A. Bakerenkov, A. Rodin, V. Felitsyn, V. Pershenkov, V. Butin
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Estimation of the Radiation Hardness of Bipolar Voltage Comparators in Wide Operation Temperature Range
Radiation induced degradation of widely used bipolar voltage comparators was investigated in wide temperature range from high to liquid nitrogen temperatures. It was obtained, that the parametric degradation is significantly greater at low temperature measurements.