Extrapolated degradation of optical systems at MGy levels due to radiation-induced refractive index change

C. Muller, T. Lépine, T. Allanche, P. Paillet, V. Goiffon, Y. Ouerdane, A. Boukenter, S. Girard
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引用次数: 2

Abstract

Measurements of permanent Radiation-induced refractive index change (RIRIC) were led on Fused Silica and K5G20 glasses irradiated by 6 MeV-electrons up to a total dose of 1.5 MGy. Based on these results and on available data from ESA, a dummy camera lens has been designed with OpticStudio and we investigate the impact of RIRIC on its optical performance through image simulation and Modulation Transfer Function (MTF). First results suggest that a limited variation of the refractive index of some or more – which is easily reached at a few MGy () dose levels – affect the performance of an optical system (OS), thus the image quality of the radiation-hardened camera. Inspired by the domain of non-cooled thermal imaging where the refractive index strongly changes with the temperature, we also investigated the approach of wavefront coding to increase the robustness of OS to high dose levels of radiations. Preliminary results are reported and open the way to OS architectures with limited RIRIC impact.
由于辐射引起的折射率变化导致的MGy水平下光学系统的外推退化
在熔融二氧化硅和K5G20玻璃上测量了6 mev电子辐照至总剂量为1.5 MGy的永久辐射诱导折射率变化(RIRIC)。基于这些结果和ESA提供的数据,我们利用OpticStudio设计了一个虚拟相机镜头,并通过图像模拟和调制传递函数(MTF)研究了RIRIC对其光学性能的影响。第一个结果表明,一些或更多的折射率的有限变化-在几毫吉的剂量水平下很容易达到-影响光学系统(OS)的性能,从而影响抗辐射相机的图像质量。受非冷却热成像领域中折射率随温度变化强烈的启发,我们还研究了波前编码的方法来增加OS对高剂量辐射水平的鲁棒性。报告了初步结果,并为具有有限RIRIC影响的操作系统架构打开了道路。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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