{"title":"MC68060微处理器的可测试性特点","authors":"A. Crouch, Matthew Pressly, J. Circello","doi":"10.1109/TEST.1994.527936","DOIUrl":null,"url":null,"abstract":"This report describes the testability design goals, constraints, and strategies used in the development of the MC68060 microprocessor. It explores the design choices that were made and the considerations that led to those choices. It presents the architectures and methodologies used to implement the design choices, and ends by describing the successes, failures, and future refinements of the test methodologies and architectures.","PeriodicalId":309921,"journal":{"name":"Proceedings., International Test Conference","volume":"37 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1994-10-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"33","resultStr":"{\"title\":\"Testability features of the MC68060 microprocessor\",\"authors\":\"A. Crouch, Matthew Pressly, J. Circello\",\"doi\":\"10.1109/TEST.1994.527936\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This report describes the testability design goals, constraints, and strategies used in the development of the MC68060 microprocessor. It explores the design choices that were made and the considerations that led to those choices. It presents the architectures and methodologies used to implement the design choices, and ends by describing the successes, failures, and future refinements of the test methodologies and architectures.\",\"PeriodicalId\":309921,\"journal\":{\"name\":\"Proceedings., International Test Conference\",\"volume\":\"37 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1994-10-02\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"33\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings., International Test Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/TEST.1994.527936\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings., International Test Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TEST.1994.527936","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Testability features of the MC68060 microprocessor
This report describes the testability design goals, constraints, and strategies used in the development of the MC68060 microprocessor. It explores the design choices that were made and the considerations that led to those choices. It presents the architectures and methodologies used to implement the design choices, and ends by describing the successes, failures, and future refinements of the test methodologies and architectures.