Proceedings Eleventh Annual IEEE International ASIC Conference (Cat. No.98TH8372)最新文献

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HiPCrypto: a high-performance VLSI cryptographic chip HiPCrypto:高性能VLSI加密芯片
Proceedings Eleventh Annual IEEE International ASIC Conference (Cat. No.98TH8372) Pub Date : 1998-09-13 DOI: 10.1109/ASIC.1998.722785
S. Salomão, V. Alves, E. Filho
{"title":"HiPCrypto: a high-performance VLSI cryptographic chip","authors":"S. Salomão, V. Alves, E. Filho","doi":"10.1109/ASIC.1998.722785","DOIUrl":"https://doi.org/10.1109/ASIC.1998.722785","url":null,"abstract":"Data security is an important issue in today's computer networks. This paper presents the HiPCrypto chip, which implements the IDEA cryptographic algorithm. HiPCrypto is oriented towards computer network applications demanding high throughput. Its architecture exploits both the spatial and the temporal parallelism available in the IDEA algorithm. When operating at a 53 MHz clock, HiPCrypto can encrypt/decrypt at data rates up to 3.4 Gbps.","PeriodicalId":104431,"journal":{"name":"Proceedings Eleventh Annual IEEE International ASIC Conference (Cat. No.98TH8372)","volume":"18 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1998-09-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126496209","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 23
A customizable DSP for DMT-based ADSL modem 基于dmt的ADSL调制解调器的可定制DSP
Proceedings Eleventh Annual IEEE International ASIC Conference (Cat. No.98TH8372) Pub Date : 1998-09-13 DOI: 10.1109/ASIC.1998.723033
L. Kiss, E. Hanssens, K. Adriaensen, M. Huysmans, C. Gendarme, E. Van Beylen, H. Van De Weghe
{"title":"A customizable DSP for DMT-based ADSL modem","authors":"L. Kiss, E. Hanssens, K. Adriaensen, M. Huysmans, C. Gendarme, E. Van Beylen, H. Van De Weghe","doi":"10.1109/ASIC.1998.723033","DOIUrl":"https://doi.org/10.1109/ASIC.1998.723033","url":null,"abstract":"From Time domain to Atm domain, the complete digital signal processing required by ADSL technology has been integrated onto a single device called SACHEM. High programmability along with flexible architecture enable the device to serve for both network and line termination. Mapping on a 0.35 /spl mu/m standard digital CMOS technology makes SACHEM a cost effective solution as well as a low power device, consuming only 800 mW at 3.3 V.","PeriodicalId":104431,"journal":{"name":"Proceedings Eleventh Annual IEEE International ASIC Conference (Cat. No.98TH8372)","volume":"75 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1998-09-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127672741","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
Dsm Interconnect Modeling And Analysis For Performance And Reliability 基于性能和可靠性的Dsm互连建模与分析
Proceedings Eleventh Annual IEEE International ASIC Conference (Cat. No.98TH8372) Pub Date : 1998-09-13 DOI: 10.1109/ASIC.1998.723091
A. Kahng, S. Muddut
{"title":"Dsm Interconnect Modeling And Analysis For Performance And Reliability","authors":"A. Kahng, S. Muddut","doi":"10.1109/ASIC.1998.723091","DOIUrl":"https://doi.org/10.1109/ASIC.1998.723091","url":null,"abstract":"DSM interconnects have a dominant impact on the achievable performance of integrated circuits. A broad spectrum of issues must be dealt with by design tools and methodologies to achieve successful outcomes. This tutorial develops the fundamentals of DSM interconnect modeling and analysis, starting with the underlying process technology and design methodology contexts, and continuing with interconnect performance and reliability analyses, frontend interconnect metrics and models, and modeling for interconnect synthesis and optimization. The tutorial’s intended audience consists of ASIC designers, design tool users, and CAD developers. The material will be presented in a form (slides, pseudocode fragments, reference lists) that attendees can take away and immediately use.","PeriodicalId":104431,"journal":{"name":"Proceedings Eleventh Annual IEEE International ASIC Conference (Cat. No.98TH8372)","volume":"35 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1998-09-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122336502","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A proven embedded DRAM compiler for deep submicron logic processes and system-on-a-chip ASIC designs 经过验证的嵌入式DRAM编译器,用于深亚微米逻辑处理和片上系统ASIC设计
Proceedings Eleventh Annual IEEE International ASIC Conference (Cat. No.98TH8372) Pub Date : 1998-09-13 DOI: 10.1109/ASIC.1998.722901
T. Tsang, B. Rodriguez, G. Haag, H. Crafts
{"title":"A proven embedded DRAM compiler for deep submicron logic processes and system-on-a-chip ASIC designs","authors":"T. Tsang, B. Rodriguez, G. Haag, H. Crafts","doi":"10.1109/ASIC.1998.722901","DOIUrl":"https://doi.org/10.1109/ASIC.1998.722901","url":null,"abstract":"This paper covers the motivations for and the advantages of using an embedded DRAM compiler technology within a standard deep submicron logic process for System-on-a-Chip (SoC). We also discuss the bit cell design and the memory architecture, as well as the automation software and methodology used in the construction of the DRAM compiler. Silicon results from the test chips are favorable. This approach makes economical and time-to-market sense, therefore it can be a viable high-performance and area-efficient option in the embedded DRAM technology.","PeriodicalId":104431,"journal":{"name":"Proceedings Eleventh Annual IEEE International ASIC Conference (Cat. No.98TH8372)","volume":"7 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1998-09-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128951065","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Development of Mitsubishi precision scale controller 三菱精密秤控制器的研制
Proceedings Eleventh Annual IEEE International ASIC Conference (Cat. No.98TH8372) Pub Date : 1998-09-13 DOI: 10.1109/ASIC.1998.722789
T. Matsukawa, M. Mizoguchi, K. Takeuchi
{"title":"Development of Mitsubishi precision scale controller","authors":"T. Matsukawa, M. Mizoguchi, K. Takeuchi","doi":"10.1109/ASIC.1998.722789","DOIUrl":"https://doi.org/10.1109/ASIC.1998.722789","url":null,"abstract":"We have developed a Mitsubishi precision scale controller ASIC using a cell based IC. This scale is a position detector applied to industrial machines. The newly developed controller is manufactured using a 0.35 /spl mu/m process and operates at 140 MHz. It can improve the resolution of a scale by 10 times.","PeriodicalId":104431,"journal":{"name":"Proceedings Eleventh Annual IEEE International ASIC Conference (Cat. No.98TH8372)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1998-09-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130747344","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Optimum repeater insertion based on a CMOS delay model for on-chip RLC interconnect 基于CMOS延迟模型的片上RLC互连中继器最佳插入
Proceedings Eleventh Annual IEEE International ASIC Conference (Cat. No.98TH8372) Pub Date : 1998-09-13 DOI: 10.1109/ASIC.1998.723040
Yehea Ismail, Eby G. Friedman
{"title":"Optimum repeater insertion based on a CMOS delay model for on-chip RLC interconnect","authors":"Yehea Ismail, Eby G. Friedman","doi":"10.1109/ASIC.1998.723040","DOIUrl":"https://doi.org/10.1109/ASIC.1998.723040","url":null,"abstract":"A closed form expression for the propagation delay of a CMOS gate driving a distributed RLC line is introduced that is within 7% of SPICE simulations for a wide range of RLC loads. This expression is based on the alpha power law for deep submicrometer technologies. It is shown that the error in the propagation delay if inductance is neglected and the interconnect is treated as a distributed RC line can be over 30% for present on-chip interconnect. It is also shown that the traditional quadratic dependence of the propagation delay on the length of the interconnect for RC lines approaches a linear dependence as inductance effects increase, which is expected to have a profound effect on traditional design methodologies. The closed form CMOS delay model is applied to the problem of repeater insertion in RLC interconnect. Closed form solutions are presented for inserting repeaters into RLC lines that are highly accurate with respect to numerical solutions. It is shown that large errors in the repeater design process are encountered if inductance is neglected. Errors up to 30% can occur if repeaters are inserted without considering the effects of inductance. The error between the RC and RLC models increases as the gate parasitic impedances decrease. Thus, the importance of inductance in high performance VLSI design methodologies will increase as technologies scale.","PeriodicalId":104431,"journal":{"name":"Proceedings Eleventh Annual IEEE International ASIC Conference (Cat. No.98TH8372)","volume":"33 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1998-09-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131966884","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 46
Novel Devices And Circuits 新型器件和电路
Proceedings Eleventh Annual IEEE International ASIC Conference (Cat. No.98TH8372) Pub Date : 1998-09-13 DOI: 10.1109/ASIC.1998.722820
J. Chickanosky, R. Frye
{"title":"Novel Devices And Circuits","authors":"J. Chickanosky, R. Frye","doi":"10.1109/ASIC.1998.722820","DOIUrl":"https://doi.org/10.1109/ASIC.1998.722820","url":null,"abstract":"The first two papers discuss novel buffer designs. One driver uses a capacitance feedback to control the output slew, reducing the power noise. The other buffer design utilizes a new CMOS logic circuit with a unique delay propagation characteristic that makes it much faster than conventional CMOS logic. There are two papers on SRAM circuit techniques. One paper presents a new approach based on current-mode to reduce energy and improve the speed of write and read access in multi-port SRAMS. The other SRAM paper presents a new currentmode sense amplifier design which can be used in the design of a low-voltage low power SRAM for ASIC applications.","PeriodicalId":104431,"journal":{"name":"Proceedings Eleventh Annual IEEE International ASIC Conference (Cat. No.98TH8372)","volume":"111 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1998-09-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122718004","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Asic Cad Applications And Algorithms Asic Cad应用与算法
Proceedings Eleventh Annual IEEE International ASIC Conference (Cat. No.98TH8372) Pub Date : 1998-09-13 DOI: 10.1109/ASIC.1998.722890
R. Auletta, Mely Chen Chi
{"title":"Asic Cad Applications And Algorithms","authors":"R. Auletta, Mely Chen Chi","doi":"10.1109/ASIC.1998.722890","DOIUrl":"https://doi.org/10.1109/ASIC.1998.722890","url":null,"abstract":"Computer-aided design is central to ASIC design, supporting the design process from specification to implementation. The papers presented in this year’s CAD session reflect the broad importance of CAD in the ASIC design process, with papers addressing both the application of ASIC EDA tools, complete tool suites, and the algorithms they use. The session opens with a case study by Alcatel and Toshiba on CAD design methods for million gate systems. The session then addresses the application of CAD tools for the design of a Fast Discrete Cosine Transform and an embedded DRAM compiler for systems on a chip. Automatic layout synthesis and power estimation are covered in the next two papers. The first describes automatic layout of dynamic CMOS circuits and the second describes architectural estimation of power dissipation in processor control units. Finally the session closes with the presentation of papers on CAD algorithms, including a paper on incremental rerouting of mapped FPGA circuits and two papers on VLSI circuit partitioning. The first applies TABU intelligent problem solving to bipafl itioning, while the second reports on improved wirelengths by relaxing the traditional bisection constraint.","PeriodicalId":104431,"journal":{"name":"Proceedings Eleventh Annual IEEE International ASIC Conference (Cat. No.98TH8372)","volume":"47 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1998-09-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128683009","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Relaxed partitioning balance constraints in top-down placement 在自上而下的布局中放松分区平衡约束
Proceedings Eleventh Annual IEEE International ASIC Conference (Cat. No.98TH8372) Pub Date : 1998-09-13 DOI: 10.1109/ASIC.1998.722911
A. Caldwell, A. Kahng, I. Markov
{"title":"Relaxed partitioning balance constraints in top-down placement","authors":"A. Caldwell, A. Kahng, I. Markov","doi":"10.1109/ASIC.1998.722911","DOIUrl":"https://doi.org/10.1109/ASIC.1998.722911","url":null,"abstract":"Recent work of Simon and Teng (1997) observes that the recursive bisection (i.e., bipartitioning with equal partition target areas, and minimum possible allowed deviation from targets) heuristic for k-way minimum-cut graph partitioning can have unbounded error, but that relaxing the balance constraints in each call to the bipartitioning engine can result in k-way net cuts within a small (O(logk)) factor of optimal. Motivated by this result, we experimentally determine whether relaxing the traditional exact bisection constraint in a top-down partitioning-based placement tool can improve the resulting cutsizes, and hence total wirelength, of the placement solution. We find that this simple change reduces total wirelength by up to several percent, with no change in placement uniformity and under 10% runtime penalty. Finally, we observe that the stability (predictability) of the placement process appears unimpaired by this modification: both wirelength stability, and stability of Rent parameter based wirelength and wireability estimates, appear to be preserved.","PeriodicalId":104431,"journal":{"name":"Proceedings Eleventh Annual IEEE International ASIC Conference (Cat. No.98TH8372)","volume":"250 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1998-09-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114147502","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 9
Design and test of a CMOS low-power mixed-analog/digital ASIC for radiation detector readout front ends 用于辐射探测器读出前端的CMOS低功耗模拟/数字混合ASIC的设计与测试
Proceedings Eleventh Annual IEEE International ASIC Conference (Cat. No.98TH8372) Pub Date : 1998-09-13 DOI: 10.1109/ASIC.1998.722809
L. Hebrand, J. Blonde, C. Colledani, G. Clauss
{"title":"Design and test of a CMOS low-power mixed-analog/digital ASIC for radiation detector readout front ends","authors":"L. Hebrand, J. Blonde, C. Colledani, G. Clauss","doi":"10.1109/ASIC.1998.722809","DOIUrl":"https://doi.org/10.1109/ASIC.1998.722809","url":null,"abstract":"A new CMOS low-power mixed A/D ASIC for radiation detector readout front ends is presented. First, we recall the principle of radiation detection system before describing the whole architecture of the circuit. The discussion is then focused on the low-power issue. By means of an innovative 128:1 analog multiplexer, we show how we drastically reduced the mean power consumption without sacrificing constraining specifications such as the input range and the readout rate. Testing mixed A/D, but strongly analog IC is also a big issue which is addressed here. Specific built-in test analog sub-circuits have been implemented in the ASIC, along with a JTAG module used to choose the type of test to perform. This module is also used to control and tune the biasing currents of the circuit. Finally, test results are presented and show that all the specifications are satisfied.","PeriodicalId":104431,"journal":{"name":"Proceedings Eleventh Annual IEEE International ASIC Conference (Cat. No.98TH8372)","volume":"33 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1998-09-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114186036","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 6
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