2019 IEEE 32nd International Conference on Microelectronic Test Structures (ICMTS)最新文献_第6页

Evaluation of Truly Passive Crossbar Memory Arrays on Short Flow Characterization Vehicle Test Chips 真正无源横杆存储阵列在短流量表征车辆测试芯片上的评估

2019 IEEE 32nd International Conference on Microelectronic Test Structures (ICMTS) Pub Date : 2019-03-01 DOI: 10.1109/ICMTS.2019.8730984

C. Hess, T. Brożek, Hendrik Schneider, Yuan Yu, M. Lunenborg, Khim Hong Ng, D. Ciplickas, R. Vallishayee, C. Dolainsky, L. Weiland

引用次数: 4

A compact model of I -V characteristic degradation for organic thin film transistors 有机薄膜晶体管I -V特性退化的紧凑模型

2019 IEEE 32nd International Conference on Microelectronic Test Structures (ICMTS) Pub Date : 2019-03-01 DOI: 10.1109/ICMTS.2019.8730987

M. Saito, Michihiro Shintani, K. Kuribara, Y. Ogasahara, Takashi Sato

引用次数: 5

Probing impact on pad moisture tightness: A challenge for pad size reduction 探测对衬垫防潮性的影响:减小衬垫尺寸的挑战

2019 IEEE 32nd International Conference on Microelectronic Test Structures (ICMTS) Pub Date : 2019-03-01 DOI: 10.1109/ICMTS.2019.8730990

Matthias Vidal-Dhô, Q. Hubert, P. Gonon, Philippe Delorme, J. Jacquot, Maxime Marchetti, L. Beauvisage, J. Moragues, Pascale Potard, P. Fornara, Jean-Philippe Escales, Pascal Sallagoity, O. Pizzuto, Delphine Maury, J. Mirabel

引用次数: 2

Invited Talk 2 特邀演讲2

2019 IEEE 32nd International Conference on Microelectronic Test Structures (ICMTS) Pub Date : 2010-01-12 DOI: 10.1109/BLISS.2009.8

P. Tuyls

引用次数: 2

Invited Talk 1 特邀演讲1

2019 IEEE 32nd International Conference on Microelectronic Test Structures (ICMTS) Pub Date : 2009-08-01 DOI: 10.1109/BLISS.2009.7

T. Kean

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引用次数: 2