Microscopy (Oxford, England)最新文献

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Characterization of the INTPIX4 SOI pixel detector in transmission electron microscopy at 120 and 200 keV. 120kev和200kev下INTPIX4 SOI像素探测器的透射电镜表征。
IF 1.9
Microscopy (Oxford, England) Pub Date : 2025-12-01 DOI: 10.1093/jmicro/dfaf027
Yuichi Ishida, Takafumi Ishida, Makoto Kuwahara, Yasuo Arai, Koh Saitoh
{"title":"Characterization of the INTPIX4 SOI pixel detector in transmission electron microscopy at 120 and 200 keV.","authors":"Yuichi Ishida, Takafumi Ishida, Makoto Kuwahara, Yasuo Arai, Koh Saitoh","doi":"10.1093/jmicro/dfaf027","DOIUrl":"10.1093/jmicro/dfaf027","url":null,"abstract":"<p><p>Imaging performance with 120 and 200 keV electrons was evaluated with an integration-type silicon-on-insulator pixel detector called INTPIX4 installed in a conventional transmission electron microscope. We demonstrated that single-electron events can be detected with INTPIX4 quantitatively. The gain and signals of single-electron events were measured. On the basis of the results, the yields of the collected charge for 120 and 200 keV electrons were estimated to be 96±5% and 97±5%, respectively. The modulation transfer function and detective quantum efficiency were also measured. INTPIX4 was clarified to have high detection efficiency and high sensitivity. We also found that it is necessary to use electron beams with energies less than 120 keV for INTPIX4 because multiple scattering of primary electrons at the silicon sensor degrades image resolution. This detector is expected to be applicable to low-dose observations in transmission electron microscopy.</p>","PeriodicalId":74193,"journal":{"name":"Microscopy (Oxford, England)","volume":" ","pages":"411-421"},"PeriodicalIF":1.9,"publicationDate":"2025-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC12685149/pdf/","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144183448","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
High energy-resolution soft X-ray emission spectrometer using a back-thinned CMOS detector for chemical bonding state analysis. 高能量分辨率软x射线发射光谱仪,采用后薄型CMOS探测器,用于化学键态分析。
IF 1.9
Microscopy (Oxford, England) Pub Date : 2025-12-01 DOI: 10.1093/jmicro/dfaf021
Shogo Koshiya, Takanori Murano, Masami Terauchi
{"title":"High energy-resolution soft X-ray emission spectrometer using a back-thinned CMOS detector for chemical bonding state analysis.","authors":"Shogo Koshiya, Takanori Murano, Masami Terauchi","doi":"10.1093/jmicro/dfaf021","DOIUrl":"10.1093/jmicro/dfaf021","url":null,"abstract":"<p><p>Improvement of a commercially available soft X-ray emission spectrometer was tested by introducing a fine-pixel-sized CMOS detector. The peak width of Mg Kα-emission was reduced to one-fourth of that obtained by the CCD detector presently used. Furthermore, the differences in the energy positions of satellite lines of Mg Kα- and also Kβ-emission profiles of Mg and MgO were observed. O K-emission profile of MgO exhibited a few structures reflecting the chemical bonding state. This spectrometer easily discriminated the intensity profiles of Fe Lα,β-emission reflecting the chemical bonding states of Fe atoms in Fe, FeO, Fe3O4 and Fe2O3.</p>","PeriodicalId":74193,"journal":{"name":"Microscopy (Oxford, England)","volume":" ","pages":"432-436"},"PeriodicalIF":1.9,"publicationDate":"2025-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144055580","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Discovery of Golgi membrane-associated degradation (GOMED) pathway: a focus on 15 years of ultrastructural analyses. 高尔基膜相关降解途径的发现,GOMED:聚焦于15年的超微结构分析。
IF 1.9
Microscopy (Oxford, England) Pub Date : 2025-10-01 DOI: 10.1093/jmicro/dfaf023
Satoko Arakawa, Hirofumi Yamaguchi, Shigeomi Shimizu
{"title":"Discovery of Golgi membrane-associated degradation (GOMED) pathway: a focus on 15 years of ultrastructural analyses.","authors":"Satoko Arakawa, Hirofumi Yamaguchi, Shigeomi Shimizu","doi":"10.1093/jmicro/dfaf023","DOIUrl":"10.1093/jmicro/dfaf023","url":null,"abstract":"<p><p>In this review, we focus on the ultrastructural characteristics of the Golgi membrane-associated degradation (GOMED) pathway, which have been clarified by electron microscopy, and highlight recent advances in the elucidation of its molecular mechanism and physiological roles. The discovery of GOMED, an Atg5/Atg7-independent degradation pathway that differs from canonical autophagy in membrane origin, stimuli and substrate specificity, has substantially expanded our understanding of intracellular degradation systems. In 2009, we identified GOMED as a novel, evolutionarily conserved autophagic pathway and demonstrated its role in intracellular degradation across eukaryotes, from yeast to mammals. We identified the conserved protein Hsv2/Wipi3 as an essential GOMED protein, which translocates to the trans-Golgi upon induction and remodels Golgi membranes into cup-shaped structures that engulf cytoplasmic components for lysosomal degradation. These processes contribute to organelle and secretory granule turnover, as well as mitochondrial clearance during erythroid differentiation. Moreover, neuronal-specific ablation of Wipi3 in mice causes severe cerebellar degeneration, implicating GOMED in tissue development and homeostasis. As these mechanisms are associated with diseases, such as neurodegenerative disorders and cancer, GOMED mechanisms should also be considered when establishing therapeutic strategies for these diseases.</p>","PeriodicalId":74193,"journal":{"name":"Microscopy (Oxford, England)","volume":" ","pages":"315-329"},"PeriodicalIF":1.9,"publicationDate":"2025-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC12527238/pdf/","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144013956","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Cryo-STEM tomography for cell biology using thick lamella. 利用厚薄片进行细胞生物学低温扫描电镜断层扫描。
IF 1.9
Microscopy (Oxford, England) Pub Date : 2025-10-01 DOI: 10.1093/jmicro/dfaf017
Kazuhiro Aoyama, Hiroko Takazaki, Misaki Arie, Hironori Suemune, Shogo Kawai
{"title":"Cryo-STEM tomography for cell biology using thick lamella.","authors":"Kazuhiro Aoyama, Hiroko Takazaki, Misaki Arie, Hironori Suemune, Shogo Kawai","doi":"10.1093/jmicro/dfaf017","DOIUrl":"10.1093/jmicro/dfaf017","url":null,"abstract":"<p><p>Electron tomography is a powerful tool for structural studies in cell biology, but specimen thickness remains a significant limitation. Scanning transmission electron microscopy (STEM) tomography offers advantages in this regard. Recent developments in focused ion beam slicing methods for cryo-cell biology have enabled the observation and 3D reconstruction of relatively thick specimens (300-500 nm) using cryo-STEM tomography. Organelles such as mitochondria and the nuclear membrane have been clearly reconstructed, demonstrating the promise of STEM tomography for structural studies in cell biology.</p>","PeriodicalId":74193,"journal":{"name":"Microscopy (Oxford, England)","volume":" ","pages":"377-381"},"PeriodicalIF":1.9,"publicationDate":"2025-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143560183","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Segmented ring-mesh model of glycosaminoglycan chains based on the 3D analysis of normal individual and musculocontractural Ehlers-Danlos syndrome skin using scanning transmission electron microscopy. 基于扫描透射电镜对正常人和肌挛缩型埃勒-丹洛斯综合征皮肤三维分析的糖胺聚糖链分段环网模型
IF 1.9
Microscopy (Oxford, England) Pub Date : 2025-10-01 DOI: 10.1093/jmicro/dfaf012
Naoki Takahashi, Takuya Hirose, Kiyokazu Kametani, Tomohito Iwasaki, Yasutada Imamura, Tomoki Kosho, Takafumi Watanabe
{"title":"Segmented ring-mesh model of glycosaminoglycan chains based on the 3D analysis of normal individual and musculocontractural Ehlers-Danlos syndrome skin using scanning transmission electron microscopy.","authors":"Naoki Takahashi, Takuya Hirose, Kiyokazu Kametani, Tomohito Iwasaki, Yasutada Imamura, Tomoki Kosho, Takafumi Watanabe","doi":"10.1093/jmicro/dfaf012","DOIUrl":"10.1093/jmicro/dfaf012","url":null,"abstract":"<p><p>Collagen fibrils in the dermis are bundled by glycosaminoglycan (GAG) chains of decorin, which contribute to its strength. The three-dimensional structure of collagen fibrils and GAG chains has been discussed on the basis of observations and experiments. This study uses scanning transmission electron microscope (STEM) tomography with high Z-axis resolution to analyze the three-dimensional structure of GAG chains in the dermis from a healthy individual and a patient with musculocontractural Ehlers-Danlos syndrome caused by pathogenic variants in CHST14 (mcEDS-CHST14). This observation revealed that the dermis from a healthy individual featured multiple GAG chains that wrapped around collagen fibrils and formed incomplete ring structures. However, in the dermis from a patient with mcEDS-CHST14, GAG chains were linear and did not form rings. Based on the relationship between collagen fibrils and GAG chains, we suggest the three-dimensional structure of normal GAG chains in a new model named the 'segmented ring-mesh model'. The interactions between collagen fibrils and GAG chains in this model also apply to the dermis of mcEDS-CHST14 patients, in which the GAG chain composition changes to become CS-rich and more linear. This change leads to an increased inter-fibrillar space, which inhibits the dense packing of collagen fibrils. These findings suggest that this phenomenon contributes to the skin fragility observed in mcEDS-CHST14 patients. Our study suggests the 'segmented ring-mesh model' of GAG chains is essential for the dense packing of collagen fibrils in normal dermis. STEM tomography is highly effective in analyzing the three-dimensional structure of collagen fibrils and GAG chains.</p>","PeriodicalId":74193,"journal":{"name":"Microscopy (Oxford, England)","volume":" ","pages":"358-366"},"PeriodicalIF":1.9,"publicationDate":"2025-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143442843","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Ultra-low accelerating voltage scanning electron microscopy with multiple imaging detectors-imaging and analysis at the 'sweet spot' - secondary publication. 超低加速电压扫描电子显微镜与多个成像探测器-成像和分析在“甜蜜点”-二次出版。
IF 1.9
Microscopy (Oxford, England) Pub Date : 2025-10-01 DOI: 10.1093/jmicro/dfaf032
{"title":"Ultra-low accelerating voltage scanning electron microscopy with multiple imaging detectors-imaging and analysis at the 'sweet spot' - secondary publication.","authors":"","doi":"10.1093/jmicro/dfaf032","DOIUrl":"10.1093/jmicro/dfaf032","url":null,"abstract":"","PeriodicalId":74193,"journal":{"name":"Microscopy (Oxford, England)","volume":" ","pages":"382"},"PeriodicalIF":1.9,"publicationDate":"2025-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145034847","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Tip treatment for subnanoscale atomic force microscopy in liquid by atomic layer deposition Al2O3 coating. 通过原子层沉积 Al2O3 涂层对液体中亚纳米尺度原子力显微镜的针尖进行处理。
IF 1.9
Microscopy (Oxford, England) Pub Date : 2025-10-01 DOI: 10.1093/jmicro/dfaf014
Ryohei Kojima, Ayhan Yurtsever, Keisuke Miyazawa, Lucas J Andrew, Mark J MacLachlan, Takeshi Fukuma
{"title":"Tip treatment for subnanoscale atomic force microscopy in liquid by atomic layer deposition Al2O3 coating.","authors":"Ryohei Kojima, Ayhan Yurtsever, Keisuke Miyazawa, Lucas J Andrew, Mark J MacLachlan, Takeshi Fukuma","doi":"10.1093/jmicro/dfaf014","DOIUrl":"10.1093/jmicro/dfaf014","url":null,"abstract":"<p><p>Atomic force microscopy (AFM) allows direct imaging of atomic- or molecular-scale surface structures in liquid. However, such subnanoscale measurements are often sensitive to the AFM tip properties. To overcome this problem, 30 nm Si-sputter coating was proposed, and its effectiveness in improving stability and reproducibility has been demonstrated in atomic-scale imaging of various materials. However, this method involves tip blunting, enhancing the tip-induced dilation effect. As an alternative method, here we investigate atomic layer deposition (ALD) Al2O3-coating, where the film thickness is atomically well-controlled. Our transmission electron microscopy, contact angle and force curve measurements consistently suggest that as-purchased tips are covered with organic contaminants, and the initial 20 cycles gradually remove them, reducing the tip radius (Rt) and hydrophobicity. Further deposition increases Rt and hydrophilicity and forms an intact Al2O3 film over 50 cycles. We compared 50-cycle ALD-coated tips with 30 nm Si-sputter-coated tips in imaging mica and chitin nanocrystals (NCs). On mica, ALD coating gives slightly less stability and reproducibility in hydration force measurements than the Si sputter coating, yet they are sufficient in atomic-scale imaging. In imaging chitin NCs, ALD-coated tips give a less tip-induced dilation effect while maintaining molecular-scale imaging capability. We also found that 10-cycle-ALD coated tips covered with carbon give a better resolution and reproducibility in observing subnanoscale features at chitin NC surfaces. This result and our experience empirically suggest carbon-coated tips' effectiveness in observing carbon-based materials.</p>","PeriodicalId":74193,"journal":{"name":"Microscopy (Oxford, England)","volume":" ","pages":"367-376"},"PeriodicalIF":1.9,"publicationDate":"2025-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC12527287/pdf/","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143560194","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Electron microscopy studies on interfacial solid-state reactions induced by electronic excitation. 电子激发诱导界面固相反应的电镜研究。
IF 1.9
Microscopy (Oxford, England) Pub Date : 2025-10-01 DOI: 10.1093/jmicro/dfaf029
Kazuhisa Sato
{"title":"Electron microscopy studies on interfacial solid-state reactions induced by electronic excitation.","authors":"Kazuhisa Sato","doi":"10.1093/jmicro/dfaf029","DOIUrl":"10.1093/jmicro/dfaf029","url":null,"abstract":"<p><p>We have studied the effects of electron irradiation on Pt/a-SiOx thin films by transmission electron microscopy and electron diffraction. Pt2Si was formed by 75 keV electron irradiation at 298 K and 90 K. Such a low-temperature synthesis of Pt2Si can be attributed to the dissociation of a-SiOx induced by electronic excitation; Si-O bonds dissociate through Auger decay of core-holes generated by electronic excitation, and then, dissociated Si atoms form Pt-Si bonds. The morphology of Pt islands extensively changed during Pt2Si formation, even at 90 K. Coalescence and growth of metallic particles are not due to thermal effects during electron irradiation but to athermal processes accompanied by silicide formation. To maintain the reaction interface between metallic particles and the dissociated Si atoms by electronic excitation, a considerable concomitant morphology change occurs. Similarly, Fe2Si was synthesized by using the same technique. In this way, we have demonstrated a versatile method for selectively forming nanoscale metal silicides in electron-irradiated areas at room temperature. We also propose a new mechanism for the crystallization of amorphous alloys, which is mediated by additional solute atoms produced by electronic excitation. Crystallization of amorphous Pd-Si alloy thin films can be realized by 75 keV electron irradiation at 90 K via the electronic excitation, where both knock-on damage and possible thermal crystallization can be excluded. Supply of dissociated Si to the Pd-Si layer may cause instability of the amorphous phase, which serves as the trigger for the remarkable structural change, i.e. additional solute atom-mediated crystallization.</p>","PeriodicalId":74193,"journal":{"name":"Microscopy (Oxford, England)","volume":" ","pages":"330-347"},"PeriodicalIF":1.9,"publicationDate":"2025-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC12527267/pdf/","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144236130","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Noise reduction of low-dose electron holograms using the wavelet hidden Markov model. 小波隐马尔可夫模型在低剂量电子全息图降噪中的应用。
IF 1.9
Microscopy (Oxford, England) Pub Date : 2025-10-01 DOI: 10.1093/jmicro/dfaf007
Yuto Tomita, Yoshihiro Midoh, Takehiro Tamaoka, Yasukazu Murakami
{"title":"Noise reduction of low-dose electron holograms using the wavelet hidden Markov model.","authors":"Yuto Tomita, Yoshihiro Midoh, Takehiro Tamaoka, Yasukazu Murakami","doi":"10.1093/jmicro/dfaf007","DOIUrl":"10.1093/jmicro/dfaf007","url":null,"abstract":"<p><p>The precision in electron holography studies on electrostatic and magnetic fields depends on the image quality of an electron hologram. Enhancing the image quality of electron holograms is essential for the comprehensive analysis of weak electromagnetic fields; however, extended electron beam irradiation can lead to undesirable radiation damage and contamination. Recent studies have demonstrated that noise reduction using the wavelet hidden Markov model (WHMM) can improve the precision of phase analysis for limited thin-foiled crystals. In this study, we examine the effects of WHMM-based denoising on the electron holography data of weakly charged nanoparticles collected under low-electron-dose conditions. The results indicate that effective noise reduction with the WHMM allows for a reduction in the magnitude of the electron dose by approximately half relative to data collection without WHMM denoising, while maintaining the same level of charge determination precision: less than one elementary charge. Notably, at a low electron dose of 0.40 e-/pixel, WHMM denoising enables the clear visualization of a weak stray electric field outside a charged latex sphere. This method offers significant advantages for electron holography studies of electron-beam-sensitive materials requiring minimal time for electron exposure.</p>","PeriodicalId":74193,"journal":{"name":"Microscopy (Oxford, England)","volume":" ","pages":"348-357"},"PeriodicalIF":1.9,"publicationDate":"2025-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC12527278/pdf/","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143026142","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Encapsulation, vacuolation and phagocytosis of the opportunistic fungal pathogen Cryptococcus in the liver of an immunocompetent host. 机会性真菌病原体隐球菌在免疫能力强的宿主肝脏中的包封、空泡化和吞噬作用。
IF 1.9
Microscopy (Oxford, England) Pub Date : 2025-08-01 DOI: 10.1093/jmicro/dfaf003
Chul Jong Yoon, Je Geun Chi, Ki Woo Kim
{"title":"Encapsulation, vacuolation and phagocytosis of the opportunistic fungal pathogen Cryptococcus in the liver of an immunocompetent host.","authors":"Chul Jong Yoon, Je Geun Chi, Ki Woo Kim","doi":"10.1093/jmicro/dfaf003","DOIUrl":"10.1093/jmicro/dfaf003","url":null,"abstract":"<p><p>The cellular characteristics of the opportunistic fungal pathogen Cryptococcus species were investigated in the infected liver of an immunocompetent host using transmission electron microscopy (TEM). With no records of immunodeficiency, the 3-year-old female patient displayed a high-grade fever, lethargy and increasing jaundice. TEM analysis revealed the presence of round yeast cells in the patient's liver. These fungal yeast cells exhibited an array of cellular events in the host's liver: (i) the formation of polysaccharide capsules outside the cell wall, (ii) vacuolation in the cytoplasm and (iii) phagocytosis by Kupffer cells. The yeast cells were surrounded by electron-transparent polysaccharide capsules (approximately 5 μm thick). A series of yeast vacuolations were observed at different stages of cell development. As vacuoles occupied the cytoplasm of yeast cells, the polysaccharide capsules were thinner and more electron-dense than those of intact yeast cells. Certain yeast cells were phagocytosed by Kupffer cells through the budding scars or discontinued regions in the cell walls. These observations suggested that the patient was suffering from liver cryptococcosis. This study provides insights into the behavior of opportunistic fungal pathogens in the livers of immunocompetent patients.</p>","PeriodicalId":74193,"journal":{"name":"Microscopy (Oxford, England)","volume":" ","pages":"286-292"},"PeriodicalIF":1.9,"publicationDate":"2025-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142959779","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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