2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS)最新文献_第7页

Pulsed laser beam identification of SEEsensitive regions and observation of additional failure modes relevant for RHA in Digital Isolators 数字隔离器中与RHA相关的脉冲激光敏感区识别和附加失效模式的观察

2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS) Pub Date : 2017-10-01 DOI: 10.1109/RADECS.2017.8696235

R. Wolf, M. Steffens, S. Metzger, P. Beck, M. Wind, M. Poizat

引用次数: 3

ELDRS Characterization to of Texas Instruments LMP2012 RRO Precision Amplifier 德州仪器LMP2012 RRO精密放大器的ELDRS特性研究

2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS) Pub Date : 2017-10-01 DOI: 10.1109/RADECS.2017.8696233

K. Kruckmeyer

引用次数: 0

The STG DICE Cell with the Decoder for Reading Data in Steady and Unsteady States for Hardened SRAM 带译码器的STG DICE单元用于强化SRAM的稳态和非稳态读取

2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS) Pub Date : 2017-10-01 DOI: 10.1109/RADECS.2017.8696115

Yu. V. Katunin, V. Stenin

引用次数: 7

Identification of Pulsed-Neutron-Induced Upset Bursts in Static Random Access Memories using Monte-Carlo Simulations 用蒙特卡罗模拟识别静态随机存储器中脉冲中子诱导的扰动爆发

2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS) Pub Date : 2017-10-01 DOI: 10.1109/RADECS.2017.8696159

Chao Qi, Wei Chen, Yan Liu, Xiaoming Jin, Shanchao Yang, Xiaoqiang Guo

{"title":"Identification of Pulsed-Neutron-Induced Upset Bursts in Static Random Access Memories using Monte-Carlo Simulations","authors":"Chao Qi, Wei Chen, Yan Liu, Xiaoming Jin, Shanchao Yang, Xiaoqiang Guo","doi":"10.1109/RADECS.2017.8696159","DOIUrl":"https://doi.org/10.1109/RADECS.2017.8696159","url":null,"abstract":"In contrast to the accumulation of upsets at a relatively slow rate in static random access memories (SRAMs) caused by neutrons at the steady-state modes of nuclear reactors, pulsed neutrons generated at a pulsed-state mode with a significantly high flux induce a burst of upsets in a short time (<102 ms). Herein, pulsed-neutron experiments are conducted on SRAMs, showing that the upset cross sections differ as the pulsed-state mode changes, indicating the nonlinearity between the upset bits and the neutron fluence, unlike the linear accumulation of single event upsets (SEUs) with increasing neutron fluence at the steady-state modes. To identify the upset pattern of pulsed-neutron-induced upset bursts, the experimental results are compared to Monte-Carlo simulations, which calculate the growing upset bits of different accumulated upset types and simulate the upset accumulation process at steady-state modes. The experimental results exhibit consistent and precise accordance with the simulation results, indicating that the pulsed-neutron induced upset bursts are caused by the same accumulating process as that of SEUs at the steady-state modes. The observed nonlinearity is attributed to the uncertainty of neutron-fluence measurements, uncounted secondary upsets, and some unidentified systematic errors in cross-section calculations. The identification of pulsed-neutron-induced upset bursts with the accumulation of SEUs can convincingly distinguish such upset bursts from dose rate upset (DRU) bursts.","PeriodicalId":223580,"journal":{"name":"2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS)","volume":"41 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123185435","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Design and Test with Proton Beam of a 1.2 Gb/s Semi-custom Serialiser Implemented in 180 nm CMOS with SEU Mitigation by TMR 1.2 Gb/s半定制串行化器的质子束设计与测试

2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS) Pub Date : 2017-10-01 DOI: 10.1109/RADECS.2017.8696110

M. Lupi, G. Rinella, M. Bonora, H. Hillemanns, D. Kim, T. Kugathasan, A. Lattuca, G. Mazza, K. Sielewicz, W. Snoeys

引用次数: 0

Effects of SiH Groups on ELDRS Quantified by XPS with Combined Use of Gamma-ray and Electron-beam Irradiation SiH基团对伽玛和电子束联合XPS定量ELDRS的影响

2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS) Pub Date : 2017-10-01 DOI: 10.1109/RADECS.2017.8696199

Shintaro Toguchi, D. Kobayashi, T. Makino, T. Ohshima, K. Hirose

{"title":"Effects of SiH Groups on ELDRS Quantified by XPS with Combined Use of Gamma-ray and Electron-beam Irradiation","authors":"Shintaro Toguchi, D. Kobayashi, T. Makino, T. Ohshima, K. Hirose","doi":"10.1109/RADECS.2017.8696199","DOIUrl":"https://doi.org/10.1109/RADECS.2017.8696199","url":null,"abstract":"There have been no studies to date estimating the quantitative relation between the increase of interface traps and SiH groups in silicon dioxide films for the effects of total ionizing dose including enhanced low-dose-rate sensitivity (ELDRS). In this study, SiH groups densities in silicon dioxide films are measured and compared with interface trap densities developed at different dose rates to evaluate the impacts of direct proton release mechanism on ELDRS by X-ray photoelectron spectroscopy (XPS) analysis with the combined use of gamma-ray and electron-beam irradiation. The measurement results in this study clearly show that ELDRS depends linearly on SiH groups densities. The linear relationship demonstrates ELDRS is caused by the direct proton release mechanism. The order of magnitude of ELDRS we observed is almost the same as the experimental results reported previously. We emphasize that our results provide the first experimental evidence that the direct proton release mechanism is a critical mechanism affecting ELDRS in addition to the space charge model and H2 cracking.","PeriodicalId":223580,"journal":{"name":"2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS)","volume":"6 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131390793","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Destructive Failure Heavy Ion Testing of Different Amplifiers 不同放大器的破坏性失效重离子测试

2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS) Pub Date : 2017-10-01 DOI: 10.1109/RADECS.2017.8696112

A. Kalashnikova, P. Chubunov, V. Anashin, Sergey A. Iakovlev, A. Koziukov, K. Z. Faradian, A. M. Chlenov

引用次数: 4

A novel combined charge balance termination structure insensitive to ionizing radiation effect 一种不受电离辐射影响的新型组合电荷平衡终端结构

2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS) Pub Date : 2017-10-01 DOI: 10.1109/RADECS.2017.8696162

Limei Song, Chao Xiao, Yanfei Zhang, Botao Sun, Lixin Wang, Jiajun Luo

{"title":"A novel combined charge balance termination structure insensitive to ionizing radiation effect","authors":"Limei Song, Chao Xiao, Yanfei Zhang, Botao Sun, Lixin Wang, Jiajun Luo","doi":"10.1109/RADECS.2017.8696162","DOIUrl":"https://doi.org/10.1109/RADECS.2017.8696162","url":null,"abstract":"Ionizing radiation effects on termination structures employing field limiting rings FLR and/or equipotential field plates have been actively studied to achieve radiation tolerance for more than two decades. However, ionizing radiation effects on charge balance termination structure have not been investigated and reported. In this paper, sensitivity of charge balance termination structure to ionizing radiation was experimentally identified for the first time and is attributed to the radiation-induced oxide trapped charges in the field oxide. It was demonstrated that these charges alter the potential at the surface and affects the breakdown voltage of charge balance termination using 3-D simulations. Based on the 3-D simulations results, a novel rad-hardened combined charge balance termination structure was proposed and optimized. The new termination structure is combined by normal charge balance termination, surface FLRs and field plates, which can improve the insensitivity of surface charge induced by ionizing radiation effect. A 300V super junction MOSFET employing novel insensitive charge balance termination structures were fabricated and exposed to Co-60 $gamma $-rays at room temperature with a total dose of 150krad(Si). The test results show that the degradation of breakdown voltage of this termination structure is less than 1V with a total dose up to 150krad(Si).","PeriodicalId":223580,"journal":{"name":"2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS)","volume":"338 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133084984","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Radiation induced background characterization for a next generation of space telescope 下一代空间望远镜的辐射诱导背景特性

2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS) Pub Date : 2017-10-01 DOI: 10.1109/RADECS.2017.8696142

L. M. M. Sierra, I. Jun, P. Morrissey

引用次数: 0

AXEL lab.: Representative Ground Simulation for Investigating Radiation effects in Materials and Electronics 阿克塞尔实验室。研究材料和电子中辐射效应的典型地面模拟

2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS) Pub Date : 2017-10-01 DOI: 10.1109/RADECS.2017.8696228

S. Duzellier, L. Artola, G. Hubert, C. Inguimbert, T. Nuns, S. Lewandowski, T. Paulmier, B. Dirassen, R. Rey, C. Pons

引用次数: 1