{"title":"结合未指定测试数据位填充方法和基于运行长度的代码来估计压缩、功率和面积开销","authors":"U. Mehta, N. Devashrayee, K. Dasgupta","doi":"10.1109/ISVLSI.2010.18","DOIUrl":null,"url":null,"abstract":"The data compression of any partially specified test data depends upon how the unspecified bits are filled with 1s and 0s. In this paper, the five different approaches for don’t care bit filling based on nature of runs are proposed. These methods are used here to predict the maximum compression based on entropy relevant to different run length based data compression code. These methods are also analyzed for test power and area overhead corresponding to run length based codes. The results are shown with various ISCAS circuits.","PeriodicalId":187530,"journal":{"name":"2010 IEEE Computer Society Annual Symposium on VLSI","volume":"20 4 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2010-07-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"7","resultStr":"{\"title\":\"Combining Unspecified Test Data Bit Filling Methods and Run Length Based Codes to Estimate Compression, Power and Area Overhead\",\"authors\":\"U. Mehta, N. Devashrayee, K. Dasgupta\",\"doi\":\"10.1109/ISVLSI.2010.18\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The data compression of any partially specified test data depends upon how the unspecified bits are filled with 1s and 0s. In this paper, the five different approaches for don’t care bit filling based on nature of runs are proposed. These methods are used here to predict the maximum compression based on entropy relevant to different run length based data compression code. These methods are also analyzed for test power and area overhead corresponding to run length based codes. The results are shown with various ISCAS circuits.\",\"PeriodicalId\":187530,\"journal\":{\"name\":\"2010 IEEE Computer Society Annual Symposium on VLSI\",\"volume\":\"20 4 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2010-07-05\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"7\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2010 IEEE Computer Society Annual Symposium on VLSI\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISVLSI.2010.18\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2010 IEEE Computer Society Annual Symposium on VLSI","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISVLSI.2010.18","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Combining Unspecified Test Data Bit Filling Methods and Run Length Based Codes to Estimate Compression, Power and Area Overhead
The data compression of any partially specified test data depends upon how the unspecified bits are filled with 1s and 0s. In this paper, the five different approaches for don’t care bit filling based on nature of runs are proposed. These methods are used here to predict the maximum compression based on entropy relevant to different run length based data compression code. These methods are also analyzed for test power and area overhead corresponding to run length based codes. The results are shown with various ISCAS circuits.
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