Alin Thomas Tharakan;Cong Huang;Yiheng Fu;Horacio Londoño Ramírez;Stéphanie P. Lacour;Mahsa Shoaran
{"title":"A 10.2 V 8-Channel Neural Stimulator With Nearly Constant Efficiency Across 90% Current Range and a TDM ADC-Based One-Shot Charge Balancing With < 6 mV Residue","authors":"Alin Thomas Tharakan;Cong Huang;Yiheng Fu;Horacio Londoño Ramírez;Stéphanie P. Lacour;Mahsa Shoaran","doi":"10.1109/LSSC.2026.3653014","DOIUrl":"https://doi.org/10.1109/LSSC.2026.3653014","url":null,"abstract":"This letter presents an 8-channel current-mode stimulator achieving a ±10.2 V voltage compliance in a standard CMOS process, supporting up to 4.5 mA stimulation current per channel. The proposed dynamic charge pump (DCP), which adaptively sizes its switches based on the stimulation current, helps achieve ~15% higher power efficiency at low currents compared to conventional approaches. We further propose an ADC-based time-division multiplexed one-shot charge balancing (CB) scheme, where the duration of the second phase is adaptively adjusted to achieve near-zero residual charge on the electrode-tissue interface (ETI). The proposed CB scheme has been validated over a wide range of ETI impedances and achieves a residual voltage below 6mV with an area overhead of only 0.024 mm2/channel.","PeriodicalId":13032,"journal":{"name":"IEEE Solid-State Circuits Letters","volume":"9 ","pages":"49-52"},"PeriodicalIF":2.0,"publicationDate":"2026-01-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"146026424","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Lautaro N. Petrauskas;Bahman K. Boroujeni;Frank Ellinger
{"title":"Dual-Band Voltage-Controlled Oscillator for CB and HF RFID Bands in a Flexible IGZO Technology","authors":"Lautaro N. Petrauskas;Bahman K. Boroujeni;Frank Ellinger","doi":"10.1109/LSSC.2026.3651909","DOIUrl":"https://doi.org/10.1109/LSSC.2026.3651909","url":null,"abstract":"In this work, a cross-coupled voltage-controlled oscillator (VCO) for the high frequency RFID and citizen bands (CBs) is investigated, and implemented on a flexible Indium gallium zinc oxide thin film transistor (TFT) technology. To circumvent the challenges of integrating passive components in this frequency range and minimize the circuit’s footprint, the resonant tank is designed as a parallel connection of an active inductor with a metal oxide semiconductor capacitor - yielding a total area of <inline-formula> <tex-math>$mathrm {200~mu text {m} }$ </tex-math></inline-formula> by <inline-formula> <tex-math>$mathrm {330~mu text {m} }$ </tex-math></inline-formula>. The VCO can operate in the CB mode at 10 V power supply, boasting a tuning range from 26.9 MHz to 27.7 MHz and a dc power of 1.93 mW, or in the RFID mode from a 4 V supply, obtaining a 12.9 MHz - 13.6 MHz range at <inline-formula> <tex-math>$mathrm {140~mu text {W} }$ </tex-math></inline-formula> dc power. To the best of the authors’ knowledge, this circuit possesses the highest figure-of-merit (frequency/total power), and overall highest oscillation frequency for VCOs reported up to date in comparable technologies.","PeriodicalId":13032,"journal":{"name":"IEEE Solid-State Circuits Letters","volume":"9 ","pages":"33-36"},"PeriodicalIF":2.0,"publicationDate":"2026-01-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145982249","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Hsi-Hao Huang;Zong-Rui Cao;Ying-Ying Cheng;Jia-Yu Lin;Chen-Yi Lee
{"title":"A 1×32 TDC Array With 0.056% Pixel-to-Pixel Variation Using a Global Timer Architecture for LiDAR Applications","authors":"Hsi-Hao Huang;Zong-Rui Cao;Ying-Ying Cheng;Jia-Yu Lin;Chen-Yi Lee","doi":"10.1109/LSSC.2026.3652323","DOIUrl":"https://doi.org/10.1109/LSSC.2026.3652323","url":null,"abstract":"This letter presents a low pixel-to-pixel variation (PPV) time-to-digital converter (TDC) array designed for light detection and ranging (LiDAR) applications. The TDC array is implemented in a 0.18-<inline-formula> <tex-math>$mu $ </tex-math></inline-formula>m HV CMOS process, integrated with a single-photon avalanche diode (SPAD) array. SPAD-based LiDAR systems require high-precision timing resolution across the entire sensing array, which is challenging due to process, voltage, and temperature (PVT) variations. To mitigate this issue, we propose a TDC array architecture featuring a single global timer (GT) circuit that controls the entire array. The GT comprises a differential gated ring oscillator (DGRO)-based all-digital frequency-locked loop (ADFLL) and a 16-to-5 encoder, which drives 32 time-sampling circuits through a buffer tree. The ADFLL ensures precise and uniform timing resolution over the measurement period, while the encoder and buffer tree ensure that the fine timing signal is distributed to the entire TDC array with minimal PPV. The total number of TDC output bits is 12, and the effective number of bits (ENOB) is 11.68. Measurement results indicate a PPV of 0.056%, a differential nonlinearity (DNL) of–0.99/+ 2.53 LSB, an integral nonlinearity (INL) of–2.01/+ 5.21 LSB, a resolution of 49.48 ps, and a full-scale range (FSR) of 202.65 ns.","PeriodicalId":13032,"journal":{"name":"IEEE Solid-State Circuits Letters","volume":"9 ","pages":"41-44"},"PeriodicalIF":2.0,"publicationDate":"2026-01-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"146026442","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"An Approximate Digital CIM Macro With Low-Power Multiply-Add Units and Dynamic Sparse-Adaptive Configuring for Edge AI Inference","authors":"Xiaofeng Li;Yi Zhan;Purui Zhu;Rui Zhou;Jiayin Song;Heng You;Yumei Zhou;Shushan Qiao","doi":"10.1109/LSSC.2026.3652570","DOIUrl":"https://doi.org/10.1109/LSSC.2026.3652570","url":null,"abstract":"This letter presents an approximate digital compute-in-memory (CIM) macro for low-power edge AI inference. It introduces three hierarchical innovations: 1) novel fused approximate multiply-add units (FAMUs) that reduces power and area consumption; 2) a bit-critical weight allocation architecture that optimally balances accuracy and hardware cost; and 3) a dynamic sparsity-adaptive configuration method to minimize accuracy loss in real-time. The macro achieves an energy efficiency of 60.35 TOPS/W and an area efficiency of 1105 GOPS/mm2 for INT8 MACs, outperforming prior works. It attains negligible accuracy degradation on multiple mainstream datasets and suits well for edge AI inference.","PeriodicalId":13032,"journal":{"name":"IEEE Solid-State Circuits Letters","volume":"9 ","pages":"45-48"},"PeriodicalIF":2.0,"publicationDate":"2026-01-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"146026358","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"A Standalone-in-Memory Voltage Crossover-Based Assist Switching Circuit for Reliable and Efficient Process Tracking Memory Vmin Improvement in Intel 18A-RibbonFET Technology","authors":"Saroj Satapathy;Amlan Ghosh;John Riley;Jalal Quadri;Jaydeep Kulkarni;Feroze Merchant","doi":"10.1109/LSSC.2026.3652110","DOIUrl":"https://doi.org/10.1109/LSSC.2026.3652110","url":null,"abstract":"Advanced CMOS memory requires voltage biasing assist techniques to achieve low operating voltages (Vmin), which must be deactivated at higher voltages for high electric field reliability. Centralized power management unit (PMU) control signals face timing synchronization and process tracking challenges when distributed across cores to activate assist circuits in various static random access memory arrays, limiting their effectiveness. This restricts the power and area benefits that could be gained from an in-situ, memory circuit-assist enable/disable mechanism. To address this, we propose a novel voltage crossover-based memory assist switching circuit implemented in Intel 18A-RibbonFET technology featuring backside power delivery. Its <inline-formula> <tex-math>$150times $ </tex-math></inline-formula> area efficiency enables independent placement within memory blocks, offering 19% array-level power and 17% performance improvements. Silicon measurements show tight variation control and strong simulation correlation.","PeriodicalId":13032,"journal":{"name":"IEEE Solid-State Circuits Letters","volume":"9 ","pages":"37-40"},"PeriodicalIF":2.0,"publicationDate":"2026-01-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"146026452","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
D. Cerviño Fungueiriño;L. A. Enthoven;J. van Staveren;M. Babaie;F. Sebastiano
{"title":"A Cryo-CMOS Smart Temperature Sensor for the Ultrawide Temperature Range From 5 K to 296 K","authors":"D. Cerviño Fungueiriño;L. A. Enthoven;J. van Staveren;M. Babaie;F. Sebastiano","doi":"10.1109/LSSC.2025.3650657","DOIUrl":"https://doi.org/10.1109/LSSC.2025.3650657","url":null,"abstract":"This work presents a cryo-CMOS smart temperature sensor operating from room temperature down to 5 K. By adopting sensing elements (CMOS bulk diodes, pMOS/DTMOS in weak inversion) that circumvent the poor cryogenic performance of Si BJTs, a robust switched-capacitor second-order sigma–delta readout and cryogenic-aware design techniques, the sensor achieves a maximum error of ±0.73 K (four samples and two-point trim), a resolution below 0.05 K for a 102.4-ms readout duration, and a power consumption of <inline-formula> <tex-math>$mathrm {15.5~mu text {W} }$ </tex-math></inline-formula> (<inline-formula> <tex-math>$mathrm {93.5~mu text {W} }$ </tex-math></inline-formula>) at 5 K (296 K).","PeriodicalId":13032,"journal":{"name":"IEEE Solid-State Circuits Letters","volume":"9 ","pages":"29-32"},"PeriodicalIF":2.0,"publicationDate":"2026-01-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145982208","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"HyFPCiM: A 65-nm 417-μW Error-Sensitivity-Aware FP8 Compute-in-Memory Macro","authors":"Gaurav Kumar K;Yatharth Agarwal;Kaushik Roy","doi":"10.1109/LSSC.2026.3688988","DOIUrl":"https://doi.org/10.1109/LSSC.2026.3688988","url":null,"abstract":"This letter presents HyFPCiM, a 65-nm FP8 compute-in-memory (CiM) macro that enables sub-mW floating-point (FP) inference using error-sensitivity-aware FP partitioning (EAP). EAP maps exponent processing to a digital CiM (DCiM) path and mantissa accumulation to an analog CiM (ACiM), avoiding the power- and area-intensive adder-tree-based accumulation used in prior FP-CiM designs. The proposed DCiM employs dual-rail inverter-based sensing for exponent processing, while the ACiM path performs preanalog-to-digital conversion (ADC) charge-domain accumulation using switched-capacitor (SC) circuits. By amortizing one ADC conversion across eight multiply-and-accumulate (MAC) units, the proposed ACiM reduces ADC energy by <inline-formula> <tex-math>$8times $ </tex-math></inline-formula>, ADC + transimpedance amplifier (TIA) power by 75%, and total macro power by 31% versus ADC-first designs. Fabricated in TSMC 65-nm, HyFPCiM consumes <inline-formula> <tex-math>$417~mu $ </tex-math></inline-formula>W at 1 V and 50 MHz, achieves 40 GFLOPS/W, and incurs < 0.55% accuracy loss across multiple classification workloads. To the best of our knowledge, HyFPCiM achieves the lowest reported power among silicon-measured FP-CiM macros.","PeriodicalId":13032,"journal":{"name":"IEEE Solid-State Circuits Letters","volume":"9 ","pages":"146-149"},"PeriodicalIF":2.0,"publicationDate":"2026-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"147937492","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Junyeong Lee;Myeongjin Oh;Kiwoon Kim;Jung-Hoon Chun
{"title":"A 7-Level 18-Wire-State Trio-Signaling Transmitter for MIPI C-PHY 3.0 Interfaces","authors":"Junyeong Lee;Myeongjin Oh;Kiwoon Kim;Jung-Hoon Chun","doi":"10.1109/LSSC.2026.3672642","DOIUrl":"https://doi.org/10.1109/LSSC.2026.3672642","url":null,"abstract":"This letter presents a MIPI C-PHY v3.0 TX, which adopts trio-signaling using three wires per lane. Each line supports seven-level signaling, enabling 18 wire states to map 32-bit data into nine symbols, achieving 3.56 bits/symbol efficiency. Balanced coding maintains constant driver current, enhancing SSO noise immunity, and embedded clocking is achieved by prohibiting identical consecutive wire states, eliminating the need for a separate clock channel. Although seven levels are used, only four detection regions are needed due to restricted level combinations. Fabricated in 28-nm CMOS, the TX achieves 17.78 Gb/s at 5 GS/s with a 3.10 pJ/bit FoM and occupies 0.0757 mm2.","PeriodicalId":13032,"journal":{"name":"IEEE Solid-State Circuits Letters","volume":"9 ","pages":"101-104"},"PeriodicalIF":2.0,"publicationDate":"2026-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"147557477","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"A 9-GHz Digital Fractional-N PLL With Dynamic-Threshold DTC","authors":"Daxu Zhang;Yuncheng Zhang;Zezheng Liu;Yuang Xiong;Wenqian Wang;Duo Li;Minzhe Tang;Dongfan Xu;Dingxin Xu;Kazuaki Kunihiro;Hiroyuki Sakai;Kenichi Okada","doi":"10.1109/LSSC.2026.3725284","DOIUrl":"https://doi.org/10.1109/LSSC.2026.3725284","url":null,"abstract":"This letter presents a fractional-N digital phase-locked loop (DPLL) employing a dynamic-threshold digital-to-time converter (DT-DTC). By dynamically adjusting the comparator threshold voltage, the proposed DT-DTC mitigates delay nonlinearity without digital predistortion (DPD). A quadrature-VCO (QVCO) generates quadrature phases for a multiphase clock generator (MPCG). The QVCO-based MPCG with skew calibration reduces the required DTC delay range by <inline-formula> <tex-math>$4times $ </tex-math></inline-formula>. Fabricated in a 65-nm CMOS process, the prototype occupies 0.39 mm2 and consumes 9.1 mW. Operating at 9 GHz with a 100-MHz reference frequency, the DPLL achieves 127.9-fs integrated jitter (1 kHz–100 MHz) and a −60.1-dBc fractional spur.","PeriodicalId":13032,"journal":{"name":"IEEE Solid-State Circuits Letters","volume":"9 ","pages":"250-253"},"PeriodicalIF":2.0,"publicationDate":"2026-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"148836843","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Mu Wu;Yihang Cheng;Xingli Cui;Sining Pan;Huaqiang Wu
{"title":"A 1.1-nJ/Conversion RC-Discharge-Based Resistance Sensor With ±0.65% (3σ) 1 -Point Trimmed Inaccuracy in 0.18-μm CMOS Technology","authors":"Mu Wu;Yihang Cheng;Xingli Cui;Sining Pan;Huaqiang Wu","doi":"10.1109/LSSC.2026.3677301","DOIUrl":"https://doi.org/10.1109/LSSC.2026.3677301","url":null,"abstract":"This letter presents an energy-efficient RC discharge-based sensor readout circuit for sub-kilo-ohm resistance measurements. An SAR logic is implemented to adjust the DAC capacitor array to equalize the RC time constants of the resistance-sensing and DAC branches, thereby eliminating the high static current required to bias the small sensing resistor. To further reduce power consumption, the sensing branch with a large discharging capacitor is triggered only once per conversion. Fabricated in a standard 0.18-<inline-formula> <tex-math>$mu $ </tex-math></inline-formula>m CMOS technology, the sensor achieves a competitive energy efficiency of 1.1 nJ/conversion and a fast conversion time of <inline-formula> <tex-math>$2.4~mu $ </tex-math></inline-formula>s. With the auto-zeroing (AZ) technique, it achieves a <inline-formula> <tex-math>$3sigma $ </tex-math></inline-formula> inaccuracy of ±0.65% after 1-point calibration over a resistance range from 150 to <inline-formula> <tex-math>$250~Omega $ </tex-math></inline-formula>.","PeriodicalId":13032,"journal":{"name":"IEEE Solid-State Circuits Letters","volume":"9 ","pages":"109-112"},"PeriodicalIF":2.0,"publicationDate":"2026-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"147606178","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}