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Quantifying layer-specific thicknesses in porcine large intestine using X-ray microscopy. 用x射线显微镜定量猪大肠的层特异性厚度。
IF 1.9
Microscopy (Oxford, England) Pub Date : 2026-06-01 DOI: 10.1093/jmicro/dfaf041
Gregory Hirst, Zachary Ross, Adam Rose, North Graff, Kennedy Campbell, Paul Reynolds, Benjamin Terry
{"title":"Quantifying layer-specific thicknesses in porcine large intestine using X-ray microscopy.","authors":"Gregory Hirst, Zachary Ross, Adam Rose, North Graff, Kennedy Campbell, Paul Reynolds, Benjamin Terry","doi":"10.1093/jmicro/dfaf041","DOIUrl":"10.1093/jmicro/dfaf041","url":null,"abstract":"<p><p>Accurate quantification of the individual layers of the intestinal wall is essential for biomechanical modeling and the development of gastrointestinal medical devices. Traditional microscopy techniques, though widely used, are limited by their two-dimensional nature and potential for tissue distortion due to complex sample preparation. This study evaluates X-ray microscopy (XRM) as a nondestructive, three-dimensional alternative for measuring the thicknesses of the four major layers of porcine large intestinal tissue: serosa, muscularis externa, submucosa and mucosa. Using the ZEISS Xradia 620 Versa, XRM scans were compared to standard light microscopy. XRM successfully visualized all four layers and yielded thickness measurements that were consistent with those obtained via standard microscopy, despite natural biological variability. Notably, XRM scans allowed for 3D reconstructions of tissue vasculature and did not need extensive preparation or staining. These findings establish XRM as a powerful and practical method for morphological analysis of soft tissues and offer the first reported absolute layer thicknesses for each layer of porcine large intestinal tissue, which can be used in layer-specific constitutive biomechanical models.</p>","PeriodicalId":74193,"journal":{"name":"Microscopy (Oxford, England)","volume":" ","pages":"240-246"},"PeriodicalIF":1.9,"publicationDate":"2026-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145202399","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Relaxation time measurement: correlating diffraction patterns. 弛豫时间测量：相关衍射图样。
IF 1.9
Microscopy (Oxford, England) Pub Date : 2026-06-01 DOI: 10.1093/jmicro/dfaf048
Katsuaki Nakazawa, Kazutaka Mitsuishi
{"title":"Relaxation time measurement: correlating diffraction patterns.","authors":"Katsuaki Nakazawa, Kazutaka Mitsuishi","doi":"10.1093/jmicro/dfaf048","DOIUrl":"10.1093/jmicro/dfaf048","url":null,"abstract":"<p><p>Dynamics in liquids and glasses can be assessed using X-ray photon correlation spectroscopy or electron correlation microscopy, which involves measuring the temporal changes in diffraction patterns. Two methods are commonly used to evaluate these temporal changes: one-time correlation function or two-time correlation function. However, the specific characteristics of these methods have not been thoroughly studied. In this study, we investigated the differences between these methods and found that the two-time correlation function can measure dynamics for longer periods than the method relying on the one-time correlation function. Additionally, we demonstrated that the two-time correlation function exhibits a weak dependence on the amount of dose applied.</p>","PeriodicalId":74193,"journal":{"name":"Microscopy (Oxford, England)","volume":" ","pages":"285-293"},"PeriodicalIF":1.9,"publicationDate":"2026-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145338313","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Cryo-EELS elemental mapping of organic-solvent systems. 有机溶剂体系的Cryo-EELS元素作图。
IF 1.9
Microscopy (Oxford, England) Pub Date : 2026-05-29 DOI: 10.1093/jmicro/dfag027
Daisuke Unabara, Yohei K Sato, Tasuku Hamaguchi, Koji Yonekura
{"title":"Cryo-EELS elemental mapping of organic-solvent systems.","authors":"Daisuke Unabara, Yohei K Sato, Tasuku Hamaguchi, Koji Yonekura","doi":"10.1093/jmicro/dfag027","DOIUrl":"https://doi.org/10.1093/jmicro/dfag027","url":null,"abstract":"<p><p>Cryogenic transmission electron microscopy (cryo-TEM) is a powerful method that enables the observation of nanomaterials while preserving the specimen in a vitrified state, and minimizing damage caused by the electron-beam irradiation. Although cryo-TEM has been widely applied to aqueous specimens, its application to organic solvent systems remains limited. Because the physicochemical properties of organic solvents differ markedly from those of water, efficient vitrification methods have not yet been well established to date. More critically, organic solvents are highly susceptible to electron-beam irradiation. In this study, we selected methanol-the smallest polar alcohol molecule -and optimized the vitrification protocol for the observation of samples containing organic solvents. This resulted in a reproducible blotting method for forming thin solvent films, along with suitable freezing conditions for producing amorphous methanol. We further aimed to expand the application of cryo-TEM to materials in organic solvent systems by performing cryogenic electron energy-loss spectroscopy (cryo-EELS) elemental mapping. The technique, recently developed by our group for frozen aqueous solutions, enabled the detection of elemental signals even from frozen methanol and provided insights into their spatial distributions. Furthermore, silicon signals from mesoporous silica nanoparticles (MSNs) dispersed in methanol were clearly observed. These results demonstrate that both solvent components and nanomaterials can be visualized and analyzed within frozen organic solvents, thereby expanding the potential of cryo-TEM for advanced materials research involving organic solvent systems.</p>","PeriodicalId":74193,"journal":{"name":"Microscopy (Oxford, England)","volume":" ","pages":""},"PeriodicalIF":1.9,"publicationDate":"2026-05-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"148058727","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
In-situ biasing DPC STEM observation of GaAs p-n junction. GaAs p-n结原位偏置DPC - STEM观测。
IF 1.9
Microscopy (Oxford, England) Pub Date : 2026-05-21 DOI: 10.1093/jmicro/dfag026
Satoko Toyama, Yoshifumi Kojima, Ayumu Oyaizu, Hirokazu Sasaki, Takehito Seki, Naoya Shibata
{"title":"In-situ biasing DPC STEM observation of GaAs p-n junction.","authors":"Satoko Toyama, Yoshifumi Kojima, Ayumu Oyaizu, Hirokazu Sasaki, Takehito Seki, Naoya Shibata","doi":"10.1093/jmicro/dfag026","DOIUrl":"https://doi.org/10.1093/jmicro/dfag026","url":null,"abstract":"<p><p>In-situ biasing differential phase contrast (DPC) scanning transmission electron microscopy (STEM) offers a powerful tool for visualizing local electric fields in devices under operating conditions. However, robust protocols for quantitative operando analysis remain underdeveloped. In this study, we established a methodology for quantitative electric field mapping of a GaAs p-n junction using in-situ biasing DPC-STEM, thereby extending previous quantitative DPC studies to device characterization under applied bias. We successfully visualized the modulation of the depletion layer under forward and reverse biases. By systematically comparing the experimental projected electric field profiles with two-dimensional Poisson simulations, we further revealed that focused ion beam induced electrically inactive layers were formed asymmetrically across the p-n junction, depending on the dopant concentration difference between the n- and p-type regions. These inactive layers significantly modify not only the field intensity but also its spatial distribution compared with the ideal case. Our results demonstrate that quantitative interpretation of in-situ DPC-STEM measurements requires simulation models incorporating realistic specimen structures, particularly asymmetric inactive layers, and provide practical guidance for quantitative characterization of functional semiconductor devices.</p>","PeriodicalId":74193,"journal":{"name":"Microscopy (Oxford, England)","volume":" ","pages":""},"PeriodicalIF":1.9,"publicationDate":"2026-05-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"147990255","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Dynamic Scan Shaping: Overcoming Coil Hysteresis for High-Speed STEM. 动态扫描整形：克服高速STEM线圈迟滞。
IF 1.9
Microscopy (Oxford, England) Pub Date : 2026-05-12 DOI: 10.1093/jmicro/dfag025
Jonathan J P Peters, Grigore Moldovan, Lewys Jones
{"title":"Dynamic Scan Shaping: Overcoming Coil Hysteresis for High-Speed STEM.","authors":"Jonathan J P Peters, Grigore Moldovan, Lewys Jones","doi":"10.1093/jmicro/dfag025","DOIUrl":"https://doi.org/10.1093/jmicro/dfag025","url":null,"abstract":"<p><p>Scanning transmission electron microscopy (STEM) has a number of benefits over conventional parallel illumination transmission electron microscopy, such as the ability to simultaneously perform a range of imaging and spectroscopy techniques. However, one distinct disadvantage is the slow imaging speeds, a consequence of the sequential nature of the pixel acquisition, limiting imaging speeds to a few frames per second (fps). This reduces dose-rate control, increases the effect of distortions, and hinder the ability to capture dynamic events for in-situ experiments. The main obstacle to faster framerates is the inductance and hysteresis of the scanning coils that has previously only been addressable with the addition of entirely new hardware coils. Here we demonstrate a predictive scan shaping approach using conventional scanning systems, where scan input is determined based on where the beam will be instead of where the beam should be. We use this new approach to acquire fully sampled 512x512 images at 60 ns per pixel, giving a framerate of 41 fps.</p>","PeriodicalId":74193,"journal":{"name":"Microscopy (Oxford, England)","volume":" ","pages":""},"PeriodicalIF":1.9,"publicationDate":"2026-05-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"147876729","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A strategy for dose-efficient atomic-resolution OBF-STEM imaging of zeolites. 沸石的剂量高效原子分辨率OBF-STEM成像策略。
IF 1.9
Microscopy (Oxford, England) Pub Date : 2026-04-28 DOI: 10.1093/jmicro/dfag024
Kousuke Ooe, Takehito Seki, Kaname Yoshida, Yuji Kohno, Yuichi Ikuhara, Naoya Shibata
{"title":"A strategy for dose-efficient atomic-resolution OBF-STEM imaging of zeolites.","authors":"Kousuke Ooe, Takehito Seki, Kaname Yoshida, Yuji Kohno, Yuichi Ikuhara, Naoya Shibata","doi":"10.1093/jmicro/dfag024","DOIUrl":"https://doi.org/10.1093/jmicro/dfag024","url":null,"abstract":"<p><p>Observation of beam-sensitive materials in scanning transmission electron microscopy (STEM) requires not only the development of highly dose-efficient imaging techniques but also the selection of appropriate imaging conditions such as the raster-scan sampling rate and optical parameters to realise a low-dose condition effectively. In this study, the convergence angle, sampling rates, and electron dose dependencies of the signal-to-noise ratio in optimum bright-field (OBF) STEM, a recently developed dose-efficient STEM imaging method, are investigated, which guides us in choosing optimal conditions to observe beam-sensitive porous materials such as zeolites. The parameters necessary for real-time OBF imaging are also considered towards practical live imaging at low dose. Experimental atomic-resolution OBF STEM observations of zeolites are then demonstrated using the strategy investigated above.</p>","PeriodicalId":74193,"journal":{"name":"Microscopy (Oxford, England)","volume":" ","pages":""},"PeriodicalIF":1.9,"publicationDate":"2026-04-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"147791363","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Special issue: advanced spectroscopy in electron microscopy. 特刊：电子显微镜中的高级光谱学。
IF 1.9
Microscopy (Oxford, England) Pub Date : 2026-04-01 DOI: 10.1093/jmicro/dfag011
Mitsutaka Haruta, Hikaru Saito
{"title":"Special issue: advanced spectroscopy in electron microscopy.","authors":"Mitsutaka Haruta, Hikaru Saito","doi":"10.1093/jmicro/dfag011","DOIUrl":"https://doi.org/10.1093/jmicro/dfag011","url":null,"abstract":"","PeriodicalId":74193,"journal":{"name":"Microscopy (Oxford, England)","volume":"75 2","pages":"75"},"PeriodicalIF":1.9,"publicationDate":"2026-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"147663442","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Probing the effective mass and fermi velocity of charges by momentum-resolved electron energy loss spectroscopy. 动量分辨电子能量损失谱探测电荷的有效质量和费米速度。
IF 1.9
Microscopy (Oxford, England) Pub Date : 2026-04-01 DOI: 10.1093/jmicro/dfag007
Chih-Ying Huang, Somboon Fongchaiya, Chen-Yu Hung, Ta-Lei Chou, Ssu-Yen Huang, Chao-Sung Lin, Chun-Wei Chen, Mason Klemm, Sijie Xu, Bin Gao, Pengcheng Dai, Ming-Wen Chu
{"title":"Probing the effective mass and fermi velocity of charges by momentum-resolved electron energy loss spectroscopy.","authors":"Chih-Ying Huang, Somboon Fongchaiya, Chen-Yu Hung, Ta-Lei Chou, Ssu-Yen Huang, Chao-Sung Lin, Chun-Wei Chen, Mason Klemm, Sijie Xu, Bin Gao, Pengcheng Dai, Ming-Wen Chu","doi":"10.1093/jmicro/dfag007","DOIUrl":"10.1093/jmicro/dfag007","url":null,"abstract":"<p><p>The effective mass (m*) and Fermi velocity (vF) are two fundamental gauges of the electronic properties of materials and conventionally measured by magnetotransport characterizations. In this Review, we introduce momentum(q)-resolved electron energy loss spectroscopy (q-EELS) as an alternative method for probing m* and vF, and demonstrate its applications in semiconductor Si and semimetal FeGe. The q-EELS methodology is based on the q-dependent plasmon dispersion in the context of the random-phase approximation (RPA) for a free-electron gas (FEG), featuring a quantitative dependence on m* and vF and thus providing the route for retrieving these parameters. We outline the experimental principles for characterizing plasmon dispersions from the optical light line (the order of 10-3 Å-1) to Brillouin-zone boundaries (the order of Å-1), and elucidate the theoretical framework for pertinent elaborations on m* and vF. This work provides both the conceptual and practical guidelines for employing the q-EELS to extract m* and vF of fundamental significances to electronic characteristics of matters.</p>","PeriodicalId":74193,"journal":{"name":"Microscopy (Oxford, England)","volume":" ","pages":"157-163"},"PeriodicalIF":1.9,"publicationDate":"2026-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"146208066","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Cathodoluminescence, light injection and EELS in STEM: from comparative to coincidence experiments. STEM中的阴极发光、光注入与EELS：从比较实验到重合实验。
IF 1.9
Microscopy (Oxford, England) Pub Date : 2026-04-01 DOI: 10.1093/jmicro/dfaf047
Luiz H G Tizei, Yves Auad, Florian Castioni, Mathieu Kociak
{"title":"Cathodoluminescence, light injection and EELS in STEM: from comparative to coincidence experiments.","authors":"Luiz H G Tizei, Yves Auad, Florian Castioni, Mathieu Kociak","doi":"10.1093/jmicro/dfaf047","DOIUrl":"10.1093/jmicro/dfaf047","url":null,"abstract":"<p><p>Electron spectroscopy implemented in electron microscopes provides high spatial resolution, down to the atomic scale, of the chemical, electronic, vibrational and optical properties of materials. In this review, we will describe how temporal coincidence experiments in the nanosecond to femtosecond range between different electron spectroscopies involving photons, inelastic electrons and secondary electrons can provide information bits not accessible to independent spectroscopies. In particular, we will focus on nano-optics applications. The instrumental modifications necessary for these experiments are discussed, as well as the perspectives for these coincidence techniques.</p>","PeriodicalId":74193,"journal":{"name":"Microscopy (Oxford, England)","volume":" ","pages":"129-144"},"PeriodicalIF":1.9,"publicationDate":"2026-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145379982","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
EELS of phonons: polarity and temperature dependence. 声子的EELS：极性和温度依赖性。
IF 1.9
Microscopy (Oxford, England) Pub Date : 2026-04-01 DOI: 10.1093/jmicro/dfaf055
Jun Kikkawa
{"title":"EELS of phonons: polarity and temperature dependence.","authors":"Jun Kikkawa","doi":"10.1093/jmicro/dfaf055","DOIUrl":"10.1093/jmicro/dfaf055","url":null,"abstract":"<p><p>This paper provides an overview of phonon measurement using electron energy loss spectroscopy (EELS) in the electron microscope, with polar cubic boron nitride (c-BN) and nonpolar diamond crystals as representative examples. Differential scattering cross-sections for phonon creation and annihilation are reviewed, highlighting the influence of crystal polarity under kinematical and dynamical scattering conditions. The temperature dependence of EELS intensity is examined, with local absolute temperature evaluated by analyzing the ratio of phonon annihilation to creation intensities. Practical aspects and challenges associated with phonon measurement in EELS are also discussed, together with future perspectives in this evolving field.</p>","PeriodicalId":74193,"journal":{"name":"Microscopy (Oxford, England)","volume":" ","pages":"103-115"},"PeriodicalIF":1.9,"publicationDate":"2026-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145806652","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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