2010 IEEE Computer Society Annual Symposium on VLSI最新文献

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Combining Unspecified Test Data Bit Filling Methods and Run Length Based Codes to Estimate Compression, Power and Area Overhead 结合未指定测试数据位填充方法和基于运行长度的代码来估计压缩、功率和面积开销
2010 IEEE Computer Society Annual Symposium on VLSI Pub Date : 2010-07-05 DOI: 10.1109/ISVLSI.2010.18
U. Mehta, N. Devashrayee, K. Dasgupta
{"title":"Combining Unspecified Test Data Bit Filling Methods and Run Length Based Codes to Estimate Compression, Power and Area Overhead","authors":"U. Mehta, N. Devashrayee, K. Dasgupta","doi":"10.1109/ISVLSI.2010.18","DOIUrl":"https://doi.org/10.1109/ISVLSI.2010.18","url":null,"abstract":"The data compression of any partially specified test data depends upon how the unspecified bits are filled with 1s and 0s. In this paper, the five different approaches for don’t care bit filling based on nature of runs are proposed. These methods are used here to predict the maximum compression based on entropy relevant to different run length based data compression code. These methods are also analyzed for test power and area overhead corresponding to run length based codes. The results are shown with various ISCAS circuits.","PeriodicalId":187530,"journal":{"name":"2010 IEEE Computer Society Annual Symposium on VLSI","volume":"20 4 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-07-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124664342","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 7
System Level Design for Embedded Reconfigurable Systems Using MORPHEUS Platform 基于MORPHEUS平台的嵌入式可重构系统的系统级设计
2010 IEEE Computer Society Annual Symposium on VLSI Pub Date : 2010-07-05 DOI: 10.1109/ISVLSI.2010.13
Paul Brelet, Arnaud Grasset, P. Bonnot, F. Ieromnimon, D. Kritharidis, N. Voros
{"title":"System Level Design for Embedded Reconfigurable Systems Using MORPHEUS Platform","authors":"Paul Brelet, Arnaud Grasset, P. Bonnot, F. Ieromnimon, D. Kritharidis, N. Voros","doi":"10.1109/ISVLSI.2010.13","DOIUrl":"https://doi.org/10.1109/ISVLSI.2010.13","url":null,"abstract":"This paper presents a novel approach for designing embedded reconfigurable systems. It presents the MORPHEUS reconfigurable platform and associated toolset and how they can be used in practice for the development of advanced reconfigurable systems. The paper presents also implementation results from three different application domains and exhibits how MORPHEUS platform can be used for shortening the development time of such systems.","PeriodicalId":187530,"journal":{"name":"2010 IEEE Computer Society Annual Symposium on VLSI","volume":"92 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-07-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122049147","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
Fast Sequential FPGA Startup Based on Partial and Dynamic Reconfiguration 基于局部和动态重构的FPGA快速顺序启动
2010 IEEE Computer Society Annual Symposium on VLSI Pub Date : 2010-07-05 DOI: 10.1109/ISVLSI.2010.19
M. Hübner, Joachim Meyer, O. Sander, L. Braun, J. Becker, Juanjo Noguera, Rodney Stewart
{"title":"Fast Sequential FPGA Startup Based on Partial and Dynamic Reconfiguration","authors":"M. Hübner, Joachim Meyer, O. Sander, L. Braun, J. Becker, Juanjo Noguera, Rodney Stewart","doi":"10.1109/ISVLSI.2010.19","DOIUrl":"https://doi.org/10.1109/ISVLSI.2010.19","url":null,"abstract":"Due to their their high flexibility and their increasing logic resources, FPGAs can be found in a wider application range as in recent years. But especially in application domains, where only a very restricted power budget is available, FPGAs still have to compete with other solutions. To reduce the power consumption to a minimum, many devices use different kinds of power saving modes, called sleep modes. In those modes they sacrifice functionality for the benefit of a lower consumption. Taking this idea to the extreme, many devices are only powered when it is necessary. If not, they are released from their power supply and do not drain current at all. The realization of such a sleep mode for a SRAM-based FPGA leads to difficulties. This is caused due to the fact, that the volatile memory is used to save the configuration of the device. The configuration has to be reloaded into the device every time when reattaching the power to the FPGA. This circumstance leads to restrictions for the device deployment in some electronic systems since in many cases the time a device may use to wake up is strictly limited. In several use cases, the configuration time of a SRAM based FPGA exceeds this limitation. This paper describes to decrease the configuration time of a design by exploiting the method of dynamic and partial reconfiguration in order to enable the usage of a sleep mode. With the presented method, the configuration time of any Xilinx SRAM based FPGA from the identical series (e.g. Spartan) is independent from the size of the used device.","PeriodicalId":187530,"journal":{"name":"2010 IEEE Computer Society Annual Symposium on VLSI","volume":"18 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-07-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115279542","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 12
A New Low-Power Soft-Error Tolerant SRAM Cell 一种新型低功耗软容错SRAM单元
2010 IEEE Computer Society Annual Symposium on VLSI Pub Date : 2010-07-05 DOI: 10.1109/ISVLSI.2010.83
N. Axelos, K. Pekmestzi, N. Moschopoulos
{"title":"A New Low-Power Soft-Error Tolerant SRAM Cell","authors":"N. Axelos, K. Pekmestzi, N. Moschopoulos","doi":"10.1109/ISVLSI.2010.83","DOIUrl":"https://doi.org/10.1109/ISVLSI.2010.83","url":null,"abstract":"In this paper we present a new 12T loadless SRAM cell that exhibits soft error resilience characteristics. The proposed cell is based on an interlocked structure with guard gates that provides an x80 increase in soft error resilience compared to a typical unprotected 6T SRAM cell, while addressing the static power consumption issue of modern CMOS technologies. At a 90nm technology, simulations show that the investigated 12T SRAM cell draws 3 times less leakage current than a DICE cell of similarly sized transistors and 20% less than a typical 6T cell.","PeriodicalId":187530,"journal":{"name":"2010 IEEE Computer Society Annual Symposium on VLSI","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-07-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130203060","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
TRB: Tag Replication Buffer for Enhancing the Reliability of the Cache Tag Array TRB:标签复制缓冲区,用于提高缓存标签阵列的可靠性
2010 IEEE Computer Society Annual Symposium on VLSI Pub Date : 2010-07-05 DOI: 10.1109/ISVLSI.2010.25
Shuai Wang, Jie S. Hu, Sotirios G. Ziavras
{"title":"TRB: Tag Replication Buffer for Enhancing the Reliability of the Cache Tag Array","authors":"Shuai Wang, Jie S. Hu, Sotirios G. Ziavras","doi":"10.1109/ISVLSI.2010.25","DOIUrl":"https://doi.org/10.1109/ISVLSI.2010.25","url":null,"abstract":"Protecting the on-chip cache memories against soft errors has become an increasing challenge in designing new generation reliable microprocessors. Previous efforts have mainly focused on improving the reliability of the cache data arrays. Due to its crucial importance to the correctness of cache accesses, the tag array demands high reliability against soft errors while the data array is fully protected. Exploiting the address locality of memory accesses, we propose to duplicate most recently accessed tag entries in a small Tag Replication Buffer (TRB) thus to protect the information integrity of the tag array in the data cache with low performance, energy and area overheads. A Selective-TRB scheme is further proposed to protect only tag entries of dirty cache lines. The experimental results show that the Selective-TRB scheme achieves a higher access-with-replica (AWR) rate of 97.4% for the dirty-cache line tags. To provide a comprehensive evaluation of the tag-array reliability, we also conduct an architectural vulnerability factor (AVF) analysis for the tag array and propose a refined metric, detected-without-replica-AVF (DOR-AVF), which combines the AVF and AWR analysis. Based on our DOR-AVF analysis, a TRB scheme with early write-back (EWB) is proposed, which achieves a zero DOR-AVF at a negligible performance overhead.","PeriodicalId":187530,"journal":{"name":"2010 IEEE Computer Society Annual Symposium on VLSI","volume":"27 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-07-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130315172","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 7
Exploration of 2D Cellular Automata as Binary Sequence Generators 二维元胞自动机作为二进制序列发生器的探索
2010 IEEE Computer Society Annual Symposium on VLSI Pub Date : 2010-07-05 DOI: 10.1109/ISVLSI.2010.34
E. Arvaniti, Ilias Mavridis, A. Kakarountas
{"title":"Exploration of 2D Cellular Automata as Binary Sequence Generators","authors":"E. Arvaniti, Ilias Mavridis, A. Kakarountas","doi":"10.1109/ISVLSI.2010.34","DOIUrl":"https://doi.org/10.1109/ISVLSI.2010.34","url":null,"abstract":"In this work a comprehensive exploration of Binary Sequence Generators (BSG) is offered, focusing on an alternative type of BSG (radix-2 counter) presenting low design complexity and interesting speed characteristics, based on 2D Cellular Automata (CA). Various “seed” configurations are explored and two architectures are examined, defining the most appropriate CA in terms of speed, silicon area and power dissipation.","PeriodicalId":187530,"journal":{"name":"2010 IEEE Computer Society Annual Symposium on VLSI","volume":"71 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-07-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130352084","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Autonomous Design in VLSI: An In-House Universal Cellular Neural Platform VLSI中的自主设计:一个内部通用细胞神经平台
2010 IEEE Computer Society Annual Symposium on VLSI Pub Date : 2010-07-05 DOI: 10.1109/ISVLSI.2010.29
L. Krundel, D. Mulvaney, V. Chouliaras
{"title":"Autonomous Design in VLSI: An In-House Universal Cellular Neural Platform","authors":"L. Krundel, D. Mulvaney, V. Chouliaras","doi":"10.1109/ISVLSI.2010.29","DOIUrl":"https://doi.org/10.1109/ISVLSI.2010.29","url":null,"abstract":"Improved on-chip circuit densities have enabled the practical realization of increasingly demanding applications. Microelectronics design now faces a number of challenges: hardware has become more complex to describe making it a more arduous process for designs to pass verification and the proportion of a design that is covered by testing is reduced increasing the likelihood of bugs in the final hardware device. To meet these challenges while more effectively exploiting the larger silicon areas now available, methods that enable autonomous design have become highly desirable and thus novel ones are proposed hereby.","PeriodicalId":187530,"journal":{"name":"2010 IEEE Computer Society Annual Symposium on VLSI","volume":"4 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-07-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130985274","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Task Dispersal Measurement in Dynamic Reconfigurable NoCs 动态可重构noc中的任务分散度量
2010 IEEE Computer Society Annual Symposium on VLSI Pub Date : 2010-07-05 DOI: 10.1109/ISVLSI.2010.91
Mohammad Hosseinabady, J. Núñez-Yáñez, A. Coppola
{"title":"Task Dispersal Measurement in Dynamic Reconfigurable NoCs","authors":"Mohammad Hosseinabady, J. Núñez-Yáñez, A. Coppola","doi":"10.1109/ISVLSI.2010.91","DOIUrl":"https://doi.org/10.1109/ISVLSI.2010.91","url":null,"abstract":"Large Network-on-Chips (NoCs) with thousands of tiles benefit from dynamic task mapping techniques in which the assignment of tasks to tiles is decided at run-time. Dynamic task mapping technique can suffer from fragmentation with free nodes being dispersed as application are mapped and released, continuously. Using these dispersed free tiles results in interference among the task traffics of different applications. The aim of this paper is to distinguish and measure the traffic contention among the tasks of an application (internal contention) and the tasks of different applications (external contention). External contention is one of the factors which decrease the application efficiency and increase the power consumption and latency. This paper also proposes a method to decrease the external contention during task mapping scenario. The proposed technique shows up to 66.34% reduction in external communication in comparison with state-of-the-art task mapping techniques.","PeriodicalId":187530,"journal":{"name":"2010 IEEE Computer Society Annual Symposium on VLSI","volume":"60 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-07-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129618159","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
A Family of Area-Time Efficient Modulo 2n+1 Adders 一类面积-时间有效模2n+1加法器
2010 IEEE Computer Society Annual Symposium on VLSI Pub Date : 2010-07-05 DOI: 10.1109/ISVLSI.2010.35
H. T. Vergos
{"title":"A Family of Area-Time Efficient Modulo 2n+1 Adders","authors":"H. T. Vergos","doi":"10.1109/ISVLSI.2010.35","DOIUrl":"https://doi.org/10.1109/ISVLSI.2010.35","url":null,"abstract":"A family of diminished-1 modulo $2^n+1$ adders is proposed in this manuscript. All members of the family use a sparse carry computation unit for deriving only some of the carries in $log_2n$ prefix levels, while all the rest carries are computed in an extra one. The proposed adders offer significant area and power savings compared to earlier proposals, while maintaining a high operation speed.","PeriodicalId":187530,"journal":{"name":"2010 IEEE Computer Society Annual Symposium on VLSI","volume":"10 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-07-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123906632","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
A Novel, Variable Resolution Flash ADC with Sub Flash Architecture 一种具有子Flash架构的新型可变分辨率Flash ADC
2010 IEEE Computer Society Annual Symposium on VLSI Pub Date : 2010-07-05 DOI: 10.1109/ISVLSI.2010.68
M. K. Adimulam, S. Veeramachaneni, N. Muthukrishnan, M. Srinivas
{"title":"A Novel, Variable Resolution Flash ADC with Sub Flash Architecture","authors":"M. K. Adimulam, S. Veeramachaneni, N. Muthukrishnan, M. Srinivas","doi":"10.1109/ISVLSI.2010.68","DOIUrl":"https://doi.org/10.1109/ISVLSI.2010.68","url":null,"abstract":"In this paper, a design for low power flash ADC with configurable resolution is proposed. A novel sub flash architecture is employed to achieve variable resolution as well as to switch the unused parallel voltage comparators and resistor bias circuit to standby mode leading to the consumption of only leakage power. The ADC is capable of operating at 4-bit, 6-bit and 8-bit precision and at a supply voltage of 1.0V, it consumes 48mW at 8-bit, 36mW at 6-bit and 15mW at 4-bit resolution. The proposed ADC have been designed, compared with conventional flash ADC and verified for post layout simulations in standard 65nm CMOS technology.","PeriodicalId":187530,"journal":{"name":"2010 IEEE Computer Society Annual Symposium on VLSI","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-07-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123170933","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 7
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