Microscopy (Oxford, England)最新文献_第7页

Development of silicon-on-insulator direct electron detector with analog memories in pixels for sub-microsecond imaging. 开发用于亚微秒成像的带像素模拟存储器的硅绝缘体直接电子探测器。

Microscopy (Oxford, England) Pub Date : 2024-12-05 DOI: 10.1093/jmicro/dfae029

Takafumi Ishida, Kosei Sugie, Toshinobu Miyoshi, Yuichi Ishida, Koh Saitoh, Yasuo Arai, Makoto Kuwahara

引用次数: 0

Sandwich freezing and freeze substitution of Arabidopsis plant tissues for electron microscopy. 拟南芥植物组织的夹心冷冻和冷冻替代，用于电子显微镜观察。

Microscopy (Oxford, England) Pub Date : 2024-12-05 DOI: 10.1093/jmicro/dfae032

Masashi Yamaguchi, Mayuko Sato, Azusa Takahashi-Nakaguchi, Michiyo Okamoto, Kiminori Toyooka, Hiroji Chibana

引用次数: 0

Fast computational approach with prior dimension reduction for three-dimensional chemical component analysis using CT data of spectral imaging. 利用光谱成像 CT 数据进行三维化学成分分析的先验降维快速计算方法。

Microscopy (Oxford, England) Pub Date : 2024-12-05 DOI: 10.1093/jmicro/dfae027

Motoki Shiga, Taisuke Ono, Kenichi Morishita, Keiji Kuno, Nanase Moriguchi

{"title":"Fast computational approach with prior dimension reduction for three-dimensional chemical component analysis using CT data of spectral imaging.","authors":"Motoki Shiga, Taisuke Ono, Kenichi Morishita, Keiji Kuno, Nanase Moriguchi","doi":"10.1093/jmicro/dfae027","DOIUrl":"10.1093/jmicro/dfae027","url":null,"abstract":"Spectral image (SI) measurement techniques, such as X-ray absorption fine structure (XAFS) imaging and scanning transmission electron microscopy (STEM) with energy-dispersive X-ray spectroscopy (EDS) or electron energy loss spectroscopy (EELS), are useful for identifying chemical structures in composite materials. Machine-learning techniques have been developed for automatic analysis of SI data and their usefulness has been proven. Recently, an extended measurement technique combining SI with a computed tomography (CT) technique (CT-SI), such as CT-XAFS and STEM-EDS/EELS tomography, was developed to identify the three-dimensional (3D) structures of chemical components. CT-SI analysis can be conducted by combining CT reconstruction algorithms and chemical component analysis based on machine-learning techniques. However, this analysis incurs high-computational costs owing to the size of the CT-SI datasets. To address this problem, this study proposed a fast computational approach for 3D chemical component analysis in an unsupervised learning setting. The primary idea for reducing the computational cost involved compressing the CT-SI data prior to CT computation and performing 3D reconstruction and chemical component analysis on the compressed data. The proposed approach significantly reduced the computational cost without losing information about the 3D structure and chemical components. We experimentally evaluated the proposed approach using synthetic and real CT-XAFS data, which demonstrated that our approach achieved a significantly faster computational speed than the conventional approach while maintaining analysis performance. As the proposed procedure can be implemented with any CT algorithm, it is expected to accelerate 3D analyses with sparse regularized CT algorithms in noisy and sparse CT-SI datasets.","PeriodicalId":74193,"journal":{"name":"Microscopy (Oxford, England)","volume":" ","pages":"488-498"},"PeriodicalIF":0.0,"publicationDate":"2024-12-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"140961075","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Wire-tracking of bent electric cable using X-ray CT and deep active learning. 利用 X 射线 CT 和深度主动学习对弯曲电缆进行电线跟踪。

Microscopy (Oxford, England) Pub Date : 2024-12-05 DOI: 10.1093/jmicro/dfae028

Yutaka Hoshina, Takuma Yamamoto, Shigeaki Uemura

引用次数: 0

Simple derivation of L-absorption spectra of 3d transition metal elements by the self-absorption effect observed in soft X-ray emission spectra. 通过软 X 射线发射光谱中观察到的自吸收效应简单推导出 3d 过渡金属元素的 L 吸收光谱。

Microscopy (Oxford, England) Pub Date : 2024-10-04 DOI: 10.1093/jmicro/dfae012

Masami Terauchi, Yohei K Sato, Takaomi D Yokoyama, Takanori Murano

引用次数: 0

Deciphering prefrontal circuits underlying stress and depression: exploring the potential of volume electron microscopy. 解密压力和抑郁的前额叶回路：探索容积电子显微镜的潜力

Microscopy (Oxford, England) Pub Date : 2024-10-04 DOI: 10.1093/jmicro/dfae036

Hirotaka Nagai

{"title":"Deciphering prefrontal circuits underlying stress and depression: exploring the potential of volume electron microscopy.","authors":"Hirotaka Nagai","doi":"10.1093/jmicro/dfae036","DOIUrl":"10.1093/jmicro/dfae036","url":null,"abstract":"Adapting to environmental changes and formulating behavioral strategies are central to the nervous system, with the prefrontal cortex being crucial. Chronic stress impacts this region, leading to disorders including major depression. This review discusses the roles for prefrontal cortex and the effects of stress, highlighting similarities and differences between human/primates and rodent brains. Notably, the rodent medial prefrontal cortex is analogous to the human subgenual anterior cingulate cortex in terms of emotional regulation, sharing similarities in cytoarchitecture and circuitry, while also performing cognitive functions similar to the human dorsolateral prefrontal cortex. It has been shown that chronic stress induces atrophic changes in the rodent mPFC, which mirrors the atrophy observed in the subgenual anterior cingulate cortex and dorsolateral prefrontal cortex of depression patients. However, the precise alterations in neural circuitry due to chronic stress are yet to be fully unraveled. The use of advanced imaging techniques, particularly volume electron microscopy, is emphasized as critical for the detailed examination of synaptic changes, providing a deeper understanding of stress and depression at the molecular, cellular and circuit levels. This approach offers invaluable insights into the alterations in neuronal circuits within the medial prefrontal cortex caused by chronic stress, significantly enriching our understanding of stress and depression pathologies.","PeriodicalId":74193,"journal":{"name":"Microscopy (Oxford, England)","volume":" ","pages":"391-404"},"PeriodicalIF":0.0,"publicationDate":"2024-10-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141753477","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Limitations and drawbacks of DQE estimation methods applied to electron detectors. 应用于电子探测器的 DQE 估算方法的局限性和缺点。

Microscopy (Oxford, England) Pub Date : 2024-10-04 DOI: 10.1093/jmicro/dfae016

Olivier Marcelot, Cécile Marcelot, Sébastien Rolando

引用次数: 0

Retraction of: Ultrastructural immunohistochemical study of L-type amino acid transporter 1-4F2 heavy chain in tumor microvasculatures of N-butyl-N-(4-hydroxybutyl) nitrosamine (BBN) induced rat bladder carcinoma. 撤回：N-丁基-N-（4-羟基丁基）亚硝胺（BBN）诱导的大鼠膀胱癌肿瘤微血管中L型氨基酸转运体1-4F2重链的超微结构免疫组化研究

Microscopy (Oxford, England) Pub Date : 2024-10-04 DOI: 10.1093/jmicro/dfae033

引用次数: 0

Application of Hilbert-differential phase contrast to scanning transmission electron microscopy. 扫描透射电子显微镜中的希尔伯特-差分相位对比应用。

Microscopy (Oxford, England) Pub Date : 2024-10-04 DOI: 10.1093/jmicro/dfae015

Haruka Iga, Toshiki Shimizu, Hiroki Minoda

引用次数: 0

Effective alignment method using a diamond notch knife for correlative array tomography. 使用金刚石缺口刀进行相关阵列断层扫描的有效对准方法。

Microscopy (Oxford, England) Pub Date : 2024-10-04 DOI: 10.1093/jmicro/dfae013

Yumi Goto, Noriko Takeda-Kamiya, Kaori Yamaguchi, Mikio Yamazaki, Kiminori Toyooka

引用次数: 0