Microscopy (Oxford, England)最新文献_第2页

Atomic-scale STEM characterization of Li-ion battery materials using orientation-controlled single-crystalline specimens. 利用取向控制单晶样品的锂离子电池材料的原子尺度STEM表征。

IF 1.9

Microscopy (Oxford, England) Pub Date : 2026-09-25 DOI: 10.1093/jmicro/dfag034

Kei Nakayama

引用次数: 0

Critical Excitation Energy-Based Method for Chemical Bonding State Analysis Using SEM-EDS. 基于临界激发能的SEM-EDS化学键态分析方法。

IF 1.9

Microscopy (Oxford, England) Pub Date : 2026-09-08 DOI: 10.1093/jmicro/dfag033

Yasuhiro Takatani, Noritake Isomura, Satoru Kosaka, Toshikazu Satoh

{"title":"Critical Excitation Energy-Based Method for Chemical Bonding State Analysis Using SEM-EDS.","authors":"Yasuhiro Takatani, Noritake Isomura, Satoru Kosaka, Toshikazu Satoh","doi":"10.1093/jmicro/dfag033","DOIUrl":"https://doi.org/10.1093/jmicro/dfag033","url":null,"abstract":"In this study, we investigate the feasibility of evaluating the chemical bonding states using an electron-beam-based spectroscopic method implemented on a conventional scanning electron microscope and energy dispersive X-ray spectroscopy (SEM-EDS) system. The widely used surface-sensitive techniques such as X-ray absorption spectroscopy (XAS) often require synchrotron facilities and are not suitable for localized measurements. The critical excitation energies of silicon and silicon oxide featuring distinct absorption edge energies in XAS were determined by measuring the onset of characteristic X-ray emission as a function of incident electron energy. The observed difference in the critical excitation energy is consistent with the reported chemical shifts in the Si 1s binding energies and Si-K absorption edge energies. Systematic evaluations confirmed that variations in the beam current, instrumental instability, and surface charge-up did not significantly affect the measured thresholds. These results indicate that the proposed method captures chemically sensitive information related to the core-level electronic structure. The proposed approach provides a simple and accessible alternative to probe chemical bonding states and offers potential advantages for localized analysis because of the small probe size achievable with electron beams.","PeriodicalId":74193,"journal":{"name":"Microscopy (Oxford, England)","volume":" ","pages":""},"PeriodicalIF":1.9,"publicationDate":"2026-09-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"148914590","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Development of dodecahedron type MCP detector for SEM toward full energy range and solid angle electron detection. 面向全能量范围和实心角电子探测的十二面体型扫描电镜MCP探测器的研制。

IF 1.9

Microscopy (Oxford, England) Pub Date : 2026-08-01 DOI: 10.1093/jmicro/dfag008

Yuto Yanagihara, Yuanzhao Yao, Kazuhiro Kumagai, Takashi Sekiguchi

{"title":"Development of dodecahedron type MCP detector for SEM toward full energy range and solid angle electron detection.","authors":"Yuto Yanagihara, Yuanzhao Yao, Kazuhiro Kumagai, Takashi Sekiguchi","doi":"10.1093/jmicro/dfag008","DOIUrl":"10.1093/jmicro/dfag008","url":null,"abstract":"A detector was developed for scanning electron microscopy (SEM) in which microchannel plates (MCPs) were mounted on the facets of a regular dodecahedron. This detector enables the detection of electrons emitted in multiple directions. By placing a bias grid in front of each MCP, both backscattered electrons (BSE) and secondary electrons (SE) can be discriminated and detected. Using this detector, images were obtained by detecting electrons emitted in the direction normal to the sample surface (Top0), in two different oblique upward directions (Up1 and Up2), and in an oblique downward direction (Down6), to evaluate the emission-angle dependence including components emitted toward the lower hemisphere. Three specimens were examined: (i) a Cu plate with fine curtain-like surface waviness, (ii) a Cu-Al eutectic microstructure and (iii) a three-dimensional stainless-steel sphere. For the Cu plate, surface corrugations were emphasized in the Up1/Up2 BSE images, whereas Top0 showed nearly uniform contrast. For the Cu-Al specimen, Top0 primarily provided compositional contrast, while the Up1/Up2 highlighted interfacial regions due to illumination-effect-like directional acceptance. For the stainless-steel sphere, obliquely downward BSE were clearly detected with Down6, indicating the usefulness of the downward channel for three-dimensional geometries. Since this regular dodecahedral detector operates without electric or magnetic fields that could distort electron trajectories, it enables analysis of the energy and emission-angle dependence of emitted electrons. This design uses identical MCP detectors at multiple viewing directions, which simplifies signal handling and facilitates multi-view analysis of direction- and energy-resolved signals.","PeriodicalId":74193,"journal":{"name":"Microscopy (Oxford, England)","volume":" ","pages":"364-370"},"PeriodicalIF":1.9,"publicationDate":"2026-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC13454699/pdf/","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"146215205","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Diverse applications of volume CLEM analysis in cell biology: brief overview, unique techniques and recent notable works. 体积CLEM分析在细胞生物学中的不同应用-简要概述，独特的技术，和最近值得注意的作品。

IF 1.9

Microscopy (Oxford, England) Pub Date : 2026-08-01 DOI: 10.1093/jmicro/dfag009

Chieko Saito

引用次数: 0

Local strain effects on bandgap energy in flexible h-WO3 nanowires. 局部应变对柔性h-WO3纳米线带隙能的影响。

IF 1.9

Microscopy (Oxford, England) Pub Date : 2026-08-01 DOI: 10.1093/jmicro/dfaf050

Sho Nekita, Naomu Sekiguchi, Yuya Kasamura, Itsuki Misono, Yusuke Shimada, Satoshi Iikubo, Tetsuya Okuyama, Satoshi Hata

引用次数: 0

Domain-specific simulated data enhances knife-mark noise suppression in microscopy images of materials. 特定领域的模拟数据增强了材料显微图像中的刀痕噪声抑制。

IF 1.9

Microscopy (Oxford, England) Pub Date : 2026-08-01 DOI: 10.1093/jmicro/dfaf049

Masato Suzuki, Yasuhiko Igarashi

{"title":"Domain-specific simulated data enhances knife-mark noise suppression in microscopy images of materials.","authors":"Masato Suzuki, Yasuhiko Igarashi","doi":"10.1093/jmicro/dfaf049","DOIUrl":"10.1093/jmicro/dfaf049","url":null,"abstract":"Accurate quantitative analysis of material microstructures from images is often hindered by noise and artifacts generated during sample preparation. While deep learning is a promising approach for this challenge, preparing the large amount of 'supervised data' (labeled real images) required for training poses a significant barrier in material science. This study proposes and validates a simulation-driven learning paradigm where a deep learning model is trained exclusively on simulated images that mimic the key features of target structures and noise, serving as a powerful solution to this data scarcity problem. As a specific case study, we applied this paradigm to the removal of 'knife-mark noise' from cross-sectional images of rubber materials to enable accurate filler region segmentation. In evaluations using simulated data, the proposed method showed superior performance across all the metrics (PSNR, SSIM, and MAE) compared with conventional methods such as the median filter and TV reconstruction, as well as a U-Net model trained on general-purpose Gaussian noise. More importantly, the model also performed effectively on real images, despite being trained solely on simulated data. It successfully removed both knife-marks and material-derived background textures, which demonstrates the viability of simulation-driven learning to overcome the need for manually annotated datasets. This work highlights the power of task-specific simulations as a practical alternative to manual data annotation in quantitative materials analysis.","PeriodicalId":74193,"journal":{"name":"Microscopy (Oxford, England)","volume":" ","pages":"318-331"},"PeriodicalIF":1.9,"publicationDate":"2026-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC13454694/pdf/","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145357057","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Low-vacuum scanning electron microscopy for informative three-dimensional imaging of cell/tissue architectures and biomedical target localization. 低真空扫描电子显微镜用于细胞/组织结构和生物医学目标定位的信息三维成像。

IF 1.9

Microscopy (Oxford, England) Pub Date : 2026-08-01 DOI: 10.1093/jmicro/dfag012

Akira Sawaguchi

{"title":"Low-vacuum scanning electron microscopy for informative three-dimensional imaging of cell/tissue architectures and biomedical target localization.","authors":"Akira Sawaguchi","doi":"10.1093/jmicro/dfag012","DOIUrl":"10.1093/jmicro/dfag012","url":null,"abstract":"This review focusses on the recent advances of practical application of low-vacuum scanning electron microscopy to informative three-dimensional imaging of cell/tissue architectures and biomedical target localization on microscope slides for biomedical sciences and clinical diagnoses. Scanning electron microscopy under low-vacuum conditions allows high-resolution imaging of complex cell/tissue architectures in nonconductive specimens because the negative charge that accumulates on the nonconductive materials can be neutralized by the positive ions in the residual gas molecules. However, the conventional methods for metal staining of biological specimens require harmful uranium compounds, which hampers the applications of electron microscopy. The development of uranium-free KMnO4/Pb metal staining allows multiscale imaging of extensive cell/tissue architectures to intensive subcellular ultrastructure. The obtained image contrast was equivalent to that of Ur/Pb staining and sufficient for ultrastructural observation. Observation of the 20-µm-thick section facilitates distinctive perception of the face-side images of the epithelium, which are seldom seen within 5-µm-thin sections. Visualization of the exact location of targeting molecules by in situ strategy provides unique insight into nanogold development via nanogold nucleation and secondary growth under hot-humid air conditions. These user-friendly techniques are highly anticipated to fill the gap between light and electron microscopy to correlate cell/tissue structure and function. Importantly, paraffin and cryostat blocks of cell or tissue samples are semipermanent, making them valuable for retrospective studies through the re-evaluation of archived specimens.","PeriodicalId":74193,"journal":{"name":"Microscopy (Oxford, England)","volume":" ","pages":"307-317"},"PeriodicalIF":1.9,"publicationDate":"2026-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC13454675/pdf/","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"146230159","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Non-destructive pre- and post-experimental validation of glass nanopipette geometry: quantifying beam-induced deformation in membrane-free TEM. 玻璃纳米吸管几何形状的非破坏性实验前和实验后验证：在无膜透射电镜中量化光束引起的变形。

IF 1.9

Microscopy (Oxford, England) Pub Date : 2026-08-01 DOI: 10.1093/jmicro/dfag004

Han Gia Nguyen, Linhao Sun, Hirotoshi Furusho, Shinji Watanabe

{"title":"Non-destructive pre- and post-experimental validation of glass nanopipette geometry: quantifying beam-induced deformation in membrane-free TEM.","authors":"Han Gia Nguyen, Linhao Sun, Hirotoshi Furusho, Shinji Watanabe","doi":"10.1093/jmicro/dfag004","DOIUrl":"10.1093/jmicro/dfag004","url":null,"abstract":"Nanopipettes have emerged as versatile tools for diverse applications, ranging from single-molecule sensing and nanoparticle detection to scanning probe microscopies such as scanning electrochemical microscopy and scanning ion conductance microscopy (SICM). In all these fields, precise geometrical characterization is a prerequisite for quantitative analysis. However, conventional \"post-experimental\" characterization cannot guarantee that the tip maintained its critical geometry during the experiment. While membrane-free transmission electron microscopy enables the non-destructive observation required for \"pre- and post-experimental\" validation, it introduces a risk of beam-induced deformation. In this study, we systematically investigated the deformation dynamics of quartz and borosilicate glass nanopipettes. Our analysis revealed distinct mechanisms: quartz exhibited continuous spheroidization enabled by structural homogeneity, whereas borosilicate glass showed fracture due to heterogeneity. Crucially, we identified a stable regime where deformation is negligible. By adhering to these conditions, we successfully demonstrated the rigorous tracking of a single quartz nanopipette's geometry both before and after live-cell SICM imaging. This workflow provides the first direct evidence of structural stability throughout the functional process, establishing a quantitative framework for reliable nanopipette metrology.","PeriodicalId":74193,"journal":{"name":"Microscopy (Oxford, England)","volume":" ","pages":"354-363"},"PeriodicalIF":1.9,"publicationDate":"2026-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"146196368","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Semi-supervised semantic segmentation of SEM images considering multi-scale structural consistency loss in semiconductor pattern layouts. 考虑半导体模式布局中多尺度结构一致性损失的SEM图像半监督语义分割。

IF 1.9

Microscopy (Oxford, England) Pub Date : 2026-08-01 DOI: 10.1093/jmicro/dfaf056

Akira Ito, Atsushi Miyamoto

{"title":"Semi-supervised semantic segmentation of SEM images considering multi-scale structural consistency loss in semiconductor pattern layouts.","authors":"Akira Ito, Atsushi Miyamoto","doi":"10.1093/jmicro/dfaf056","DOIUrl":"10.1093/jmicro/dfaf056","url":null,"abstract":"In the fabrication of semiconductor devices, increased yield is achieved using Scanning Electron Microscopes (SEM) to measure and inspect circuit patterns. With the recent decreasing scale and increasing complexity of semiconductor circuit patterns, it has become increasingly difficult to recognize patterns accurately using rule-based image processing methods. As such, we propose a method that uses semi-supervised learning for segmentation processing to recognize which pattern level each pixel represents. With existing methods, the pseudo-labels used for training were not accurate enough, and there were issues such as inconsistent recognition of repeated-pattern layouts and mixed-up results in large unmarked areas distant from the pattern contour. Accordingly, the proposed method is able to perform highly accurate segmentation with the design of new types of loss for evaluating consistency in pattern structure at various scales. When compared with Unimatch and CAC, which are well-known high-performance segmentation methods, the accuracy relative to visual identification increased dramatically, from 10-12% to 100%. In quantitative evaluation using mean Intersection-over-Union (mIoU) at the pixel level, mean values also increased from a range between 0.45 and 0.65 to over 0.94, confirming that the proposed method is effective.","PeriodicalId":74193,"journal":{"name":"Microscopy (Oxford, England)","volume":" ","pages":"343-353"},"PeriodicalIF":1.9,"publicationDate":"2026-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145844485","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Anisotropic optical properties of β-CuGaO2 single crystal studied via momentum transfer resolved EELS. 利用动量传递分辨电鳗研究了β-CuGaO2单晶的各向异性光学性质。

IF 1.9

Microscopy (Oxford, England) Pub Date : 2026-07-30 DOI: 10.1093/jmicro/dfag032

Asahi Mizuno, Yohei K Sato, Masami Terauchi, Issei Suzuki, Takahisa Omata

{"title":"Anisotropic optical properties of β-CuGaO2 single crystal studied via momentum transfer resolved EELS.","authors":"Asahi Mizuno, Yohei K Sato, Masami Terauchi, Issei Suzuki, Takahisa Omata","doi":"10.1093/jmicro/dfag032","DOIUrl":"https://doi.org/10.1093/jmicro/dfag032","url":null,"abstract":"β-CuGaO2 has attracted attention as a photovoltaic material because of its p-type semiconducting nature and strong-visible-light absorption capability. Because ion-exchange methods yield only micron-sized crystals and random orientations, conventional optical characterization of their anisotropic properties has been largely inaccessible. Herein, the dielectric function of β-CuGaO2 was determined as a function of momentum transfer (q) using q-resolved electron energy-loss spectroscopy (q-EELS) on single crystals in transmission electron microscopy (TEM). EELS spectra were acquired along the q// 100, q// 010, and q// 001, revealing a pronounced dependence of the visible-light-region spectral intensity on q. The dielectric functions derived from the EELS spectra indicate anisotropic absorption, which is stronger for q// 100 and q// 001 and weaker for q// 010. This anisotropic absorption feature is attributable to interband transitions from localized Cu 3d states at the valence band maximum and localized O 2p states at the conduction band minimum, consistent with theoretical studies. These results demonstrate that TEM-based q-EELS enables the evaluation of anisotropic dielectric properties even from micron-sized crystals, providing insight into the electronic structure of β-CuGaO2.","PeriodicalId":74193,"journal":{"name":"Microscopy (Oxford, England)","volume":" ","pages":""},"PeriodicalIF":1.9,"publicationDate":"2026-07-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"148623112","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0