Microscopy (Oxford, England)最新文献

筛选
英文 中文
Correction to: Observation and quantitative analysis of dislocations in steel using electron channeling contrast imaging method with precise control of electron beam incident direction. 更正为利用精确控制电子束入射方向的电子通道对比成像方法观测和定量分析钢中的位错。
Microscopy (Oxford, England) Pub Date : 2024-12-05 DOI: 10.1093/jmicro/dfae037
{"title":"Correction to: Observation and quantitative analysis of dislocations in steel using electron channeling contrast imaging method with precise control of electron beam incident direction.","authors":"","doi":"10.1093/jmicro/dfae037","DOIUrl":"10.1093/jmicro/dfae037","url":null,"abstract":"","PeriodicalId":74193,"journal":{"name":"Microscopy (Oxford, England)","volume":" ","pages":"523"},"PeriodicalIF":0.0,"publicationDate":"2024-12-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC11630296/pdf/","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142047619","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Bayesian inference of atomic column positions in scanning transmission electron microscopy images. 扫描透射电子显微镜图像中原子柱位置的贝叶斯推断。
Microscopy (Oxford, England) Pub Date : 2024-12-05 DOI: 10.1093/jmicro/dfae025
Yuki Nomura, Satoshi Anada, Shunsuke Kobayashi
{"title":"Bayesian inference of atomic column positions in scanning transmission electron microscopy images.","authors":"Yuki Nomura, Satoshi Anada, Shunsuke Kobayashi","doi":"10.1093/jmicro/dfae025","DOIUrl":"10.1093/jmicro/dfae025","url":null,"abstract":"<p><p>Atomic-resolution scanning transmission electron microscopy combined with two-dimensional Gaussian fitting enables the accurate and precise identification of atomic column positions within a few picometers. The measurement performance significantly depends on the signal-to-noise ratio of the atomic columns. In areas with low signal-to-noise ratios, such as near surfaces, the measurement performance was lower than that of the bulk. However, previous studies evaluated the accuracy and precision only in bulk areas, underscoring the need for a method that quantitatively evaluates the accuracy and precision of each atomic column position with various signal-to-noise ratios. This study introduced Bayesian inference to assess the accuracy and precision of determining individual atomic column positions under various signals. We applied this method to simulated and experimental images and demonstrated its effectiveness in identifying statistically significant displacements, particularly near surfaces with signal degradation. The use of vector maps and kernel density estimate plots obtained from Bayesian inference provided a probabilistic understanding of the atom displacement. Therefore, this study highlighted the potential benefits of Bayesian inference in high-resolution imaging to reveal material properties.</p>","PeriodicalId":74193,"journal":{"name":"Microscopy (Oxford, England)","volume":" ","pages":"481-487"},"PeriodicalIF":0.0,"publicationDate":"2024-12-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"140900800","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Development of silicon-on-insulator direct electron detector with analog memories in pixels for sub-microsecond imaging. 开发用于亚微秒成像的带像素模拟存储器的硅绝缘体直接电子探测器。
Microscopy (Oxford, England) Pub Date : 2024-12-05 DOI: 10.1093/jmicro/dfae029
Takafumi Ishida, Kosei Sugie, Toshinobu Miyoshi, Yuichi Ishida, Koh Saitoh, Yasuo Arai, Makoto Kuwahara
{"title":"Development of silicon-on-insulator direct electron detector with analog memories in pixels for sub-microsecond imaging.","authors":"Takafumi Ishida, Kosei Sugie, Toshinobu Miyoshi, Yuichi Ishida, Koh Saitoh, Yasuo Arai, Makoto Kuwahara","doi":"10.1093/jmicro/dfae029","DOIUrl":"10.1093/jmicro/dfae029","url":null,"abstract":"<p><p>We have developed a high-speed recordable direct electron detector based on silicon-on-insulator technology. The detector has 16 analog memories in each pixel to record 16 images with sub-microsecond temporal resolution. A dedicated data acquisition system has also been developed to display and record the results on a personal computer. The performance of the direct electron detector as an image sensor is evaluated under electron irradiation with an energy of 30 keV in a low-voltage transmission electron microscope equipped with a photocathode electron gun. We demonstrate that the detector can record images at an exposure time of 100 ns and an interval of 900 ns.</p>","PeriodicalId":74193,"journal":{"name":"Microscopy (Oxford, England)","volume":" ","pages":"511-516"},"PeriodicalIF":0.0,"publicationDate":"2024-12-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC11630314/pdf/","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141187161","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Sandwich freezing and freeze substitution of Arabidopsis plant tissues for electron microscopy. 拟南芥植物组织的夹心冷冻和冷冻替代,用于电子显微镜观察。
Microscopy (Oxford, England) Pub Date : 2024-12-05 DOI: 10.1093/jmicro/dfae032
Masashi Yamaguchi, Mayuko Sato, Azusa Takahashi-Nakaguchi, Michiyo Okamoto, Kiminori Toyooka, Hiroji Chibana
{"title":"Sandwich freezing and freeze substitution of Arabidopsis plant tissues for electron microscopy.","authors":"Masashi Yamaguchi, Mayuko Sato, Azusa Takahashi-Nakaguchi, Michiyo Okamoto, Kiminori Toyooka, Hiroji Chibana","doi":"10.1093/jmicro/dfae032","DOIUrl":"10.1093/jmicro/dfae032","url":null,"abstract":"<p><p>Sandwich freezing is a method of rapid freezing by sandwiching specimens between two copper disks, and it has been used for observing exquisite close-to-native ultrastructure of living yeast and bacteria. Recently, this method has been found to be useful for preserving cell images of glutaraldehyde-fixed cultured cells, as well as animal and human tissues. In the present study, this method was applied to observe the fine structure of living Arabidopsis plant tissues and was found to achieve excellent ultrastructural preservation of cells and tissues. This is the first report of applying the sandwich freezing method to observe plant tissues.</p>","PeriodicalId":74193,"journal":{"name":"Microscopy (Oxford, England)","volume":" ","pages":"517-522"},"PeriodicalIF":0.0,"publicationDate":"2024-12-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141728400","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Fast computational approach with prior dimension reduction for three-dimensional chemical component analysis using CT data of spectral imaging. 利用光谱成像 CT 数据进行三维化学成分分析的先验降维快速计算方法。
Microscopy (Oxford, England) Pub Date : 2024-12-05 DOI: 10.1093/jmicro/dfae027
Motoki Shiga, Taisuke Ono, Kenichi Morishita, Keiji Kuno, Nanase Moriguchi
{"title":"Fast computational approach with prior dimension reduction for three-dimensional chemical component analysis using CT data of spectral imaging.","authors":"Motoki Shiga, Taisuke Ono, Kenichi Morishita, Keiji Kuno, Nanase Moriguchi","doi":"10.1093/jmicro/dfae027","DOIUrl":"10.1093/jmicro/dfae027","url":null,"abstract":"<p><p>Spectral image (SI) measurement techniques, such as X-ray absorption fine structure (XAFS) imaging and scanning transmission electron microscopy (STEM) with energy-dispersive X-ray spectroscopy (EDS) or electron energy loss spectroscopy (EELS), are useful for identifying chemical structures in composite materials. Machine-learning techniques have been developed for automatic analysis of SI data and their usefulness has been proven. Recently, an extended measurement technique combining SI with a computed tomography (CT) technique (CT-SI), such as CT-XAFS and STEM-EDS/EELS tomography, was developed to identify the three-dimensional (3D) structures of chemical components. CT-SI analysis can be conducted by combining CT reconstruction algorithms and chemical component analysis based on machine-learning techniques. However, this analysis incurs high-computational costs owing to the size of the CT-SI datasets. To address this problem, this study proposed a fast computational approach for 3D chemical component analysis in an unsupervised learning setting. The primary idea for reducing the computational cost involved compressing the CT-SI data prior to CT computation and performing 3D reconstruction and chemical component analysis on the compressed data. The proposed approach significantly reduced the computational cost without losing information about the 3D structure and chemical components. We experimentally evaluated the proposed approach using synthetic and real CT-XAFS data, which demonstrated that our approach achieved a significantly faster computational speed than the conventional approach while maintaining analysis performance. As the proposed procedure can be implemented with any CT algorithm, it is expected to accelerate 3D analyses with sparse regularized CT algorithms in noisy and sparse CT-SI datasets.</p>","PeriodicalId":74193,"journal":{"name":"Microscopy (Oxford, England)","volume":" ","pages":"488-498"},"PeriodicalIF":0.0,"publicationDate":"2024-12-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"140961075","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Wire-tracking of bent electric cable using X-ray CT and deep active learning. 利用 X 射线 CT 和深度主动学习对弯曲电缆进行电线跟踪。
Microscopy (Oxford, England) Pub Date : 2024-12-05 DOI: 10.1093/jmicro/dfae028
Yutaka Hoshina, Takuma Yamamoto, Shigeaki Uemura
{"title":"Wire-tracking of bent electric cable using X-ray CT and deep active learning.","authors":"Yutaka Hoshina, Takuma Yamamoto, Shigeaki Uemura","doi":"10.1093/jmicro/dfae028","DOIUrl":"10.1093/jmicro/dfae028","url":null,"abstract":"<p><p>We have demonstrated a quantification of all component wires in a bent electric cable, which is necessary for discussion of cable products in actual use cases. Quantification became possible for the first time because of our new technologies for image analysis of bent cables. In this paper, various image analysis techniques to detect all wire tracks in a bent cable are demonstrated. Unique cross-sectional image construction and deep active learning schemes are the most important items in this study. These methods allow us to know the actual state of cables under external loads, which makes it possible to elucidate the mechanisms of various phenomena related to cables in the field and further improve the quality of cable products.</p>","PeriodicalId":74193,"journal":{"name":"Microscopy (Oxford, England)","volume":" ","pages":"499-510"},"PeriodicalIF":0.0,"publicationDate":"2024-12-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141097016","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Recent advancement and human tissue applications of volume electron microscopy. 体视电子显微镜的最新进展和人体组织应用。
Microscopy (Oxford, England) Pub Date : 2024-10-18 DOI: 10.1093/jmicro/dfae047
Makoto Abe, Nobuhiko Ohno
{"title":"Recent advancement and human tissue applications of volume electron microscopy.","authors":"Makoto Abe, Nobuhiko Ohno","doi":"10.1093/jmicro/dfae047","DOIUrl":"https://doi.org/10.1093/jmicro/dfae047","url":null,"abstract":"<p><p>Structural observations are essential for the advancement of life science. Volume electron microscopy has recently realized remarkable progress in the three-dimensional analyses of biological specimens for elucidating complex ultrastructures in several fields of life science. The advancements in volume electron microscopy technologies have led to improvements, including higher resolution, more stability, and the ability to handle larger volumes. Although human applications of volume electron microscopy remain limited, the reported applications in various organs have already provided previously unrecognized features of human tissues and also novel insights of human diseases. Simultaneously, the application of volume electron microscopy to human studies faces challenges, including ethical and clinical hurdles, costs of data storage and analysis, and efficient and automated imaging methods for larger volume. Solutions including the use of residual clinical specimens and data analysis based on artificial intelligence would address those issues and establish the role of volume electron microscopy in human structural research. Future advancements in volume electron microscopy are anticipated to lead to transformative discoveries in basic research and clinical practice, deepening our understanding of human health and diseases for better diagnostic and therapeutic strategies.</p>","PeriodicalId":74193,"journal":{"name":"Microscopy (Oxford, England)","volume":" ","pages":""},"PeriodicalIF":0.0,"publicationDate":"2024-10-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142482450","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Simple derivation of L-absorption spectra of 3d transition metal elements by the self-absorption effect observed in soft X-ray emission spectra. 通过软 X 射线发射光谱中观察到的自吸收效应简单推导出 3d 过渡金属元素的 L 吸收光谱。
Microscopy (Oxford, England) Pub Date : 2024-10-04 DOI: 10.1093/jmicro/dfae012
Masami Terauchi, Yohei K Sato, Takaomi D Yokoyama, Takanori Murano
{"title":"Simple derivation of L-absorption spectra of 3d transition metal elements by the self-absorption effect observed in soft X-ray emission spectra.","authors":"Masami Terauchi, Yohei K Sato, Takaomi D Yokoyama, Takanori Murano","doi":"10.1093/jmicro/dfae012","DOIUrl":"10.1093/jmicro/dfae012","url":null,"abstract":"<p><p>This study proposes a simple evaluation method for deriving L-absorption information from two L-emission spectra of 3d transition metal (TM) elements obtained at two different accelerating voltages. This method realizes a spatial identity for X-ray emission and absorption spectroscopies. This method was evaluated for the Fe L-emission spectra of Fe and its oxides and was applied to the TM L-emission spectra of MnO, Co, CoO and NiO. The derived absorption peak positions were consistent with those obtained previously at synchrotron orbital radiation facilities, which considered the core-hole effect. This simple derivation method could be useful for obtaining X-ray absorption spectroscopy distribution images from X-ray emission spectroscopy mapping data obtained by scanning electron microscopy.</p>","PeriodicalId":74193,"journal":{"name":"Microscopy (Oxford, England)","volume":" ","pages":"451-455"},"PeriodicalIF":0.0,"publicationDate":"2024-10-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"140029725","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Deciphering prefrontal circuits underlying stress and depression: exploring the potential of volume electron microscopy. 解密压力和抑郁的前额叶回路:探索容积电子显微镜的潜力
Microscopy (Oxford, England) Pub Date : 2024-10-04 DOI: 10.1093/jmicro/dfae036
Hirotaka Nagai
{"title":"Deciphering prefrontal circuits underlying stress and depression: exploring the potential of volume electron microscopy.","authors":"Hirotaka Nagai","doi":"10.1093/jmicro/dfae036","DOIUrl":"10.1093/jmicro/dfae036","url":null,"abstract":"<p><p>Adapting to environmental changes and formulating behavioral strategies are central to the nervous system, with the prefrontal cortex being crucial. Chronic stress impacts this region, leading to disorders including major depression. This review discusses the roles for prefrontal cortex and the effects of stress, highlighting similarities and differences between human/primates and rodent brains. Notably, the rodent medial prefrontal cortex is analogous to the human subgenual anterior cingulate cortex in terms of emotional regulation, sharing similarities in cytoarchitecture and circuitry, while also performing cognitive functions similar to the human dorsolateral prefrontal cortex. It has been shown that chronic stress induces atrophic changes in the rodent mPFC, which mirrors the atrophy observed in the subgenual anterior cingulate cortex and dorsolateral prefrontal cortex of depression patients. However, the precise alterations in neural circuitry due to chronic stress are yet to be fully unraveled. The use of advanced imaging techniques, particularly volume electron microscopy, is emphasized as critical for the detailed examination of synaptic changes, providing a deeper understanding of stress and depression at the molecular, cellular and circuit levels. This approach offers invaluable insights into the alterations in neuronal circuits within the medial prefrontal cortex caused by chronic stress, significantly enriching our understanding of stress and depression pathologies.</p>","PeriodicalId":74193,"journal":{"name":"Microscopy (Oxford, England)","volume":" ","pages":"391-404"},"PeriodicalIF":0.0,"publicationDate":"2024-10-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141753477","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Limitations and drawbacks of DQE estimation methods applied to electron detectors. 应用于电子探测器的 DQE 估算方法的局限性和缺点。
Microscopy (Oxford, England) Pub Date : 2024-10-04 DOI: 10.1093/jmicro/dfae016
Olivier Marcelot, Cécile Marcelot, Sébastien Rolando
{"title":"Limitations and drawbacks of DQE estimation methods applied to electron detectors.","authors":"Olivier Marcelot, Cécile Marcelot, Sébastien Rolando","doi":"10.1093/jmicro/dfae016","DOIUrl":"10.1093/jmicro/dfae016","url":null,"abstract":"<p><p>The detective quantum efficiency (DQE) is generally accepted as the main figure of merit for the comparison between electron detectors, and most of the time given as a unique number at the Nyquist frequency while it is known to vary with electron dose. It is usually estimated, thanks to a method improved by McMullan in 2009. The purpose of this work is to analyze and to criticize this DQE extraction method on the basis of measurement and model results, and to give recommendations for fair comparison between detectors, wondering if the DQE is the right figure of merit for electron detectors.</p>","PeriodicalId":74193,"journal":{"name":"Microscopy (Oxford, England)","volume":" ","pages":"405-413"},"PeriodicalIF":0.0,"publicationDate":"2024-10-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"140159753","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
相关产品
×
本文献相关产品
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信