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2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS)最新文献

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The effect of preliminary neutron irradiation on IR-LED characteristics during operation 运行过程中初始中子辐照对红外- led特性的影响
2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS) Pub Date : 2017-10-01 DOI: 10.1109/RADECS.2017.8696247
A. V. Simonova, A. Gradoboev, K. N. Orlova
{"title":"The effect of preliminary neutron irradiation on IR-LED characteristics during operation","authors":"A. V. Simonova, A. Gradoboev, K. N. Orlova","doi":"10.1109/RADECS.2017.8696247","DOIUrl":"https://doi.org/10.1109/RADECS.2017.8696247","url":null,"abstract":"Infrared light-emitting diodes operate under ionizing radiation. The purpose of this work is to research the effect of preliminary neutron irradiation on the reliability of LEDs during long-term operation. The objects of the research were lightemitting diodes based upon AlGaAs heterostructures. Long-term operating conditions were simulated by accelerated step-by-step tests. Changes in watt-ampere characteristic during the step-bystep tests can be represented as a change in the corresponding threshold currents with increasing of test steps. It is proved that the use of an optimal level of preliminary fast neutrons irradiation of LEDs makes it possible to increase their reliability.","PeriodicalId":223580,"journal":{"name":"2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS)","volume":"41 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127518327","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Advanced In-Situ Instrumentation of RF Circuits for Mixed-Field Irradiation Testing Purpose 用于混合场辐射测试的先进射频电路原位仪器
2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS) Pub Date : 2017-10-01 DOI: 10.1109/RADECS.2017.8696117
Steffen Mueller, S. Danzeca, R. G. Alía, M. Brugger, R. Weigel, A. Koelpin
{"title":"Advanced In-Situ Instrumentation of RF Circuits for Mixed-Field Irradiation Testing Purpose","authors":"Steffen Mueller, S. Danzeca, R. G. Alía, M. Brugger, R. Weigel, A. Koelpin","doi":"10.1109/RADECS.2017.8696117","DOIUrl":"https://doi.org/10.1109/RADECS.2017.8696117","url":null,"abstract":"This paper presents a method that applies multiplexing and in-fixture calibration technique to qualify for efficient instrumentation of multiple RF circuits up to 6 GHz during mixed-field irradiation.","PeriodicalId":223580,"journal":{"name":"2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS)","volume":"31 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126948035","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
A Survey on Analog-to-Digital Converter Performance with Respect to Ionizing Radiation 关于电离辐射的模数转换器性能研究
2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS) Pub Date : 2017-10-01 DOI: 10.1109/RADECS.2017.8696150
Steffen Mueller, R. Weigel, A. Koelpin
{"title":"A Survey on Analog-to-Digital Converter Performance with Respect to Ionizing Radiation","authors":"Steffen Mueller, R. Weigel, A. Koelpin","doi":"10.1109/RADECS.2017.8696150","DOIUrl":"https://doi.org/10.1109/RADECS.2017.8696150","url":null,"abstract":"This paper discusses radiation performance evolution of analog-to-digital converters, based on a comprehensive empirical analysis of both, experimental reports and datasheet specifications including commercial devices, radiation hardened parts, and scientific converters.","PeriodicalId":223580,"journal":{"name":"2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129445669","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Estimation of the Radiation Hardness of Bipolar Voltage Comparators in Wide Operation Temperature Range 双极电压比较器宽工作温度范围辐射硬度的估计
2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS) Pub Date : 2017-10-01 DOI: 10.1109/RADECS.2017.8696190
A. Bakerenkov, A. Rodin, V. Felitsyn, V. Pershenkov, V. Butin
{"title":"Estimation of the Radiation Hardness of Bipolar Voltage Comparators in Wide Operation Temperature Range","authors":"A. Bakerenkov, A. Rodin, V. Felitsyn, V. Pershenkov, V. Butin","doi":"10.1109/RADECS.2017.8696190","DOIUrl":"https://doi.org/10.1109/RADECS.2017.8696190","url":null,"abstract":"Radiation induced degradation of widely used bipolar voltage comparators was investigated in wide temperature range from high to liquid nitrogen temperatures. It was obtained, that the parametric degradation is significantly greater at low temperature measurements.","PeriodicalId":223580,"journal":{"name":"2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS)","volume":"61 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114071290","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Comparison of Single Event Transients in AlGaN/GaN Schottky-Gate HEMTs Using Four Sources for Charge Injection 四种电荷注入源下AlGaN/GaN肖特基门hemt单事件瞬态的比较
2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS) Pub Date : 2017-10-01 DOI: 10.1109/RADECS.2017.8696147
A. Khachatrian, N. Roche, S. Buchner, A. Koehler, T. Anderson, K. Hobart, D. McMorrow, S. Lalumondiere, N. Wells, M. Tockstein, E. C. Dillingham, J. Bonsall, P. Karuza, W. Lotshaw, S. Moss, D. Brewe, V. Ferlet-Cavrois, M. Mushitiello
{"title":"Comparison of Single Event Transients in AlGaN/GaN Schottky-Gate HEMTs Using Four Sources for Charge Injection","authors":"A. Khachatrian, N. Roche, S. Buchner, A. Koehler, T. Anderson, K. Hobart, D. McMorrow, S. Lalumondiere, N. Wells, M. Tockstein, E. C. Dillingham, J. Bonsall, P. Karuza, W. Lotshaw, S. Moss, D. Brewe, V. Ferlet-Cavrois, M. Mushitiello","doi":"10.1109/RADECS.2017.8696147","DOIUrl":"https://doi.org/10.1109/RADECS.2017.8696147","url":null,"abstract":"The shapes of single-event transients produced by heavy ions, focused pulsed laser-light, and focused pulsed x-rays in an AlGaN/GaN HEMT were compared.","PeriodicalId":223580,"journal":{"name":"2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS)","volume":"4 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132817718","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Worst-Case Proton Contribution to the Direct Ionization SEU Rate 最坏情况下质子对直接电离SEU速率的贡献
2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS) Pub Date : 2017-10-01 DOI: 10.1109/RADECS.2017.8696135
J. Guillermin, N. Sukhaseum, P. Pourrouquet, N. Chatry, F. Bezerra, R. Ecoffet
{"title":"Worst-Case Proton Contribution to the Direct Ionization SEU Rate","authors":"J. Guillermin, N. Sukhaseum, P. Pourrouquet, N. Chatry, F. Bezerra, R. Ecoffet","doi":"10.1109/RADECS.2017.8696135","DOIUrl":"https://doi.org/10.1109/RADECS.2017.8696135","url":null,"abstract":"Low energy protons can induce Single Event Upsets in highly integrated memories. The direct ionization phenomenon has been observed for technology nodes lower than 90 nm. The Single Event Upset rate calculation is usually performed with an isotropic shielding of 1 g.cm-2. Considering the direct ionization, low energy proton fluxes can be significantly impacted by the shielding or the altitude considered for the mission. The purpose of this study was to assess the impact of the radiative and mechanical environments on the calculated in-orbit rates.","PeriodicalId":223580,"journal":{"name":"2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS)","volume":"84 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134618592","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 6
Internal Electrostatic Discharge Testing of a RF Cable and Connectors 射频电缆和连接器的内部静电放电测试
2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS) Pub Date : 2017-10-01 DOI: 10.1109/RADECS.2017.8696114
Wousik Kim, J. Chinn, H. Figueroa, D. Thorbourn
{"title":"Internal Electrostatic Discharge Testing of a RF Cable and Connectors","authors":"Wousik Kim, J. Chinn, H. Figueroa, D. Thorbourn","doi":"10.1109/RADECS.2017.8696114","DOIUrl":"https://doi.org/10.1109/RADECS.2017.8696114","url":null,"abstract":"Internal Electrostatic Discharge (IESD) tests and 3D simulations on a RF coax cable with three different connectors (SMA, 2.92 mm, and 3.5 mm) are performed to assess the iESD threat at Europa Clipper Environment.","PeriodicalId":223580,"journal":{"name":"2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123720587","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Photobleaching effects in multi-mode radiation resistant optical fibers 多模抗辐射光纤中的光漂白效应
2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS) Pub Date : 2017-10-01 DOI: 10.1109/RADECS.2017.8696251
A. Billat, J. Blanc, J. Kuhnhenn, D. Ricci
{"title":"Photobleaching effects in multi-mode radiation resistant optical fibers","authors":"A. Billat, J. Blanc, J. Kuhnhenn, D. Ricci","doi":"10.1109/RADECS.2017.8696251","DOIUrl":"https://doi.org/10.1109/RADECS.2017.8696251","url":null,"abstract":"This work investigates radiation induced attenuation under gamma ray exposure in various multimode fibers intended for deployment in CERN accelerators. It reports photobleaching under injection of optical signals and characterizes the signal power influence.","PeriodicalId":223580,"journal":{"name":"2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS)","volume":"71 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121896747","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Muller C-element Self-corrected Triple Modular Redundant Logic with Multithreading and Low Power Modes 穆勒c元自校正三模冗余逻辑多线程和低功耗模式
2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS) Pub Date : 2017-10-01 DOI: 10.1109/RADECS.2017.8696212
C. Ramamurthy, A. Gujja, V. Vashishtha, S. Chellappa, L. Clark
{"title":"Muller C-element Self-corrected Triple Modular Redundant Logic with Multithreading and Low Power Modes","authors":"C. Ramamurthy, A. Gujja, V. Vashishtha, S. Chellappa, L. Clark","doi":"10.1109/RADECS.2017.8696212","DOIUrl":"https://doi.org/10.1109/RADECS.2017.8696212","url":null,"abstract":"This work describes voting feedback circuits for triple modular redundant (TMR) self-correcting flip-flops that reduce the flip-flop circuit area by 20% and the energy consumption by 10% over the conventional use of a majority gate. A fully pipelined 256-bit key and 128-bit data advanced encryption standard (AES) engine implemented at the 90 nm technology node using the proposed design and has a maximum performance of 400 MHz and 297 mW in TMR and multi-thread modes. It operates in a low-power, non-redundant mode at 102 mW power dissipation. Testability modes are are also described.","PeriodicalId":223580,"journal":{"name":"2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS)","volume":"16 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130086905","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Move the Laser Spot, Not the DUT: Investigating the New Micro-mirror Capability and Challenges for Localizing SEE Sites on Large Modern ICs 移动激光光斑，而不是DUT:在大型现代集成电路上研究新的微镜能力和定位SEE站点的挑战
2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS) Pub Date : 2017-10-01 DOI: 10.1109/RADECS.2017.8696180
M. Cannon, Andrés Pérez-Celis, G. Swift, R. Wong, S. Wen, M. Wirthlin
{"title":"Move the Laser Spot, Not the DUT: Investigating the New Micro-mirror Capability and Challenges for Localizing SEE Sites on Large Modern ICs","authors":"M. Cannon, Andrés Pérez-Celis, G. Swift, R. Wong, S. Wen, M. Wirthlin","doi":"10.1109/RADECS.2017.8696180","DOIUrl":"https://doi.org/10.1109/RADECS.2017.8696180","url":null,"abstract":"Small spot size laser testing for single-event effects has proven to be a particularly productive path to insights on the physics of charge collection and circuit response that are difficult or impossible to obtain through broad ion beam tests. As a result, there are a number of such laser facilities; for example, four of them were compared in 2012 [1], but a relatively new facility at the facility at the University of Saskatchewan offers a unique galvo-mirror, laser-spot scanning capability in addition to the usual micrometer-based DUT motion stage [2]. Operating in a fashion similar to LASIX eye surgery, fast pin-point redirection of the laser beam makes tractable (seconds, not hours or days) comprehensive scanning of a millimeter size field-of-view. Combined with auto-stepping the field-of-view, this new spot scanning capability opens up the possibility of comprehensively covering a large die and finding all SEE sites, including the rare, but important, ones such as SEFIs.","PeriodicalId":223580,"journal":{"name":"2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS)","volume":"79 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129149842","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
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