Application of optoelectronic techniques to high speed testing

Abstract

The concept and experimental results for the novel optoelectronic architecture of the IC tester allowing very high test rates is presented. This architecture is based on our new alternative approach of encoding the data implying double optical pulses. The validity of the concept has been confirmed with the simulation results. This new method along with optical multiplexing and self-clocked optical distribution resulted in outstanding performance and revealed numerous possibilities for the proposed architecture.