Microscopy (Oxford, England)最新文献_第6页

Valence electron spectroscopy using soft X-ray emission spectroscopy electron microscopes. 使用软x射线发射光谱电子显微镜的价电子能谱。

IF 1.9

Microscopy (Oxford, England) Pub Date : 2026-04-01 DOI: 10.1093/jmicro/dfaf057

Masami Terauchi

{"title":"Valence electron spectroscopy using soft X-ray emission spectroscopy electron microscopes.","authors":"Masami Terauchi","doi":"10.1093/jmicro/dfaf057","DOIUrl":"10.1093/jmicro/dfaf057","url":null,"abstract":"Compact soft-X-ray emission spectroscopy (SXES) instrument, which was first applied to transmission electron microscope, was recently applied to scanning electron microscope and electron-probe microanalyzer, which improved the practical applicability of SXES as a tool for investigating chemical bonding state of elements in bulk materials. Intensity profiles of Al-L, B-K and Si-L emission spectra, which directly reflect the partial density of state of valence band (VB), were explained. Those energy positions are affected by core-level shift (chemical shift, CS) and a change of density of state (DOS) of VB, for example a bandgap formation. Those VB DOS measurements, combined with electron-beam scanning technique, can conduct a chemical bond mapping of a bulk material. It was presented that L-emission spectra of 3d transition-metal elements give DOS+CS information in Lα,β emission, dielectric information in Lℓ,η, and the number of 3d electrons in the integrated intensity ratio of Lα,β/(Lα,β+ Lℓ,η). Since the electron-beam excited SXES experiment for bulk specimens can control the self-absorption effect, L-absorption profile of 3d-TM elements is obtainable from L-emission measurements by changing the accelerating voltage. Furthermore, CB information can be obtained from SXES spectra of semiconductor materials; Si and diamond cases were presented, by using the self-absorption effect on the background intensity of bremsstrahlung (BS) caused by electron-beam irradiation of the specimen.","PeriodicalId":74193,"journal":{"name":"Microscopy (Oxford, England)","volume":" ","pages":"195-208"},"PeriodicalIF":1.9,"publicationDate":"2026-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145847008","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Analysis of photo-functional materials using momentum-resolved EELS. 利用动量分辨EELS分析光功能材料。

IF 1.9

Microscopy (Oxford, England) Pub Date : 2026-04-01 DOI: 10.1093/jmicro/dfag006

Yohei K Sato

{"title":"Analysis of photo-functional materials using momentum-resolved EELS.","authors":"Yohei K Sato","doi":"10.1093/jmicro/dfag006","DOIUrl":"10.1093/jmicro/dfag006","url":null,"abstract":"Momentum transfer (q)-resolved electron energy-loss spectroscopy (q-EELS) is a powerful tool for analyzing photo-functional materials. The technique's application has been demonstrated in several recent studies. This study first investigated the anisotropic plasmon oscillations in Cs-doped hexagonal WO3, a near-infrared (NIR) shielding material, to understand the origin of its highly efficient light-scattering properties. This revealed how plasmon energies differ along different crystallographic directions, contributing to the broad NIR absorption capabilities of the material. Second, the study measured the q dispersion of carrier plasmons and thus quantified interactions (exchange-correlation effect) between carrier electrons in LaB6 crystals, another NIR shielding filter. This analysis provides critical insights into many-body effects not captured by the ideal free-electron gas model. Finally, the spatial spread sizes of excitons in anatase TiO2 were determined, establishing a correlation between the exciton size and the anisotropic photocatalytic activity of anatase TiO2. Collectively, this research demonstrates that q-EELS provides unique, q-dependent information on electronic excitations, deepening our understanding of the properties governing the performance of advanced materials.","PeriodicalId":74193,"journal":{"name":"Microscopy (Oxford, England)","volume":" ","pages":"116-128"},"PeriodicalIF":1.9,"publicationDate":"2026-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC13069902/pdf/","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"146196334","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Recent progress in electron energy loss spectroscopy with concurrent spatial and momentum resolution. 同步空间和动量分辨率的电子能量损失谱研究进展。

IF 1.9

Microscopy (Oxford, England) Pub Date : 2026-04-01 DOI: 10.1093/jmicro/dfaf035

Lan Song, Ruilin Mao, Peng Gao

{"title":"Recent progress in electron energy loss spectroscopy with concurrent spatial and momentum resolution.","authors":"Lan Song, Ruilin Mao, Peng Gao","doi":"10.1093/jmicro/dfaf035","DOIUrl":"10.1093/jmicro/dfaf035","url":null,"abstract":"Scanning transmission electron microscopy-electron energy loss spectroscopy (STEM-EELS) has emerged as a state-of-the-art characterization modality in materials science, undergoing transformative advancements over the past decade. Revolutionary developments in monochromator technology have pushed EELS energy resolution into the sub-10 meV regime, enabling investigations of low-energy excitations such as phonons, excitons, plasmons and polaritons at nanometer and sub-nanometer scales, in addition to traditional core-loss spectroscopy. Besides to the high spatial resolution and high energy resolution, the coherent nature of STEM electron probes now allows momentum-resolved spectral information to be acquired, providing an ideal platform for correlating nanoscale structural features with functional properties at the nanometer and atomic level. This review surveys recent breakthroughs in STEM-EELS methodology, with particular emphasis on the four-dimensional electron energy loss spectroscopy (4D-EELS) technique, which simultaneously captures spectral information across spatial, momentum and energy dimensions with unprecedented efficiency. We highlight landmark scientific discoveries enabled by this spontaneous spatial-momentum resolving capability, including phonon dispersion mapping, plasmon dispersion mapping and magnon mapping. The review concludes with perspectives on future technical refinements, such as resolution enhancements, machine learning-driven data analytics and in-situ characterization capabilities, and the potential of this technology to revolutionize interdisciplinary research in quantum materials and nanophotonics.","PeriodicalId":74193,"journal":{"name":"Microscopy (Oxford, England)","volume":" ","pages":"76-88"},"PeriodicalIF":1.9,"publicationDate":"2026-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144981566","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Data-driven ELNES/XANES analysis: predicting spectra, unveiling structures and quantifying properties. 数据驱动的ELNES/XANES分析：预测光谱，揭示结构和量化属性。

IF 1.9

Microscopy (Oxford, England) Pub Date : 2026-04-01 DOI: 10.1093/jmicro/dfaf038

Teruyasu Mizoguchi

{"title":"Data-driven ELNES/XANES analysis: predicting spectra, unveiling structures and quantifying properties.","authors":"Teruyasu Mizoguchi","doi":"10.1093/jmicro/dfaf038","DOIUrl":"10.1093/jmicro/dfaf038","url":null,"abstract":"Core-loss spectroscopies using electrons and X-rays, such as electron energy loss near-edge structures (ELNES) and X-ray absorption near-edge structures (XANES), are indispensable tools for materials characterization and development. These techniques provide detailed insights into atomic environments, chemical bonding, and vibrational properties that underpin material functionality. Traditionally, ELNES/XANES analyses have relied on qualitative interpretation or comparisons with reference spectra obtained from experiments and/or simulations. Recent advances in data-driven approaches, however, have enabled more quantitative and predictive use of these spectra. This review highlights newly developed data-driven methodologies that extend far beyond conventional ELNES/XANES analysis. These approaches accelerate ELNES/XANES simulations, enable the extraction of radial distribution functions, and quantify multiple material properties directly from spectral data. To enhance the interpretability of machine learning (ML) predictions, sensitivity analysis is employed to elucidate the relationships between specific spectral features and target properties. The rapid growth of open materials databases, coupled with increasingly powerful ML models, has further fueled these developments. Together, these advances would point to a future in which automated, interpretable and scalable spectroscopy serves as a central driver for deeper understandings and accelerated materials discovery.","PeriodicalId":74193,"journal":{"name":"Microscopy (Oxford, England)","volume":" ","pages":"164-184"},"PeriodicalIF":1.9,"publicationDate":"2026-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC13069900/pdf/","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145234475","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Impact of atomic thermal motion on the Ti L2,3-edge fine structure. 原子热运动对Ti L2三棱精细结构的影响

IF 1.9

Microscopy (Oxford, England) Pub Date : 2026-04-01 DOI: 10.1093/jmicro/dfaf042

Mitsutaka Haruta, I-Ching Lin, Takashi Nemoto, Hiroki Kurata

{"title":"Impact of atomic thermal motion on the Ti L2,3-edge fine structure.","authors":"Mitsutaka Haruta, I-Ching Lin, Takashi Nemoto, Hiroki Kurata","doi":"10.1093/jmicro/dfaf042","DOIUrl":"10.1093/jmicro/dfaf042","url":null,"abstract":"This review examines the effects of thermal vibrations on core-level excitation spectra, with a particular emphasis on the Ti L2,3-edge spectra of cubic perovskite-type titanium oxides (SrTiO3 and PbTiO3). Based on combining scanning transmission electron microscopy energy-loss near-edge structure analyses with cluster-type crystal-field multiplet calculations, the influence of atomic thermal vibrations on the fine structure of the Ti L2,3-edge is investigated, and it is demonstrated that the thermal vibration of oxygen atoms in cubic SrTiO3 can be estimated from the spectrum by fitting experimental and theoretical results. The same approach was extended to cubic PbTiO3 such that isotropic thermal vibrations were identified that relate to the difference in the transition to a low-temperature tetragonal phase. Although the present technique does not directly resolve phonon modes, it treats thermal factors as adjustable parameters, enabling the identification of subtle vibrational features even in materials already widely studied. Further investigation of the relationship between thermal vibrations and the fine structure of core-loss spectra could assist in elucidating certain material properties.","PeriodicalId":74193,"journal":{"name":"Microscopy (Oxford, England)","volume":" ","pages":"185-194"},"PeriodicalIF":1.9,"publicationDate":"2026-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145245556","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Angle-resolved cathodoluminescence microscopy on plasmonic crystals. 等离子体晶体的角度分辨阴极发光显微镜。

IF 1.9

Microscopy (Oxford, England) Pub Date : 2026-04-01 DOI: 10.1093/jmicro/dfag002

Hikaru Saito, Takumi Sannomiya

引用次数: 0

Exploring electronic, optical and vibrational properties of low-dimensional materials using monochromated EELS. 利用单色EELS探索低维材料的电子、光学和振动特性。

IF 1.9

Microscopy (Oxford, England) Pub Date : 2026-04-01 DOI: 10.1093/jmicro/dfag005

Ryosuke Senga

{"title":"Exploring electronic, optical and vibrational properties of low-dimensional materials using monochromated EELS.","authors":"Ryosuke Senga","doi":"10.1093/jmicro/dfag005","DOIUrl":"10.1093/jmicro/dfag005","url":null,"abstract":"Low-dimensional materials, such as fullerenes, carbon nanotubes, graphene, hexagonal boron nitride and transition metal dichalcogenides have garnered significant attention as candidates for next-generation device components. Their distinctive properties stem from reduced dimensionality and are significantly influenced by the behavior of quasiparticles, including excitons and phonons, particularly in non-periodic structures like vacancies and edges. Correlating local atomic structures with spectral features is crucial for elucidating their physical properties. Scanning transmission electron microscopy coupled with electron energy loss spectroscopy (EELS) offers localized spectral information at the single-atom level, providing valuable insights for materials characterization. Recent advances in monochromators for transmission electron microscopy have enhanced the energy resolution of EELS, enabling the measurement of optical and vibrational absorption properties at the nanoscale and atomic level. Additionally, phenomena like optically forbidden excitations and modulation of the local phonon density of states, previously inaccessible via conventional spectroscopic methods, are now observable. This review summarizes recent advancements in using monochromated transmission electron microscopy to characterize low-dimensional materials.","PeriodicalId":74193,"journal":{"name":"Microscopy (Oxford, England)","volume":" ","pages":"89-102"},"PeriodicalIF":1.9,"publicationDate":"2026-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"146208131","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Detection of low-energy backscattered electron in scanning electron microscopy using microchannel plate detector. 利用微通道板探测器检测扫描电镜低能背散射电子。

IF 1.9

Microscopy (Oxford, England) Pub Date : 2026-01-01 DOI: 10.1093/jmicro/dfaf033

Yuto Yanagihara, Yuanzhao Yao, Hayata Yamamoto, Takashi Sekiguchi

引用次数: 0

Fluorescent probes for visualizing ion dynamics in bacteria: current tools and future perspectives. 荧光探针在细菌离子动力学可视化：目前的工具和未来的展望。

IF 1.9

Microscopy (Oxford, England) Pub Date : 2026-01-01 DOI: 10.1093/jmicro/dfaf040

Yusuke V Morimoto

引用次数: 0

Detection limit of defect-induced strain in GaN evaluated by valence EELS and correlated structural analysis. 用价态EELS和相关结构分析评价GaN中缺陷诱发应变的检测限。

IF 1.9

Microscopy (Oxford, England) Pub Date : 2026-01-01 DOI: 10.1093/jmicro/dfaf034

Shunsuke Yamashita, Jun Kikkawa, Susumu Kusanagi, Ichiro Nomachi, Ryoji Arai, Yuya Kanitani, Koji Kimoto, Yoshihiro Kudo

{"title":"Detection limit of defect-induced strain in GaN evaluated by valence EELS and correlated structural analysis.","authors":"Shunsuke Yamashita, Jun Kikkawa, Susumu Kusanagi, Ichiro Nomachi, Ryoji Arai, Yuya Kanitani, Koji Kimoto, Yoshihiro Kudo","doi":"10.1093/jmicro/dfaf034","DOIUrl":"10.1093/jmicro/dfaf034","url":null,"abstract":"Crystal defects are intrinsically linked to the electrical and optical properties of semiconductor materials, making their nanoscale detection essential across all phases (from research and development to manufacturing). Electron energy loss spectroscopy (EELS) in scanning transmission electron microscopy (STEM) has emerged as a promising technique for detecting even point defects due to the shape modulation in valence-loss spectra induced by defects. However, previous studies have primarily focused on qualitative detection, leaving the detection limit, i.e. the minimum detectable concentration, insufficiently explored. To experimentally evaluate the detection limit of defects and clarify the application scope of valence EELS, we prepared GaN samples with controlled defect concentrations along the depth direction using multi-step He-ion implantation and acquired valence-loss spectra at each depth. Based on the simulated depth profile of defects, we evaluated the detection limit from the depth at which significant modulation in the spectral shape was observed. The detection limit fundamentally depends on the signal-to-noise ratio of the valence-loss spectra. Under typical STEM conditions with an electron dose of 5 × 105 e-/Å2, the detection limit of defects in GaN was determined to be 0.35% (3500 ppm). Detailed structural analysis revealed that GaN contains implantation-induced defects and their clusters, and exhibits lattice strain and local disorder while retaining its wurtzite structure. The shape modulation in the valence-loss spectra was attributed to the indirect detection of defects through the surrounding strain fields.","PeriodicalId":74193,"journal":{"name":"Microscopy (Oxford, England)","volume":" ","pages":"29-37"},"PeriodicalIF":1.9,"publicationDate":"2026-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144692648","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0