关于处理器中持续切换活动的最大化

2015 IEEE 21st International On-Line Testing Symposium (IOLTS) Pub Date : 2015-07-06 DOI:10.1109/IOLTS.2015.7229826

R. Cantoro, M. Reorda, Alireza Rohani, H. Kerkhoff

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引用次数: 3

摘要

最近，测试领域的几个应用领域(如老化监测和老化监测)开始要求合适的输入刺激，能够在一定时间内最大化某个模块的开关活动。如果模块是处理器的一部分，这就变成了识别一个合适的指令序列，能够最大化切换活动。本文提出了一种解决这一问题的方法，并报告了在类似mips的流水线处理器上收集的一些实验结果。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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On the maximization of the sustained switching activity in a processor

Recently, several application areas in the test domain (e.g., burn-in and aging monitoring) started to require suitable input stimuli, able to maximize the switching activity of a certain module for a certain period of time. If the module is part of a processor, this turns into identifying a suitable sequence of instructions, able to maximize the switching activity. This paper proposes a method to attack this problem, and reports some experimental results gathered on a MIPS-like pipelined processor.

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来源期刊

2015 IEEE 21st International On-Line Testing Symposium (IOLTS)

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