{"title":"电子背散射衍射(EBSD)评价18Cr-9Ni-3Cu-Nb-N钢蠕变损伤——传统霍夫分度与新型球面分度的比较","authors":"Tomotaka Hatakeyama, Kota Sawada","doi":"10.1016/j.micron.2025.103908","DOIUrl":null,"url":null,"abstract":"<div><div>The creep damage evaluation of 18Cr–9Ni–3Cu–Nb–N steel creep interrupted and ruptured at 873 K was performed. Kernel average misorientation (KAM) and grain orientation spread (GOS) values obtained by electron backscattered diffraction (EBSD) through two types of indexing procedures, traditional Hough Indexing (HI) and novel Spherical Indexing (SI), were used as the descriptors of creep damage. The SI resulted in a lower KAM value than that obtained via HI, suggesting improved angular resolution and higher sensitivity for creep damage detection at lower strain levels. The GOS of the virgin sample obtained via SI was also lower than that obtained via HI, whereas that of the crept specimens evaluated via SI and HI were almost identical. Nevertheless, by considering the deviation from the initial value, SI also improved the sensitivity of creep damage detection at the lower strain level using GOS. Therefore, this study revealed the effectiveness of creep damage evaluation with SI compared to that with HI.</div></div>","PeriodicalId":18501,"journal":{"name":"Micron","volume":"199 ","pages":"Article 103908"},"PeriodicalIF":2.2000,"publicationDate":"2025-08-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Creep damage evaluation of 18Cr–9Ni–3Cu–Nb–N steel by electron backscattered diffraction (EBSD) – comparison of traditional Hough Indexing and novel Spherical Indexing –\",\"authors\":\"Tomotaka Hatakeyama, Kota Sawada\",\"doi\":\"10.1016/j.micron.2025.103908\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<div><div>The creep damage evaluation of 18Cr–9Ni–3Cu–Nb–N steel creep interrupted and ruptured at 873 K was performed. Kernel average misorientation (KAM) and grain orientation spread (GOS) values obtained by electron backscattered diffraction (EBSD) through two types of indexing procedures, traditional Hough Indexing (HI) and novel Spherical Indexing (SI), were used as the descriptors of creep damage. The SI resulted in a lower KAM value than that obtained via HI, suggesting improved angular resolution and higher sensitivity for creep damage detection at lower strain levels. The GOS of the virgin sample obtained via SI was also lower than that obtained via HI, whereas that of the crept specimens evaluated via SI and HI were almost identical. Nevertheless, by considering the deviation from the initial value, SI also improved the sensitivity of creep damage detection at the lower strain level using GOS. Therefore, this study revealed the effectiveness of creep damage evaluation with SI compared to that with HI.</div></div>\",\"PeriodicalId\":18501,\"journal\":{\"name\":\"Micron\",\"volume\":\"199 \",\"pages\":\"Article 103908\"},\"PeriodicalIF\":2.2000,\"publicationDate\":\"2025-08-22\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Micron\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://www.sciencedirect.com/science/article/pii/S096843282500126X\",\"RegionNum\":3,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q1\",\"JCRName\":\"MICROSCOPY\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Micron","FirstCategoryId":"5","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S096843282500126X","RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"MICROSCOPY","Score":null,"Total":0}
Creep damage evaluation of 18Cr–9Ni–3Cu–Nb–N steel by electron backscattered diffraction (EBSD) – comparison of traditional Hough Indexing and novel Spherical Indexing –
The creep damage evaluation of 18Cr–9Ni–3Cu–Nb–N steel creep interrupted and ruptured at 873 K was performed. Kernel average misorientation (KAM) and grain orientation spread (GOS) values obtained by electron backscattered diffraction (EBSD) through two types of indexing procedures, traditional Hough Indexing (HI) and novel Spherical Indexing (SI), were used as the descriptors of creep damage. The SI resulted in a lower KAM value than that obtained via HI, suggesting improved angular resolution and higher sensitivity for creep damage detection at lower strain levels. The GOS of the virgin sample obtained via SI was also lower than that obtained via HI, whereas that of the crept specimens evaluated via SI and HI were almost identical. Nevertheless, by considering the deviation from the initial value, SI also improved the sensitivity of creep damage detection at the lower strain level using GOS. Therefore, this study revealed the effectiveness of creep damage evaluation with SI compared to that with HI.
期刊介绍:
Micron is an interdisciplinary forum for all work that involves new applications of microscopy or where advanced microscopy plays a central role. The journal will publish on the design, methods, application, practice or theory of microscopy and microanalysis, including reports on optical, electron-beam, X-ray microtomography, and scanning-probe systems. It also aims at the regular publication of review papers, short communications, as well as thematic issues on contemporary developments in microscopy and microanalysis. The journal embraces original research in which microscopy has contributed significantly to knowledge in biology, life science, nanoscience and nanotechnology, materials science and engineering.