Microscopy (Oxford, England)最新文献_第2页

Biomedical application of organosilica nanoparticles. 有机二氧化硅纳米颗粒的生物医学应用。

Microscopy (Oxford, England) Pub Date : 2025-06-09 DOI: 10.1093/jmicro/dfaf030

Vikas Shukla, Junna Nakamura, Tomohiro Haruta, Michihiro Nakamura

引用次数: 0

Electron microscopy studies on interfacial solid-state reactions induced by electronic excitation. 电子激发诱导界面固相反应的电镜研究。

Microscopy (Oxford, England) Pub Date : 2025-06-05 DOI: 10.1093/jmicro/dfaf029

Kazuhisa Sato

{"title":"Electron microscopy studies on interfacial solid-state reactions induced by electronic excitation.","authors":"Kazuhisa Sato","doi":"10.1093/jmicro/dfaf029","DOIUrl":"https://doi.org/10.1093/jmicro/dfaf029","url":null,"abstract":"We have studied the effects of electron irradiation on Pt/a-SiOx thin films by transmission electron microscopy and electron diffraction. Pt2Si was formed by 75 keV electron irradiation at 298 K and 90 K. Such a low temperature synthesis of Pt2Si can be attributed to the dissociation of a-SiOx induced by electronic excitation; Si-O bonds dissociate through Auger decay of core-holes generated by electronic excitation, and then, dissociated Si atoms form Pt-Si bonds. The morphology of Pt islands extensively changed during Pt2Si formation even at 90 K. Coalescence and growth of metallic particles are not due to thermal effects during electron irradiation but to athermal processes accompanied by silicide formation. To maintain the reaction interface between metallic particles and the dissociated Si atoms by electronic excitation, a considerable concomitant morphology change occurs. Similarly, Fe2Si was synthesized by using the same technique. In this way, we have demonstrated a versatile method for selectively forming nanoscale metal silicides in electron irradiated areas at room temperature. We also propose a new mechanism for crystallization of amorphous alloys which is mediated by additional solute atoms produced by electronic excitation. Crystallization of amorphous Pd-Si alloy thin films can be realized by 75 keV electron irradiation at 90 K via the electronic excitation, where both knock-on damage and a possible thermal crystallization can be excluded. Supply of dissociated Si to the Pd-Si layer may cause instability of the amorphous phase, which serves as the trigger for the remarkable structural change; ie, additional solute atom mediated crystallization.","PeriodicalId":74193,"journal":{"name":"Microscopy (Oxford, England)","volume":" ","pages":""},"PeriodicalIF":0.0,"publicationDate":"2025-06-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144236130","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Expanding the potential of paraffin section studies using NanoSuit-correlative light and electron microscopy. 利用纳米光镜和电子显微镜扩大石蜡切片研究的潜力。

Microscopy (Oxford, England) Pub Date : 2025-05-29 DOI: 10.1093/jmicro/dfaf028

Hideya Kawasaki

{"title":"Expanding the potential of paraffin section studies using NanoSuit-correlative light and electron microscopy.","authors":"Hideya Kawasaki","doi":"10.1093/jmicro/dfaf028","DOIUrl":"https://doi.org/10.1093/jmicro/dfaf028","url":null,"abstract":"Histological examination using optical microscopy is essential in life sciences and diagnostic medicine, particularly for formalin-fixed paraffin-embedded (FFPE) tissue sections stained with hematoxylin and eosin or 3,3'-diaminobenzidine. However, conventional electron microscopy faces challenges, such as sample destruction, complex processing, and difficulty in correlating light and electron microscopy images. The NanoSuit method overcomes these limitations by forming an ultrathin protective membrane that enhances conductivity and preserves hydrated tissue architecture, enabling high-resolution scanning electron microscopy imaging. In this study, we applied NanoSuit-correlative light and electron microscopy (CLEM) to FFPE sections to assess its potential for non-destructive and reversible electron microscopy characterization. Using NanoSuit-CLEM, we successfully visualized endothelial structures, amyloid deposits, sarcomeres, mitochondria, bacteria, viruses, and foreign body deposits in FFPE sections. Energy-dispersive X-ray spectrometry further facilitated elemental analysis of foreign materials. These findings demonstrate that NanoSuit-CLEM allows for the precise visualization of ultrastructural details in FFPE sections without requiring new equipment. This method holds promise for advancing pathology by improving diagnostic accuracy and enabling multimodal tissue analysis.","PeriodicalId":74193,"journal":{"name":"Microscopy (Oxford, England)","volume":" ","pages":""},"PeriodicalIF":0.0,"publicationDate":"2025-05-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144183011","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Characterization of the INTPIX4 SOI pixel detector in transmission electron microscopy at 120 keV and 200 keV. 120kev和200kev下INTPIX4 SOI像素探测器的透射电镜表征。

Microscopy (Oxford, England) Pub Date : 2025-05-29 DOI: 10.1093/jmicro/dfaf027

Yuichi Ishida, Takafumi Ishida, Makoto Kuwahara, Yasuo Arai, Koh Saitoh

引用次数: 0

Auto-thresholding for Unbiased Electron Counting. 无偏电子计数的自动阈值。

Microscopy (Oxford, England) Pub Date : 2025-05-19 DOI: 10.1093/jmicro/dfaf025

Julie Marie Bekkevold, Jonathan J P Peters, Ryo Ishikawa, Naoya Shibata, Lewys Jones

{"title":"Auto-thresholding for Unbiased Electron Counting.","authors":"Julie Marie Bekkevold, Jonathan J P Peters, Ryo Ishikawa, Naoya Shibata, Lewys Jones","doi":"10.1093/jmicro/dfaf025","DOIUrl":"https://doi.org/10.1093/jmicro/dfaf025","url":null,"abstract":"As interest in fast real-space frame-rate scanning transmission electron microscopy for both structural and functional characterisation of materials increases, so does the need for precise and fast electron detection techniques. Electron counting, with monolithic, segmented, or 4D detectors, has been explored for many years. Recent studies have shown that a retrofittable signal digitiser for a monolithic or segmented detector can be a sustainable and accessible way to enhance the performance of existing detectors, especially for imaging at fast scan speeds. Since such signal digitisation uses a threshold on the gradient of the detector signal to identify electron events, appropriate threshold choice is key. Previously, this threshold has been set manually by the operator and is therefore inherently susceptible to human bias. In this work, we introduce an auto-thresholding approach for electron counting to determine the optimal threshold by maximising the difference in identified counts from a stream with real electron events and a stream with only noise. This leads to easier operation, increased throughput and eliminates human bias in signal digitisation.","PeriodicalId":74193,"journal":{"name":"Microscopy (Oxford, England)","volume":" ","pages":""},"PeriodicalIF":0.0,"publicationDate":"2025-05-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144103296","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Ultra-low-voltage observation of battery materials by scanning electron microscopy. 电池材料的超低电压扫描电镜观察。

Microscopy (Oxford, England) Pub Date : 2025-05-16 DOI: 10.1093/jmicro/dfaf024

Yoichiro Hashimoto, Yutaka Nagaoka, Toru Aiso, Shuhei Yabu, Masahiro Sasajima

{"title":"Ultra-low-voltage observation of battery materials by scanning electron microscopy.","authors":"Yoichiro Hashimoto, Yutaka Nagaoka, Toru Aiso, Shuhei Yabu, Masahiro Sasajima","doi":"10.1093/jmicro/dfaf024","DOIUrl":"https://doi.org/10.1093/jmicro/dfaf024","url":null,"abstract":"The mechanism of voltage contrast formation under ultra-low landing energy condition is discussed, by which a binder contained in lithium-ion battery anode material has been visualized with high contrast. Since the anode material is a complex experimental system with multiple contrast formation factors, a standard sample simulating it was fabricated for simplification. The binder was observed darker than the substrate at landing energies of 30 eV to 50 eV. The binder exhibited a distinct appearance reflecting its shape (in the 3D-particle mode) at 20 eV. The mirroring phenomenon occurred at 10 eV, in which the primary electrons bounced off the sample before irradiating on the surface. The surface potential at the electron beam irradiation moment was presumed to affect the contrast formation, but direct measurement of it was difficult. Thus, the sample was transferred to an AFM without exposure to the atmosphere to measure the \"residual\" potential of the binder in KPFM mode after the SEM observations. Under darker binder observed conditions of 30 eV to 50 eV, KPFM measured residual potential was positive relative to the substrate. Under conditions of the 3D-particle mode at 20 eV and the mirroring phenomenon at 10 eV, the residual potentials were negative. Therefore, a correlation between the behavior of the voltage contrast and the residual potential was obtained. Finer landing-energy step measurement revealed hysteresis responses of voltage contrast and the residual potential to the landing energy. The Cause of the hysteresis was discussed. The mechanism of voltage contrast formation under ultra-low landing energy condition is discussed, by which a binder contained in lithium-ion battery material has been visualized with high contrast. We confirmed that the contrast change is caused by the surface potential change depending on the landing energy of the primary electron.","PeriodicalId":74193,"journal":{"name":"Microscopy (Oxford, England)","volume":" ","pages":""},"PeriodicalIF":0.0,"publicationDate":"2025-05-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144082601","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Discovery of Golgi Membrane-associated Degradation Pathway, GOMED: A Focus on 15 Years of Ultrastructural Analyses. 高尔基膜相关降解途径的发现，GOMED：聚焦于15年的超微结构分析。

Microscopy (Oxford, England) Pub Date : 2025-05-13 DOI: 10.1093/jmicro/dfaf023

Satoko Arakawa, Hirofumi Yamaguchi, Shigeomi Shimizu

{"title":"Discovery of Golgi Membrane-associated Degradation Pathway, GOMED: A Focus on 15 Years of Ultrastructural Analyses.","authors":"Satoko Arakawa, Hirofumi Yamaguchi, Shigeomi Shimizu","doi":"10.1093/jmicro/dfaf023","DOIUrl":"https://doi.org/10.1093/jmicro/dfaf023","url":null,"abstract":"In this review, we focus on the ultrastructural characteristics of the Golgi membrane-associated degradation (GOMED) pathway, which have been clarified by electron microscopy and highlight recent advances in the elucidation of its molecular mechanism and physiological roles. The discovery of GOMED, an Atg5/Atg7-independent degradation pathway that differs from canonical autophagy in membrane origin, stimuli, and substrate specificity, has substantially expanded our understanding of intracellular degradation systems. In 2009, we identified GOMED as a novel, evolutionarily conserved autophagic pathway and demonstrated its role in intracellular degradation across eukaryotes, from yeast to mammals. We identified the conserved protein Hsv2/Wipi3 as an essential GOMED protein, which translocates to the trans-Golgi upon induction and remodels Golgi membranes into cup-shaped structures that engulf cytoplasmic components for lysosomal degradation. These processes contribute to organelle and secretory granule turnover, as well as mitochondrial clearance during erythroid differentiation. Moreover, neuronal-specific ablation of Wipi3 in mice causes severe cerebellar degeneration, implicating GOMED in tissue development and homeostasis. As these mechanisms are associated with diseases, such as neurodegenerative disorders and cancer, GOMED mechanisms should also be considered when establishing therapeutic strategies for these diseases.","PeriodicalId":74193,"journal":{"name":"Microscopy (Oxford, England)","volume":" ","pages":""},"PeriodicalIF":0.0,"publicationDate":"2025-05-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144013956","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Ultra-Low Accelerating Voltage Scanning Electron Microscopy with Multiple Imaging Detectors. 超低加速电压扫描电子显微镜与多成像探测器。

Microscopy (Oxford, England) Pub Date : 2025-04-16 DOI: 10.1093/jmicro/dfaf022

Kaoru Sato, Masayasu Nagoshi, Takaya Nakamura, Hiroshi Imoto

引用次数: 0

High energy-resolution soft X-ray emission spectrometer using a back-thinned CMOS detector for chemical bonding state analysis. 高能量分辨率软x射线发射光谱仪，采用后薄型CMOS探测器，用于化学键态分析。

Microscopy (Oxford, England) Pub Date : 2025-04-16 DOI: 10.1093/jmicro/dfaf021

Shogo Koshiya, Takanori Murano, Masami Terauchi

引用次数: 0

Mechanical characterization of nanomaterials revealed by Microscopic Nanomechanical Measurement method. 微观纳米力学测量方法揭示纳米材料的力学特性。

Microscopy (Oxford, England) Pub Date : 2025-04-07 DOI: 10.1093/jmicro/dfaf019

Yoshifumi Oshima, Jiaqi Zhang, Chunmeng Liu, Jiaming Liu, Keisuke Ishizuka, Toyoko Arai, Masahiko Tomitori

{"title":"Mechanical characterization of nanomaterials revealed by Microscopic Nanomechanical Measurement method.","authors":"Yoshifumi Oshima, Jiaqi Zhang, Chunmeng Liu, Jiaming Liu, Keisuke Ishizuka, Toyoko Arai, Masahiko Tomitori","doi":"10.1093/jmicro/dfaf019","DOIUrl":"https://doi.org/10.1093/jmicro/dfaf019","url":null,"abstract":"Mechanical properties of nanomaterials (approximately 10 nm or less in size) has been attracted much attention for their application in nanoelectromechanical and advanced sensors. Recently, an in-situ transmission electron microscope (TEM) holder with a length extension resonator (LER) of quartz crystal as a force sensor, called Microscopic nanomechanical measurement (MNM) method, has been developed. It enables us to estimate not only Young's modulus but also critical shear stress for nanomaterials precisely. In this review, the principle of this novel method is introduced and the mechanical characterization of nanomaterials revealed by this method are presented. (1) The size dependence of Young's modulus of gold nanocontacts when stretched in the [111] direction was measured, which could be explained by summing the bulk and surface Young's moduli weighted according to the ratio of internal to surface atoms. Bulk and surface Young's modulus was estimated to be 119 and 22 GPa, respectively. (2) Young's modulus of MoS2 nanoribbons with armchair edge increased with decreasing the width, which indicated that the armchair edge bonds were stiffer than those inside the nanoribbon. (3) By measuring stiffness of Pt atomic chains consisting of two to five atoms, bond stiffnesses at the middle of the chain and at the connection to the base were estimated to be 25 and 23 N/m, respectively, which were higher than the bulk bond stiffness. (4) Critical shear stress of Au nanocontacts was estimated to be 0.94 GPa by measuring the LER amplitude dependence of dissipative energy.","PeriodicalId":74193,"journal":{"name":"Microscopy (Oxford, England)","volume":" ","pages":""},"PeriodicalIF":0.0,"publicationDate":"2025-04-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143797295","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0