2015 IEEE 21st International On-Line Testing Symposium (IOLTS)最新文献_第3页

Bayesian network early reliability evaluation analysis for both permanent and transient faults 永久故障和暂态故障的贝叶斯网络早期可靠性评估分析

2015 IEEE 21st International On-Line Testing Symposium (IOLTS) Pub Date : 2015-07-06 DOI: 10.1109/IOLTS.2015.7229819

Alessandro Vallero, A. Savino, Sotiris Tselonis, N. Foutris, Manolis Kaliorakis, G. Politano, D. Gizopoulos, S. Carlo

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引用次数: 3

Simplification of fully delay testable combinational circuits 全延迟可测试组合电路的简化

2015 IEEE 21st International On-Line Testing Symposium (IOLTS) Pub Date : 2015-07-06 DOI: 10.1109/IOLTS.2015.7229829

A. Matrosova, E. Mitrofanov, Toral Shah

引用次数: 1

Laser fault injection into SRAM cells: Picosecond versus nanosecond pulses SRAM单元的激光故障注入:皮秒脉冲与纳秒脉冲

2015 IEEE 21st International On-Line Testing Symposium (IOLTS) Pub Date : 2015-07-06 DOI: 10.1109/IOLTS.2015.7229820

Marc Lacruche, N. Borrel, C. Champeix, Cyril Roscian, A. Sarafianos, J. Rigaud, J. Dutertre, E. Kussener

引用次数: 15

MUGEN: A high-performance fault-tolerant routing algorithm for unreliable Networks-on-Chip MUGEN:一种针对不可靠片上网络的高性能容错路由算法

2015 IEEE 21st International On-Line Testing Symposium (IOLTS) Pub Date : 2015-07-06 DOI: 10.1109/IOLTS.2015.7229835

A. Charif, N. Zergainoh, M. Nicolaidis

{"title":"MUGEN: A high-performance fault-tolerant routing algorithm for unreliable Networks-on-Chip","authors":"A. Charif, N. Zergainoh, M. Nicolaidis","doi":"10.1109/IOLTS.2015.7229835","DOIUrl":"https://doi.org/10.1109/IOLTS.2015.7229835","url":null,"abstract":"NoCs (Networks-on-Chip) are an attractive alternative to communication buses for SoCs (Systems-on-Chip) as they offer both high scalability and low power consumption. However, designing such systems in the nanoscale era brings up some serious concerns about reliability. Our aim is to design robust NoCs while limiting performance degradation. In this paper, we introduce several techniques meant to increase the reliability and performance of NoCs. We combine these techniques to build a fault-tolerant, deadlock-free and congestion-aware routing algorithm called MUGEN. The algorithm comprises an optimized method to exchange messages between different virtual channel classes, a selection function that uses distant router link information to avoid dead-ends and a new congestion metric used to guide routing decisions towards less congested areas. We simulate an 8×8 Mesh NoC with fault injection to evaluate each method used by MUGEN individually before comparing the full algorithm with existing works from literature. We present promising results about the proposed techniques both in terms of fault-tolerance and performance.","PeriodicalId":413023,"journal":{"name":"2015 IEEE 21st International On-Line Testing Symposium (IOLTS)","volume":"33 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-07-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126809457","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 6

Mining simulation metrics for failure triage in regression testing 为回归测试中的故障分类挖掘模拟度量

2015 IEEE 21st International On-Line Testing Symposium (IOLTS) Pub Date : 2015-07-06 DOI: 10.1109/IOLTS.2015.7229856

Zissis Poulos, A. Veneris

{"title":"Mining simulation metrics for failure triage in regression testing","authors":"Zissis Poulos, A. Veneris","doi":"10.1109/IOLTS.2015.7229856","DOIUrl":"https://doi.org/10.1109/IOLTS.2015.7229856","url":null,"abstract":"Design debugging poses a major bottleneck in modern VLSI CAD flows, consuming up to 60% of the verification cycle. The debug pain, however, worsens in regression verification flows at the pre-silicon stage where myriads of failures can be exposed. These failures need to be properly grouped and distributed among engineers for further analysis before the next regression run commences. This high-level and complex debug problem is referred to as failure triage and largely remains a manual task in the industry. In this paper, we propose an automated failure triage flow that mines information from both failing and passing tests during regression, and automatically performs a coarse-grain partitioning of the failures. The proposed framework combines formal tools and novel statistical metrics to quantify the likelihood of specific design components being the root-cause of the observed failures. These components are then used to represent failures as high-dimensional objects, which are grouped by applying data-mining clustering algorithms. Finally, the generated failure clusters are automatically prioritized and passed to the best suited engineers for detailed analysis. Experimental results show that the proposed approach groups related failures together with 90% accuracy on the average, and efficiently prioritizes the responsible design errors for 86% of the exposed failures.","PeriodicalId":413023,"journal":{"name":"2015 IEEE 21st International On-Line Testing Symposium (IOLTS)","volume":"10 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-07-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115390049","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 1

An effective embedded test & diagnosis solution for external memories 一个有效的嵌入式测试和诊断解决方案的外部存储器

2015 IEEE 21st International On-Line Testing Symposium (IOLTS) Pub Date : 2015-07-06 DOI: 10.1109/IOLTS.2015.7229852

Gurgen Harutunyan, Y. Zorian

引用次数: 6

Soft error immune latch under SEU related double-node charge collection 双节点电荷收集下的软误差免疫锁存

2015 IEEE 21st International On-Line Testing Symposium (IOLTS) Pub Date : 2015-07-06 DOI: 10.1109/IOLTS.2015.7229830

K. Katsarou, Y. Tsiatouhas

引用次数: 5

On the maximization of the sustained switching activity in a processor 关于处理器中持续切换活动的最大化

2015 IEEE 21st International On-Line Testing Symposium (IOLTS) Pub Date : 2015-07-06 DOI: 10.1109/IOLTS.2015.7229826

R. Cantoro, M. Reorda, Alireza Rohani, H. Kerkhoff

引用次数: 3

The future of fault tolerant computing 容错计算的未来

2015 IEEE 21st International On-Line Testing Symposium (IOLTS) Pub Date : 2015-07-06 DOI: 10.1109/IOLTS.2015.7229841

J. Abraham, R. Iyer, D. Gizopoulos, D. Alexandrescu, Y. Zorian

引用次数: 2

Towards Trojan circuit detection with maximum state transition exploration 基于最大状态转移探索的木马电路检测

2015 IEEE 21st International On-Line Testing Symposium (IOLTS) Pub Date : 2015-07-06 DOI: 10.1109/IOLTS.2015.7229831

Joseph Lenox, S. Tragoudas

引用次数: 1