Proceedings., International Test Conference最新文献_第5页

On synthesizing circuits with implicit testability constraints 具有隐式可测性约束的合成电路

Proceedings., International Test Conference Pub Date : 1994-10-02 DOI: 10.1109/TEST.1994.528048

H. Cox

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引用次数: 21

3B21D BIST/Boundary-Scan system diagnostic test story 3B21D BIST/边界扫描系统诊断测试故事

Proceedings., International Test Conference Pub Date : 1994-10-02 DOI: 10.1109/TEST.1994.527943

Edward C. Behnke

引用次数: 3

Environmental Stress Testing with Boundary-Scan 边界扫描环境压力测试

Proceedings., International Test Conference Pub Date : 1994-10-02 DOI: 10.1109/TEST.1994.527964

D. Le, Ivan Karolik, Ronald Smith, A. Mcgovern, Chyral Curette, Joseph Ulbin, Michael Zarubaiko, Charles Henry, L. Stevens

引用次数: 0

Implementation of a dual segment architecture for a high pin count VLSI test system 高引脚数VLSI测试系统双段架构的实现

Proceedings., International Test Conference Pub Date : 1994-10-02 DOI: 10.1109/TEST.1994.527958

M.G. Davis

引用次数: 0

Development of a solution for achieving known-good-die 开发一个解决方案来实现已知的好模具

Proceedings., International Test Conference Pub Date : 1994-10-02 DOI: 10.1109/TEST.1994.527931

L. Prokopchak

引用次数: 7

Testing issues on high speed synchronous DRAMs 高速同步dram的测试问题

Proceedings., International Test Conference Pub Date : 1994-10-02 DOI: 10.1109/TEST.1994.527973

Wha-Joon Lee

引用次数: 0

Testability features of the MC68060 microprocessor MC68060微处理器的可测试性特点

Proceedings., International Test Conference Pub Date : 1994-10-02 DOI: 10.1109/TEST.1994.527936

A. Crouch, Matthew Pressly, J. Circello

引用次数: 33

Hybrid design for testability combining scan and clock line control and method for test generation 扫描与时钟线控制相结合的可测性混合设计与测试生成方法

Proceedings., International Test Conference Pub Date : 1994-10-02 DOI: 10.1109/TEST.1994.527968

S. Baeg, W. A. Rogers

引用次数: 8

Application of optoelectronic techniques to high speed testing 光电技术在高速测试中的应用

Proceedings., International Test Conference Pub Date : 1994-10-02 DOI: 10.1109/TEST.1994.528017

E. Sokolowska, B. Kaminska

引用次数: 0

On the initialization of sequential circuits 关于顺序电路的初始化

Proceedings., International Test Conference Pub Date : 1994-10-02 DOI: 10.1109/TEST.1994.527954

J. Wehbeh, D. Saab

引用次数: 37