{"title":"3B21D BIST/Boundary-Scan system diagnostic test story","authors":"Edward C. Behnke","doi":"10.1109/TEST.1994.527943","DOIUrl":null,"url":null,"abstract":"The 3B21D BIST and Boundary-Scan Design, based on the ANSI/IEEE Std 1149.1-1990, has given the 3B21D System Diagnostic Test Strategy an excellent set of tests at all levels of product assembly.","PeriodicalId":309921,"journal":{"name":"Proceedings., International Test Conference","volume":"22 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1994-10-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings., International Test Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TEST.1994.527943","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3
Abstract
The 3B21D BIST and Boundary-Scan Design, based on the ANSI/IEEE Std 1149.1-1990, has given the 3B21D System Diagnostic Test Strategy an excellent set of tests at all levels of product assembly.
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