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2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS)最新文献

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Irradiation Facilities at CERN 欧洲核子研究中心的辐照设施
2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS) Pub Date : 2017-10-04 DOI: 10.1109/RADECS.2017.8696163
B. Gkotse, M. Brugger, P. Carbonez, S. Danzeca, A. Fabich, R. G. Alía, M. Glaser, G. Gorine, M. Jaekel, I. M. Suau, G. Pezzullo, F. Pozzi, F. Ravotti, M. Silari, M. Tali
{"title":"Irradiation Facilities at CERN","authors":"B. Gkotse, M. Brugger, P. Carbonez, S. Danzeca, A. Fabich, R. G. Alía, M. Glaser, G. Gorine, M. Jaekel, I. M. Suau, G. Pezzullo, F. Pozzi, F. Ravotti, M. Silari, M. Tali","doi":"10.1109/RADECS.2017.8696163","DOIUrl":"https://doi.org/10.1109/RADECS.2017.8696163","url":null,"abstract":"CERN provides unique irradiation facilities for applications in many scientific fields. This paper summarizes the facilities currently operating for proton, gamma, mixed-field and electron irradiations, including their main usage, characteristics and information about their operation. The new CERN irradiation facilities database is also presented. This includes not only CERN facilities but also irradiation facilities available worldwide.","PeriodicalId":223580,"journal":{"name":"2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS)","volume":"18 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-10-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125068778","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 7
Incidents and Accidents: The Way of the Single Event Tester 事件与意外:单事件测试的方法
2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS) Pub Date : 2017-10-03 DOI: 10.1109/RADECS.2017.8696261
K. Label
{"title":"Incidents and Accidents: The Way of the Single Event Tester","authors":"K. Label","doi":"10.1109/RADECS.2017.8696261","DOIUrl":"https://doi.org/10.1109/RADECS.2017.8696261","url":null,"abstract":"When performing a single event effect (SEE) test during a test campaign, flexibility and out of the box thinking is often required for unexpected and unplanned events.","PeriodicalId":223580,"journal":{"name":"2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS)","volume":"3 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-10-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127724088","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Options for Radiation Tolerant High-Performance Memory 可选的耐辐射高性能存储器
2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS) Pub Date : 2017-10-02 DOI: 10.1109/RADECS.2017.8696197
S. Guertin, J. Yang-Scharlotta, Paris Blaisdell-Pijuan, R. Some
{"title":"Options for Radiation Tolerant High-Performance Memory","authors":"S. Guertin, J. Yang-Scharlotta, Paris Blaisdell-Pijuan, R. Some","doi":"10.1109/RADECS.2017.8696197","DOIUrl":"https://doi.org/10.1109/RADECS.2017.8696197","url":null,"abstract":"Memory technologies were reviewed for radiation effects performance in order to determine the most cost-efficient target for a possible memory investment targeted at creating a memory component of general applicability for space use. TID and SEL trends that had indicated improvement in intrinsic performance based on scaling cannot be trusted. SEE hardening of memory arrays is prohibitive in terms of cell-level power and area requirements. Radiation-hardened cells and custom controllers are recommended for future memory developments.","PeriodicalId":223580,"journal":{"name":"2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-10-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129813282","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Towards a Unified Environmental Monitoring, Control and Data Management System for Irradiation Facilities: the CERN IRRAD Use Case 迈向辐射设施的统一环境监测、控制和数据管理系统:CERN IRRAD用例
2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS) Pub Date : 2017-10-02 DOI: 10.1109/RADECS.2017.8696209
B. Gkotse, M. Glaser, P. Jouvelot, E. Matli, G. Pezzullo, F. Ravotti
{"title":"Towards a Unified Environmental Monitoring, Control and Data Management System for Irradiation Facilities: the CERN IRRAD Use Case","authors":"B. Gkotse, M. Glaser, P. Jouvelot, E. Matli, G. Pezzullo, F. Ravotti","doi":"10.1109/RADECS.2017.8696209","DOIUrl":"https://doi.org/10.1109/RADECS.2017.8696209","url":null,"abstract":"The qualification of materials, electronic components and equipment for the CERN High Energy Physics experiments and beyond requires testing against possible radiation effects. These quite complex tests are performed by specialized teams working in irradiation facilities such as IRRAD, the Proton Irradiation Facility at CERN. Building upon the details of the overall irradiation control, monitoring, and logistical systems of IRRAD as a use case, we introduce the motivations for and general architecture of its new data management framework, currently under development at CERN. This infrastructure is intended to allow for the seamless and comprehensive handling of IRRAD irradiation experiments and to help manage all aspects of the facility. Its architecture, currently focused on the specific requirements of the IRRAD facility, is intended to be upgraded to a general framework that could be used in other irradiation facilities within the radiation effects community, as well as for other applications.","PeriodicalId":223580,"journal":{"name":"2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS)","volume":"14 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-10-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124690437","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
Multi-MGy Total Ionizing Dose Induced MOSFET Variability Effects on Radiation Hardened CMOS Image Sensor Performances 多mgy总电离剂量诱导的MOSFET可变性对辐射硬化CMOS图像传感器性能的影响
2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS) Pub Date : 2017-10-02 DOI: 10.1109/RADECS.2017.8696140
S. Rizzolo, V. Goiffon, M. Sergent, F. Corbière, S. Rolando, A. Chabane, P. Paillet, C. Marcandella, S. Girard, P. Magnan, M. Van Uffelen, Laura Mont Casellas, R. Scott, W. De Cock
{"title":"Multi-MGy Total Ionizing Dose Induced MOSFET Variability Effects on Radiation Hardened CMOS Image Sensor Performances","authors":"S. Rizzolo, V. Goiffon, M. Sergent, F. Corbière, S. Rolando, A. Chabane, P. Paillet, C. Marcandella, S. Girard, P. Magnan, M. Van Uffelen, Laura Mont Casellas, R. Scott, W. De Cock","doi":"10.1109/RADECS.2017.8696140","DOIUrl":"https://doi.org/10.1109/RADECS.2017.8696140","url":null,"abstract":"MOSFETs variability in irradiated CIS up to 10 MGy(SiO2) is statistically investigated on about 65000 devices. Different variability sources are identified and the role played by the transistors composing the readout chain is clarified.","PeriodicalId":223580,"journal":{"name":"2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS)","volume":"199 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-10-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133524555","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
Analysis of X-Ray Photo-Charge Induced Speckles in a Radiation Hardened CMOS Image Sensor 辐射硬化CMOS图像传感器x射线光电荷诱导散斑分析
2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS) Pub Date : 2017-10-02 DOI: 10.1109/RADECS.2017.8696152
T. Allanche, V. Goiffon, S. Rizzolo, P. Paillet, O. Duhamel, A. Chabane, C. Muller, P. Magnan, F. Corbière, S. Rolando, Raphael Clerc, Emmanuel Marin, A. Boukenter, Y. Ouerdane, S. Girard
{"title":"Analysis of X-Ray Photo-Charge Induced Speckles in a Radiation Hardened CMOS Image Sensor","authors":"T. Allanche, V. Goiffon, S. Rizzolo, P. Paillet, O. Duhamel, A. Chabane, C. Muller, P. Magnan, F. Corbière, S. Rolando, Raphael Clerc, Emmanuel Marin, A. Boukenter, Y. Ouerdane, S. Girard","doi":"10.1109/RADECS.2017.8696152","DOIUrl":"https://doi.org/10.1109/RADECS.2017.8696152","url":null,"abstract":"For the first time we collect photo-current induce by X-Ray in a CMOS Image Sensor (CIS). From measurement from on a range from 20 to 119 keV, integration time from 0.135 ms to 1.35ms and dose rate from 30 Gy/h to 30 kGy/h we highlight effects of energy, dose rate and integration time. We demonstrate that as integration time near 1 ms and a dose rate of 30 kGy/h a CIS can acquire image with only 23% of is dynamic use by photo-generated electrons.","PeriodicalId":223580,"journal":{"name":"2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS)","volume":"2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-10-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115635585","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Testing the Tester: Lessons Learned During the Testing of a State-of-the-Art Commercial 14nm Processor Under Proton Irradiation 测试测试仪:在质子辐照下测试最先进的商用14nm处理器的经验教训
2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS) Pub Date : 2017-10-02 DOI: 10.1109/RADECS.2017.8696137
C. M. Szabo, A. Duncan, K. Label
{"title":"Testing the Tester: Lessons Learned During the Testing of a State-of-the-Art Commercial 14nm Processor Under Proton Irradiation","authors":"C. M. Szabo, A. Duncan, K. Label","doi":"10.1109/RADECS.2017.8696137","DOIUrl":"https://doi.org/10.1109/RADECS.2017.8696137","url":null,"abstract":"Testing of an Intel 14nm desktop processor was conducted under proton irradiation. We share lessons learned, demonstrating that complex devices beget further complex challenges requiring practical and theoretical investigative expertise to solve.","PeriodicalId":223580,"journal":{"name":"2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS)","volume":"16 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-10-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114054610","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Farmer chamber response to different filter box and surrounding configurations 农场主腔对不同过滤箱和周围配置的响应
2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS) Pub Date : 2017-10-02 DOI: 10.1109/RADECS.2017.8696252
P. Martín-Holgado, Y. Morilla, M. Domínguez, G. Fernández
{"title":"Farmer chamber response to different filter box and surrounding configurations","authors":"P. Martín-Holgado, Y. Morilla, M. Domínguez, G. Fernández","doi":"10.1109/RADECS.2017.8696252","DOIUrl":"https://doi.org/10.1109/RADECS.2017.8696252","url":null,"abstract":"The use of a filter box for Total Ionizing Dose (TID) test is a recommendation present in the more relevant test method standards. However, the absence of specific details can produce discrepancies between different radiation facilities and dosimetry procedures.","PeriodicalId":223580,"journal":{"name":"2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS)","volume":"33 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-10-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125548446","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Extrapolated degradation of optical systems at MGy levels due to radiation-induced refractive index change 由于辐射引起的折射率变化导致的MGy水平下光学系统的外推退化
2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS) Pub Date : 2017-10-02 DOI: 10.1109/RADECS.2017.8696156
C. Muller, T. Lépine, T. Allanche, P. Paillet, V. Goiffon, Y. Ouerdane, A. Boukenter, S. Girard
{"title":"Extrapolated degradation of optical systems at MGy levels due to radiation-induced refractive index change","authors":"C. Muller, T. Lépine, T. Allanche, P. Paillet, V. Goiffon, Y. Ouerdane, A. Boukenter, S. Girard","doi":"10.1109/RADECS.2017.8696156","DOIUrl":"https://doi.org/10.1109/RADECS.2017.8696156","url":null,"abstract":"Measurements of permanent Radiation-induced refractive index change (RIRIC) were led on Fused Silica and K5G20 glasses irradiated by 6 MeV-electrons up to a total dose of 1.5 MGy. Based on these results and on available data from ESA, a dummy camera lens has been designed with OpticStudio and we investigate the impact of RIRIC on its optical performance through image simulation and Modulation Transfer Function (MTF). First results suggest that a limited variation of the refractive index of some or more – which is easily reached at a few MGy () dose levels – affect the performance of an optical system (OS), thus the image quality of the radiation-hardened camera. Inspired by the domain of non-cooled thermal imaging where the refractive index strongly changes with the temperature, we also investigated the approach of wavefront coding to increase the robustness of OS to high dose levels of radiations. Preliminary results are reported and open the way to OS architectures with limited RIRIC impact.","PeriodicalId":223580,"journal":{"name":"2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS)","volume":"4 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-10-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128103198","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
TID test on ITER Interlock Discharge Loop Interface Box (DLIB) system, an example of radiation test at equipment level. ITER联锁放电环路接口箱(DLIB)系统的TID试验，是设备级辐射试验的一个实例。
2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS) Pub Date : 2017-10-01 DOI: 10.1109/RADECS.2017.8696107
G. Fernández, Javier Bárcena, E. Muñoz
{"title":"TID test on ITER Interlock Discharge Loop Interface Box (DLIB) system, an example of radiation test at equipment level.","authors":"G. Fernández, Javier Bárcena, E. Muñoz","doi":"10.1109/RADECS.2017.8696107","DOIUrl":"https://doi.org/10.1109/RADECS.2017.8696107","url":null,"abstract":"There is a trend, for some new space projects, cubesats, LEO missions,…, etc., or other radiation environment application, to search options to get equipment radiation confidence in a cost effective manner. In this paper we present a case study based on a safety electronic equipment intended for ITER application which will operate under radiation environment and it is designed and built with COTS devices.","PeriodicalId":223580,"journal":{"name":"2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS)","volume":"19 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117149863","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
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