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2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS)最新文献

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Review and Comparison of Irradiation Response and Annealing Models for High-Sensitivity RADFETs 高灵敏度radfet辐照响应和退火模型的综述与比较
2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS) Pub Date : 2017-10-01 DOI: 10.1109/RADECS.2017.8696175
M. Benito-Parejo, S. Ibarmia, P. Portillo
{"title":"Review and Comparison of Irradiation Response and Annealing Models for High-Sensitivity RADFETs","authors":"M. Benito-Parejo, S. Ibarmia, P. Portillo","doi":"10.1109/RADECS.2017.8696175","DOIUrl":"https://doi.org/10.1109/RADECS.2017.8696175","url":null,"abstract":"A comparison between different RADFET response models to irradiation and annealing processes has been carried out. Three irradiation models have been compared against high-sensitivity RADFETs experimental data. Afterwards, the comparison has been performed with three annealing models. Two sets of experimental data are used for the comparison: first set was obtained during a high-dose rate irradiation campaign with Co-60, and second set during a high-energy proton line. Finally, we compare the obtained models for proton and Co-60.","PeriodicalId":223580,"journal":{"name":"2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS)","volume":"11 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129925646","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Validation of a Geant4 full model for the MIXS instrument at BepiColombo bepicolcolombo的MIXS仪器的Geant4全模型验证
2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS) Pub Date : 2017-10-01 DOI: 10.1109/RADECS.2017.8696223
P. Portillo-Caurcel, S. Ibarmia, M. Benito-Parejo, J. Mas-Hesse, A. Balado, A. Martindale, J. Pearson, G. Butcher, C. Feldman, E. Bunce
{"title":"Validation of a Geant4 full model for the MIXS instrument at BepiColombo","authors":"P. Portillo-Caurcel, S. Ibarmia, M. Benito-Parejo, J. Mas-Hesse, A. Balado, A. Martindale, J. Pearson, G. Butcher, C. Feldman, E. Bunce","doi":"10.1109/RADECS.2017.8696223","DOIUrl":"https://doi.org/10.1109/RADECS.2017.8696223","url":null,"abstract":"A full Geant4 model for the BepiColombo MIXS X-ray telescope has been implemented in order to simulate the propagation of fluorescence X-rays through a state-of-the-art micro channel optics (MCP). Our model includes a realistic 3D geometrical description of the instrument, down to micrometer scale for the optics, as well as the physics processes for the reflection of X-ray photons at grazing angles combined with the standard Geant4 electromagnetic interactions. The model has been preliminary validated against design reference simulation software and with experimental test data.","PeriodicalId":223580,"journal":{"name":"2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130000674","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Study of Floating Gate MOS Structures to improve the noise and sensitivity as Radiation Dosimeter 用于提高辐射剂量计噪声和灵敏度的浮栅MOS结构研究
2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS) Pub Date : 2017-10-01 DOI: 10.1109/RADECS.2017.8696254
J. Cesari, M. Brucoli, S. Danzeca, Á. Pineda, A. Masi, M. Brugger, S. Gilardoni, E. Isern, M. Roca, E. García-Moreno
{"title":"Study of Floating Gate MOS Structures to improve the noise and sensitivity as Radiation Dosimeter","authors":"J. Cesari, M. Brucoli, S. Danzeca, Á. Pineda, A. Masi, M. Brugger, S. Gilardoni, E. Isern, M. Roca, E. García-Moreno","doi":"10.1109/RADECS.2017.8696254","DOIUrl":"https://doi.org/10.1109/RADECS.2017.8696254","url":null,"abstract":"The floating gate dosimeter is a new dosimeter whose performance can be improved by applying different techniques at sensor design and at readout level. This work is focused on the active sensor part and it extrapolates the key parameters influencing the sensitivity and the noise of the floating gate by means of real measurements and models. The measurements have been carried out on different type of structures and compared with two theoretical models presented in the literature.","PeriodicalId":223580,"journal":{"name":"2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS)","volume":"96 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123234821","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Combined x-ray and gamma ray testing to investigate the TID tolerance of flip-chip FPGAs 结合x射线和伽马射线测试研究倒装fpga的TID公差
2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS) Pub Date : 2017-10-01 DOI: 10.1109/RADECS.2017.8696120
N. Rezzak, Jih-Jong Wang, V. Nguyen, Durwyn Dsilva
{"title":"Combined x-ray and gamma ray testing to investigate the TID tolerance of flip-chip FPGAs","authors":"N. Rezzak, Jih-Jong Wang, V. Nguyen, Durwyn Dsilva","doi":"10.1109/RADECS.2017.8696120","DOIUrl":"https://doi.org/10.1109/RADECS.2017.8696120","url":null,"abstract":"This paper investigates and proves the use of xray testing as a methodology and/or complement for TID testing of flip-chip FPGAs to identify the most sensitive circuit. This testing methodology can be used to test any flip-chip FPGA, Flash-based and SRAM-based. Microsemi’s RTG4 flip-chip FPGA is characterized with gamma ray to prove the concept and in addition do a detailed investigation of RTG4’s TID sensitive circuits. The advantage of using x-ray as a proxy for gamma-ray TID testing is that shielding can be used to identify the most sensitive circuits. In this paper both gamma-ray and x-ray results of RTG4 are presented and compared. Furthermore, during this investigation we discovered that the most important mechanism causing the failure of RTG4 re-programming is the degradation of the high voltage devices in the high voltage generation and word line access circuits.","PeriodicalId":223580,"journal":{"name":"2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS)","volume":"107 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123243007","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
600 Mrad TID effects on a new generation high rate Pixel Readout ASIC in 65nm CMOS with low-power, low noise synchronous analog front-end using Fast ToT encodingand auto-zeroing 新一代高速率像素读出ASIC低功耗，低噪声，同步模拟前端采用快速ToT编码和自动调零
2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS) Pub Date : 2017-10-01 DOI: 10.1109/RADECS.2017.8696141
E. Monteil, N. Demaria, L. Pacher, A. Rivetti, M. Rolo, R. Wheadon, A. Paternò, S. Panati
{"title":"600 Mrad TID effects on a new generation high rate Pixel Readout ASIC in 65nm CMOS with low-power, low noise synchronous analog front-end using Fast ToT encodingand auto-zeroing","authors":"E. Monteil, N. Demaria, L. Pacher, A. Rivetti, M. Rolo, R. Wheadon, A. Paternò, S. Panati","doi":"10.1109/RADECS.2017.8696141","DOIUrl":"https://doi.org/10.1109/RADECS.2017.8696141","url":null,"abstract":"An innovative synchronous analog front-end for pixel detectors at HL-LHC has been designed. 600 Mrad TID irradiation at -20°C has been performed. Measurement results are presented and discussed.","PeriodicalId":223580,"journal":{"name":"2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS)","volume":"111 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124256410","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Impact of the Electric Field in the Modelling of the Dark Current Non Uniformity in Pixel Arrays 电场对像素阵列暗电流不均匀性建模的影响
2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS) Pub Date : 2017-10-01 DOI: 10.1109/RADECS.2017.8696167
M. C. Ursule, T. Nuns, C. Inguimbert, H. Bugnet, F. Mayer, J. Pratlong
{"title":"Impact of the Electric Field in the Modelling of the Dark Current Non Uniformity in Pixel Arrays","authors":"M. C. Ursule, T. Nuns, C. Inguimbert, H. Bugnet, F. Mayer, J. Pratlong","doi":"10.1109/RADECS.2017.8696167","DOIUrl":"https://doi.org/10.1109/RADECS.2017.8696167","url":null,"abstract":"Taking into account the electric field enhancement of the thermal generation improves the simulation of the DCNU. It increases the number of hot pixels, which fits the case of the experimental measurements and gives a more realistic global shape of the distribution.","PeriodicalId":223580,"journal":{"name":"2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS)","volume":"53 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131125733","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Proton dosimetry at the accelerator COSY for radiation effect testing 质子剂量法在加速器COSY进行辐射效应测试
2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS) Pub Date : 2017-10-01 DOI: 10.1109/RADECS.2017.8696102
M. Baum, O. Felden, U. Weinand, S. Höffgen, J. Kuhnhenn, S. Metzger
{"title":"Proton dosimetry at the accelerator COSY for radiation effect testing","authors":"M. Baum, O. Felden, U. Weinand, S. Höffgen, J. Kuhnhenn, S. Metzger","doi":"10.1109/RADECS.2017.8696102","DOIUrl":"https://doi.org/10.1109/RADECS.2017.8696102","url":null,"abstract":"We present a comprehensive survey of different dosimetry systems to be used at the proton accelerator COSY. Thereby the emphasis is set on the evaluation of radiochromic films. The developed capability helps to conduct future proton irradiations with spatially-resolved dosimetry.","PeriodicalId":223580,"journal":{"name":"2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS)","volume":"7 3 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127236888","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Implications of Work-Function Fluctuation on Radiation Robustness of FinFET XOR Circuits 工作函数波动对FinFET XOR电路辐射稳健性的影响
2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS) Pub Date : 2017-10-01 DOI: 10.1109/RADECS.2017.8696238
Y. Aguiar, F. Kastensmidt, C. Meinhardt, L. Artola, G. Hubert, R. Reis
{"title":"Implications of Work-Function Fluctuation on Radiation Robustness of FinFET XOR Circuits","authors":"Y. Aguiar, F. Kastensmidt, C. Meinhardt, L. Artola, G. Hubert, R. Reis","doi":"10.1109/RADECS.2017.8696238","DOIUrl":"https://doi.org/10.1109/RADECS.2017.8696238","url":null,"abstract":"Traditional CMOS technology has reached its limit in the deep submicron era. Hence, advanced technology nodes require novel device structures and new materials to overcome the challenges faced when dealing with planar devices for nanocircuits. As technology scales down, the circuits are becoming more susceptible to the increase of the uncertainty degree related to the many sources of variability as the ones due to radiation effects. This work evaluates the impact of Gate Work-function Fluctuation (WFF) on the radiation robustness of XOR circuits designed using 7nm FinFET devices. The results explore temperature effect, transistor gate sizing and voltage scaling, showing that radiation-induced transients are quite sensitive to WFF. The increase in the SET pulse-width can reach from 10% to 200% in lower power designs.","PeriodicalId":223580,"journal":{"name":"2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS)","volume":"8 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121623327","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Radiation Hard Optical Link Developments at CERN 欧洲核子研究中心的辐射硬光链路发展
2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS) Pub Date : 2017-10-01 DOI: 10.1109/RADECS.2017.8696160
L. Olanterä, S. Détraz, A. Kraxner, C. Scarcella, C. Sigaud, Csaba Soόos, J. Troska, F. Vasey
{"title":"Radiation Hard Optical Link Developments at CERN","authors":"L. Olanterä, S. Détraz, A. Kraxner, C. Scarcella, C. Sigaud, Csaba Soόos, J. Troska, F. Vasey","doi":"10.1109/RADECS.2017.8696160","DOIUrl":"https://doi.org/10.1109/RADECS.2017.8696160","url":null,"abstract":"The Versatile Link project at CERN has developed a radiation tolerant transceiver module, so called Versatile Transceiver, for the uniquely harsh environment inside high energy physics experiments, where optical and electrical components have to withstand extremely high doses of both particle and ionizing radiation. Rigorous evaluation of candidate components has been carried out during the development phase and now we have entered into the production phase with the selected components. We are producing around 40 000 radiation tolerant transceivers, all of which go through an extensive quality assurance process. The functionality has been tested in laboratory conditions and across a wide temperature range, as well as the reliability of the assembly has been verified in accelerated aging tests. One of the most important parts of the quality assurance is to verify the desired radiation hardness. Samples from all photodiode and laser wafers used in the Versatile Transceiver production were exposed to both gamma rays and neutron fluence. Fully functioning final modules were tested in a complex test setup which enabled us to test all main transmitter and receiver parameters during the irradiation. Samples, both optical components and full modules, experienced the expected degradation in performance but the transceiver modules were able to transmit error free data with required margins even in the end of the irradiation.","PeriodicalId":223580,"journal":{"name":"2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS)","volume":"13 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125290570","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Calculation Method of Maximum Radiation Conditions and Reliability using Quasi-Dynamic Radiation Belt Model 准动态辐射带模型的最大辐射条件及可靠性计算方法
2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS) Pub Date : 2017-10-01 DOI: 10.1109/RADECS.2017.8696183
H. Matsumoto
{"title":"Calculation Method of Maximum Radiation Conditions and Reliability using Quasi-Dynamic Radiation Belt Model","authors":"H. Matsumoto","doi":"10.1109/RADECS.2017.8696183","DOIUrl":"https://doi.org/10.1109/RADECS.2017.8696183","url":null,"abstract":"We have developed a new dynamic model for the flux of energetic particles trapped in the Earth's radiation belts based on data from the MDS-1 spacecraft. This model covers the energy ranges of 0.4-2MeV for electrons, 0.9-210 MeV for protons, and 6-140 MeV for helium ions, and it is valid from low altitudes (approximately 500km) to geosynchronous orbit altitude. This model also includes a magnetic activity variation, solar wind speed variation and pitch angle distributions.We discuss the problems with NASA's radiation model, the developed of the new model, and comparisons between MDS-1 data and new models.","PeriodicalId":223580,"journal":{"name":"2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS)","volume":"37 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123942471","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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