Microscopy (Oxford, England)最新文献_第10页

Evaluating the roughness dynamics of kefir biofilms grown on Amazon cupuaçu juice: a monofractal and multifractal approach. 评估生长在亚马逊丘比特果汁上的克菲尔生物膜的粗糙度动态：单分形和多分形方法。

Microscopy (Oxford, England) Pub Date : 2024-02-07 DOI: 10.1093/jmicro/dfad040

Robert S Matos, Erveton P Pinto, Marcelo A Pires, Glenda Q Ramos, Ştefan Ţălu, Lucas S Lima, Henrique D da Fonseca Filho

{"title":"Evaluating the roughness dynamics of kefir biofilms grown on Amazon cupuaçu juice: a monofractal and multifractal approach.","authors":"Robert S Matos, Erveton P Pinto, Marcelo A Pires, Glenda Q Ramos, Ştefan Ţălu, Lucas S Lima, Henrique D da Fonseca Filho","doi":"10.1093/jmicro/dfad040","DOIUrl":"10.1093/jmicro/dfad040","url":null,"abstract":"We conducted a comprehensive analysis of the surface microtexture of kefir biofilms grown on Theobroma grandiflorum Shum (cupuaçu) juice using atomic force microscopy. Our goal was to investigate the unique monofractal and multifractal spatial patterns of these biofilms to complement the existing limited literature. The biofilms were prepared dispersing four different concentrations of kefir grains in cupuaçu juice. Our morphological analysis showed that the surface of the obtained biofilms is essentially formed by the presence of cupuaçu fibers and microorganisms like lactobacilli and yeast. The topographic height-based parameter analysis reveals that there is a dependence between surface roughness and the concentration of kefir grains used. The strongly anisotropic well-centralized topographical height distribution of the biofilms also exhibited a quasi-symmetrical and platykurtic pattern. The biofilms exhibit comparable levels of spatial complexity, surface percolation and surface homogeneity, which can be attributed to their similar topographic uniformity. This aspect was further supported by the presence of similar multifractality in the biofilms, suggesting that despite their varying topographic roughness, their vertical growth dynamics follow a similar pattern. Our findings demonstrate that the surface roughness of kefir biofilms cultivated on cupuaçu juice is influenced by the concentration of kefir grains in the precursor solution. However, this dependence follows a consistent pattern across different concentrations. Graphical Abstract.","PeriodicalId":74193,"journal":{"name":"Microscopy (Oxford, England)","volume":" ","pages":"55-65"},"PeriodicalIF":0.0,"publicationDate":"2024-02-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"9937529","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Prediction of secondary electron yield for metal materials using deep learning. 利用深度学习预测金属材料的二次电子产量。

Microscopy (Oxford, England) Pub Date : 2024-02-07 DOI: 10.1093/jmicro/dfad034

Masahiro Kusumi, Bunta Inoue, Yoshihiko Hirai, Masaaki Yasuda

引用次数: 0

Enhancing performance of electron holography with mathematical and machine learning-based denoising techniques. 利用基于数学和机器学习的去噪技术增强电子全息术的性能。

Microscopy (Oxford, England) Pub Date : 2023-11-24 DOI: 10.1093/jmicro/dfad037

Satoshi Anada, Yuki Nomura, Kazuo Yamamoto

{"title":"Enhancing performance of electron holography with mathematical and machine learning-based denoising techniques.","authors":"Satoshi Anada, Yuki Nomura, Kazuo Yamamoto","doi":"10.1093/jmicro/dfad037","DOIUrl":"10.1093/jmicro/dfad037","url":null,"abstract":"Electron holography is a useful tool for analyzing functional properties, such as electromagnetic fields and strains of materials and devices. The performance of electron holography is limited by the 'shot noise' inherent in electron micrographs (holograms), which are composed of a finite number of electrons. A promising approach for addressing this issue is to use mathematical and machine learning-based image-processing techniques for hologram denoising. With the advancement of information science, denoising methods have become capable of extracting signals that are completely buried in noise, and they are being applied to electron microscopy, including electron holography. However, these advanced denoising methods are complex and have many parameters to be tuned; therefore, it is necessary to understand their principles in depth and use them carefully. Herein, we present an overview of the principles and usage of sparse coding, the wavelet hidden Markov model and tensor decomposition, which have been applied to electron holography. We also present evaluation results for the denoising performance of these methods obtained through their application to simulated and experimentally recorded holograms. Our analysis, review and comparison of the methods clarify the impact of denoising on electron holography research.","PeriodicalId":74193,"journal":{"name":"Microscopy (Oxford, England)","volume":" ","pages":"461-484"},"PeriodicalIF":0.0,"publicationDate":"2023-11-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"10143776","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

A preparation of bacterial outer membrane with osmium tetroxide and uranyl acetate co-stain enables improved structural determination by transmission electron microscopy. 用四氧化锇和醋酸铀酰共染色剂制备细菌外膜，改进了透射电子显微镜的结构测定。

Microscopy (Oxford, England) Pub Date : 2023-11-24 DOI: 10.1093/jmicro/dfad027

Aadil Sheikh, Bernd Zechmann, Christie M Sayes, Joseph H Taube, K Leigh Greathouse

引用次数: 0

A novel embedding composition for the evaluation of the internal structure of carbon materials using electron microscopy. 一种用电子显微镜评价碳材料内部结构的新型包埋组合物。

Microscopy (Oxford, England) Pub Date : 2023-11-24 DOI: 10.1093/jmicro/dfad020

Tsukaho Yahagi

引用次数: 0

High-resolution and analytical electron microscopy in a liquid flow cell via gas purging. 高分辨率和分析电子显微镜在液体流动电池通过气体净化。

Microscopy (Oxford, England) Pub Date : 2023-11-24 DOI: 10.1093/jmicro/dfad023

Yevheniy Pivak, Junbeom Park, Shibabrata Basak, Rüdiger-Albert Eichel, Anne Beker, Alejandro Rozene, Héctor Hugo Pérez Garza, Hongyu Sun

引用次数: 0

Using a novel CLEM system to localize lipid droplets and membranes in desiccated embryonic axis cells of soybean seeds. 利用新型CLEM系统定位大豆种子干燥胚轴细胞的脂滴和膜。

Microscopy (Oxford, England) Pub Date : 2023-11-24 DOI: 10.1093/jmicro/dfad017

Salma Khanam, Takayuki Funatsu, Koji Tanaka, Yasuko Kaneko

引用次数: 0

Low-dose measurement of electric potential distribution in organic light-emitting diode by phase-shifting electron holography with 3D tensor decomposition. 用三维张量分解相移电子全息法测量有机发光二极管的低剂量电位分布。

Microscopy (Oxford, England) Pub Date : 2023-11-24 DOI: 10.1093/jmicro/dfad019

Yusei Sasaki, Kazuo Yamamoto, Satoshi Anada, Noriyuki Yoshimoto

{"title":"Low-dose measurement of electric potential distribution in organic light-emitting diode by phase-shifting electron holography with 3D tensor decomposition.","authors":"Yusei Sasaki, Kazuo Yamamoto, Satoshi Anada, Noriyuki Yoshimoto","doi":"10.1093/jmicro/dfad019","DOIUrl":"10.1093/jmicro/dfad019","url":null,"abstract":"To improve the performance of organic light-emitting diodes (OLEDs), it is essential to understand and control the electric potential in the organic semiconductor layers. Electron holography (EH) is a powerful technique for visualizing the potential distribution with a transmission electron microscope. However, it has a serious issue that high-energy electrons may damage the organic layers, meaning that a low-dose EH is required. Here, we used a machine learning technique, three-dimensional (3D) tensor decomposition, to denoise electron interference patterns (holograms) of bilayer OLEDs composed of N,N'-di-[(1-naphthyl)-N,N'-diphenyl]-(1,1'-biphenyl)-4,4'-diamine (α-NPD) and tris-(8-hydroxyquinoline)aluminum (Alq3), acquired under a low-dose rate of 130 e- nm-2 s-1. The effect of denoising on the phase images reconstructed from the holograms was evaluated in terms of both the phase measurement error and the peak signal-to-noise ratio. We achieved a precision equivalent to that of a conventional measurement that had an exposure time 60 times longer. The electric field within the Alq3 layer decreased as the cumulative dose increased, which indicates that the Alq3 layer was degraded by the electron irradiation. On the basis of the degradation of the electric field, we concluded that the tolerance dose without damaging the OLED sample is about 1.7 × 105 e- nm-2, which is about 0.6 times that of the conventional EH. The combination of EH and 3D tensor decomposition denoising is capable of making a time series measurement of an OLED sample without any effect from the electron irradiation.","PeriodicalId":74193,"journal":{"name":"Microscopy (Oxford, England)","volume":" ","pages":"485-493"},"PeriodicalIF":0.0,"publicationDate":"2023-11-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"10783859","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

In situ pulsed electrical biasing TEM observation of AA7075. AA7075原位脉冲电偏置透射电镜观察。

Microscopy (Oxford, England) Pub Date : 2023-11-24 DOI: 10.1093/jmicro/dfad025

Tyler J Grimm, Laine Mears

引用次数: 0

Analyzing the synchronism of stacking-fault formation in side-by-side SiC nanowire pairs using the Levenshtein distance: stochastic versus deterministic processes. 使用Levenstein距离分析并排SiC纳米线对中堆垛层错形成的同步性：随机过程与确定性过程。

Microscopy (Oxford, England) Pub Date : 2023-10-09 DOI: 10.1093/jmicro/dfac073

Fuka Moriuchi, Hideo Kohno

引用次数: 0