formula> <tex-math>$textrm {BER}lt 10^{-9}$ </tex-math></inline-formula>, while consuming <1.1-pJ/b power and 0.22-mm2 area per lane. The performance targets are achieved using an transceiver equalization strategy which minimizes 0.5-UI ISI by design in the data path and using a LUT-based TX FFE-3 for signal equalization and envelope adaptation.","PeriodicalId":13032,"journal":{"name":"IEEE Solid-State Circuits Letters","volume":"8 ","pages":"33-36"},"PeriodicalIF":2.2,"publicationDate":"2025-01-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143105949","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A 2.6-GS/s 8-bit Time-Interleaved ADC With Fully Dynamic Current Integrating Sampler 具有全动态电流积分采样器的2.6-GS/s 8位时间交错ADC
IF 2.2
IEEE Solid-State Circuits Letters Pub Date : 2024-12-27 DOI: 10.1109/LSSC.2024.3523509
Dengquan Li;Maowen Qian;Depan Li;Hongzhi Liang;Zhangming Zhu
{"title":"A 2.6-GS/s 8-bit Time-Interleaved ADC With Fully Dynamic Current Integrating Sampler","authors":"Dengquan Li;Maowen Qian;Depan Li;Hongzhi Liang;Zhangming Zhu","doi":"10.1109/LSSC.2024.3523509","DOIUrl":"https://doi.org/10.1109/LSSC.2024.3523509","url":null,"abstract":"This letter presents an 8-bit 2.6-GS/s 8-way time-interleaved (TI) analog-to-digital converter (ADC) in 65-nm CMOS. The proposed dynamic current integrating sampler (DCIS) implements the functionality of input buffer and anti-aliasing filter, and eliminates the memory effect caused by parasitic capacitance. It breaks through the limitations of conventional CIS in terms of power consumption, output swing, and bandwidth. A global master sampling network with charge sharing is adopted to alleviate the impact of timing skew. The measured results show that the TI-ADC achieves an SFDR of 50.01 dB and SNDR of 41.29 dB with Nyquist input, respectively. The total power consumption is 28.88 mW, which corresponds to a Walden figure of merit of 117.2 fJ/conv.-step.","PeriodicalId":13032,"journal":{"name":"IEEE Solid-State Circuits Letters","volume":"8 ","pages":"29-32"},"PeriodicalIF":2.2,"publicationDate":"2024-12-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142993085","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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