Microscopy (Oxford, England)最新文献

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A strategy for dose-efficient atomic-resolution OBF-STEM imaging of zeolites. 沸石的剂量高效原子分辨率OBF-STEM成像策略。
IF 1.9
Microscopy (Oxford, England) Pub Date : 2026-04-28 DOI: 10.1093/jmicro/dfag024
Kousuke Ooe, Takehito Seki, Kaname Yoshida, Yuji Kohno, Yuichi Ikuhara, Naoya Shibata
{"title":"A strategy for dose-efficient atomic-resolution OBF-STEM imaging of zeolites.","authors":"Kousuke Ooe, Takehito Seki, Kaname Yoshida, Yuji Kohno, Yuichi Ikuhara, Naoya Shibata","doi":"10.1093/jmicro/dfag024","DOIUrl":"https://doi.org/10.1093/jmicro/dfag024","url":null,"abstract":"<p><p>Observation of beam-sensitive materials in scanning transmission electron microscopy (STEM) requires not only the development of highly dose-efficient imaging techniques but also the selection of appropriate imaging conditions such as the raster-scan sampling rate and optical parameters to realise a low-dose condition effectively. In this study, the convergence angle, sampling rates, and electron dose dependencies of the signal-to-noise ratio in optimum bright-field (OBF) STEM, a recently developed dose-efficient STEM imaging method, are investigated, which guides us in choosing optimal conditions to observe beam-sensitive porous materials such as zeolites. The parameters necessary for real-time OBF imaging are also considered towards practical live imaging at low dose. Experimental atomic-resolution OBF STEM observations of zeolites are then demonstrated using the strategy investigated above.</p>","PeriodicalId":74193,"journal":{"name":"Microscopy (Oxford, England)","volume":" ","pages":""},"PeriodicalIF":1.9,"publicationDate":"2026-04-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"147791363","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Low‑Damage Thinning of Polymer Specimens for Transmission Electron Microscopy by Gas Cluster Ion Beam Irradiation. 气体束离子束辐照用于透射电子显微镜的聚合物样品的低损伤减薄。
IF 1.9
Microscopy (Oxford, England) Pub Date : 2026-04-16 DOI: 10.1093/jmicro/dfag023
Shin Inamoto, Akiyo Yoshida, Mayumi Oto, Kazuhiro Matsuda, Yuji Otsuka
{"title":"Low‑Damage Thinning of Polymer Specimens for Transmission Electron Microscopy by Gas Cluster Ion Beam Irradiation.","authors":"Shin Inamoto, Akiyo Yoshida, Mayumi Oto, Kazuhiro Matsuda, Yuji Otsuka","doi":"10.1093/jmicro/dfag023","DOIUrl":"https://doi.org/10.1093/jmicro/dfag023","url":null,"abstract":"<p><p>Focused ion beam (FIB) processing is widely used for preparing transmission electron microscopy (TEM) specimens of polymer materials. However, it often introduces damaged layers that hinder structural analysis. In this study, we demonstrate the effectiveness of gas cluster ion beam (GCIB) irradiation in reducing such damaged layers in polyethylene (PE) extracted from a PE/polyamide (PA) multilayer film, used here as a representative single-component polymer. GCIB treatment successfully removed the FIB-induced damaged layers and enabled access by ruthenium tetroxide (RuO4), which allowed clear visualization of the lamellar structure in PE. Electron tomography confirmed that GCIB not only eliminated damaged layers but also thinned the specimen. These findings suggest that GCIB is a promising technique for preparing ultra-thin, low-damage TEM specimens of polymer materials and can facilitate more accurate structural and chemical analyses.</p>","PeriodicalId":74193,"journal":{"name":"Microscopy (Oxford, England)","volume":" ","pages":""},"PeriodicalIF":1.9,"publicationDate":"2026-04-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"147700896","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Wide-Field Montage on Transmission Electron Microscopy via Network Tele-Microscopy Enables Quantitative Analysis of Mouse Olfactory Bulb Neural Circuits. 通过网络远程显微镜对透射电子显微镜进行宽视场蒙太奇,可以对小鼠嗅球神经回路进行定量分析。
IF 1.9
Microscopy (Oxford, England) Pub Date : 2026-04-13 DOI: 10.1093/jmicro/dfag022
Haruyo Yamanishi, Emi Kiyokage, Satoshi Ichikawa, Kaoru Mitsuoka, Kazunori Toida
{"title":"Wide-Field Montage on Transmission Electron Microscopy via Network Tele-Microscopy Enables Quantitative Analysis of Mouse Olfactory Bulb Neural Circuits.","authors":"Haruyo Yamanishi, Emi Kiyokage, Satoshi Ichikawa, Kaoru Mitsuoka, Kazunori Toida","doi":"10.1093/jmicro/dfag022","DOIUrl":"https://doi.org/10.1093/jmicro/dfag022","url":null,"abstract":"<p><p>Transmission electron microscopy (TEM) provides nanometer-scale resolution, which is essential for ultrastructural analysis of biological tissue. However, its application for large tissue areas is limited by a restricted field of view and observer-dependent sampling. In this study, we present a workflow that combines wide-field montage TEM-via \"network tele-microscopy\"-with correlative light and electron microscopy to enable large-area ultrastructural analysis while preserving synapse-level resolution. We demonstrate this approach in the glomerular layer and tyrosine hydroxylase-positive neurons in mouse olfactory bulb glomeruli, which exhibit dense, heterogeneous synaptic organization. Light and confocal laser scanning microscopy was first used for orientation in regions of interest, allowing the generation of continuous wide-field montage TEM datasets. This approach allowed systematic identification and quantification of synapses across an entire glomerulus while maintaining spatial relationships among ultrastructural elements. This study demonstrates a technically feasible platform for the development of TEM and the future integration of network tele-microscopy with computational methods.</p>","PeriodicalId":74193,"journal":{"name":"Microscopy (Oxford, England)","volume":" ","pages":""},"PeriodicalIF":1.9,"publicationDate":"2026-04-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"147679155","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Fluorescent protein-based probe architecture modulates rotational and translational diffusion readouts in polarization-dependent fluorescence correlation spectroscopy. 荧光蛋白为基础的探针结构调节旋转和平移扩散读数在偏振依赖的荧光相关光谱。
IF 1.9
Microscopy (Oxford, England) Pub Date : 2026-04-06 DOI: 10.1093/jmicro/dfag021
Miho Hanaoka, Kenta Saito, Masahiko Kawagishi, Johtaro Yamamoto, Nori Nakai, Minori Iida, Keisuke Sato, Makoto Nakakido, Satoru Nagatoishi, Kouhei Tsumoto, Masataka Kinjo, Sumio Terada
{"title":"Fluorescent protein-based probe architecture modulates rotational and translational diffusion readouts in polarization-dependent fluorescence correlation spectroscopy.","authors":"Miho Hanaoka, Kenta Saito, Masahiko Kawagishi, Johtaro Yamamoto, Nori Nakai, Minori Iida, Keisuke Sato, Makoto Nakakido, Satoru Nagatoishi, Kouhei Tsumoto, Masataka Kinjo, Sumio Terada","doi":"10.1093/jmicro/dfag021","DOIUrl":"https://doi.org/10.1093/jmicro/dfag021","url":null,"abstract":"<p><p>We systematically engineered fluorescent protein-nanobody probes with different coupling rigidities and binding geometries to specific targets and analyzed the diffusion properties of their complexes by polarization-dependent fluorescence correlation spectroscopy (Pol-FCS). The results demonstrate that probe architecture critically affects Pol-FCS readouts, suggesting practical design principles for structure-sensitive probes. Polarization-dependent fluorescence correlation spectroscopy (Pol-FCS) simultaneously measures translational and rotational diffusion of fluorescently labeled molecules and provides information on molecular size and shape. Rotational diffusion is, in principle, expected to provide even higher sensitivity than translational diffusion, which is routinely used in conventional FCS to detect binding of fluorescent protein (FP)-fused binders to their targets. However, when FPs are fused to binders via flexible linkers, local wobbling of the FP can decouple its rotational diffusion from that of the binding complex. Quantitative evaluation of this decoupling effect remains lacking. Here, leveraging our expertise from polarization-dependent orientation probes, POLArIS, we designed and compared two classes of probes, termed \"Rigid\" and \"Flex,\" that differ in how tightly the FP is linked to the anti-ALFAtag nanobody, to evaluate how probe architecture affects Pol-FCS readouts. Using ALFAtag and the rod-like repeat protein DHR10 as a structurally anisotropic binding target, we varied probe binding geometry while keeping molecular weight nearly constant and measured rotational and translational diffusion. Flex probes exhibited shorter rotational diffusion times than Rigid probes when bound to the same targets, consistent with the expected local reorientation. Notably, translational diffusion times also showed architecture-dependent differences between Rigid and Flex probes. These results demonstrate that probe architecture is a key determinant of diffusion readouts in FP-based Pol-FCS and suggest practical probe design principles for sensitive reporters of intermolecular binding accompanied by changes in complex shape.</p>","PeriodicalId":74193,"journal":{"name":"Microscopy (Oxford, England)","volume":" ","pages":""},"PeriodicalIF":1.9,"publicationDate":"2026-04-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"147640825","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Rigorous Computation of High-Order Aberrations and Their Errors. 高阶像差及其误差的严格计算。
IF 1.9
Microscopy (Oxford, England) Pub Date : 2026-04-03 DOI: 10.1093/jmicro/dfag019
Kyoko Makino, Martin Berz
{"title":"Rigorous Computation of High-Order Aberrations and Their Errors.","authors":"Kyoko Makino, Martin Berz","doi":"10.1093/jmicro/dfag019","DOIUrl":"https://doi.org/10.1093/jmicro/dfag019","url":null,"abstract":"<p><p>High-order transfer maps offer many advantages in the study of both singlepass systems, where they represent optical aberrations, and multipass systems, where they allow the direct computation of relevant properties like high-order dispersions, chromaticities, and amplitude- and parameter dependent tune shifts. However, one remaining question is always how accurate a map of a given expansion order really is-while in many cases, the sizes of high order contributions decrease as a function of order, this does not always have to be the case. To address these topics, we present methods to determine mathematically rigorous bounds on all missing orders beyond the one explicitly considered. The computational effort to determine these bounds is small compared to the cost of the underlying high-order transfer map computation. Furthermore, the method allows for rigorous step size control in the DA-based (Differential Algebra) integration of high order transfer maps.</p>","PeriodicalId":74193,"journal":{"name":"Microscopy (Oxford, England)","volume":" ","pages":""},"PeriodicalIF":1.9,"publicationDate":"2026-04-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"147619102","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Special issue: advanced spectroscopy in electron microscopy. 特刊:电子显微镜中的高级光谱学。
IF 1.9
Microscopy (Oxford, England) Pub Date : 2026-04-01 DOI: 10.1093/jmicro/dfag011
Mitsutaka Haruta, Hikaru Saito
{"title":"Special issue: advanced spectroscopy in electron microscopy.","authors":"Mitsutaka Haruta, Hikaru Saito","doi":"10.1093/jmicro/dfag011","DOIUrl":"https://doi.org/10.1093/jmicro/dfag011","url":null,"abstract":"","PeriodicalId":74193,"journal":{"name":"Microscopy (Oxford, England)","volume":"75 2","pages":"75"},"PeriodicalIF":1.9,"publicationDate":"2026-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"147663442","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Probing the effective mass and fermi velocity of charges by momentum-resolved electron energy loss spectroscopy. 动量分辨电子能量损失谱探测电荷的有效质量和费米速度。
IF 1.9
Microscopy (Oxford, England) Pub Date : 2026-04-01 DOI: 10.1093/jmicro/dfag007
Chih-Ying Huang, Somboon Fongchaiya, Chen-Yu Hung, Ta-Lei Chou, Ssu-Yen Huang, Chao-Sung Lin, Chun-Wei Chen, Mason Klemm, Sijie Xu, Bin Gao, Pengcheng Dai, Ming-Wen Chu
{"title":"Probing the effective mass and fermi velocity of charges by momentum-resolved electron energy loss spectroscopy.","authors":"Chih-Ying Huang, Somboon Fongchaiya, Chen-Yu Hung, Ta-Lei Chou, Ssu-Yen Huang, Chao-Sung Lin, Chun-Wei Chen, Mason Klemm, Sijie Xu, Bin Gao, Pengcheng Dai, Ming-Wen Chu","doi":"10.1093/jmicro/dfag007","DOIUrl":"10.1093/jmicro/dfag007","url":null,"abstract":"<p><p>The effective mass (m*) and Fermi velocity (vF) are two fundamental gauges of the electronic properties of materials and conventionally measured by magnetotransport characterizations. In this Review, we introduce momentum(q)-resolved electron energy loss spectroscopy (q-EELS) as an alternative method for probing m* and vF, and demonstrate its applications in semiconductor Si and semimetal FeGe. The q-EELS methodology is based on the q-dependent plasmon dispersion in the context of the random-phase approximation (RPA) for a free-electron gas (FEG), featuring a quantitative dependence on m* and vF and thus providing the route for retrieving these parameters. We outline the experimental principles for characterizing plasmon dispersions from the optical light line (the order of 10-3 Å-1) to Brillouin-zone boundaries (the order of Å-1), and elucidate the theoretical framework for pertinent elaborations on m* and vF. This work provides both the conceptual and practical guidelines for employing the q-EELS to extract m* and vF of fundamental significances to electronic characteristics of matters.</p>","PeriodicalId":74193,"journal":{"name":"Microscopy (Oxford, England)","volume":" ","pages":"157-163"},"PeriodicalIF":1.9,"publicationDate":"2026-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"146208066","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Cathodoluminescence, light injection and EELS in STEM: from comparative to coincidence experiments. STEM中的阴极发光、光注入与EELS:从比较实验到重合实验。
IF 1.9
Microscopy (Oxford, England) Pub Date : 2026-04-01 DOI: 10.1093/jmicro/dfaf047
Luiz H G Tizei, Yves Auad, Florian Castioni, Mathieu Kociak
{"title":"Cathodoluminescence, light injection and EELS in STEM: from comparative to coincidence experiments.","authors":"Luiz H G Tizei, Yves Auad, Florian Castioni, Mathieu Kociak","doi":"10.1093/jmicro/dfaf047","DOIUrl":"10.1093/jmicro/dfaf047","url":null,"abstract":"<p><p>Electron spectroscopy implemented in electron microscopes provides high spatial resolution, down to the atomic scale, of the chemical, electronic, vibrational and optical properties of materials. In this review, we will describe how temporal coincidence experiments in the nanosecond to femtosecond range between different electron spectroscopies involving photons, inelastic electrons and secondary electrons can provide information bits not accessible to independent spectroscopies. In particular, we will focus on nano-optics applications. The instrumental modifications necessary for these experiments are discussed, as well as the perspectives for these coincidence techniques.</p>","PeriodicalId":74193,"journal":{"name":"Microscopy (Oxford, England)","volume":" ","pages":"129-144"},"PeriodicalIF":1.9,"publicationDate":"2026-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145379982","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Analysis of photo-functional materials using momentum-resolved EELS. 利用动量分辨EELS分析光功能材料。
IF 1.9
Microscopy (Oxford, England) Pub Date : 2026-04-01 DOI: 10.1093/jmicro/dfag006
Yohei K Sato
{"title":"Analysis of photo-functional materials using momentum-resolved EELS.","authors":"Yohei K Sato","doi":"10.1093/jmicro/dfag006","DOIUrl":"10.1093/jmicro/dfag006","url":null,"abstract":"<p><p>Momentum transfer (q)-resolved electron energy-loss spectroscopy (q-EELS) is a powerful tool for analyzing photo-functional materials. The technique's application has been demonstrated in several recent studies. This study first investigated the anisotropic plasmon oscillations in Cs-doped hexagonal WO3, a near-infrared (NIR) shielding material, to understand the origin of its highly efficient light-scattering properties. This revealed how plasmon energies differ along different crystallographic directions, contributing to the broad NIR absorption capabilities of the material. Second, the study measured the q dispersion of carrier plasmons and thus quantified interactions (exchange-correlation effect) between carrier electrons in LaB6 crystals, another NIR shielding filter. This analysis provides critical insights into many-body effects not captured by the ideal free-electron gas model. Finally, the spatial spread sizes of excitons in anatase TiO2 were determined, establishing a correlation between the exciton size and the anisotropic photocatalytic activity of anatase TiO2. Collectively, this research demonstrates that q-EELS provides unique, q-dependent information on electronic excitations, deepening our understanding of the properties governing the performance of advanced materials.</p>","PeriodicalId":74193,"journal":{"name":"Microscopy (Oxford, England)","volume":" ","pages":"116-128"},"PeriodicalIF":1.9,"publicationDate":"2026-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC13069902/pdf/","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"146196334","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
EELS of phonons: polarity and temperature dependence. 声子的EELS:极性和温度依赖性。
IF 1.9
Microscopy (Oxford, England) Pub Date : 2026-04-01 DOI: 10.1093/jmicro/dfaf055
Jun Kikkawa
{"title":"EELS of phonons: polarity and temperature dependence.","authors":"Jun Kikkawa","doi":"10.1093/jmicro/dfaf055","DOIUrl":"10.1093/jmicro/dfaf055","url":null,"abstract":"<p><p>This paper provides an overview of phonon measurement using electron energy loss spectroscopy (EELS) in the electron microscope, with polar cubic boron nitride (c-BN) and nonpolar diamond crystals as representative examples. Differential scattering cross-sections for phonon creation and annihilation are reviewed, highlighting the influence of crystal polarity under kinematical and dynamical scattering conditions. The temperature dependence of EELS intensity is examined, with local absolute temperature evaluated by analyzing the ratio of phonon annihilation to creation intensities. Practical aspects and challenges associated with phonon measurement in EELS are also discussed, together with future perspectives in this evolving field.</p>","PeriodicalId":74193,"journal":{"name":"Microscopy (Oxford, England)","volume":" ","pages":"103-115"},"PeriodicalIF":1.9,"publicationDate":"2026-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145806652","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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