基于CMOS延迟模型的片上RLC互连中继器最佳插入

Yehea Ismail, Eby G. Friedman
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引用次数: 46

摘要

本文介绍了驱动分布式RLC线路的CMOS栅极传播延迟的封闭表达式,该表达式在大范围RLC负载下的SPICE模拟误差在7%以内。该表达式基于深亚微米技术的alpha幂律。研究结果表明,对于目前的片上互连,如果忽略电感,将互连作为分布式RC线处理,其传输延迟误差可达30%以上。研究还表明,随着电感效应的增加,RC线的传播延迟对互连长度的传统二次依赖关系接近线性依赖关系,这有望对传统的设计方法产生深远的影响。将封闭形式的CMOS延迟模型应用于RLC互连中中继器的插入问题。给出了将中继器插入RLC线路的封闭解,该解相对于数值解具有很高的精度。结果表明,如果忽略电感,在中继器设计过程中会遇到较大的误差。如果插入中继器而不考虑电感的影响,误差可达30%。RC和RLC模型之间的误差随着栅极寄生阻抗的减小而增大。因此,电感在高性能VLSI设计方法中的重要性将随着技术规模的扩大而增加。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Optimum repeater insertion based on a CMOS delay model for on-chip RLC interconnect
A closed form expression for the propagation delay of a CMOS gate driving a distributed RLC line is introduced that is within 7% of SPICE simulations for a wide range of RLC loads. This expression is based on the alpha power law for deep submicrometer technologies. It is shown that the error in the propagation delay if inductance is neglected and the interconnect is treated as a distributed RC line can be over 30% for present on-chip interconnect. It is also shown that the traditional quadratic dependence of the propagation delay on the length of the interconnect for RC lines approaches a linear dependence as inductance effects increase, which is expected to have a profound effect on traditional design methodologies. The closed form CMOS delay model is applied to the problem of repeater insertion in RLC interconnect. Closed form solutions are presented for inserting repeaters into RLC lines that are highly accurate with respect to numerical solutions. It is shown that large errors in the repeater design process are encountered if inductance is neglected. Errors up to 30% can occur if repeaters are inserted without considering the effects of inductance. The error between the RC and RLC models increases as the gate parasitic impedances decrease. Thus, the importance of inductance in high performance VLSI design methodologies will increase as technologies scale.
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