2016 20th International Symposium on VLSI Design and Test (VDAT)最新文献

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A high speed low voltage latch type sense amplifier for non-volatile memory 一种用于非易失性存储器的高速低压锁存器型感测放大器
2016 20th International Symposium on VLSI Design and Test (VDAT) Pub Date : 2016-05-24 DOI: 10.1109/ISVDAT.2016.8064841
Disha Arora, Anil Kumar Gundu, M. Hashmi
{"title":"A high speed low voltage latch type sense amplifier for non-volatile memory","authors":"Disha Arora, Anil Kumar Gundu, M. Hashmi","doi":"10.1109/ISVDAT.2016.8064841","DOIUrl":"https://doi.org/10.1109/ISVDAT.2016.8064841","url":null,"abstract":"A high speed low power modified latch type static sense amplifier design for current sensing in non-volatile memories is presented in this paper. The idea presented in this paper makes use of the fact that the scaling in technology introduces severe reliability issues in sensing circuits, due to device mismatches, which cause unpredictability in their performance metrics. In this paper, a detailed analysis on the proposed sense amplifier topology has been carried out by introducing variations in the threshold voltage of the devices to determine its impact on the performance metrics such as sensing delay, offset, and power. The proposed sense amplifier exhibits a worst case sensing delay of 0.946ns and allows operation at power supplies lower than 1.2V. This design is capable of working at a current offset of 1μΑ, consumes total power of 45.512μW at 27°C with an improvement of 32.6% in power consumption when compared to conventional designs.","PeriodicalId":301815,"journal":{"name":"2016 20th International Symposium on VLSI Design and Test (VDAT)","volume":"40 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-05-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114332254","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 6
Analysis of regeneration time constant of dynamic latch using Adomian Decomposition method 用Adomian分解法分析动态锁存器的再生时间常数
2016 20th International Symposium on VLSI Design and Test (VDAT) Pub Date : 2016-05-24 DOI: 10.1109/ISVDAT.2016.8064860
A. Purushothaman
{"title":"Analysis of regeneration time constant of dynamic latch using Adomian Decomposition method","authors":"A. Purushothaman","doi":"10.1109/ISVDAT.2016.8064860","DOIUrl":"https://doi.org/10.1109/ISVDAT.2016.8064860","url":null,"abstract":"This paper presents Adomian Decomposition based analysis of regeneration time constant of CMOS dynamic cross-coupled latch. A CMOS dynamic cross-coupled latch, which is a nonlinear system, is typically analyzed by linearizing it around an operating point to arrive at regeneration time constant. However, the time domain behavior obtained using the linear analysis deviates from the actual behavior of the latch. Thus, circuit simulators like SPICE and Spectre solve the nonlinear differential equations numerically to obtain the time domain behavior. These numerical solutions neither give a closed form expression of the regeneration time-constant nor do they give an expression of time domain behavior in closed form. Adomian Decomposition Method (ADM), however, can be used to obtain the complete time-domain behavior and the regeneration time-constant. ADM expresses the solution of a nonlinear differential equation in a manner similar to Taylor series approximation of a polynomial. The paper first introduces the concept of ADM and then applies it to RC linear circuits. c. Simulations show good agreement between Cadence based and ADM based time domain behavior.","PeriodicalId":301815,"journal":{"name":"2016 20th International Symposium on VLSI Design and Test (VDAT)","volume":"48 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-05-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134474031","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
New technique to improve transient response of LDO regulators without an off-chip capacitor 无片外电容改善LDO稳压器瞬态响应的新技术
2016 20th International Symposium on VLSI Design and Test (VDAT) Pub Date : 2016-05-24 DOI: 10.1109/ISVDAT.2016.8064847
C. Parikh, Gopal Agarwal
{"title":"New technique to improve transient response of LDO regulators without an off-chip capacitor","authors":"C. Parikh, Gopal Agarwal","doi":"10.1109/ISVDAT.2016.8064847","DOIUrl":"https://doi.org/10.1109/ISVDAT.2016.8064847","url":null,"abstract":"A new technique for low dropout (LDO) regulators operating without an off-chip capacitor is proposed. The technique restricts the output voltage drop to around 100mV when the load current switches from 0 to 200mA in 50ns. An on-chip load capacitance of 200pF is assumed. The proposed extra circuitry requires only 5 transistors and a small 1pf capacitor, consumes 110μA of quiescent current, and affects the LDO loop operation only when the output changes suddenly. Results are verified in Spice, for a 1.8-V LDO with a 2-V nominal input voltage and a 1.24-V reference voltage in an 180nm CMOS technology.","PeriodicalId":301815,"journal":{"name":"2016 20th International Symposium on VLSI Design and Test (VDAT)","volume":"14 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-05-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124045203","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Synthesis of scheduler automata guaranteeing stability and reliability of embedded control systems 调度自动机的综合,保证嵌入式控制系统的稳定性和可靠性
2016 20th International Symposium on VLSI Design and Test (VDAT) Pub Date : 2016-05-24 DOI: 10.1109/ISVDAT.2016.8064856
S. Ghosh, Akash Mondal, Souradeep Dutta, Aritra Hazra, Soumyajit Dey
{"title":"Synthesis of scheduler automata guaranteeing stability and reliability of embedded control systems","authors":"S. Ghosh, Akash Mondal, Souradeep Dutta, Aritra Hazra, Soumyajit Dey","doi":"10.1109/ISVDAT.2016.8064856","DOIUrl":"https://doi.org/10.1109/ISVDAT.2016.8064856","url":null,"abstract":"Automata-based scheduling is a recent technique for pre-computed online scheduling of software control components in embedded systems. This paper studies an important aspect of automata-based scheduling that has not been addressed in the past, namely reliable control scheduling under the presence of permanent and/or transient failures in the applied control. The goal of the proposed technique is to create a scheduler automaton for every controller that recommends the scheduling patterns that are not only admissible with respect to the control performance requirements, but are also reliable with respect to the given permanent/transient failures. We conclude with a choice of admissible schedules from multiple scheduler automata, for a given set of controllers, under resource constrained environment. We illustrate the proposed approach over a case-study and present experimental results over the same.","PeriodicalId":301815,"journal":{"name":"2016 20th International Symposium on VLSI Design and Test (VDAT)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-05-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130757648","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Frequency domain analysis of on-chip power distribution network 片上配电网的频域分析
2016 20th International Symposium on VLSI Design and Test (VDAT) Pub Date : 2016-05-24 DOI: 10.1109/ISVDAT.2016.8064853
Shipra Batra, Pankhuri Singh, S. Kaushik, M. Hashmi
{"title":"Frequency domain analysis of on-chip power distribution network","authors":"Shipra Batra, Pankhuri Singh, S. Kaushik, M. Hashmi","doi":"10.1109/ISVDAT.2016.8064853","DOIUrl":"https://doi.org/10.1109/ISVDAT.2016.8064853","url":null,"abstract":"The noise induced by variations in power supply adversely effects System-on-chip (SoC) performance and these effects could be understood through modelling and analysis of Power Distribution Network (PDN). This paper presents modelling of PDN by incorporation of BGR and LDO for analyzing the effect of supply induced noise on the PDN performance. The effect of Simultaneous Switching Noise (SSN) resulting from switching of various analog and digital sub-systems is assessed through power spectral density curves. Finally, an appropriate PDN topology is proposed for connecting the sub-systems on a chip by considering the minimal effect of simultaneous switching noise on output as the main criterion.","PeriodicalId":301815,"journal":{"name":"2016 20th International Symposium on VLSI Design and Test (VDAT)","volume":"19 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-05-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116862647","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
An efficient reversible cryptographic circuit design 一种高效的可逆密码电路设计
2016 20th International Symposium on VLSI Design and Test (VDAT) Pub Date : 2016-05-01 DOI: 10.1109/ISVDAT.2016.8064874
Bikromadittya Mondal, Kushal Dey, Susanta Chakraborty
{"title":"An efficient reversible cryptographic circuit design","authors":"Bikromadittya Mondal, Kushal Dey, Susanta Chakraborty","doi":"10.1109/ISVDAT.2016.8064874","DOIUrl":"https://doi.org/10.1109/ISVDAT.2016.8064874","url":null,"abstract":"Hardware cryptographic circuits emerge in the field of cryptography as an alternative of software rendition where the analysis of the dissipated power causes the major attacks like DPA and SPA which are formally executed on the classical circuits. The paper proposes a novel design of cryptographic circuit based on the popular RSA algorithm using fast Modular Multiplier designed with reversible logic gates. The proposed structure is simple and regular as almost all the same component sets repeat itself throughout the design. The quantum cost of the proposed circuit is significantly less as compared to previous works done so far.","PeriodicalId":301815,"journal":{"name":"2016 20th International Symposium on VLSI Design and Test (VDAT)","volume":"14 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126528513","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A Pre-RTL floorplanner tool for automated CMP design space exploration with thermal awareness 一个Pre-RTL地板规划工具,用于自动CMP设计空间探索,具有热意识
2016 20th International Symposium on VLSI Design and Test (VDAT) Pub Date : 2016-05-01 DOI: 10.1109/ISVDAT.2016.8064876
G. Harsha, Praveen Kumar, Sujay Deb
{"title":"A Pre-RTL floorplanner tool for automated CMP design space exploration with thermal awareness","authors":"G. Harsha, Praveen Kumar, Sujay Deb","doi":"10.1109/ISVDAT.2016.8064876","DOIUrl":"https://doi.org/10.1109/ISVDAT.2016.8064876","url":null,"abstract":"Chip Multiprocessor (CMP) and System-on-Chip (SoC) designs have a large number of modules with billions of transistors embedded on a single die. While they offer very high performance, they also increase the design complexity and pose many challenges with one of them being floor-planning and placement. Floor-planning process is affected by and in turn effects physical characteristics, wire length, propagation delay between modules, power and thermal density of the chip. Floor-planning at backend generally takes considerable amount of runtime. With large design space of CMP/SoC designs, it is not possible to explore multiple options or rerun the process in case of discrepancies. In this work, we propose and develop a pre-RTL tool framework that performs floor-planning analysis at early stages of development. The primary goal is to perform floor-plan analysis using abstract description of a design. The tool explores multiple layout options for a design and provide insights into different physical aspects like area, relative position of IPs, thermal and power performance. Since detailed physical information is not required at early stages, it allows us to explore the vast design space of SoCs. The tool is written in python and is based on simulated annealing algorithm which is adapted to the problem's context. We demonstrate the utility and robustness of the tool in providing multiple layout options with different user specifications.","PeriodicalId":301815,"journal":{"name":"2016 20th International Symposium on VLSI Design and Test (VDAT)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116790556","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Design of coherence verification unit for CMPs realizing dragon protocol 实现龙协议的cmp相干验证单元设计
2016 20th International Symposium on VLSI Design and Test (VDAT) Pub Date : 2016-05-01 DOI: 10.1109/ISVDAT.2016.8064850
B. Chakraborty, M. Dalui, B. Sikdar
{"title":"Design of coherence verification unit for CMPs realizing dragon protocol","authors":"B. Chakraborty, M. Dalui, B. Sikdar","doi":"10.1109/ISVDAT.2016.8064850","DOIUrl":"https://doi.org/10.1109/ISVDAT.2016.8064850","url":null,"abstract":"The data coherence in Chip Multiprocessors (CMPs) cache system is to be more accurate and reliable. A system with single producer and multiple consumers uses update based coherence protocol (dragon). This work proposes an effective solution for coherence verification in dragon through introduction of highly efficient test logic (fault detection unit). The test design is based on the modular structure of Cellular Automata (CA). The SACA (single length cycle single attractor cellular automata) has been introduced to identify the inconsistencies in cache line states of dragon. The simple hardware implementation of the CA based design realizes quick decision on the cache coherency in CMPs with 100% accuracy.","PeriodicalId":301815,"journal":{"name":"2016 20th International Symposium on VLSI Design and Test (VDAT)","volume":"23 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121064169","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
A FSM based approach for efficient implementation of K-means algorithm 基于FSM的K-means算法高效实现方法
2016 20th International Symposium on VLSI Design and Test (VDAT) Pub Date : 2016-05-01 DOI: 10.1109/ISVDAT.2016.8064848
Rahul Ratnakumar, S. Nanda
{"title":"A FSM based approach for efficient implementation of K-means algorithm","authors":"Rahul Ratnakumar, S. Nanda","doi":"10.1109/ISVDAT.2016.8064848","DOIUrl":"https://doi.org/10.1109/ISVDAT.2016.8064848","url":null,"abstract":"After Fifty years of it's existence the K-means clustering is still popular among researchers due to lower computational complexity. Real time embedded applications require hardwiring of unsupervised learning algorithms like K-means within System-on-Chip for prompt processing in applications like image segmentation, pattern classification, speech recognition etc. This requirement is a must while analyzing Big Datasets. In this manuscript a FSM based architecture is developed for the efficient implementation of K-means algorithm. The proposed architecture has lower computational requirement due to the introduction of concepts like simplified Convergence Checker as well as Fibonacci linear feedback shift register for centroid initialization. To reduce hardware further, Manhattan distance is used as the distance metric instead of the conventional Euclidean distance. Benchmark IRIS flower dataset is used for testing the clustering performance of the proposed architecture. Results obtained after synthesis in Xilinx FPGA Artix7, reveals that the hardware performance is better than previous works, with respect to power (82mW), number of gates, area etc. and has good system clock frequency of 162MHz (6.1592ns), without using any DSP Blocks.","PeriodicalId":301815,"journal":{"name":"2016 20th International Symposium on VLSI Design and Test (VDAT)","volume":"187 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116137585","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 9
A robust 8T FinFET SRAM cell with improved stability for low voltage applications 一个强大的8T FinFET SRAM单元,具有提高的稳定性,适用于低电压应用
2016 20th International Symposium on VLSI Design and Test (VDAT) Pub Date : 2016-05-01 DOI: 10.1109/ISVDAT.2016.8064858
C. Kushwah, D. Dwivedi, N. Sathisha, Krishnan S. Rengarajan
{"title":"A robust 8T FinFET SRAM cell with improved stability for low voltage applications","authors":"C. Kushwah, D. Dwivedi, N. Sathisha, Krishnan S. Rengarajan","doi":"10.1109/ISVDAT.2016.8064858","DOIUrl":"https://doi.org/10.1109/ISVDAT.2016.8064858","url":null,"abstract":"As we move in sub-nanometer range, we have to deal with its darker side with problems like short channel effects. The yield loss due to device and process variations has never been so critical to cause failure in circuits. Due to growth in size of embedded SRAMs as well as usage of small size memory cells, process variations in cells leads to significant loss of yield for that we need to come up with process variation tolerant circuit styles and new devices. In this paper, we have used reverse bitlines feedback control (RBLFC) and data isolation enhanced read (DIER) techniques which results in 7 sigma yield at system level. The novel structure of proposed 8T cell gives 6% higher hold static noise margin (HSNM) and 66% higher write static noise margin (WSNM) as compared to conventional 6T cell. Proposed 8T cell allows 29% faster write operation as compared to 6T with 20% lower leakage power.","PeriodicalId":301815,"journal":{"name":"2016 20th International Symposium on VLSI Design and Test (VDAT)","volume":"32 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115001810","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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