IF 2.2 3区工程技术

Micron Pub Date : 2025-09-08 DOI: 10.1016/j.micron.2025.103907

Misa Hayashida (林田美咲) , Makoto Tokoro Schreiber , Heiko Müller , Yoshifumi Taniguchi (谷口佳史) , John Canlas , Charles Soong , Kai Cui , Ray Egerton , Marek Malac

{"title":"Momentum-dispersion calibration and measurement of a surface layer dielectric constant using momentum-resolved electron energy-loss spectroscopy in the optical region","authors":"Misa Hayashida (林田美咲) , Makoto Tokoro Schreiber , Heiko Müller , Yoshifumi Taniguchi (谷口佳史) , John Canlas , Charles Soong , Kai Cui , Ray Egerton , Marek Malac","doi":"10.1016/j.micron.2025.103907","DOIUrl":"10.1016/j.micron.2025.103907","url":null,"abstract":"<div><div>Momentum-resolved electron energy loss spectroscopy (<span><math><mi>q</mi></math></span>EELS) in the low-loss (from 0 to <span><math><mo>≈</mo></math></span>10 eV) region provides means for measurement of sample optical properties at the nanoscale. When both energy loss <span><math><mrow><mi>Δ</mi><mi>E</mi><mo>=</mo><mo>ħ</mo><mi>ω</mi></mrow></math></span> and momentum transfer <span><math><mi>q</mi></math></span> are measured, the dispersion relation of surface-plasmon polaritons (SPP) can be studied. However, the momentum (<span><math><mi>q</mi></math></span>) dispersion calibration is challenging due to the small scattering angles involved, and the consequent lack of suitable calibration samples and methods. Here, we discuss how by fitting the experimental data to a simplified SPP dispersion formula, the momentum dispersion can be calibrated and the dielectric constant <span><math><msub><mrow><mi>ϵ</mi></mrow><mrow><mi>r</mi></mrow></msub></math></span> of a thin surface layer measured. The dielectric constant measured by SPP fitting is robust to small sample tilts and stays within <span><math><mo>±</mo></math></span>11% over a −6 ° to +13.3 ° sample tilt relative to the incident-beam direction. Methods such as electron diffraction and chemical mapping, can be applied to the same area as examined by <span><math><mi>q</mi></math></span>EELS, potentially providing insights in materials structure and composition with its optical properties.</div></div>","PeriodicalId":18501,"journal":{"name":"Micron","volume":"199 ","pages":"Article 103907"},"PeriodicalIF":2.2,"publicationDate":"2025-09-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145109631","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Optimized protocol for intracellular labeling of red blood cells with anti-hemoglobin F for confocal microscopy analysis 共聚焦显微镜分析中红细胞抗血红蛋白F细胞内标记的优化方案

IF 2.2 3区工程技术

Micron Pub Date : 2025-09-08 DOI: 10.1016/j.micron.2025.103913

Laura Rey-Barroso , Mònica Roldán , Marcos Frías , Francisco J. Burgos-Fernández , Ignacio Isola , Anna Ruiz Llobet , Edurne Sarrate , Meritxell Vilaseca

{"title":"Optimized protocol for intracellular labeling of red blood cells with anti-hemoglobin F for confocal microscopy analysis","authors":"Laura Rey-Barroso , Mònica Roldán , Marcos Frías , Francisco J. Burgos-Fernández , Ignacio Isola , Anna Ruiz Llobet , Edurne Sarrate , Meritxell Vilaseca","doi":"10.1016/j.micron.2025.103913","DOIUrl":"10.1016/j.micron.2025.103913","url":null,"abstract":"<div><div>The combined use of immunolabeling and confocal microscopy offers a robust tool for the comprehensive examination of red blood cells, allowing clear visualization of specific proteins and their roles in the cell. While immunolabeling is a widely employed technique, it presents specific challenges in the study of red blood cells, including difficulties with membrane permeabilization, the appearance of background fluorescence, detection of very faint signals, interference from other blood components, and, notably, poor preservation resulting from an incorrect choice of fixation components. Adding to this, fresh blood samples are very labile and need to be preserved as soon as possible, ideally immediately after extraction. Addressing these challenges requires careful experimental design to ensure assay specificity and sensitivity, often complicated by incomplete or unclear information in the literature. In this study, we have compiled available bibliographic data regarding key aspects of red blood cell immunolabeling and devised a detailed immunostaining protocol to investigate the presence of Hemoglobin F in patients with sickle cell anemia treated with hydroxyurea. This protocol ensures proper preservation of red blood cell characteristics and may find application in immunolabeling with other intracellular antibodies.</div></div>","PeriodicalId":18501,"journal":{"name":"Micron","volume":"199 ","pages":"Article 103913"},"PeriodicalIF":2.2,"publicationDate":"2025-09-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145045172","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Applications of electron channeling pattern for the determination of wafer offcut and misorientation angles 电子通道图在晶圆边角和错位角测定中的应用

IF 2.2 3区工程技术

Micron Pub Date : 2025-09-03 DOI: 10.1016/j.micron.2025.103912

Han Han , Libor Strakoš , Clément Porret , Valérie Depauw , Tomáš Vystavěl , Olivier Richard , Marina Baryshnikova , Eva Grieten , Thomas Hantschel

{"title":"Applications of electron channeling pattern for the determination of wafer offcut and misorientation angles","authors":"Han Han , Libor Strakoš , Clément Porret , Valérie Depauw , Tomáš Vystavěl , Olivier Richard , Marina Baryshnikova , Eva Grieten , Thomas Hantschel","doi":"10.1016/j.micron.2025.103912","DOIUrl":"10.1016/j.micron.2025.103912","url":null,"abstract":"<div><div>The epitaxial growth of semiconductor multilayers often starts from monocrystalline wafers that have an offcut angle. This offcut angle is critical for tailoring the properties of epitaxial materials, making its precise control essential. This study demonstrates a novel approach to determine the wafer offcut angle based on electron channeling patterns (ECP) obtained by scanning electron microscopy. The technique involves calculating the angular distance between the zone axis and the surface normal by analyzing a series of ECP images acquired at various rotations/tilts. The method successfully applies to Si(001) substrates with different offcut angles, measured within ∼1 h with an angular accuracy of <span><math><mo>∼</mo></math></span>0.05°. Additionally, the misorientation between the overlaying semiconductor crystalline films and the substrate is estimated with a precision down to ∼ 0.03º within ∼ 30 min. This performance can meet the accuracy requirements for a wide range of industrial and research applications.</div></div>","PeriodicalId":18501,"journal":{"name":"Micron","volume":"199 ","pages":"Article 103912"},"PeriodicalIF":2.2,"publicationDate":"2025-09-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145019819","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Bulk uniaxial crystal stray field images modeling based on the magnetic force microscopy experimental data 基于磁力显微镜实验数据的体单轴晶体杂散场图像建模

IF 2.2 3区工程技术

Micron Pub Date : 2025-09-02 DOI: 10.1016/j.micron.2025.103911

A.I. Sinkevich, S.D. Smetannikova, E.M. Semenova

引用次数: 0

Hierarchical nanotopographies and fractal fingerprints of Anopheles mosquito wing surfaces 按蚊翅膀表面的分层纳米形貌和分形指纹图谱

IF 2.2 3区工程技术

Micron Pub Date : 2025-09-02 DOI: 10.1016/j.micron.2025.103914

Leandro Caio Correa Pinto , Glenda Quaresma Ramos , Robert Saraiva Matos , Abhijeet Das , Carlos Alberto Rodrigues Costa , Rosa Amélia Gonçalves Santana , Silvia Cássia Brandão Justiniano , Henrique Duarte da Fonseca Filho

{"title":"Hierarchical nanotopographies and fractal fingerprints of Anopheles mosquito wing surfaces","authors":"Leandro Caio Correa Pinto , Glenda Quaresma Ramos , Robert Saraiva Matos , Abhijeet Das , Carlos Alberto Rodrigues Costa , Rosa Amélia Gonçalves Santana , Silvia Cássia Brandão Justiniano , Henrique Duarte da Fonseca Filho","doi":"10.1016/j.micron.2025.103914","DOIUrl":"10.1016/j.micron.2025.103914","url":null,"abstract":"<div><div>This study investigates the nanoscale surface morphology of <em>Anopheles darlingi</em> and <em>Anopheles aquasalis</em> mosquito wings using Atomic Force Microscopy (AFM) and fractal analysis. High-resolution 3D AFM imaging revealed pronounced inter- and intra-species differences, with the ventral surface of <em>An. darlingi</em> (V-Ad) exhibiting the greatest roughness (Sq = 45.34 ± 3.20 nm) and height amplitude (Sz = 399.17 ± 65.46 nm), compared to the smoother dorsal surface of <em>An. aquasalis</em> (D-Aa, Sq = 23.54 ± 3.47 nm, Sz = 157.80 ± 17.91 nm). Spectral analysis via Fast Fourier Transform (FFT) and Hough transform identified directional anisotropy in <em>An. darlingi</em>, suggesting aligned nanostructures possibly related to aerodynamic or ecological adaptations. Monofractal analysis revealed that V-Ad surfaces had the highest Hurst coefficient (H = 0.96 ± 0.02), indicating persistent roughness, while dorsal surface of <em>An. aquasalis</em> (D-Aa) showed lower spatial correlation (H = 0.82 ± 0.03). These findings highlight functional nanostructural divergences among malaria vectors and underscore the utility of AFM and fractal descriptors in entomological and bioinspired materials research.</div></div>","PeriodicalId":18501,"journal":{"name":"Micron","volume":"199 ","pages":"Article 103914"},"PeriodicalIF":2.2,"publicationDate":"2025-09-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144996744","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Assessment of skeletal muscle deformability during clinical paralysis in EAE, a mouse model of multiple sclerosis 多发性硬化症小鼠EAE模型临床瘫痪时骨骼肌变形能力的评估

IF 2.2 3区工程技术

Micron Pub Date : 2025-08-29 DOI: 10.1016/j.micron.2025.103910

G. Pyka-Fościak , J. Śmiałek-Bartyzel , B. Wójcik , J.A. Litwin , M. Lekka

{"title":"Assessment of skeletal muscle deformability during clinical paralysis in EAE, a mouse model of multiple sclerosis","authors":"G. Pyka-Fościak , J. Śmiałek-Bartyzel , B. Wójcik , J.A. Litwin , M. Lekka","doi":"10.1016/j.micron.2025.103910","DOIUrl":"10.1016/j.micron.2025.103910","url":null,"abstract":"<div><div>Multiple sclerosis (MS) and its mouse model, experimental autoimmune encephalomyelitis (EAE), are neurodegenerative diseases associated with inflammation and demyelination of the central nervous system, often leading to severe motor deficits, including progressive paralysis and spasticity. Although the neurological aspects of MS and EAE are widely described, the influence of disease progression on skeletal muscle structure and mechanics remains a largely unexplored field. In the present study, we assessed skeletal muscle deformability during EAE-induced paralysis using atomic force microscopy (AFM), histological examination, and analysis of dystrophin and laminin expression in relation to EAE disease severity. Nanomechanical measurements showed a biphasic response of forelimb muscles: an early increase in muscle rigidity at disease onset, a marked decrease at the peak of the disease, and a later increase in the chronic phase. Hindlimb muscles revealed a similar but more gradual rigidity progression. Our study revealed disease phase-dependent alterations of skeletal muscle histology, with changes in myofiber cross-sectional area, the presence of fibers with centrally located nuclei and increased collagen accumulation, particularly in the peak and chronic phases. Immunofluorescence and Western blot studies revealed decreased expression of dystrophin and laminin, particularly in the chronic phase of EAE, suggesting that cytoskeletal disorganization and extracellular matrix remodeling are contributing factors. These results demonstrate that EAE-related paralysis includes progressive biomechanical and structural changes in skeletal muscles, exacerbating motor disability. Understanding the musculoskeletal consequences of MS-like disease could provide a more comprehensive overview of disease pathology and might motivate therapeutic strategies targeting muscle integrity along with neuronal repair.</div></div>","PeriodicalId":18501,"journal":{"name":"Micron","volume":"199 ","pages":"Article 103910"},"PeriodicalIF":2.2,"publicationDate":"2025-08-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144926192","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

The analysis approach for high collection efficiency of secondary electron using Wien filter and in-lens collection system based on differential algebra method 基于微分代数方法的维恩滤光片和透镜内收集系统对二次电子高收集效率的分析方法

IF 2.2 3区工程技术

Micron Pub Date : 2025-08-26 DOI: 10.1016/j.micron.2025.103909

Hangfeng Hu, Fu Liu, Jie Li, Yongfeng Kang

{"title":"The analysis approach for high collection efficiency of secondary electron using Wien filter and in-lens collection system based on differential algebra method","authors":"Hangfeng Hu, Fu Liu, Jie Li, Yongfeng Kang","doi":"10.1016/j.micron.2025.103909","DOIUrl":"10.1016/j.micron.2025.103909","url":null,"abstract":"<div><div>In this work, an analysis approach based on the differential algebra method is proposed to achieve high collection efficiency of secondary electron (SE) using Wien filter in retarding field SEM. In the approach, the influence of Wien filter on electron optical properties of primary electron (PE) is also comprehensively considered. Due to the unmatched fringe fields in Wien filter, the optical axis of primary electron will be deviated from the central axis, but it can be deflected back to the central axis again by the developed Wien condition. And the electron optical properties are calculated and analyzed referred to this curved optical axis. Then, based on the calculation results of SE at detector plane, the expressions about orientation angle and excitations of Wien filter for high SE collection efficiency are derived. By further considering the influence of Wien filter on electron optical properties of PE, the optimized orientation angle and excitations can be obtained. Taking a retarding field SEM with Wien filter as an example, high SE collection efficiency is achieved by optimizing the appropriate orientation angle and excitations of Wien filter, with the analysis of the proposed approach. Finally, experiments are carried out with varying excitations of the Wien filter, and the experimental results are well explained by the calculated current density distributions of SE and the electron optical properties of PE, which validates the proposed analysis approach.</div></div>","PeriodicalId":18501,"journal":{"name":"Micron","volume":"199 ","pages":"Article 103909"},"PeriodicalIF":2.2,"publicationDate":"2025-08-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144919846","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Creep damage evaluation of 18Cr–9Ni–3Cu–Nb–N steel by electron backscattered diffraction (EBSD) – comparison of traditional Hough Indexing and novel Spherical Indexing – 电子背散射衍射（EBSD）评价18Cr-9Ni-3Cu-Nb-N钢蠕变损伤——传统霍夫分度与新型球面分度的比较

IF 2.2 3区工程技术

Micron Pub Date : 2025-08-22 DOI: 10.1016/j.micron.2025.103908

Tomotaka Hatakeyama, Kota Sawada

引用次数: 0

Knowledge-distilled swin transformer for efficient vibration artifact removal in SEM imaging 知识提炼的swin变压器在扫描电镜成像中有效去除振动伪影

IF 2.2 3区工程技术

Micron Pub Date : 2025-08-21 DOI: 10.1016/j.micron.2025.103897

Xuecheng Zhang , Bin Zhang , Wenchao Meng , Yuefei Zhang , Xianjue Ye , Ze Zhang

{"title":"Knowledge-distilled swin transformer for efficient vibration artifact removal in SEM imaging","authors":"Xuecheng Zhang , Bin Zhang , Wenchao Meng , Yuefei Zhang , Xianjue Ye , Ze Zhang","doi":"10.1016/j.micron.2025.103897","DOIUrl":"10.1016/j.micron.2025.103897","url":null,"abstract":"<div><div>This study addresses the challenge of removing vibration-induced horizontal stripe artifacts in Scanning Electron Microscopy (SEM) images, which degrade image fidelity and compromise quantitative analysis. The main contribution lies in the development of SwinIR-KD, a computationally efficient image restoration framework. This framework synergistically integrates the Swin Transformer architecture with knowledge distillation and a novel Horizontal Stripe Suppress Loss. Specifically, SwinIR-KD employs a lightweight student model, distilled from a larger pre-trained SwinIR teacher model, and incorporates architectural modifications to reduce complexity. A specialized loss function, combining reconstruction, distillation, and stripe suppression components, guides the training. Experimental results on an SEM speckle image dataset demonstrate that SwinIR-KD significantly reduces model parameters and computational complexity by approximately 79% compared to the baseline SwinIR, while achieving comparable or even superior image restoration performance in terms of PSNR, SSIM, FID, and LPIPS. Furthermore, SwinIR-KD effectively processes large-scale SEM images and is complemented by a user-friendly interface for practical application.</div></div>","PeriodicalId":18501,"journal":{"name":"Micron","volume":"199 ","pages":"Article 103897"},"PeriodicalIF":2.2,"publicationDate":"2025-08-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144888679","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Study of gas-based charge compensation in an open-cell environmental TEM by off-axis electron holography 用离轴电子全息技术研究开孔环境TEM中气基电荷补偿

IF 2.2 3区工程技术

Micron Pub Date : 2025-08-19 DOI: 10.1016/j.micron.2025.103896

Makoto Tokoro Schreiber , Cathal Cassidy

引用次数: 0

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