TRB:标签复制缓冲区,用于提高缓存标签阵列的可靠性

Shuai Wang, Jie S. Hu, Sotirios G. Ziavras
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引用次数: 7

摘要

在设计新一代可靠的微处理器时,保护片上高速缓存不受软错误的影响已成为越来越大的挑战。以前的工作主要集中在提高缓存数据阵列的可靠性上。由于标签阵列对缓存访问的正确性至关重要,因此在对数据阵列进行充分保护的同时,标签阵列对软错误的可靠性要求很高。利用内存访问的地址局域性,我们建议在一个小的标签复制缓冲区(TRB)中复制最近访问的标签条目,从而以低性能、低能耗和低面积开销来保护数据缓存中标签阵列的信息完整性。进一步提出了一种选择性trb方案,只保护脏缓存线路的标签项。实验结果表明,选择性trb方案对脏缓存行标签实现了97.4%的副本访问(AWR)率。为了提供对标签阵列可靠性的全面评估,我们还对标签阵列进行了架构脆弱性因素(AVF)分析,并提出了一种改进的度量,即无副本检测AVF (DOR-AVF),它结合了AVF和AWR分析。基于我们的DOR-AVF分析,提出了一种具有早期回写(EWB)的TRB方案,该方案在可以忽略性能开销的情况下实现了零DOR-AVF。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
TRB: Tag Replication Buffer for Enhancing the Reliability of the Cache Tag Array
Protecting the on-chip cache memories against soft errors has become an increasing challenge in designing new generation reliable microprocessors. Previous efforts have mainly focused on improving the reliability of the cache data arrays. Due to its crucial importance to the correctness of cache accesses, the tag array demands high reliability against soft errors while the data array is fully protected. Exploiting the address locality of memory accesses, we propose to duplicate most recently accessed tag entries in a small Tag Replication Buffer (TRB) thus to protect the information integrity of the tag array in the data cache with low performance, energy and area overheads. A Selective-TRB scheme is further proposed to protect only tag entries of dirty cache lines. The experimental results show that the Selective-TRB scheme achieves a higher access-with-replica (AWR) rate of 97.4% for the dirty-cache line tags. To provide a comprehensive evaluation of the tag-array reliability, we also conduct an architectural vulnerability factor (AVF) analysis for the tag array and propose a refined metric, detected-without-replica-AVF (DOR-AVF), which combines the AVF and AWR analysis. Based on our DOR-AVF analysis, a TRB scheme with early write-back (EWB) is proposed, which achieves a zero DOR-AVF at a negligible performance overhead.
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