Microscopy (Oxford, England)最新文献_第7页

Detection and electron microscopic study of thick cross-striated linear fibrils in mammalian cell nuclei. 哺乳动物细胞核中粗横纹线状原纤维的检测与电镜研究。

IF 1.9

Microscopy (Oxford, England) Pub Date : 2026-01-01 DOI: 10.1093/jmicro/dfaf036

Mark I Mosevitsky

{"title":"Detection and electron microscopic study of thick cross-striated linear fibrils in mammalian cell nuclei.","authors":"Mark I Mosevitsky","doi":"10.1093/jmicro/dfaf036","DOIUrl":"10.1093/jmicro/dfaf036","url":null,"abstract":"Using an electron microscope, thick (30-100 nm wide), linear (not branched), cross-striated protein fibrils with an axial repeat of about 65 nm were detected in mammalian cell nuclei. These fibrils differ from the thin filaments of the nuclear matrix described in the literature. Therefore, in this work, the main efforts were aimed at demonstrating the nuclear origin of thick fibrils. Their presence in the material of nuclei destroyed by ultrasound, their contact with isolated nucleoli, and their presence in residual nuclei (nuclear matrix) are shown. Contacts of thick fibrils with both chromatin and the network of filaments of the nuclear matrix were observed. Thick fibrils, which are axial components of condensed chromosomes, are preserved during mitosis. It is likely that their contacts with chromatin and elements of the nuclear matrix are also preserved, ensuring the reproduction of the internal structure of the nuclei in daughter cells. Thick fibrils disintegrate in a medium with low ionic strength. Perhaps this is the reason for their absence in other authors' nuclear matrix preparations. In this work, the nuclei were isolated, and all experiments were carried out in a \"complete medium\" simulating the intranuclear salt content.","PeriodicalId":74193,"journal":{"name":"Microscopy (Oxford, England)","volume":" ","pages":"45-59"},"PeriodicalIF":1.9,"publicationDate":"2026-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144981609","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Myosin-1e drives ruffle-edge lamellipodia formation and motility in A549 invasive lung cancer cells. 肌球蛋白- ie驱动A549浸润性肺癌细胞褶边板足的形成和运动。

IF 1.9

Microscopy (Oxford, England) Pub Date : 2026-01-01 DOI: 10.1093/jmicro/dfaf039

Haruka Morishita, Katsuhisa Kawai, Ayaka Noda, Youhei Egami, Nobukazu Araki

{"title":"Myosin-1e drives ruffle-edge lamellipodia formation and motility in A549 invasive lung cancer cells.","authors":"Haruka Morishita, Katsuhisa Kawai, Ayaka Noda, Youhei Egami, Nobukazu Araki","doi":"10.1093/jmicro/dfaf039","DOIUrl":"10.1093/jmicro/dfaf039","url":null,"abstract":"Lamellipodia are generally defined as thin, sheet-like cell protrusions that constitute the actin cytoskeleton-based motile apparatus, which promotes the movement of migrating cells. Recently, we identified a novel type of lamellipodia, termed ruffle-edge lamellipodia, which have α-actinin-4 (ACTN4)-enriched multilayer membrane folds at their leading edges in certain invasive cancer cell lines. In this study, the role of unconventional myosin-1e (Myo1E) in ACTN4-enriched ruffle-edge lamellipodia was analyzed using live-cell imaging, immunofluorescence, and scanning electron microscopy. Immunofluorescence microscopy for endogenous Myo1E and live-cell imaging of mApple-Myo1E-expressing cells showed that Myo1E was localized to ACTN4-rich lamellipodia tips in A549 cells. The wound-healing assay and live-cell movies showed that Myo1E small interfering RNA knockdown significantly suppressed cell migration and ruffle-edge lamellipodia formation. Furthermore, scanning electron microscopy demonstrated that Myo1E knockdown significantly reduced ruffle-edge structures. These results suggest that Myo1E may play an important role not only in the motility of ruffle-edge lamellipodia but also in the construction of ruffle-edge structures, which are probably associated with cancer cell invasion and metastasis.","PeriodicalId":74193,"journal":{"name":"Microscopy (Oxford, England)","volume":" ","pages":"60-69"},"PeriodicalIF":1.9,"publicationDate":"2026-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145152187","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Reduction of membrane-derived noise using beam-tilt measurement and deep learning in observation using environmental cell. 利用波束倾斜测量和环境细胞观测中的深度学习降低膜源噪声。

IF 1.9

Microscopy (Oxford, England) Pub Date : 2026-01-01 DOI: 10.1093/jmicro/dfaf031

Fumiaki Ichihashi, Yoshio Takahashi, Toshiaki Tanigaki

引用次数: 0

Biomedical application of organosilica nanoparticles. 有机二氧化硅纳米颗粒的生物医学应用。

IF 1.9

Microscopy (Oxford, England) Pub Date : 2026-01-01 DOI: 10.1093/jmicro/dfaf030

Vikas Shukla, Junna Nakamura, Tomohiro Haruta, Michihiro Nakamura

引用次数: 0

Characterization of ultra-variable-pressure detector for secondary electrons in low-vacuum SEM. 低真空扫描电镜中二次电子超变压探测器的表征。

IF 1.9

Microscopy (Oxford, England) Pub Date : 2026-01-01 DOI: 10.1093/jmicro/dfaf037

Yuanzhao Yao, Ryosuke Sonoda, Yasunari Sohda, Takashi Sekiguchi

{"title":"Characterization of ultra-variable-pressure detector for secondary electrons in low-vacuum SEM.","authors":"Yuanzhao Yao, Ryosuke Sonoda, Yasunari Sohda, Takashi Sekiguchi","doi":"10.1093/jmicro/dfaf037","DOIUrl":"10.1093/jmicro/dfaf037","url":null,"abstract":"Scanning electron microscope (SEM) observation in low vacuum can overcome the issue of charge-up at the specimen surface, allowing for the observation of insulating samples without sample pretreatment. The ultra-variable-pressure detector (UVD) was developed as a secondary electron (SE) detector for the low-vacuum observation in SEM. It works by collecting the light signal released from the collision between SEs and gas molecules. In this study, we propose a simple method using a stainless-steel sphere to characterize the feature of UVD signal in low-vacuum SEM and compare it with the traditional Everhart-Thornley (E-T) detector in normal SEM. The UVD signal showed characteristic features, namely a two-round-peak feature in the profile, which is different from that of E-T detector. Through experiment and simulation, we revealed that at higher vacuum levels (as a few Pa), SEs provide the primary contribution to the UVD signal, exhibiting a profile similar to that of the E-T signal. As the vacuum deteriorates, as 30 Pa, the main contribution to the UVD signal shifts from SEs to low-energy backscattered electrons (BSEs). Our finding indicates that by tuning the chamber pressure, we can vary the UVD image between SE and low-energy BSE features.","PeriodicalId":74193,"journal":{"name":"Microscopy (Oxford, England)","volume":" ","pages":"38-44"},"PeriodicalIF":1.9,"publicationDate":"2026-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144994664","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Auto-thresholding for unbiased electron counting. 无偏电子计数的自动阈值。

IF 1.9

Microscopy (Oxford, England) Pub Date : 2025-12-01 DOI: 10.1093/jmicro/dfaf025

Julie Marie Bekkevold, Jonathan J P Peters, Ryo Ishikawa, Naoya Shibata, Lewys Jones

{"title":"Auto-thresholding for unbiased electron counting.","authors":"Julie Marie Bekkevold, Jonathan J P Peters, Ryo Ishikawa, Naoya Shibata, Lewys Jones","doi":"10.1093/jmicro/dfaf025","DOIUrl":"10.1093/jmicro/dfaf025","url":null,"abstract":"As interest in fast real-space frame-rate scanning transmission electron microscopy for both structural and functional characterization of materials increases, so does the need for precise and fast electron detection techniques. Electron counting, with monolithic, segmented, or 4D detectors, has been explored for many years. Recent studies have shown that a retrofittable signal digitizer for a monolithic or segmented detector can be a sustainable and accessible way to enhance the performance of existing detectors, especially for imaging at fast scan speeds. Since such signal digitization uses a threshold on the gradient of the detector signal to identify electron events, appropriate threshold choice is key. Previously, this threshold has been set manually by the operator and is therefore inherently susceptible to human bias. In this work, we introduce an auto-thresholding approach for electron counting to determine the optimal threshold by maximizing the difference in identified counts from a stream with real electron events and a stream with only noise. This leads to easier operation, increased throughput and eliminates human bias in signal digitization. When pixel dwell time becomes shorter than scintillator response time, digitization of the detector signal is needed to avoid artefacts in STEM images. Optimizing the threshold for this digitization process automatically is crucial to achieve high-quality quantitative digitized images, free of human bias for what threshold yields the best digitization.","PeriodicalId":74193,"journal":{"name":"Microscopy (Oxford, England)","volume":" ","pages":"404-410"},"PeriodicalIF":1.9,"publicationDate":"2025-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC12685148/pdf/","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144103296","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Expanding the potential of paraffin section studies using NanoSuit-correlative light and electron microscopy. 利用纳米光镜和电子显微镜扩大石蜡切片研究的潜力。

IF 1.9

Microscopy (Oxford, England) Pub Date : 2025-12-01 DOI: 10.1093/jmicro/dfaf028

Hideya Kawasaki

{"title":"Expanding the potential of paraffin section studies using NanoSuit-correlative light and electron microscopy.","authors":"Hideya Kawasaki","doi":"10.1093/jmicro/dfaf028","DOIUrl":"10.1093/jmicro/dfaf028","url":null,"abstract":"Histological examination using optical microscopy is essential in life sciences and diagnostic medicine, particularly for formalin-fixed paraffin-embedded (FFPE) tissue sections stained with hematoxylin and eosin or 3,3'-diaminobenzidine. However, conventional electron microscopy faces challenges, such as sample destruction, complex processing and difficulty in correlating light and electron microscopy images. The NanoSuit method overcomes these limitations by forming an ultrathin protective membrane that enhances conductivity and preserves hydrated tissue architecture, enabling high-resolution scanning electron microscopy imaging. In this study, we applied NanoSuit-correlative light and electron microscopy (CLEM) to FFPE sections to assess its potential for non-destructive and reversible electron microscopy characterization. Using NanoSuit-CLEM, we successfully visualized endothelial structures, amyloid deposits, sarcomeres, mitochondria, bacteria, viruses and foreign body deposits in FFPE sections. Energy-dispersive X-ray spectrometry further facilitated elemental analysis of foreign materials. These findings demonstrate that NanoSuit-CLEM allows for the precise visualization of ultrastructural details in FFPE sections without requiring new equipment. This method holds promise for advancing pathology by improving diagnostic accuracy and enabling multimodal tissue analysis.","PeriodicalId":74193,"journal":{"name":"Microscopy (Oxford, England)","volume":" ","pages":"422-431"},"PeriodicalIF":1.9,"publicationDate":"2025-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144183011","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Seg & Ref: a newly developed toolset for artificial intelligence-powered segmentation and interactive refinement for labor-saving three-dimensional reconstruction. Seg and Ref：新开发的人工智能分割和交互式细化工具集，用于省力的三维重建。

IF 1.9

Microscopy (Oxford, England) Pub Date : 2025-12-01 DOI: 10.1093/jmicro/dfaf015

Satoru Muro, Takuya Ibara, Akimoto Nimura, Keiichi Akita

{"title":"Seg & Ref: a newly developed toolset for artificial intelligence-powered segmentation and interactive refinement for labor-saving three-dimensional reconstruction.","authors":"Satoru Muro, Takuya Ibara, Akimoto Nimura, Keiichi Akita","doi":"10.1093/jmicro/dfaf015","DOIUrl":"10.1093/jmicro/dfaf015","url":null,"abstract":"Traditional three-dimensional (3D) reconstruction is labor-intensive owing to manual segmentation; this can be addressed by developing artificial intelligence (AI)-driven automated segmentation. However, it is limited by a lack of user-friendly tools for morphologists. We present a workflow for 3D reconstruction using our AI-powered segmentation tool. Specifically, we developed an interactive toolset, 'Seg & Ref', to overcome the abovementioned challenges by enabling AI-powered segmentation and easy mask editing without requiring a command-line setup. We demonstrated a 3D reconstruction workflow using serial sections of a Carnegie Stage 15 human embryo. Automated segmentation (Step 1) was performed using the graphical user interface, 'SAM2 GUI for Img Seq', which utilizes the Segment Anything Model 2 and supports interactive segmentation through a web-based interface. Users specify target structures via box prompts, and the results are propagated across all images for batch segmentation. The segmentation masks were reviewed and corrected (Step 2) using 'Segment Editor PP', a PowerPoint-based tool enabling interactive mask refinement. Finally, the corrected masks were imported into the 3D Slicer application for reconstruction (Step 3). Our 3D reconstruction visualized key structures, including the spinal cord, veins, aorta, mesonephros, gut, heart, trachea, liver and peritoneal cavity. The reconstructed models accurately represented their spatial relationships and morphologies. This provides a labor-saving approach for 3D reconstruction workflows owing to their optimization for serial sections, versatility and accessibility without programming expertise. Therefore, morphological research can be enhanced by precise segmentation using intuitive and user-friendly interfaces of 'Seg & Ref'.","PeriodicalId":74193,"journal":{"name":"Microscopy (Oxford, England)","volume":" ","pages":"383-393"},"PeriodicalIF":1.9,"publicationDate":"2025-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143560189","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Ultra-low-voltage observation of battery materials by scanning electron microscopy. 电池材料的超低电压扫描电镜观察。

IF 1.9

Microscopy (Oxford, England) Pub Date : 2025-12-01 DOI: 10.1093/jmicro/dfaf024

Yoichiro Hashimoto, Yutaka Nagaoka, Toru Aiso, Shuhei Yabu, Masahiro Sasajima

{"title":"Ultra-low-voltage observation of battery materials by scanning electron microscopy.","authors":"Yoichiro Hashimoto, Yutaka Nagaoka, Toru Aiso, Shuhei Yabu, Masahiro Sasajima","doi":"10.1093/jmicro/dfaf024","DOIUrl":"10.1093/jmicro/dfaf024","url":null,"abstract":"The mechanism of voltage contrast formation under ultra-low landing energy condition is discussed, by which a binder contained in lithium-ion battery anode material has been visualized with high contrast. Since the anode material is a complex experimental system with multiple contrast formation factors, a standard sample simulating it was fabricated for simplification. The binder was observed to be darker than the substrate at landing energies of 30-50 eV. The binder exhibited a distinct appearance reflecting its shape (in the 3D-particle mode) at 20 eV. The mirroring phenomenon occurred at 10 eV, in which the primary electrons bounced off the sample before irradiating the surface. The surface potential at the electron beam irradiation moment was presumed to affect the contrast formation, but direct measurement of it was difficult. Thus, the sample was transferred to an Atomic Force Microscope without exposure to the atmosphere to measure the 'residual' potential of the binder in KPFM mode after the SEM observations. Under darker binder observed conditions of 30-50 eV, KPFM measured residual potential was positive relative to the substrate. Under conditions of the 3D-particle mode at 20 eV and the mirroring phenomenon at 10 eV, the residual potentials were negative. Therefore, a correlation between the behavior of the voltage contrast and the residual potential was obtained. Finer landing-energy step measurement revealed hysteresis responses of voltage contrast and the residual potential to the landing energy. The Cause of the hysteresis was discussed.","PeriodicalId":74193,"journal":{"name":"Microscopy (Oxford, England)","volume":" ","pages":"394-403"},"PeriodicalIF":1.9,"publicationDate":"2025-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144082601","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Semi-automated image acquisition and analyses for broad users utilizing macro keyboards. 半自动图像采集和分析，为广大用户利用宏键盘。

IF 1.9

Microscopy (Oxford, England) Pub Date : 2025-12-01 DOI: 10.1093/jmicro/dfaf018

Takaaki Watanabe, Toshiyasu Taniguchi

引用次数: 0