模拟器件RT6804-1耐辐射多电池监测器的辐射评估

S. Hart, P. Pandol, Nathan Wendel, Ryan Peralta
{"title":"模拟器件RT6804-1耐辐射多电池监测器的辐射评估","authors":"S. Hart, P. Pandol, Nathan Wendel, Ryan Peralta","doi":"10.1109/RADECS.2017.8696268","DOIUrl":null,"url":null,"abstract":"Radiation Tolerant Multicell Battery Monitor RT6804-1 from Analog Devices Inc. has been evaluated for total dose radiation performance and Single event effect characterization. Results and discussions are presented in this work.","PeriodicalId":223580,"journal":{"name":"2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS)","volume":"117 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2017-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Radiation Evaluation of Analog Devices’ RT6804-1 Radiation Tolerant Multicell Battery Monitor\",\"authors\":\"S. Hart, P. Pandol, Nathan Wendel, Ryan Peralta\",\"doi\":\"10.1109/RADECS.2017.8696268\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Radiation Tolerant Multicell Battery Monitor RT6804-1 from Analog Devices Inc. has been evaluated for total dose radiation performance and Single event effect characterization. Results and discussions are presented in this work.\",\"PeriodicalId\":223580,\"journal\":{\"name\":\"2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS)\",\"volume\":\"117 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2017-10-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/RADECS.2017.8696268\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/RADECS.2017.8696268","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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摘要

adi公司的耐辐射多电池监视器RT6804-1已被评估为总剂量辐射性能和单事件效应表征。本文给出了研究结果和讨论。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Radiation Evaluation of Analog Devices’ RT6804-1 Radiation Tolerant Multicell Battery Monitor
Radiation Tolerant Multicell Battery Monitor RT6804-1 from Analog Devices Inc. has been evaluated for total dose radiation performance and Single event effect characterization. Results and discussions are presented in this work.
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