{"title":"Simplification of fully delay testable combinational circuits","authors":"A. Matrosova, E. Mitrofanov, Toral Shah","doi":"10.1109/IOLTS.2015.7229829","DOIUrl":null,"url":null,"abstract":"Fully delay testable circuits obtained by covering ROBDD nodes with Invert-AND-OR sub-circuits and Invert-AND-XOR sub-circuits implementing Shannon decomposition formula are considered. Algorithms of finding test pairs for robust testable PDFs and validatable non robust testable PDFs of resulted circuits have been developed. They have a polynomial complexity. Experimental results demonstrate essential simplification of suggested circuits in contrast to fully delay testable circuits obtained by covering each ROBDD node with only Invert-AND-XOR sub-circuit.","PeriodicalId":413023,"journal":{"name":"2015 IEEE 21st International On-Line Testing Symposium (IOLTS)","volume":"25 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2015-07-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2015 IEEE 21st International On-Line Testing Symposium (IOLTS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IOLTS.2015.7229829","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
Fully delay testable circuits obtained by covering ROBDD nodes with Invert-AND-OR sub-circuits and Invert-AND-XOR sub-circuits implementing Shannon decomposition formula are considered. Algorithms of finding test pairs for robust testable PDFs and validatable non robust testable PDFs of resulted circuits have been developed. They have a polynomial complexity. Experimental results demonstrate essential simplification of suggested circuits in contrast to fully delay testable circuits obtained by covering each ROBDD node with only Invert-AND-XOR sub-circuit.