2019 IEEE 32nd International Conference on Microelectronic Test Structures (ICMTS)最新文献_第3页

Taming Emerging Devices' Variation and Reliability Challenges with Architectural and System Solutions [Invited] 利用架构和系统解决方案应对新兴设备的变化和可靠性挑战[特邀]

2019 IEEE 32nd International Conference on Microelectronic Test Structures (ICMTS) Pub Date : 2019-03-01 DOI: 10.1109/ICMTS.2019.8730924

Yuyang Wang, Leilai Shao, M. Lastras-Montaño, K. Cheng

引用次数: 3

Vertical Bipolar Transistor Test Structure for Measuring Minority Carrier Lifetime in IGBTs 测量igbt中少数载流子寿命的垂直双极晶体管测试结构

2019 IEEE 32nd International Conference on Microelectronic Test Structures (ICMTS) Pub Date : 2019-03-01 DOI: 10.1109/ICMTS.2019.8730922

K. Takeuchi, M. Fukui, T. Saraya, K. Itou, T. Takakura, S. Suzuki, Y. Numasawa, K. Kakushima, T. Hoshii, K. Furukawa, M. Watanabe, N. Shigyo, H. Wakabayashi, M. Tsukuda, A. Ogura, K. Tsutsui, H. Iwai, S. Nishizawa, I. Omura, H. Ohashi, T. Hiramoto

引用次数: 1

Session 8: Noise 第八部分:噪音

2019 IEEE 32nd International Conference on Microelectronic Test Structures (ICMTS) Pub Date : 2019-03-01 DOI: 10.1109/icmts.2019.8730963

引用次数: 0

Session 6: Matching & Variability 第6部分:匹配和可变性

2019 IEEE 32nd International Conference on Microelectronic Test Structures (ICMTS) Pub Date : 2019-03-01 DOI: 10.1109/icmts.2019.8730982

引用次数: 0

Session 9: Packaging 第九部分:包装

2019 IEEE 32nd International Conference on Microelectronic Test Structures (ICMTS) Pub Date : 2019-03-01 DOI: 10.1109/icmts.2019.8730961

引用次数: 0

A Study of Test Throughput Analysis on Capacitance Measurement of Parallel Test Structures Using LCR and Direct Charge based Instruments 基于LCR和直接充电的并联测试结构电容测量的测试吞吐量分析研究

2019 IEEE 32nd International Conference on Microelectronic Test Structures (ICMTS) Pub Date : 2019-03-01 DOI: 10.1109/ICMTS.2019.8730979

V. Katragadda, Namita N Deshmukh, A. Gasasira, Cheng-Mao Lee, Alan Cusick

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引用次数: 1

Damage Assessment Structure of Test-Pad Post-Processing on CMOS LSIs CMOS lsi测试台后处理损伤评估结构

2019 IEEE 32nd International Conference on Microelectronic Test Structures (ICMTS) Pub Date : 2019-03-01 DOI: 10.1109/ICMTS.2019.8730991

Y. Okamoto, Ayako Mizushima, Naoto Usami, Jun Kinoshita, A. Higo, Y. Mita

引用次数: 1

Chairman's Letter 主席的信

2019 IEEE 32nd International Conference on Microelectronic Test Structures (ICMTS) Pub Date : 2019-03-01 DOI: 10.1109/icmts.2019.8730994

David Bercovici

{"title":"Chairman's Letter","authors":"David Bercovici","doi":"10.1109/icmts.2019.8730994","DOIUrl":"https://doi.org/10.1109/icmts.2019.8730994","url":null,"abstract":"Greetings, friends of Yale Geology & Geophysics, this is my second year as Chair of our fine department, and it gives me great pleasure to tell you about the many events of the last year. There have been numerous changes, including new faculty, new graduates, expansion in numbers of undergraduate majors, graduate students, and postdoctoral scholars; even the building has seen renovations. Early in 2007 we ran two simultaneous junior searches, one in mineral physics and geophysics, the other in isotope geochemistry. The searches led to the appointment of four new faculty, two in each of the disciplines. The new assistant professors are geochemists Hagit Affek and Zhengrong Wang, both of whom started in July 2007, and geophysicists Kanani Lee (who starts in July 2008) and Maureen Long (who starts in January 2009). Each brings unique talents to the Department, and they will oversee major expansions in isotope geochemistry, mineral physics and seismological research. You can find profiles and a photo of each of them later in this newsletter. As we add new young faculty, our formerly young faculty are getting older and this year saw the promotions of geophysicist Jun Korenaga to Associate Professor, and atmospheric physicist Steven Sherwood to Professor. You might recall that Jun Korenaga was the recipient of the James B. Macelwane Medal from the American Geophysical Union in 2006, and Steve Sherwood received the Clarence Leroy Meisinger award from the American Meteorological Society in 2005. Bob Gordon retired in July of this year but continues as a Senior Research Scientist. Bob was an undergraduate ’52 and PhD ’55 in engineering; he returned to Yale after a stint at Columbia and has been a professor since 1957. In early November, the Department held a two-day symposium in Bob’s honor to highlight the singular contributions he has made in the fields of rock mechanics (including some of the early work that paved the GEOLOGY & GEOPHYSICS NEWS","PeriodicalId":333915,"journal":{"name":"2019 IEEE 32nd International Conference on Microelectronic Test Structures (ICMTS)","volume":"48 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127011542","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Conference Officials 会议官员

2019 IEEE 32nd International Conference on Microelectronic Test Structures (ICMTS) Pub Date : 2019-03-01 DOI: 10.1109/icmts.2019.8730959

引用次数: 0

Session 10: TFTs 第十场:TFTs

2019 IEEE 32nd International Conference on Microelectronic Test Structures (ICMTS) Pub Date : 2019-03-01 DOI: 10.1109/icmts.2019.8730916

引用次数: 0