Single Event Effect Analysis for Command and Data Handling Electronics of a Millimeter-Wave Radiometer 6U-Class Satellite Instrument

Abstract

Radiation effects analysis is essential to improve reliability for space missions. The number of small satellite and CubeSat missions has increased significantly in recent years. Compared to traditional larger satellite missions, CubeSats are designed at lower cost and with shorter development cycles. The reliability of CubeSats and small satellites in on-orbit radiation environments needs to be ensured for mission success. In this study, single event effect analysis has been performed for a 6U-Class satellite instrument in low Earth orbit to improve its on-orbit reliability. Critical commercial off-the-shelf parts of the Command and Data Handling Subsystem of a 6U-Class satellite instrument have been tested under heavy-ion radiation at the Texas A&M University Cyclotron Institute Radiation Effects Facility. SEE characteristics have been tested and analyzed for analog-to-digital data converters, voltage regulators, and current sensing and voltage monitoring devices. Device- and system-level risk analyses have been performed for the Command and Data Handling electronics based on the results of heavy-ion radiation testing. System-level mitigation techniques have been studied to minimize the effects of SEEs on electronic systems for deployment on 6U-Class satellites in low Earth orbit.