Microscopy (Oxford, England)最新文献_第4页

Electron microscopy studies on interfacial solid-state reactions induced by electronic excitation. 电子激发诱导界面固相反应的电镜研究。

Microscopy (Oxford, England) Pub Date : 2025-06-05 DOI: 10.1093/jmicro/dfaf029

Kazuhisa Sato

{"title":"Electron microscopy studies on interfacial solid-state reactions induced by electronic excitation.","authors":"Kazuhisa Sato","doi":"10.1093/jmicro/dfaf029","DOIUrl":"https://doi.org/10.1093/jmicro/dfaf029","url":null,"abstract":"We have studied the effects of electron irradiation on Pt/a-SiOx thin films by transmission electron microscopy and electron diffraction. Pt2Si was formed by 75 keV electron irradiation at 298 K and 90 K. Such a low temperature synthesis of Pt2Si can be attributed to the dissociation of a-SiOx induced by electronic excitation; Si-O bonds dissociate through Auger decay of core-holes generated by electronic excitation, and then, dissociated Si atoms form Pt-Si bonds. The morphology of Pt islands extensively changed during Pt2Si formation even at 90 K. Coalescence and growth of metallic particles are not due to thermal effects during electron irradiation but to athermal processes accompanied by silicide formation. To maintain the reaction interface between metallic particles and the dissociated Si atoms by electronic excitation, a considerable concomitant morphology change occurs. Similarly, Fe2Si was synthesized by using the same technique. In this way, we have demonstrated a versatile method for selectively forming nanoscale metal silicides in electron irradiated areas at room temperature. We also propose a new mechanism for crystallization of amorphous alloys which is mediated by additional solute atoms produced by electronic excitation. Crystallization of amorphous Pd-Si alloy thin films can be realized by 75 keV electron irradiation at 90 K via the electronic excitation, where both knock-on damage and a possible thermal crystallization can be excluded. Supply of dissociated Si to the Pd-Si layer may cause instability of the amorphous phase, which serves as the trigger for the remarkable structural change; ie, additional solute atom mediated crystallization.","PeriodicalId":74193,"journal":{"name":"Microscopy (Oxford, England)","volume":" ","pages":""},"PeriodicalIF":0.0,"publicationDate":"2025-06-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144236130","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Expanding the potential of paraffin section studies using NanoSuit-correlative light and electron microscopy. 利用纳米光镜和电子显微镜扩大石蜡切片研究的潜力。

Microscopy (Oxford, England) Pub Date : 2025-05-29 DOI: 10.1093/jmicro/dfaf028

Hideya Kawasaki

{"title":"Expanding the potential of paraffin section studies using NanoSuit-correlative light and electron microscopy.","authors":"Hideya Kawasaki","doi":"10.1093/jmicro/dfaf028","DOIUrl":"https://doi.org/10.1093/jmicro/dfaf028","url":null,"abstract":"Histological examination using optical microscopy is essential in life sciences and diagnostic medicine, particularly for formalin-fixed paraffin-embedded (FFPE) tissue sections stained with hematoxylin and eosin or 3,3'-diaminobenzidine. However, conventional electron microscopy faces challenges, such as sample destruction, complex processing, and difficulty in correlating light and electron microscopy images. The NanoSuit method overcomes these limitations by forming an ultrathin protective membrane that enhances conductivity and preserves hydrated tissue architecture, enabling high-resolution scanning electron microscopy imaging. In this study, we applied NanoSuit-correlative light and electron microscopy (CLEM) to FFPE sections to assess its potential for non-destructive and reversible electron microscopy characterization. Using NanoSuit-CLEM, we successfully visualized endothelial structures, amyloid deposits, sarcomeres, mitochondria, bacteria, viruses, and foreign body deposits in FFPE sections. Energy-dispersive X-ray spectrometry further facilitated elemental analysis of foreign materials. These findings demonstrate that NanoSuit-CLEM allows for the precise visualization of ultrastructural details in FFPE sections without requiring new equipment. This method holds promise for advancing pathology by improving diagnostic accuracy and enabling multimodal tissue analysis.","PeriodicalId":74193,"journal":{"name":"Microscopy (Oxford, England)","volume":" ","pages":""},"PeriodicalIF":0.0,"publicationDate":"2025-05-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144183011","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Characterization of the INTPIX4 SOI pixel detector in transmission electron microscopy at 120 keV and 200 keV. 120kev和200kev下INTPIX4 SOI像素探测器的透射电镜表征。

Microscopy (Oxford, England) Pub Date : 2025-05-29 DOI: 10.1093/jmicro/dfaf027

Yuichi Ishida, Takafumi Ishida, Makoto Kuwahara, Yasuo Arai, Koh Saitoh

引用次数: 0

Auto-thresholding for Unbiased Electron Counting. 无偏电子计数的自动阈值。

Microscopy (Oxford, England) Pub Date : 2025-05-19 DOI: 10.1093/jmicro/dfaf025

Julie Marie Bekkevold, Jonathan J P Peters, Ryo Ishikawa, Naoya Shibata, Lewys Jones

{"title":"Auto-thresholding for Unbiased Electron Counting.","authors":"Julie Marie Bekkevold, Jonathan J P Peters, Ryo Ishikawa, Naoya Shibata, Lewys Jones","doi":"10.1093/jmicro/dfaf025","DOIUrl":"https://doi.org/10.1093/jmicro/dfaf025","url":null,"abstract":"As interest in fast real-space frame-rate scanning transmission electron microscopy for both structural and functional characterisation of materials increases, so does the need for precise and fast electron detection techniques. Electron counting, with monolithic, segmented, or 4D detectors, has been explored for many years. Recent studies have shown that a retrofittable signal digitiser for a monolithic or segmented detector can be a sustainable and accessible way to enhance the performance of existing detectors, especially for imaging at fast scan speeds. Since such signal digitisation uses a threshold on the gradient of the detector signal to identify electron events, appropriate threshold choice is key. Previously, this threshold has been set manually by the operator and is therefore inherently susceptible to human bias. In this work, we introduce an auto-thresholding approach for electron counting to determine the optimal threshold by maximising the difference in identified counts from a stream with real electron events and a stream with only noise. This leads to easier operation, increased throughput and eliminates human bias in signal digitisation.","PeriodicalId":74193,"journal":{"name":"Microscopy (Oxford, England)","volume":" ","pages":""},"PeriodicalIF":0.0,"publicationDate":"2025-05-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144103296","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Ultra-low-voltage observation of battery materials by scanning electron microscopy. 电池材料的超低电压扫描电镜观察。

Microscopy (Oxford, England) Pub Date : 2025-05-16 DOI: 10.1093/jmicro/dfaf024

Yoichiro Hashimoto, Yutaka Nagaoka, Toru Aiso, Shuhei Yabu, Masahiro Sasajima

{"title":"Ultra-low-voltage observation of battery materials by scanning electron microscopy.","authors":"Yoichiro Hashimoto, Yutaka Nagaoka, Toru Aiso, Shuhei Yabu, Masahiro Sasajima","doi":"10.1093/jmicro/dfaf024","DOIUrl":"https://doi.org/10.1093/jmicro/dfaf024","url":null,"abstract":"The mechanism of voltage contrast formation under ultra-low landing energy condition is discussed, by which a binder contained in lithium-ion battery anode material has been visualized with high contrast. Since the anode material is a complex experimental system with multiple contrast formation factors, a standard sample simulating it was fabricated for simplification. The binder was observed darker than the substrate at landing energies of 30 eV to 50 eV. The binder exhibited a distinct appearance reflecting its shape (in the 3D-particle mode) at 20 eV. The mirroring phenomenon occurred at 10 eV, in which the primary electrons bounced off the sample before irradiating on the surface. The surface potential at the electron beam irradiation moment was presumed to affect the contrast formation, but direct measurement of it was difficult. Thus, the sample was transferred to an AFM without exposure to the atmosphere to measure the \"residual\" potential of the binder in KPFM mode after the SEM observations. Under darker binder observed conditions of 30 eV to 50 eV, KPFM measured residual potential was positive relative to the substrate. Under conditions of the 3D-particle mode at 20 eV and the mirroring phenomenon at 10 eV, the residual potentials were negative. Therefore, a correlation between the behavior of the voltage contrast and the residual potential was obtained. Finer landing-energy step measurement revealed hysteresis responses of voltage contrast and the residual potential to the landing energy. The Cause of the hysteresis was discussed. The mechanism of voltage contrast formation under ultra-low landing energy condition is discussed, by which a binder contained in lithium-ion battery material has been visualized with high contrast. We confirmed that the contrast change is caused by the surface potential change depending on the landing energy of the primary electron.","PeriodicalId":74193,"journal":{"name":"Microscopy (Oxford, England)","volume":" ","pages":""},"PeriodicalIF":0.0,"publicationDate":"2025-05-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144082601","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Discovery of Golgi Membrane-associated Degradation Pathway, GOMED: A Focus on 15 Years of Ultrastructural Analyses. 高尔基膜相关降解途径的发现，GOMED：聚焦于15年的超微结构分析。

Microscopy (Oxford, England) Pub Date : 2025-05-13 DOI: 10.1093/jmicro/dfaf023

Satoko Arakawa, Hirofumi Yamaguchi, Shigeomi Shimizu

{"title":"Discovery of Golgi Membrane-associated Degradation Pathway, GOMED: A Focus on 15 Years of Ultrastructural Analyses.","authors":"Satoko Arakawa, Hirofumi Yamaguchi, Shigeomi Shimizu","doi":"10.1093/jmicro/dfaf023","DOIUrl":"https://doi.org/10.1093/jmicro/dfaf023","url":null,"abstract":"In this review, we focus on the ultrastructural characteristics of the Golgi membrane-associated degradation (GOMED) pathway, which have been clarified by electron microscopy and highlight recent advances in the elucidation of its molecular mechanism and physiological roles. The discovery of GOMED, an Atg5/Atg7-independent degradation pathway that differs from canonical autophagy in membrane origin, stimuli, and substrate specificity, has substantially expanded our understanding of intracellular degradation systems. In 2009, we identified GOMED as a novel, evolutionarily conserved autophagic pathway and demonstrated its role in intracellular degradation across eukaryotes, from yeast to mammals. We identified the conserved protein Hsv2/Wipi3 as an essential GOMED protein, which translocates to the trans-Golgi upon induction and remodels Golgi membranes into cup-shaped structures that engulf cytoplasmic components for lysosomal degradation. These processes contribute to organelle and secretory granule turnover, as well as mitochondrial clearance during erythroid differentiation. Moreover, neuronal-specific ablation of Wipi3 in mice causes severe cerebellar degeneration, implicating GOMED in tissue development and homeostasis. As these mechanisms are associated with diseases, such as neurodegenerative disorders and cancer, GOMED mechanisms should also be considered when establishing therapeutic strategies for these diseases.","PeriodicalId":74193,"journal":{"name":"Microscopy (Oxford, England)","volume":" ","pages":""},"PeriodicalIF":0.0,"publicationDate":"2025-05-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144013956","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

High energy-resolution soft X-ray emission spectrometer using a back-thinned CMOS detector for chemical bonding state analysis. 高能量分辨率软x射线发射光谱仪，采用后薄型CMOS探测器，用于化学键态分析。

Microscopy (Oxford, England) Pub Date : 2025-04-16 DOI: 10.1093/jmicro/dfaf021

Shogo Koshiya, Takanori Murano, Masami Terauchi

引用次数: 0

Semi-automated image acquisition and analyses for broad users utilizing macro keyboards. 半自动图像采集和分析，为广大用户利用宏键盘。

Microscopy (Oxford, England) Pub Date : 2025-04-03 DOI: 10.1093/jmicro/dfaf018

Takaaki Watanabe, Toshiyasu Taniguchi

{"title":"Semi-automated image acquisition and analyses for broad users utilizing macro keyboards.","authors":"Takaaki Watanabe, Toshiyasu Taniguchi","doi":"10.1093/jmicro/dfaf018","DOIUrl":"https://doi.org/10.1093/jmicro/dfaf018","url":null,"abstract":"Mini-abstract: This report presents a semi-automated microscopy system using macro keyboards to streamline workflows. Programming multi-action keys for tasks such as focusing, image capture, and data analysis reduces the manual input, boosting efficiency, and accuracy. This cost-effective solution improves accessibility and usability, supporting diverse imaging applications and broader scientific instrumentation processes. Scientific research relies on microscopy. However, manual image acquisition and analysis are inefficient and susceptible to errors. Fully automated workflows are often task-specific, and current AI-based systems are costly and may face difficulties in new scenarios. Here we introduce a semi-automated system utilizing macro keyboards to streamline workflows. Programming multi-action keys for tasks such as focusing, image capture, and data analysis reduces the manual input, boosting efficiency, and accuracy. This intuitive system saves time for both experienced users and trainees. This cost-effective solution improves accessibility, flexibility, and usability, supporting not only diverse imaging applications but also broader scientific instrumentation processes.","PeriodicalId":74193,"journal":{"name":"Microscopy (Oxford, England)","volume":" ","pages":""},"PeriodicalIF":0.0,"publicationDate":"2025-04-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143774961","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Evaluating accuracy in artificial intelligence-powered serial segmentation for sectional images applied to morphological studies with three-dimensional reconstruction. 评估人工智能驱动的连续分割在三维重建形态学研究中的应用。

Microscopy (Oxford, England) Pub Date : 2025-03-31 DOI: 10.1093/jmicro/dfae054

Satoru Muro, Takuya Ibara, Yuzuki Sugiyama, Akimoto Nimura, Keiichi Akita

{"title":"Evaluating accuracy in artificial intelligence-powered serial segmentation for sectional images applied to morphological studies with three-dimensional reconstruction.","authors":"Satoru Muro, Takuya Ibara, Yuzuki Sugiyama, Akimoto Nimura, Keiichi Akita","doi":"10.1093/jmicro/dfae054","DOIUrl":"10.1093/jmicro/dfae054","url":null,"abstract":"Three-dimensional (3D) reconstruction is time-consuming owing to segmentation work. We evaluated the accuracy of the artificial intelligence (AI)-based segmentation and tracking model SAM-Track for segmentation of anatomical or histological structures and explored the potential of AI to enhance research efficiency. Images [obtained via computed tomography (CT) and magnetic resonance imaging (MRI)], anatomical sections from a Visible Korean Human open resource, and serial histological section images of cadavers were obtained. Six structures in the CT, MRI, and anatomical sections and seven in the histological sections were segmented using SAM-Track and compared with manual segmentation by calculating the Dice similarity coefficient. Segmented images were then reconstructed three dimensionally. The average Dice scores of CT and MRI results varied (0.13-0.83); anatomical sections showed mostly good accuracy (0.31-0.82). Clear-edged structures, such as the femur and liver, had high scores (0.69-0.83). In contrast, soft tissue structures, such as the rectus femoris and stomach, had variable accuracy (0.38-0.82). Histological sections showed high accuracy, especially for well-delineated tissues, such as the tibia and pancreas (0.95, 0.90). However, the tracking of branching structures, such as arteries and veins, was less successful (0.72, 0.52). In 3D reconstruction, high Dice scores were associated with accurate shapes, whereas low scores indicated discrepancies between the predicted and true shapes. AI-based automatic segmentation using SAM-Track provides moderate-to-good accuracy for anatomical and histological structures and is beneficial for conducting morphological studies involving 3D reconstruction.","PeriodicalId":74193,"journal":{"name":"Microscopy (Oxford, England)","volume":" ","pages":"107-116"},"PeriodicalIF":0.0,"publicationDate":"2025-03-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143416503","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Dose-efficient phase-contrast imaging of thick weak phase objects via OBF STEM using a pixelated detector. 利用像素化探测器，通过 OBF STEM 对厚的弱相位物体进行具有剂量效率的相位对比成像。

Microscopy (Oxford, England) Pub Date : 2025-03-31 DOI: 10.1093/jmicro/dfae051

Kousuke Ooe, Takehito Seki, Mitsuru Nogami, Yuichi Ikuhara, Naoya Shibata

{"title":"Dose-efficient phase-contrast imaging of thick weak phase objects via OBF STEM using a pixelated detector.","authors":"Kousuke Ooe, Takehito Seki, Mitsuru Nogami, Yuichi Ikuhara, Naoya Shibata","doi":"10.1093/jmicro/dfae051","DOIUrl":"10.1093/jmicro/dfae051","url":null,"abstract":"Optimum bright-field scanning transmission electron microscopy (OBF STEM) is a recently developed low-dose imaging technique that uses a segmented or pixelated detector. While we previously reported that OBF STEM with a segmented detector has a higher efficiency than conventional STEM techniques such as annular bright field (ABF), the imaging efficiency is expected to be further improved by using a pixelated detector. In this study, we adopted a pixelated detector for the OBF technique and investigated the imaging characteristics. Because OBF imaging is based on the thick weak phase object approximation (tWPOA), a non-zero crystalline sample thickness is considered in addition to the conventional WPOA, where the pixelated OBF method can be regarded as the theoretical extension of single side band (SSB) ptychography. Thus, we compared these two techniques via signal-to-noise ratio transfer functions (SNRTFs), multi-slice image simulations, and experiments, showing how the OBF technique can improve dose efficiency from the conventional WPOA-based ptychographic imaging.","PeriodicalId":74193,"journal":{"name":"Microscopy (Oxford, England)","volume":" ","pages":"98-106"},"PeriodicalIF":0.0,"publicationDate":"2025-03-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC11957251/pdf/","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142591414","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0