利用纳米光镜和电子显微镜扩大石蜡切片研究的潜力。

IF 1.9
Hideya Kawasaki
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引用次数: 0

摘要

使用光学显微镜进行组织学检查在生命科学和诊断医学中是必不可少的,特别是对于用苏木精和伊红或3,3'-二氨基联苯胺染色的福尔马林固定石蜡包埋(FFPE)组织切片。然而,传统的电子显微镜面临的挑战,如样品破坏,复杂的处理,以及难以将光学和电子显微镜图像相关联。NanoSuit方法通过形成超薄保护膜来提高导电性并保持水合组织结构,从而克服了这些限制,实现了高分辨率扫描电子显微镜成像。在这项研究中,我们将纳米套件相关的光学和电子显微镜(CLEM)应用于FFPE切片,以评估其无损和可逆的电子显微镜表征的潜力。利用nanofit - clem,我们成功地可视化了FFPE切片中的内皮结构、淀粉样蛋白沉积、肌瘤、线粒体、细菌、病毒和异物沉积。能量色散x射线光谱法进一步促进了外来物质的元素分析。这些发现表明,nanosuite - clem可以在不需要新设备的情况下精确显示FFPE切片的超微结构细节。这种方法有望通过提高诊断准确性和实现多模态组织分析来推进病理学。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Expanding the potential of paraffin section studies using NanoSuit-correlative light and electron microscopy.

Histological examination using optical microscopy is essential in life sciences and diagnostic medicine, particularly for formalin-fixed paraffin-embedded (FFPE) tissue sections stained with hematoxylin and eosin or 3,3'-diaminobenzidine. However, conventional electron microscopy faces challenges, such as sample destruction, complex processing, and difficulty in correlating light and electron microscopy images. The NanoSuit method overcomes these limitations by forming an ultrathin protective membrane that enhances conductivity and preserves hydrated tissue architecture, enabling high-resolution scanning electron microscopy imaging. In this study, we applied NanoSuit-correlative light and electron microscopy (CLEM) to FFPE sections to assess its potential for non-destructive and reversible electron microscopy characterization. Using NanoSuit-CLEM, we successfully visualized endothelial structures, amyloid deposits, sarcomeres, mitochondria, bacteria, viruses, and foreign body deposits in FFPE sections. Energy-dispersive X-ray spectrometry further facilitated elemental analysis of foreign materials. These findings demonstrate that NanoSuit-CLEM allows for the precise visualization of ultrastructural details in FFPE sections without requiring new equipment. This method holds promise for advancing pathology by improving diagnostic accuracy and enabling multimodal tissue analysis.

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