Microscopy (Oxford, England)最新文献_第5页

Acceptance characterization of electron detector in SEM using stainless steel sphere. 使用不锈钢球对扫描电子显微镜中的电子探测器进行验收表征。

Microscopy (Oxford, England) Pub Date : 2025-03-31 DOI: 10.1093/jmicro/dfae050

Takashi Sekiguchi, Yuanzhao Yao, Ryosuke Sonoda, Yasunari Sohda

{"title":"Acceptance characterization of electron detector in SEM using stainless steel sphere.","authors":"Takashi Sekiguchi, Yuanzhao Yao, Ryosuke Sonoda, Yasunari Sohda","doi":"10.1093/jmicro/dfae050","DOIUrl":"10.1093/jmicro/dfae050","url":null,"abstract":"Although modern scanning electron microscope (SEM) possesses several electron detectors, it is not clear what kind of information is contained in a SEM image taken by a certain detector. Specifically, the detectors installed in the objective lens are difficult to know their characters. Thus, we propose a simple method to assess the acceptance of electron detector using a stainless steel sphere. After taking images under certain conditions, say electron beam energy, working distance (WD), etc., the image intensity of each pixel point, which is characterized by coordinate (θ, φ), is evaluated. The advantage of this method is the ease of implementation and the whole information of electron emission from the tilted surfaces is contained in the image. Using this information, the acceptance of the detector can be analyzed systematically. In this paper, the traditional Everhart-Thornley (ET) detector is analyzed with this method. It is demonstrated how the sphere image changes according to the measurement condition. The ET image quality is strongly governed by WD but not so much by the electron beam energy. We propose an alternative method to avoid the ambiguity of WD. Using a needle-type specimen stage, the ET image does not vary so much with WD and the reliability of ET image significantly improves.","PeriodicalId":74193,"journal":{"name":"Microscopy (Oxford, England)","volume":" ","pages":"79-85"},"PeriodicalIF":0.0,"publicationDate":"2025-03-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142482448","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Resolution improvement of differential phase-contrast microscopy via tilt-series acquisition for environmental cell application. 通过倾斜序列采集提高环境细胞应用中的差分相位对比显微镜分辨率

Microscopy (Oxford, England) Pub Date : 2025-03-31 DOI: 10.1093/jmicro/dfae049

Kazutaka Mitsuishi, Fumiaki Ichihashi, Yoshio Takahashi, Katsuaki Nakazawa, Masaki Takeguchi, Ayako Hashimoto, Toshiaki Tanigaki

引用次数: 0

Observation of morphological changes in silicon-based negative-electrode active materials during charging/discharging using Operando scanning electron microscopy. 用operando扫描电镜观察硅基负极活性材料在充放电过程中的形态变化。

Microscopy (Oxford, England) Pub Date : 2025-03-31 DOI: 10.1093/jmicro/dfae060

Takako Kurosawa, Noriaki Fukumoto, Kaoru Inoue, Emiko Igaki

引用次数: 0

Basic properties of solidified organic liquids at a cryogenic temperature for electron microscopic visualization and sample preparation of dispersion systems. 低温下固化有机液体的基本性质，用于电镜观察和分散体系的样品制备。

Microscopy (Oxford, England) Pub Date : 2025-03-31 DOI: 10.1093/jmicro/dfae059

Satoshi Okada

{"title":"Basic properties of solidified organic liquids at a cryogenic temperature for electron microscopic visualization and sample preparation of dispersion systems.","authors":"Satoshi Okada","doi":"10.1093/jmicro/dfae059","DOIUrl":"10.1093/jmicro/dfae059","url":null,"abstract":"It is challenging to image structures in liquids for electron microscopy (EM); thus, low-temperature imaging has been developed, initially for aqueous systems. Organic liquids (OLs) are widely used as dispersants, although their cryogenic EM (cryo-EM) imaging is less common than that of aqueous systems. This is because the basic properties (e.g. vapor pressure, density and amorphousness) of OL in the solid state have not been extensively investigated, preventing the determination of whether the observed structure is free from artifacts. Herein, I summarized physical data related to the phase change, and the solid density at 77 K and sublimation speed for some OLs were measured independently to discuss the applicability of OLs for cryo-EM. Among various OL properties, the sublimation temperature, pressure and rate and crystallinity are important for cryo-EM. The sublimation-related properties are used to judge whether the OL is stable during storage, observation and sample preparation such as etching. These properties were calculated, and the calculated sublimation speed matched with that measured by cryogenic scanning EM movie imaging. Crystallinity was estimated using the difference between the extrapolated temperature-dependent liquid density and the solid density of frozen OLs measured in liquid nitrogen. Artifacts observed upon freezing were exemplified by focused ion beam cross-sections of OL-in-water emulsions, and cracks, voids and wrinkles are found in the OL phase at a large shrinkage ratio. The study findings show that the applicability of OLs largely differs for structural isomers and that appropriate OLs are required for the cryo-EM imaging of nonaqueous systems.","PeriodicalId":74193,"journal":{"name":"Microscopy (Oxford, England)","volume":" ","pages":"124-133"},"PeriodicalIF":0.0,"publicationDate":"2025-03-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142959854","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Correction to: Low-dose measurement of electric potential distribution in organic light-emitting diode by phase-shifting electron holography with 3D tensor decomposition. 修正：用三维张量分解相移电子全息法测量有机发光二极管的低剂量电位分布。

Microscopy (Oxford, England) Pub Date : 2025-03-31 DOI: 10.1093/jmicro/dfae058

引用次数: 0

Correction to: Microstructural observation of casein micelles in milk by cryo-electron microscopy of vitreous sections (CEMOVIS). 更正：通过玻璃体切片冷冻电镜（CEMOVIS）观察牛奶中酪蛋白胶束的微观结构。

Microscopy (Oxford, England) Pub Date : 2025-03-31 DOI: 10.1093/jmicro/dfae053

引用次数: 0

Anisotropic electronic structure study of MgB2C2 using soft X-ray emission spectroscopy microscopes. 利用软 X 射线发射光谱显微镜研究 MgB2C2 的各向异性电子结构。

Microscopy (Oxford, England) Pub Date : 2025-03-31 DOI: 10.1093/jmicro/dfae048

Yuki Hada, Masami Terauchi, Tomoya Saito, Yohei K Sato, Masaaki Baba, Masatoshi Takeda

{"title":"Anisotropic electronic structure study of MgB2C2 using soft X-ray emission spectroscopy microscopes.","authors":"Yuki Hada, Masami Terauchi, Tomoya Saito, Yohei K Sato, Masaaki Baba, Masatoshi Takeda","doi":"10.1093/jmicro/dfae048","DOIUrl":"10.1093/jmicro/dfae048","url":null,"abstract":"The anisotropic electronic structure of MgB2C2 was studied using soft X-ray emission spectroscopy electron microscopes. MgB2C2 fragments were selected by examining C K-emission profiles. C and B K-emission and Mg L-emission spectra were obtained, revealing common and distinct structures that reflect the mixing of valence orbitals. Since the material is reported to have two-dimensional B-C honeycomb layers, the orientational dependence of these emission spectra was also examined. Experimental data were compared with the theoretically calculated partial density of states of the valence bands (VBs) of the material. The C K-emission profile showed an apparent orientational dependence, while the B K-emission exhibited minimal dependence. This difference originated from the different energy distributions of C-2pz and B-2pz components in the VBs. The Mg L-emission intensity was very small, likely due to charge transfer from Mg atoms to B-N layers. The Mg L-emission profile showed a peak related to structures in C-K and B-K. An unexpected intensity was observed just above the VBs, which also showed orientational dependence, possibly due to a small deviation from the ideal composition of Mg:B:C = 1:2:2.","PeriodicalId":74193,"journal":{"name":"Microscopy (Oxford, England)","volume":" ","pages":"86-91"},"PeriodicalIF":0.0,"publicationDate":"2025-03-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142482449","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Derivation method of the dielectric function of amorphous materials using angle-resolved electron energy loss spectroscopy for exciton size evaluation. 非晶态材料介电函数的角分辨电子能量损失谱推导方法用于激子尺寸评价。

Microscopy (Oxford, England) Pub Date : 2025-03-31 DOI: 10.1093/jmicro/dfae056

Tomoya Saito, Yohei K Sato, Masami Terauchi

{"title":"Derivation method of the dielectric function of amorphous materials using angle-resolved electron energy loss spectroscopy for exciton size evaluation.","authors":"Tomoya Saito, Yohei K Sato, Masami Terauchi","doi":"10.1093/jmicro/dfae056","DOIUrl":"10.1093/jmicro/dfae056","url":null,"abstract":"Accurately deriving the momentum transfer dependence of the dielectric function ε(q, ω) using angle-resolved electron energy loss spectroscopy (AR-EELS) is necessary for evaluating the average electron-hole distance, i.e. the exciton size, in materials. Achieving accurate exciton size evaluations will promote the comprehension of optical functionality in materials such as photocatalysts. However, for amorphous materials, it is difficult to accurately derive ε(q, ω) because the elastic scattering intensity originating from the amorphous structure and the inelastic scattering intensity associated with elastic scattering overlap in the EELS spectrum. In this study, a method to remove these overlapping intensities from the EELS spectrum is proposed to accurately derive ε(q, ω) of an amorphous material. Amorphous SiO2 (am-SiO2) was subjected to AR-EELS measurements, and ε(q, ω) of am-SiO2 was derived after removing the intensity due to the amorphous structure using the proposed method. Thereafter, the exciton absorption intensity and the exciton size were evaluated. Applying the proposed method, the exciton absorption intensity was considerably suppressed in the q-region after 1.0 Å-1, where the elastic and inelastic scattering intensities originating from the amorphous structure are dominant. The exciton size evaluated was 2 nm ($ pm $ 1 nm), consistent with the theoretically predicted size of ∼1 nm. Therefore, the proposed method is effective for deriving accurate ε(q, ω), facilitating exciton size evaluation for amorphous materials using AR-EELS.","PeriodicalId":74193,"journal":{"name":"Microscopy (Oxford, England)","volume":" ","pages":"117-123"},"PeriodicalIF":0.0,"publicationDate":"2025-03-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC11957257/pdf/","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143191528","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Correction to: Structures of multisubunit membrane complexes with the CRYO ARM 200. 修正：多亚基膜复合物的结构与CRYO ARM 200。

Microscopy (Oxford, England) Pub Date : 2025-03-31 DOI: 10.1093/jmicro/dfae057

引用次数: 0

Improved dopant fraction variance estimation in statistical ALCHEMI based on correct error propagation rule. 基于正确的误差传播规则改进统计 ALCHEMI 中的掺杂分数方差估计。

Microscopy (Oxford, England) Pub Date : 2025-03-31 DOI: 10.1093/jmicro/dfae052

Akimitsu Ishizuka, Masahiro Ohtsuka, Shunsuke Muto

引用次数: 0