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2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS)最新文献

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Radiation Evaluation of Digital Isolators for Space Applications 空间应用数字隔离器的辐射评估
2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS) Pub Date : 2017-10-01 DOI: 10.1109/RADECS.2017.8696248
P. Beck, M. Wind, P. Clemens, Tobias Kündgen, M. Latocha, Wilhelm Lennartz, S. Metzger, M. Poizat, S. Ruge, M. Steffens, Christoph Tscherne
{"title":"Radiation Evaluation of Digital Isolators for Space Applications","authors":"P. Beck, M. Wind, P. Clemens, Tobias Kündgen, M. Latocha, Wilhelm Lennartz, S. Metzger, M. Poizat, S. Ruge, M. Steffens, Christoph Tscherne","doi":"10.1109/RADECS.2017.8696248","DOIUrl":"https://doi.org/10.1109/RADECS.2017.8696248","url":null,"abstract":"Recently we presented preliminary results on TID and SEE testing of digital isolators. In this paper, we give a comprehensive summary of radiation-hardness characterization for three digital isolator’s technologies. Further, we provide overall conclusions on their suitability for space applications and give recommendations on further investigations.","PeriodicalId":223580,"journal":{"name":"2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS)","volume":"160 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122468162","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Radiation Evaluation of Analog Devices’ RT6804-1 Radiation Tolerant Multicell Battery Monitor 模拟器件RT6804-1耐辐射多电池监测器的辐射评估
2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS) Pub Date : 2017-10-01 DOI: 10.1109/RADECS.2017.8696268
S. Hart, P. Pandol, Nathan Wendel, Ryan Peralta
{"title":"Radiation Evaluation of Analog Devices’ RT6804-1 Radiation Tolerant Multicell Battery Monitor","authors":"S. Hart, P. Pandol, Nathan Wendel, Ryan Peralta","doi":"10.1109/RADECS.2017.8696268","DOIUrl":"https://doi.org/10.1109/RADECS.2017.8696268","url":null,"abstract":"Radiation Tolerant Multicell Battery Monitor RT6804-1 from Analog Devices Inc. has been evaluated for total dose radiation performance and Single event effect characterization. Results and discussions are presented in this work.","PeriodicalId":223580,"journal":{"name":"2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS)","volume":"117 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123178335","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
In-Beam Programming of Radiation-Hardened Flash-Based FPGA—RTG4 基于闪存的抗辐射FPGA-RTG4波束内编程
2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS) Pub Date : 2017-10-01 DOI: 10.1109/RADECS.2017.8696174
Jih-Jong Wang, N. Rezzak, Stephen Varela, V. Nguyen, S. Samiee, F. Hawley, E. Hamdy
{"title":"In-Beam Programming of Radiation-Hardened Flash-Based FPGA—RTG4","authors":"Jih-Jong Wang, N. Rezzak, Stephen Varela, V. Nguyen, S. Samiee, F. Hawley, E. Hamdy","doi":"10.1109/RADECS.2017.8696174","DOIUrl":"https://doi.org/10.1109/RADECS.2017.8696174","url":null,"abstract":"In-beam programming of the first radiation-hardened Flash-based FPGA—RTG4 is investigated. Programming by commercially available FlashPro is performed under perpendicular heavy-ion irradiation with LET ranging from 1.2 to 30.5 MeV-cm2/mg. Although there are interruptions during programming with artificially high flux in beam test, the acquired Weibull curve predicts very high successful rate of programming in space. The cause of interruptions is identified by TPA laser scanning to be single event upsets of row and column registers which setup the cells to be configured.","PeriodicalId":223580,"journal":{"name":"2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS)","volume":"29 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126000050","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Hardened By Design All-Digital Pulsed Multiplying DLL for DDR2-3 Interfaces DDR2-3接口全数字脉冲乘法DLL加固设计
2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS) Pub Date : 2017-10-01 DOI: 10.1109/RADECS.2017.8696144
C. Ramamurthy, L. Clark
{"title":"Hardened By Design All-Digital Pulsed Multiplying DLL for DDR2-3 Interfaces","authors":"C. Ramamurthy, L. Clark","doi":"10.1109/RADECS.2017.8696144","DOIUrl":"https://doi.org/10.1109/RADECS.2017.8696144","url":null,"abstract":"This abstract proposes a novel radiation hardened all-digital multiplying delay locked loop. The design uses pulse-clocking to create a high frequency clock for use in DDR2 and DDR3 data recovery and transmit without intermediate frequency generation. Implementation on a 55 nm low standby power process, can achieve DDR3-800 speeds at all corners with a peak to peak jitter of 22 ps. The energy dissipation is 14 pJ/MHz in active mode and 1.65 pJ/MHz in low-power standby mode. The full block area is 0.11 mm2. Control and filter circuits use a proven interleaved automated placement and routing providing full triple mode redundant domain separation for multiple critical node collection immunity.","PeriodicalId":223580,"journal":{"name":"2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS)","volume":"14 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127617117","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
MELAF -a 50 MeV Electron Accelerator Facility for Research in Radiation Effects MELAF -用于辐射效应研究的50 MeV电子加速器设备
2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS) Pub Date : 2017-10-01 DOI: 10.1109/RADECS.2017.8696226
A. Schuller, C. Makowski, R. Kapsch, R. Nolte, P. Beck
{"title":"MELAF -a 50 MeV Electron Accelerator Facility for Research in Radiation Effects","authors":"A. Schuller, C. Makowski, R. Kapsch, R. Nolte, P. Beck","doi":"10.1109/RADECS.2017.8696226","DOIUrl":"https://doi.org/10.1109/RADECS.2017.8696226","url":null,"abstract":"The Metrological Electron Accelerator Facility (MELAF) of the Physikalisch-Technische Bundesanstalt (PTB) offers access to well characterized high energy (0.5 – 50 MeV) electron and photon radiation fields. This work outlines the capabilities to foster new collaborations.","PeriodicalId":223580,"journal":{"name":"2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS)","volume":"83 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127862012","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Evaluation of spacecraft materials behavior to JUICE environment (Synergistic effect of radiations and cryogenic temperature) 航天器材料在JUICE环境下的性能评价(辐射和低温协同效应)
2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS) Pub Date : 2017-10-01 DOI: 10.1109/RADECS.2017.8696170
S. Dagras, J. Eck, C. Tonon, S. Duzellier, T. Paulmier, N. Sukhaseum, M. Maliki, C. Semprimoschnig
{"title":"Evaluation of spacecraft materials behavior to JUICE environment (Synergistic effect of radiations and cryogenic temperature)","authors":"S. Dagras, J. Eck, C. Tonon, S. Duzellier, T. Paulmier, N. Sukhaseum, M. Maliki, C. Semprimoschnig","doi":"10.1109/RADECS.2017.8696170","DOIUrl":"https://doi.org/10.1109/RADECS.2017.8696170","url":null,"abstract":"Two extended tests campaigns were performed on JUICE spacecraft materials to evaluate their behavior to Jovian environment. This study was specifically focused on the synergistic effects of radiations and very low temperature on materials.","PeriodicalId":223580,"journal":{"name":"2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS)","volume":"2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133741706","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Extended TID, ELDRS and SEE Hardening and Testing on Mixed Signal Telemetry LX7730 Controller LX7730混合信号遥测控制器的扩展TID, ELDRS和SEE硬化与测试
2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS) Pub Date : 2017-10-01 DOI: 10.1109/RADECS.2017.8696179
M. Sureau, Russell Stevens, M. Leuenberger, N. Rezzak, Dorian Johnson, Kathy Zhang
{"title":"Extended TID, ELDRS and SEE Hardening and Testing on Mixed Signal Telemetry LX7730 Controller","authors":"M. Sureau, Russell Stevens, M. Leuenberger, N. Rezzak, Dorian Johnson, Kathy Zhang","doi":"10.1109/RADECS.2017.8696179","DOIUrl":"https://doi.org/10.1109/RADECS.2017.8696179","url":null,"abstract":"Extended TID test results up to 300krad TID for the first radiation hardened analog mixed-signal telemetry controller IC, the LX7730, are presented.","PeriodicalId":223580,"journal":{"name":"2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS)","volume":"199 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134190832","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Investigation into SEU Effects and Hardening Strategies in SRAM Based FPGA 基于SRAM的FPGA中SEU效应及强化策略研究
2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS) Pub Date : 2017-10-01 DOI: 10.1109/RADECS.2017.8696177
Tianwen Li, Haigang Yang, He Zhao, Nan Wang, Yuan-feng Wei, Yiping Jia
{"title":"Investigation into SEU Effects and Hardening Strategies in SRAM Based FPGA","authors":"Tianwen Li, Haigang Yang, He Zhao, Nan Wang, Yuan-feng Wei, Yiping Jia","doi":"10.1109/RADECS.2017.8696177","DOIUrl":"https://doi.org/10.1109/RADECS.2017.8696177","url":null,"abstract":"The mitigation of single event upset (SEU) in SRAM based Field Programmable Gate Array (FPGA) is increasingly important as it is widely used in radiation environments such as space. As D flip-flop (DFF) and memory (including Block RAM and Configuration RAM) are the key elements in FPGAs, it is crucial to develop radiation hardening techniques for enhanced reliability of the DFF and memory. A novel hardened memory design for FPGA is proposed with multi-bit upset (MBU) protection. We further developed two prototype FPGA chips, one with and the other without SEU hardening for comparison. The FPGA chips are fabricated in a standard 0.13μm CMOS process and have a volume of 3 million equivalent logic gates. In contrast to the base FPGA, the SEU cross section of the memory in the hardened FPGA is at least three orders of magnitude lower. Also, no SEU upsets are observed in the DFF of the hardened FPGA.","PeriodicalId":223580,"journal":{"name":"2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS)","volume":"16 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115346913","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
A mechanism for Destructive Single-Event Efect in Gallium Nitride Power HEMTs 氮化镓功率hemt中破坏性单事件效应的机理
2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS) Pub Date : 2017-10-01 DOI: 10.1109/RADECS.2017.8696100
L. Scheick
{"title":"A mechanism for Destructive Single-Event Efect in Gallium Nitride Power HEMTs","authors":"L. Scheick","doi":"10.1109/RADECS.2017.8696100","DOIUrl":"https://doi.org/10.1109/RADECS.2017.8696100","url":null,"abstract":"The destructive Single-Event Effects in GaN HEMTs are varied and complicated. This paper presents a mechanism of the effect.","PeriodicalId":223580,"journal":{"name":"2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS)","volume":"146 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122860019","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Single Event Effect Analysis for Command and Data Handling Electronics of a Millimeter-Wave Radiometer 6U-Class Satellite Instrument 毫米波辐射计6u级卫星仪器指挥与数据处理电子系统单事件效应分析
2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS) Pub Date : 2017-10-01 DOI: 10.1109/RADECS.2017.8696153
M. Ogut, Y. Goncharenko, S. Reising, Braxton Kilmer, X. Bosch-Lluis, P. Kangaslahti, E. Schlecht
{"title":"Single Event Effect Analysis for Command and Data Handling Electronics of a Millimeter-Wave Radiometer 6U-Class Satellite Instrument","authors":"M. Ogut, Y. Goncharenko, S. Reising, Braxton Kilmer, X. Bosch-Lluis, P. Kangaslahti, E. Schlecht","doi":"10.1109/RADECS.2017.8696153","DOIUrl":"https://doi.org/10.1109/RADECS.2017.8696153","url":null,"abstract":"Radiation effects analysis is essential to improve reliability for space missions. The number of small satellite and CubeSat missions has increased significantly in recent years. Compared to traditional larger satellite missions, CubeSats are designed at lower cost and with shorter development cycles. The reliability of CubeSats and small satellites in on-orbit radiation environments needs to be ensured for mission success. In this study, single event effect analysis has been performed for a 6U-Class satellite instrument in low Earth orbit to improve its on-orbit reliability. Critical commercial off-the-shelf parts of the Command and Data Handling Subsystem of a 6U-Class satellite instrument have been tested under heavy-ion radiation at the Texas A&M University Cyclotron Institute Radiation Effects Facility. SEE characteristics have been tested and analyzed for analog-to-digital data converters, voltage regulators, and current sensing and voltage monitoring devices. Device- and system-level risk analyses have been performed for the Command and Data Handling electronics based on the results of heavy-ion radiation testing. System-level mitigation techniques have been studied to minimize the effects of SEEs on electronic systems for deployment on 6U-Class satellites in low Earth orbit.","PeriodicalId":223580,"journal":{"name":"2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS)","volume":"53 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116093403","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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