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Artifactual atomic displacements on surfaces using annular dark-field images with image simulation. 利用环形暗视野图像和图像模拟在表面上伪造原子位移。
Microscopy (Oxford, England) Pub Date : 2024-07-30 DOI: 10.1093/jmicro/dfae001
Shunsuke Kobayashi, Kousuke Ooe, Kei Nakayama, Akihide Kuwabara
{"title":"Artifactual atomic displacements on surfaces using annular dark-field images with image simulation.","authors":"Shunsuke Kobayashi, Kousuke Ooe, Kei Nakayama, Akihide Kuwabara","doi":"10.1093/jmicro/dfae001","DOIUrl":"10.1093/jmicro/dfae001","url":null,"abstract":"<p><p>We investigated artifactual atomic displacements on a Pt (111) surface using annular dark-field (ADF) scanning transmission electron microscopy images under ideal conditions with multi-slice image simulation. Pt atomic columns on the surface exhibited artifact displacement. The bright spots shifted slightly toward the interior of the crystal, indicating that ADF imaging underestimates atomic distance measurements on the crystal surface. Multiple peak fitting is an effective method for determining the positions of bright spots and obtaining more accurate atomic positions while reducing the impact of surface-related artifacts. This is important for the measurement of interatomic distances on crystal surfaces, particularly for catalyst particles.</p>","PeriodicalId":74193,"journal":{"name":"Microscopy (Oxford, England)","volume":" ","pages":"349-353"},"PeriodicalIF":0.0,"publicationDate":"2024-07-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"139473162","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A simple coordinate transformation method for quickly locating the features of interest in TEM samples. 在 TEM 样品中快速定位相关特征的简单坐标转换方法。
Microscopy (Oxford, England) Pub Date : 2024-07-30 DOI: 10.1093/jmicro/dfae009
Mingzhi Zeng, Wenzhao Wang, Yang Yin, Changlin Zheng
{"title":"A simple coordinate transformation method for quickly locating the features of interest in TEM samples.","authors":"Mingzhi Zeng, Wenzhao Wang, Yang Yin, Changlin Zheng","doi":"10.1093/jmicro/dfae009","DOIUrl":"10.1093/jmicro/dfae009","url":null,"abstract":"<p><p>We developed a simple coordinate transformation method for quickly locating features of interest (FOIs) of samples in transmission electron microscope (TEM). The method is well suited for conducting sample searches in aberration-corrected scanning/transmission electron microscopes (S/TEM), where the survey can be very time-consuming because of the limited field of view imposed by the highly excited objective lens after fine-tuning the aberration correctors. For implementation, a digital image of the sample and the TEM holder was captured using a simple stereo-optical microscope. Naturally presented geometric patterns on the holder were referenced to construct a projective transformation between the electron and optical coordinate systems. The test results demonstrated that the method was accurate and required no electron microscope or specimen holder modifications. Additionally, it eliminated the need to mount the sample onto specific patterned TEM grids or deposit markers, resulting in universal applications for most TEM samples, holders and electron microscopes for fast FOI identification. Furthermore, we implemented the method into a Gatan script for graphical-user-interface-based step-by-step instructions. Through online communication, the script enabled real-time navigation and tracking of the motion of samples in TEM on enlarged optical images with a panoramic view.</p>","PeriodicalId":74193,"journal":{"name":"Microscopy (Oxford, England)","volume":" ","pages":"381-387"},"PeriodicalIF":0.0,"publicationDate":"2024-07-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"139992062","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
High-precision charge analysis in a catalytic nanoparticle by electron holography. 利用电子全息技术对催化纳米粒子进行高精度电荷分析。
Microscopy (Oxford, England) Pub Date : 2024-07-30 DOI: 10.1093/jmicro/dfae018
Ryotaro Aso, Yoshihiro Midoh, Toshiaki Tanigaki, Yasukazu Murakami
{"title":"High-precision charge analysis in a catalytic nanoparticle by electron holography.","authors":"Ryotaro Aso, Yoshihiro Midoh, Toshiaki Tanigaki, Yasukazu Murakami","doi":"10.1093/jmicro/dfae018","DOIUrl":"10.1093/jmicro/dfae018","url":null,"abstract":"<p><p>The charge state of supported metal catalysts is the key to understand the elementary processes involved in catalytic reactions. However, high-precision charge analysis of the metal catalysts at the atomic level is experimentally challenging. To address this critical challenge, high-sensitivity electron holography has recently been successfully applied for precisely measuring the elementary charges on individual platinum nanoparticles supported on a titanium dioxide surface. In this review, we introduce the latest advancements in high-precision charge analysis and discuss the mechanisms of charge transfer at the metal-support interface. The development of charge measurements is entering a new era, and charge analyses under conditions closer to practical working environments, such as real-time, real-space, and reactive gas environments, are expected to be realized in the near future.</p>","PeriodicalId":74193,"journal":{"name":"Microscopy (Oxford, England)","volume":" ","pages":"301-307"},"PeriodicalIF":0.0,"publicationDate":"2024-07-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"140320051","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Development of an integrated high-voltage electron microscope-gas chromatograph-quadrupole mass spectrometer system for the operando analysis of catalytic gas reactions. 开发用于催化气体反应操作分析的高压电子显微镜-气相色谱仪-四极杆质谱仪集成系统。
Microscopy (Oxford, England) Pub Date : 2024-07-30 DOI: 10.1093/jmicro/dfae010
Longshu Tang, Tetsuo Higuchi, Shigeo Arai, Hiromochi Tanaka, Shunsuke Muto
{"title":"Development of an integrated high-voltage electron microscope-gas chromatograph-quadrupole mass spectrometer system for the operando analysis of catalytic gas reactions.","authors":"Longshu Tang, Tetsuo Higuchi, Shigeo Arai, Hiromochi Tanaka, Shunsuke Muto","doi":"10.1093/jmicro/dfae010","DOIUrl":"10.1093/jmicro/dfae010","url":null,"abstract":"<p><p>This paper describes the development of a gas chromatography-quadrupole mass spectrometry system attached to a differential-pumping-type environmental cell of the reaction science high-voltage electron microscopy instrument at Nagoya University to distinguish unambiguously between different gas species with the same mass-to-charge ratio. Several model experiments were used to verify the efficacy of the newly proposed system, confirming its ability to analyse the atomic-level structural changes during heterogeneous catalysts and the associated gas-reaction kinetics simultaneously, providing new insights into operando measurements in the field of environmental transmission electron microscopy. Graphical Abstract.</p>","PeriodicalId":74193,"journal":{"name":"Microscopy (Oxford, England)","volume":" ","pages":"358-366"},"PeriodicalIF":0.0,"publicationDate":"2024-07-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC11288188/pdf/","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"139984767","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Removal of phase residues in electron holography. 去除电子全息摄影中的相位残留。
Microscopy (Oxford, England) Pub Date : 2024-07-30 DOI: 10.1093/jmicro/dfad062
Yoshio Takahashi, Tetsuya Akashi, Toshiaki Tanigaki
{"title":"Removal of phase residues in electron holography.","authors":"Yoshio Takahashi, Tetsuya Akashi, Toshiaki Tanigaki","doi":"10.1093/jmicro/dfad062","DOIUrl":"10.1093/jmicro/dfad062","url":null,"abstract":"<p><p>Electron holography provides quantitative phase information regarding the electromagnetic fields and the morphology of micro- to nano-scale samples. A phase image reconstructed numerically from an electron hologram sometimes includes phase residues, i.e. origins of unremovable phase discontinuities, which make it much more difficult to quantitatively analyze local phase values. We developed a method to remove the residues in a phase image by a combination of patching local areas of a hologram and denoising based on machine learning. The small patches for a hologram, which were generated using the spatial frequency information of the own fringe patterns, were pasted at each residue point by an algorithm based on sparse modeling. After successive phase reconstruction, the phase components with no dependency on the vicinity were filtered out by Gaussian process regression. We determined that the phase discontinuities that appeared around phase residues were removed and the phase distributions of an atomic resolution phase image of a Pt nanoparticle were sufficiently restored.</p>","PeriodicalId":74193,"journal":{"name":"Microscopy (Oxford, England)","volume":" ","pages":"376-380"},"PeriodicalIF":0.0,"publicationDate":"2024-07-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"139486760","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Magnetic field observation in a magnetic tunnel junction by scanning transmission electron microscopy. 用扫描透射电子显微镜观察磁隧道结中的磁场。
Microscopy (Oxford, England) Pub Date : 2024-07-30 DOI: 10.1093/jmicro/dfad063
Yuji Kohno, Takehito Seki, Shun Tsuruoka, Shinobu Ohya, Naoya Shibata
{"title":"Magnetic field observation in a magnetic tunnel junction by scanning transmission electron microscopy.","authors":"Yuji Kohno, Takehito Seki, Shun Tsuruoka, Shinobu Ohya, Naoya Shibata","doi":"10.1093/jmicro/dfad063","DOIUrl":"10.1093/jmicro/dfad063","url":null,"abstract":"<p><p>A magnetic tunnel junction (MTJ) consists of two ferromagnetic layers separated by a thin insulating layer. MTJs show tunnel magnetoresistance effect, where the resistance in the direction perpendicular to the insulator layer drastically changes depending on the magnetization directions (parallel or antiparallel) in the ferromagnetic layers. However, direct observation of local magnetizations inside MTJs has been challenging. In this study, we demonstrate direct observation of magnetic flux density distribution inside epitaxially grown Fe/MgO/Fe layers using differential phase contrast scanning transmission electron microscopy. By utilizing newly developed tilt-scan averaging system for suppressing diffraction contrasts, we clearly visualize parallel and antiparallel states of ferromagnetic layers at nanometer resolution.</p>","PeriodicalId":74193,"journal":{"name":"Microscopy (Oxford, England)","volume":" ","pages":"329-334"},"PeriodicalIF":0.0,"publicationDate":"2024-07-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"139059249","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Retraction of: The presence of perforated synapses in the striatum after dopamine depletion, is this a sign of maladaptive brain plasticity? 撤回：多巴胺耗竭后纹状体出现穿孔突触，这是大脑适应性可塑性不良的表现吗？
Microscopy (Oxford, England) Pub Date : 2024-07-30 DOI: 10.1093/jmicro/dfae024
{"title":"Retraction of: The presence of perforated synapses in the striatum after dopamine depletion, is this a sign of maladaptive brain plasticity?","authors":"","doi":"10.1093/jmicro/dfae024","DOIUrl":"10.1093/jmicro/dfae024","url":null,"abstract":"","PeriodicalId":74193,"journal":{"name":"Microscopy (Oxford, England)","volume":" ","pages":"388"},"PeriodicalIF":0.0,"publicationDate":"2024-07-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141158931","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Chlamydia psittaci infected cell studies by 4Pi Raman and atomic force microscopy. 利用 4Pi 拉曼和原子力显微镜研究受鹦鹉热衣原体感染的细胞。
Microscopy (Oxford, England) Pub Date : 2024-07-30 DOI: 10.1093/jmicro/dfae011
Dmitry Khalenkow, Alejandro Diaz Tormo, Anne De Meyst, Louis Van Der Meeren, Joost Verduijn, Joanna Rybarczyk, Daisy Vanrompay, Nicolas Le Thomas, Andre G Skirtach
{"title":"Chlamydia psittaci infected cell studies by 4Pi Raman and atomic force microscopy.","authors":"Dmitry Khalenkow, Alejandro Diaz Tormo, Anne De Meyst, Louis Van Der Meeren, Joost Verduijn, Joanna Rybarczyk, Daisy Vanrompay, Nicolas Le Thomas, Andre G Skirtach","doi":"10.1093/jmicro/dfae011","DOIUrl":"10.1093/jmicro/dfae011","url":null,"abstract":"<p><p>Chlamydia psittaci is an avian bacterial pathogen that can cause atypical pneumonia in humans via zoonotic transmission. It is a Gram-negative intracellular bacterium that proliferates inside membrane bound inclusions in the cytoplasm of living eukaryotic cells. The study of such cells with C. psittaci inside without destroying them poses a significant challenge. We demonstrated in this work the utility of a combined multitool approach to analyze such complex samples. Atomic force microscopy was applied to obtain high-resolution images of the surface of infected cells upon entrance of bacteria. Atomic force microscopy scans revealed the morphological changes of the cell membrane of Chlamydia infected cells such as changes in roughness of cell membrane and the presence of micro vesicles. 4Pi Raman microscopy was used to image and probe the molecular composition of intracellular bacteria inside intact cells. Information about the structure of the inclusion produced by C. psittaci was obtained and it was found to have a similar molecular fingerprint as that of an intracellular lipid droplet but with less proteins and unsaturated lipids. The presented approach demonstrates complementarity of various microscopy-based approaches and might be useful for characterization of intracellular bacteria.</p>","PeriodicalId":74193,"journal":{"name":"Microscopy (Oxford, England)","volume":" ","pages":"335-342"},"PeriodicalIF":0.0,"publicationDate":"2024-07-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"140289850","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Comparison of large-volume 3D reconstruction using plasma FIB-SEM and X-ray CT. 使用等离子 FIB-SEM 和 X 射线 CT 进行大体积三维重建的比较。
Microscopy (Oxford, England) Pub Date : 2024-07-30 DOI: 10.1093/jmicro/dfae003
Ryuji Yoshida, Yasutoshi Mizuta, Takeharu Kato, Teiichi Kimura
{"title":"Comparison of large-volume 3D reconstruction using plasma FIB-SEM and X-ray CT.","authors":"Ryuji Yoshida, Yasutoshi Mizuta, Takeharu Kato, Teiichi Kimura","doi":"10.1093/jmicro/dfae003","DOIUrl":"10.1093/jmicro/dfae003","url":null,"abstract":"<p><p>We demonstrated large-volume three-dimensional (3D) reconstruction using plasma-focused ion beam-scanning electron microscopy (PFIB-SEM). We successfully reconstructed a 750 μm (W) × 143 μm (H) × 310 μm (D) volume at a resolution of 200 nm/pix from 1550 SEM backscattered electron images of a Li-ion battery cathode sheet. The PFIB-SEM system was found to be capable of acquiring and reconstructing larger volume 3D datasets than X-ray computed tomography, and with higher resolution and contrast.</p>","PeriodicalId":74193,"journal":{"name":"Microscopy (Oxford, England)","volume":" ","pages":"354-357"},"PeriodicalIF":0.0,"publicationDate":"2024-07-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"139512893","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A tool for live-cell confocal imaging of temperature-dependent organelle dynamics. 对温度依赖性细胞器动态进行活细胞共聚焦成像的工具。
Microscopy (Oxford, England) Pub Date : 2024-07-30 DOI: 10.1093/jmicro/dfad064
Keiko Midorikawa, Yutaka Kodama
{"title":"A tool for live-cell confocal imaging of temperature-dependent organelle dynamics.","authors":"Keiko Midorikawa, Yutaka Kodama","doi":"10.1093/jmicro/dfad064","DOIUrl":"10.1093/jmicro/dfad064","url":null,"abstract":"<p><p>Intracellular organelles alter their morphology in response to ambient conditions such as temperature to optimize physiological activities in cells. Observing organelle dynamics at various temperatures deepens our understanding of cellular responses to the environment. Confocal laser microscopy is a powerful tool for live-cell imaging of fluorescently labeled organelles. However, the large contact area between the specimen and the ambient air on the microscope stage makes it difficult to maintain accurate cellular temperatures. Here, we present a method for precisely controlling cellular temperatures using a custom-made adaptor that can be installed on a commercially available temperature-controlled microscope stage. Using this adaptor, we observed temperature-dependent organelle dynamics in living plant cells; morphological changes in chloroplasts and peroxisomes were temperature dependent. This newly developed adaptor can be easily placed on a temperature-controlled stage to capture intracellular responses to temperature at unprecedentedly high resolution.</p>","PeriodicalId":74193,"journal":{"name":"Microscopy (Oxford, England)","volume":" ","pages":"343-348"},"PeriodicalIF":0.0,"publicationDate":"2024-07-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC11288189/pdf/","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"139467378","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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