Microscopy (Oxford, England)最新文献_第5页

Limitations and drawbacks of DQE estimation methods applied to electron detectors. 应用于电子探测器的 DQE 估算方法的局限性和缺点。

Microscopy (Oxford, England) Pub Date : 2024-10-04 DOI: 10.1093/jmicro/dfae016

Olivier Marcelot, Cécile Marcelot, Sébastien Rolando

引用次数: 0

Retraction of: Ultrastructural immunohistochemical study of L-type amino acid transporter 1-4F2 heavy chain in tumor microvasculatures of N-butyl-N-(4-hydroxybutyl) nitrosamine (BBN) induced rat bladder carcinoma. 撤回：N-丁基-N-（4-羟基丁基）亚硝胺（BBN）诱导的大鼠膀胱癌肿瘤微血管中L型氨基酸转运体1-4F2重链的超微结构免疫组化研究

Microscopy (Oxford, England) Pub Date : 2024-10-04 DOI: 10.1093/jmicro/dfae033

引用次数: 0

Application of Hilbert-differential phase contrast to scanning transmission electron microscopy. 扫描透射电子显微镜中的希尔伯特-差分相位对比应用。

Microscopy (Oxford, England) Pub Date : 2024-10-04 DOI: 10.1093/jmicro/dfae015

Haruka Iga, Toshiki Shimizu, Hiroki Minoda

引用次数: 0

Effective alignment method using a diamond notch knife for correlative array tomography. 使用金刚石缺口刀进行相关阵列断层扫描的有效对准方法。

Microscopy (Oxford, England) Pub Date : 2024-10-04 DOI: 10.1093/jmicro/dfae013

Yumi Goto, Noriko Takeda-Kamiya, Kaori Yamaguchi, Mikio Yamazaki, Kiminori Toyooka

引用次数: 0

Unlocking the potential of large-scale 3D imaging with tissue clearing techniques. 利用组织清除技术释放大规模三维成像的潜力。

Microscopy (Oxford, England) Pub Date : 2024-09-28 DOI: 10.1093/jmicro/dfae046

Etsuo A Susaki

{"title":"Unlocking the potential of large-scale 3D imaging with tissue clearing techniques.","authors":"Etsuo A Susaki","doi":"10.1093/jmicro/dfae046","DOIUrl":"https://doi.org/10.1093/jmicro/dfae046","url":null,"abstract":"The three-dimensional (3D) anatomical structure of living organisms is intrinsically linked to their functions, yet modern life sciences have not fully explored this aspect. Recently, the combination of efficient tissue clearing techniques and light-sheet fluorescence microscopy (LSFM) for rapid 3D imaging has improved access to 3D spatial information in biological systems. This technology has found applications in various fields, including neuroscience, cancer research, and clinical histopathology, leading to significant insights. It allows imaging of entire organs or even whole bodies of animals and humans at multiple scales. Moreover, it enables a form of spatial omics by capturing and analyzing cellome information, which represents the complete spatial organization of cells. While current 3D imaging of cleared tissues has limitations in obtaining sufficient molecular information, emerging technologies such as multi-round tissue staining and super-multicolor imaging are expected to address these constraints. 3D imaging using tissue clearing and light-sheet microscopy thus offers a valuable research tool in the current and future life sciences for acquiring and analyzing large-scale biological spatial information.","PeriodicalId":74193,"journal":{"name":"Microscopy (Oxford, England)","volume":" ","pages":""},"PeriodicalIF":0.0,"publicationDate":"2024-09-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142333935","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Electron holography observation of electron spin polarization around charged insulating wire. 带电绝缘线周围电子自旋极化的电子全息观察。

Microscopy (Oxford, England) Pub Date : 2024-07-30 DOI: 10.1093/jmicro/dfad056

Takafumi Sato, Keiko Shimada, Zentaro Akase, Hideyuki Magara, Takeshi Tomita, Daisuke Shindo

引用次数: 0

Three-dimensional nanostructure analysis of non-stained Nafion in fuel-cell electrode by combined ADF-STEM tomography. 利用 ADF-STEM 层析成像技术对燃料电池电极中未染色的 Nafion 进行三维纳米结构分析。

Microscopy (Oxford, England) Pub Date : 2024-07-30 DOI: 10.1093/jmicro/dfae002

Takuji Ube

{"title":"Three-dimensional nanostructure analysis of non-stained Nafion in fuel-cell electrode by combined ADF-STEM tomography.","authors":"Takuji Ube","doi":"10.1093/jmicro/dfae002","DOIUrl":"10.1093/jmicro/dfae002","url":null,"abstract":"The polymer electrolyte fuel cell (PEFC) is one of the strongest candidates for a next-generation power source for vehicles which do not emit CO2 gas as exhaust gas. The key factor in PEFCs is the nano-scaled electrochemical reactions that take place on the catalyst material and an ionomer supported by a carbon support. However, because the nano-scaled morphological features of the key materials in the catalyst compound cannot be observed clearly by transmission electron microscopy, improvement of PEFC performance had been approached by an imaginal schematic diagram based on an electrochemical analysis. In this study, we revealed the nano-scaled morphological features of the PEFC electrode in three dimensions and performed a quantitative analysis of the nanostructure by the newly developed 'Combined ADF-STEM tomography technique'. This method combines information from plural annular darkfield detectors with different electron collection angles and can emphasize the difference of the electron scattering intensity between the ionomer and carbon in the cross-sectional image of the reconstructed three-dimensional (3D) data. Therefore, this segmentation method utilizing image contrast does not require a high electron beam current like that used in energy dispersive X-ray analysis, and thus is suitable for electron beam damage-sensitive materials. By eliminating the process of manually determining the thresholds for obtaining classified component data from grayscale data, the obtained 3D structures have sufficient accuracy to allow quantitative analysis and specify the nano-scaled structural parameters directly related to power generation characteristics.","PeriodicalId":74193,"journal":{"name":"Microscopy (Oxford, England)","volume":" ","pages":"318-328"},"PeriodicalIF":0.0,"publicationDate":"2024-07-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC11288185/pdf/","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"139473164","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Observation and quantitative analysis of dislocations in steel using electron channeling contrast imaging method with precise control of electron beam incident direction. 利用精确控制电子束入射方向的电子通道对比成像方法观测和定量分析钢中的位错。

Microscopy (Oxford, England) Pub Date : 2024-07-30 DOI: 10.1093/jmicro/dfad061

Takashige Mori, Takafumi Amino, Chie Yokoyama, Shunsuke Taniguchi, Takayuki Yonezawa, Akira Taniyama

{"title":"Observation and quantitative analysis of dislocations in steel using electron channeling contrast imaging method with precise control of electron beam incident direction.","authors":"Takashige Mori, Takafumi Amino, Chie Yokoyama, Shunsuke Taniguchi, Takayuki Yonezawa, Akira Taniyama","doi":"10.1093/jmicro/dfad061","DOIUrl":"10.1093/jmicro/dfad061","url":null,"abstract":"Electron channeling contrast imaging (ECCI) was applied by precisely controlling the primary electron beam incident direction of the crystal plane in scanning electron microscope (SEM), and the dislocation contrast in steel materials was investigated in detail via SEM/ECCI. The dislocation contrast was observed near a channeling condition, where the incident electron beam direction of the crystal plane varied, and the backscattered electron intensity reached a local minimum. Comparing the dislocation contrasts in the visualized electron channeling contrast (ECC) images and transmission electron microscope (TEM) images, the positions of all dislocation lines were coincident. During the SEM/ECCI observation, the dislocation contrast varied depending on the incident electron beam direction of the crystal plane and accelerating voltages, and optimal conditions existed. When the diffraction condition g and the Burgers vector b of dislocation satisfied the condition g⸱b = 0, the screw dislocation contrast in the ECC image disappeared. An edge dislocation line was wider than a screw dislocation line. Thus, the SEM/ECCI method can be used for dislocation characterization and the strain field evaluation around dislocation, like the TEM method. The depth information of SEM/ECCI, where the channeling condition is strictly satisfied, can be obtained from dislocation contrast deeper than 5ξg, typically used for depth of SEM/ECCI.","PeriodicalId":74193,"journal":{"name":"Microscopy (Oxford, England)","volume":" ","pages":"308-317"},"PeriodicalIF":0.0,"publicationDate":"2024-07-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC11288192/pdf/","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"138812984","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Artifactual atomic displacements on surfaces using annular dark-field images with image simulation. 利用环形暗视野图像和图像模拟在表面上伪造原子位移。

Microscopy (Oxford, England) Pub Date : 2024-07-30 DOI: 10.1093/jmicro/dfae001

Shunsuke Kobayashi, Kousuke Ooe, Kei Nakayama, Akihide Kuwabara

引用次数: 0

A simple coordinate transformation method for quickly locating the features of interest in TEM samples. 在 TEM 样品中快速定位相关特征的简单坐标转换方法。

Microscopy (Oxford, England) Pub Date : 2024-07-30 DOI: 10.1093/jmicro/dfae009

Mingzhi Zeng, Wenzhao Wang, Yang Yin, Changlin Zheng

{"title":"A simple coordinate transformation method for quickly locating the features of interest in TEM samples.","authors":"Mingzhi Zeng, Wenzhao Wang, Yang Yin, Changlin Zheng","doi":"10.1093/jmicro/dfae009","DOIUrl":"10.1093/jmicro/dfae009","url":null,"abstract":"We developed a simple coordinate transformation method for quickly locating features of interest (FOIs) of samples in transmission electron microscope (TEM). The method is well suited for conducting sample searches in aberration-corrected scanning/transmission electron microscopes (S/TEM), where the survey can be very time-consuming because of the limited field of view imposed by the highly excited objective lens after fine-tuning the aberration correctors. For implementation, a digital image of the sample and the TEM holder was captured using a simple stereo-optical microscope. Naturally presented geometric patterns on the holder were referenced to construct a projective transformation between the electron and optical coordinate systems. The test results demonstrated that the method was accurate and required no electron microscope or specimen holder modifications. Additionally, it eliminated the need to mount the sample onto specific patterned TEM grids or deposit markers, resulting in universal applications for most TEM samples, holders and electron microscopes for fast FOI identification. Furthermore, we implemented the method into a Gatan script for graphical-user-interface-based step-by-step instructions. Through online communication, the script enabled real-time navigation and tracking of the motion of samples in TEM on enlarged optical images with a panoramic view.","PeriodicalId":74193,"journal":{"name":"Microscopy (Oxford, England)","volume":" ","pages":"381-387"},"PeriodicalIF":0.0,"publicationDate":"2024-07-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"139992062","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0