{"title":"光电技术在高速测试中的应用","authors":"E. Sokolowska, B. Kaminska","doi":"10.1109/TEST.1994.528017","DOIUrl":null,"url":null,"abstract":"The concept and experimental results for the novel optoelectronic architecture of the IC tester allowing very high test rates is presented. This architecture is based on our new alternative approach of encoding the data implying double optical pulses. The validity of the concept has been confirmed with the simulation results. This new method along with optical multiplexing and self-clocked optical distribution resulted in outstanding performance and revealed numerous possibilities for the proposed architecture.","PeriodicalId":309921,"journal":{"name":"Proceedings., International Test Conference","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1994-10-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Application of optoelectronic techniques to high speed testing\",\"authors\":\"E. Sokolowska, B. Kaminska\",\"doi\":\"10.1109/TEST.1994.528017\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The concept and experimental results for the novel optoelectronic architecture of the IC tester allowing very high test rates is presented. This architecture is based on our new alternative approach of encoding the data implying double optical pulses. The validity of the concept has been confirmed with the simulation results. This new method along with optical multiplexing and self-clocked optical distribution resulted in outstanding performance and revealed numerous possibilities for the proposed architecture.\",\"PeriodicalId\":309921,\"journal\":{\"name\":\"Proceedings., International Test Conference\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1994-10-02\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings., International Test Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/TEST.1994.528017\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings., International Test Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TEST.1994.528017","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Application of optoelectronic techniques to high speed testing
The concept and experimental results for the novel optoelectronic architecture of the IC tester allowing very high test rates is presented. This architecture is based on our new alternative approach of encoding the data implying double optical pulses. The validity of the concept has been confirmed with the simulation results. This new method along with optical multiplexing and self-clocked optical distribution resulted in outstanding performance and revealed numerous possibilities for the proposed architecture.
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