发布求助
文献互助 智能选刊 最新文献

2015 IEEE 21st International On-Line Testing Symposium (IOLTS)最新文献

筛选
英文 中文
Experimental validation of a Bulk Built-In Current Sensor for detecting laser-induced currents 用于检测激光感应电流的大型内置电流传感器的实验验证
2015 IEEE 21st International On-Line Testing Symposium (IOLTS) Pub Date : 2015-07-06 DOI: 10.1109/IOLTS.2015.7229849
C. Champeix, N. Borrel, J. Dutertre, B. Robisson, M. Lisart, A. Sarafianos
{"title":"Experimental validation of a Bulk Built-In Current Sensor for detecting laser-induced currents","authors":"C. Champeix, N. Borrel, J. Dutertre, B. Robisson, M. Lisart, A. Sarafianos","doi":"10.1109/IOLTS.2015.7229849","DOIUrl":"https://doi.org/10.1109/IOLTS.2015.7229849","url":null,"abstract":"Bulk Built-In Current Sensors (BBICS) were developed to detect the transient bulk currents induced in the bulk of integrated circuits when hit by ionizing particles or pulsed laser. This paper reports the experimental evaluation of a complete BBICS architecture, designed to simultaneously monitor PMOS and NMOS transistors, under Photoelectric Laser Stimulation (PLS). The obtained results are the first experimental proof of the efficiency of BBICS in laser fault injection detection attempts. Furthermore, this paper highlights the importance of BBICS tapping in a sensitive area (logical gates) for improved laser detection. It studies the performances of this BBICS architecture and suggests modifications for its future implementation.","PeriodicalId":413023,"journal":{"name":"2015 IEEE 21st International On-Line Testing Symposium (IOLTS)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-07-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131184367","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 21
OPUF: Obfuscation logic based physical unclonable function OPUF:基于混淆逻辑的物理不可克隆功能
2015 IEEE 21st International On-Line Testing Symposium (IOLTS) Pub Date : 2015-07-01 DOI: 10.1109/IOLTS.2015.7229850
Jing Ye, Yu Hu, Xiaowei Li
{"title":"OPUF: Obfuscation logic based physical unclonable function","authors":"Jing Ye, Yu Hu, Xiaowei Li","doi":"10.1109/IOLTS.2015.7229850","DOIUrl":"https://doi.org/10.1109/IOLTS.2015.7229850","url":null,"abstract":"The Physical Unclonable Function (PUF) has broad application prospects in the field of hardware security. The arbiter PUF is a typical kind of strong PUF. However, due to its deterministic logic, attackers can use modeling techniques to break it in short time. Therefore, this paper proposes an Obfuscation logic based PUF (OPUF) design. A Boolean obfuscation module is proposed to obfuscate the logic which is employed to select the path segments in the arbiter PUF. In this way, the nondeterminacy of PUF is improved, and the computation complexities of modeling attacks are significantly increased, making the OPUF much safer against modeling attack. Both the theoretical analysis and the experimental results show the proposed OPUF design has good stability and randomness.","PeriodicalId":413023,"journal":{"name":"2015 IEEE 21st International On-Line Testing Symposium (IOLTS)","volume":"36 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129165319","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 24
Efficient on-line fault-tolerance for the preconditioned conjugate gradient method 预条件共轭梯度法的有效在线容错
2015 IEEE 21st International On-Line Testing Symposium (IOLTS) Pub Date : 2015-07-01 DOI: 10.1109/IOLTS.2015.7229839
A. Schöll, Claus Braun, M. Kochte, H. Wunderlich
{"title":"Efficient on-line fault-tolerance for the preconditioned conjugate gradient method","authors":"A. Schöll, Claus Braun, M. Kochte, H. Wunderlich","doi":"10.1109/IOLTS.2015.7229839","DOIUrl":"https://doi.org/10.1109/IOLTS.2015.7229839","url":null,"abstract":"Linear system solvers are key components of many scientific applications and they can benefit significantly from modern heterogeneous computer architectures. However, such nano-scaled CMOS devices face an increasing number of reliability threats, which make the integration of fault tolerance mandatory. The preconditioned conjugate gradient method (PCG) is a very popular solver since it typically finds solutions faster than direct methods, and it is less vulnerable to transient effects. However, as latest research shows, the vulnerability is still considerable. Even single errors caused, for instance, by marginal hardware, harsh operating conditions or particle radiation can increase execution times considerably or corrupt solutions without indication. In this work, a novel and highly efficient fault-tolerant PCG method is presented. The method applies only two inner products to reliably detect errors. In case of errors, the method automatically selects between roll-back and efficient on-line correction. This significantly reduces the error detection overhead and expensive re-computations.","PeriodicalId":413023,"journal":{"name":"2015 IEEE 21st International On-Line Testing Symposium (IOLTS)","volume":"14 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132874872","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 8
首页 上一页
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整，为了账户安全，请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
请完成安全验证×
相关产品
×
本文献相关产品
联系我们：info@booksci.cn Book学术提供免费学术资源搜索服务，方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号：604180095
Book学术官方微信