Microscopy (Oxford, England)最新文献_第10页

Analyzing the synchronism of stacking-fault formation in side-by-side SiC nanowire pairs using the Levenshtein distance: stochastic versus deterministic processes. 使用Levenstein距离分析并排SiC纳米线对中堆垛层错形成的同步性：随机过程与确定性过程。

Microscopy (Oxford, England) Pub Date : 2023-10-09 DOI: 10.1093/jmicro/dfac073

Fuka Moriuchi, Hideo Kohno

引用次数: 0

Measurement and correction of TEM image distortion using arbitrary samples. 使用任意样本测量和校正TEM图像失真。

Microscopy (Oxford, England) Pub Date : 2023-10-09 DOI: 10.1093/jmicro/dfad015

Hirokazu Tamaki, Koh Saitoh

引用次数: 0

Development of temporal series 4D-STEM and application to relaxation time measurement. 时间序列4D-STEM的发展及其在弛豫时间测量中的应用。

Microscopy (Oxford, England) Pub Date : 2023-10-09 DOI: 10.1093/jmicro/dfad006

Katsuaki Nakazawa, Kazutaka Mitsuishi

引用次数: 2

Correction to: High-resolution and analytical electron microscopy in a liquid flow cell via gas purging. 更正：通过气体吹扫在液体流动池中进行高分辨率和分析电子显微镜检查。

Microscopy (Oxford, England) Pub Date : 2023-10-09 DOI: 10.1093/jmicro/dfad033

引用次数: 0

Super-resolution method for SEM images based on pixelwise weighted loss function. 基于像素加权损失函数的扫描电镜图像超分辨率方法。

Microscopy (Oxford, England) Pub Date : 2023-10-09 DOI: 10.1093/jmicro/dfad009

Akira Ito, Atsushi Miyamoto, Naoaki Kondo, Minoru Harada

引用次数: 0

Edge effect of wide spectrum denoising in super-resolution microscopy. 超分辨率显微镜中宽谱去噪的边缘效应。

Microscopy (Oxford, England) Pub Date : 2023-10-09 DOI: 10.1093/jmicro/dfad012

Tao Cheng, Yingshan Wang

引用次数: 0

Low-aberration ExB deflector optics for scanning electron microscopy. 用于扫描电子显微镜的低像差ExB偏转器光学器件。

Microscopy (Oxford, England) Pub Date : 2023-10-09 DOI: 10.1093/jmicro/dfad001

Momoyo Enyama, Ryuji Nishi, Hiroyuki Ito, Jun Yamasaki

{"title":"Low-aberration ExB deflector optics for scanning electron microscopy.","authors":"Momoyo Enyama, Ryuji Nishi, Hiroyuki Ito, Jun Yamasaki","doi":"10.1093/jmicro/dfad001","DOIUrl":"10.1093/jmicro/dfad001","url":null,"abstract":"To suppress aberrations in the signal electron optics of a scanning electron microscope, we propose ExB deflector (deflector with superimposed electric and magnetic fields) optics that cancel the aberrations generated during large-angle deflection. This improves the resolution of the angle or position of the signal electrons on the sample surface, allowing them to be discriminately detected. The proposed optics consist of two ExB deflectors and a transfer system with two 4-f systems, or systems that have four times the focal length, placed between them. This configuration maintains the symmetry of the electron beam trajectory throughout the transfer system such that aberrations generated by the first ExB deflector are negated by the second. The effect of the proposed optics was confirmed using a ray-tracing simulation of the electron beam, and the aberration was reduced to at most one-tenth of that in the case with only one ExB deflector. Furthermore, as an example, we examined the implementation of the proposed ExB deflector optics to resolve the signal electron angle and found that the sample emission angle range of 80° can be resolved with an angular resolution of 1°. Therefore, the proposed ExB deflector optics can be applied to the signal electron optics of a scanning electron microscope to improve the resolution of the signal electrons.","PeriodicalId":74193,"journal":{"name":"Microscopy (Oxford, England)","volume":" ","pages":"399-407"},"PeriodicalIF":0.0,"publicationDate":"2023-10-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"10520213","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

A specific technique of immunolabelling of urinary small extracellular vesicle biomarkers for the diagnostic of renal cancer. 尿小细胞外囊泡生物标志物免疫标记技术在癌症诊断中的应用。

Microscopy (Oxford, England) Pub Date : 2023-10-09 DOI: 10.1093/jmicro/dfad007

Nora Mallouk, Sisareuth Tan, Claire Scepaniack, Arnauld Garcin, Camille Pradat, Claude Lambert, Guorong Li

{"title":"A specific technique of immunolabelling of urinary small extracellular vesicle biomarkers for the diagnostic of renal cancer.","authors":"Nora Mallouk, Sisareuth Tan, Claire Scepaniack, Arnauld Garcin, Camille Pradat, Claude Lambert, Guorong Li","doi":"10.1093/jmicro/dfad007","DOIUrl":"10.1093/jmicro/dfad007","url":null,"abstract":"Small extracellular vesicles (EVs) are characterized by the membrane expression of CD63, CD81 and CD9 tetraspanins. Their size is inferior to 200 nm. They share the same characteristics as the native cells and are found in human fluids. Specific membrane protein biomarkers expressed on small EV are useful for the diagnosis of tumoural pathologies. Clear cell renal cell carcinoma (CCRCC) is diagnosed by imaging examinations and/or tissue biopsy. Carbonic anhydrase IX (CAIX) is a powerful biomarker of CCRCC. The detection of CAIX on small EV from the urine of patients could constitute a liquid biopsy for CCRCC. We have set up a specific protocol for the preparation, the immunostaining characterization and the transmission electron microscopy observation of small EVs isolated from the urine of CCRCC patients. The background labelling was significantly reduced. We successfully detected biomarkers on urinary small EVs from CCRCC patients. This technique could be extended with antibodies directed against other EV biomarkers for the detection and the monitoring of cancer diseases.","PeriodicalId":74193,"journal":{"name":"Microscopy (Oxford, England)","volume":" ","pages":"450-454"},"PeriodicalIF":0.0,"publicationDate":"2023-10-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"10635788","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Semiautomatic contour tracking method for biological object segmentation in thin-section electron microscope images with modified zero DC component-type Gabor wavelets. 用改进的零直流分量型Gabor小波实现薄切片电子显微镜图像生物目标分割的半自动轮廓跟踪方法。

Microscopy (Oxford, England) Pub Date : 2023-10-09 DOI: 10.1093/jmicro/dfad018

Gen Maeda, Misuzu Baba, Norio Baba

{"title":"Semiautomatic contour tracking method for biological object segmentation in thin-section electron microscope images with modified zero DC component-type Gabor wavelets.","authors":"Gen Maeda, Misuzu Baba, Norio Baba","doi":"10.1093/jmicro/dfad018","DOIUrl":"10.1093/jmicro/dfad018","url":null,"abstract":"In electron microscopic image processing, artificial intelligence (AI) is a powerful method for segmentation. Because creating training data remains time-consuming and burdensome, a simple and accurate segmentation tool, which is effective and does not rely on manual drawings, is necessary to create training data for AI and to support immediate image analysis. A Gabor wavelet-based contour tracking method has been devised as a step toward realizing such a tool. Although many papers on Gabor filter-based and Gabor filter bank-based texture segmentations have been published, previous studies did not apply the Gabor wavelet-based method to straightforwardly detect membrane-like ridges and step edges for segmentation because earlier works used a nonzero DC component-type Gabor wavelets. The DC component has a serious flaw in such detection. Although the DC component can be removed by a formula that satisfies the wavelet theory or by a log-Gabor function, this is not practical for the proposed scheme. Herein, we devised modified zero DC component-type Gabor wavelets. The proposed method can practically confine a wavelet within a small image area. This type of Gabor wavelet can appropriately track various contours of organelles appearing in thin-section transmission electron microscope images prepared by the freeze-substitution fixation method. The proposed method not only more accurately tracks ridge and step edge contours but also tracks pattern boundary contours consisting of slightly different image patterns. Simulations verified these results.","PeriodicalId":74193,"journal":{"name":"Microscopy (Oxford, England)","volume":" ","pages":"433-445"},"PeriodicalIF":0.0,"publicationDate":"2023-10-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"10793985","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Recent advances in in-resin correlative light and electron microscopy of Epon-embedded cells. Epon包埋细胞的树脂相关光学和电子显微镜研究进展。

Microscopy (Oxford, England) Pub Date : 2023-10-09 DOI: 10.1093/jmicro/dfad028

Isei Tanida, Junji Yamaguchi, Chigure Suzuki, Soichiro Kakuta, Yasuo Uchiyama

{"title":"Recent advances in in-resin correlative light and electron microscopy of Epon-embedded cells.","authors":"Isei Tanida, Junji Yamaguchi, Chigure Suzuki, Soichiro Kakuta, Yasuo Uchiyama","doi":"10.1093/jmicro/dfad028","DOIUrl":"10.1093/jmicro/dfad028","url":null,"abstract":"Correlative fluorescent and electron microscopic images of the same section of epoxy (or other polymer)-embedded samples, hereafter referred to as 'in-resin CLEM', have been developed to improve the positional accuracy and Z-axis resolution limitations of conventional correlative light and electron microscopy (CLEM). High-pressure freezing and quick-freezing substitution result in in-resin CLEM of acrylic-based resin-embedded cells expressing green fluorescent protein, yellow fluorescent protein, mVenus and mCherry, which are sensitive to osmium tetroxide. The identification of osmium-resistant fluorescent proteins leads to the development of in-resin CLEM of Epon-embedded cells. Using subtraction-based fluorescence microscopy with a photoconvertible fluorescent protein, mEosEM-E, its green fluorescence can be observed in thin sections of Epon-embedded cells, and two-color in-resin CLEM using mEosEM-E and mScarlet-H can be performed. Green fluorescent proteins, CoGFP variant 0 and mWasabi, and far-red fluorescent proteins, mCherry2 and mKate2, are available for in-resin CLEM of Epon-embedded cells using the standard procedure for Epon-embedding with additional incubation. Proximity labeling is applied to in-resin CLEM to overcome the limitations of fluorescent proteins in epoxy resin. These approaches will contribute significantly to the future of CLEM analysis.","PeriodicalId":74193,"journal":{"name":"Microscopy (Oxford, England)","volume":" ","pages":"383-387"},"PeriodicalIF":0.0,"publicationDate":"2023-10-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"9875681","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 1